• Bidirectional data strobe (DQS) transmitted/
received with data, i.e., source-synchronous data
capture (x16 has two - one per byte)
• Internal, pipelined double-data-rate (DDR)
architecture; two data accesses per clock cycle
• Differential clock inputs (CK and CK#)
• Commands entered on each positive CK edge
• DQS edge-aligned with data for READs; centeraligned with data for WRITEs
• DLL to align DQ and DQS transitions with CK
• Four internal banks for concurrent operation
• Data mask (DM) for masking write data (x16 has
two - one per byte)
• Programmable burst lengths: 2, 4, or 8
• Concurrent Auto Precharge option supported
• Auto Refresh and Self Refresh Modes
• FBGA package available
• 2.5V I/O (SSTL_2 compatible)
•tRAS lockout (tRAP = tRCD)
• Backwards compatible with DDR200 and DDR266
MT46V64M4 – 16 Meg x 4 x 4 banks
MT46V32M8 – 8 Meg x 8 x 4 banks
MT46V16M16 – 4 Meg x 16 x 4 banks
For the latest data sheet revisions, please refer to the Micron
Web site: www.micron.com/dramds
DDR333 COMPATIBILITY
DDR333 meets or surpasses all DDR266 timing requirements thus assuring full backwards compatibility
with current DDR designs. In addition, these devices
support concurrent auto-precharge and tRAS lockout
for improved timing performance. The 256Mb,
DDR333 device will support an (tREFI) average periodic refresh interval of 7.8us.
The standard 66-pin TSOP package is offered for
point-to-point applications where the FBGA package
is intended for the multi-drop systems.
The Micron 256Mb data sheet provides full specifications and functionality unless specified herein.
CONFIGURATION
Architecture64 Meg x 432 Meg x 816 Meg x 16
Configuration16 Meg x 4 x 4 banks 8 Meg x 8 x 4 banks 4 Meg x 16 x 4 banks
Refresh Count8K8K8K
Row Addressing8K (A0–A12)8K (A0–A12)8K (A0–A12)
Bank Addressing4 (BA0, BA1)4 (BA0, BA1)4 (BA0, BA1)
Column Addressing2K (A0–A9, A11)1K (A0–A9)512 (A0– A8)
OPTIONS PART NUMBER
• Configuration
64 Meg x 4 (16 Meg x 4 x 4 banks) 64M4
32 Meg x 8 (8 Meg x 8 x 4 banks) 32M8
16 Meg x 16 (4 Meg x 16 x 4 banks) 16M16
Due to the physical size of the FBGA package, the full
ordering part number is not printed on the package.
Instead the following package code is utilized.
FBGA PACKAGE PINOUT
x4 (Top View)
123456 789
A
V
B
C
D
E
V
F
G
H
J
K
L
M
A
V
B
C
D
E
F
G
H
J
K
L
M
NC
SS
NC
NC
NC
NC
REF
Q
V
V
V
V
DD
SS
DD
SS
SS
V
CK
A12
A11
A8
A6
A4
VSS
Q
DQ3
Q
NC
Q
DQ2
Q
DQS
DM
CK#
CKE
A9
A7
A5
SS
V
x8 (Top View)
123456 789
DQ7
SS
V
NC
NC
NC
NC
Q
V
V
V
V
REF
DD
SS
DD
SS
SS
V
CK
A12
A11
A8
A6
A4
VSS
Q
DQ6
Q
DQ5
Q
DQ4
Q
DQS
DM
CK#
CKE
A9
A7
A5
SS
V
A
B
C
D
E
F
G
H
J
K
L
M
A
B
C
D
E
F
G
H
J
K
L
M
V
DD
DQ0
NC
DQ1
NC
NC
WE#
RAS#
BA1
A0
A2
DD
V
V
DD
DQ1
DQ2
DQ3
NC
NC
WE#
RAS#
BA1
A0
A2
DD
V
NC
SS
V
DD
V
V
SS
DD
V
DD
V
CAS#
CS#
BA0
A10
A1
A3
DQ0
SS
V
DD
V
SS
V
DD
V
DD
V
CAS#
CS#
BA0
A10
A1
A3
V
DD
Q
Q
NC
Q
NC
Q
NC
Q
NC
A13
V
DD
Q
Q
NC
Q
NC
Q
NC
Q
NC
A13
Top mark contains five fields12345
• Field 1 (Product Family)
DRAMD
DRAM - ESZ
• Field 2 (Product Type)
2.5 Volt, DDR SDRAM, 60-ballL
• Field 3 (Width)
x4 devicesB
x8 devicesC
x16 devicesD
H344CKEInputClock Enable: CKE HIGH activates and CKE LOW deactivates the
H824CS#InputChip Select: CS# enables (registered LOW) and disables (regis-
H7, G8, G723, 22, 21RAS#, CAS#,InputCommand Inputs: RAS#, CAS#, and WE# (along with CS#) define the
3F47 DMInputInput Data Mask: DM is an input mask signal for write data. Input
F7, 3F20, 47LDM, UDMdata is masked when DM is sampled HIGH along with that input
J8,J726, 27BA0, BA1InputBank Address Inputs: BA0 and BA1 define to which bank an
K7, L8, L729-32A0, A1, A2InputAddress Inputs: Provide the row address for ACTIVE commands, and
M8, M2, L332, 35, 36A3, A4, A5the column address and auto precharge bit (A10) for READ/WRITE
L2, K3, K236, 38, 39A6, A7, A8commands, to select one location out of the memory array in the
J3, K8, J240, 29, 41A9, A10, A11respective bank. A10 sampled during a PRECHARGE command
H242A12determines whether the PRECHARGE applies to one bank (A10 LOW,
45, 46CK, CK#InputClock: CK and CK# are differential clock inputs. All address and
control input signals are sampled on the crossing of the positive
edge of CK and negative edge of CK#. Output data (DQs and
DQS) is referenced to the crossings of CK and CK#.
internal clock, input buffers and output drivers. Taking CKE LOW
provides PRECHARGE POWER-DOWN and SELF REFRESH
operations (all banks idle), or ACTIVE POWER-DOWN (row
ACTIVE in any bank). CKE is synchronous for POWER-DOWN
entry and exit, and for SELF REFRESH entry. CKE is asynchronous
for SELF REFRESH exit and for disabling the outputs. CKE must be
maintained HIGH throughout read and write accesses. Input
buffers (excluding CK, CK# and CKE) are disabled during POWERDOWN. Input buffers (excluding CKE) are disabled during SELF
REFRESH. CKE is an SSTL_2 input but will detect an LVCMOS
LOW level after VDD is applied.
tered HIGH) the command decoder. All commands are masked
when CS# is registered HIGH. CS# provides for external bank
selection on systems with multiple banks. CS# is considered part
of the command code.
WE#command being entered.
data during a WRITE access. DM is sampled on both edges of
DQS. Although DM pins are input-only, the DM loading is
designed to match that of DQ and DQS pins. For the x16 , LDM is
DM for DQ0-DQ7 and UDM is DM for DQ8-DQ15. Pin 20 is a NC
on x4 and x8
ACTIVE, READ, WRITE, or PRECHARGE command is being applied.
bank selected by BA0, BA1) or all banks (A10 HIGH). The address inputs
also provide the op-code during a MODE REGISTER SET command. BA0
and BA1 define which mode register (mode register or extended mode
register) is loaded during the LOAD MODE REGISTER command.
B2, D2, C8, 3, 9, 15, 55,VDDQSupply DQ Power Supply: +2.5V ±0.2V. Isolated on the die for improved
E8, A961noise immunity.
A1, C2, E2,6, 12, 52,VSSQSupply DQ Ground. Isolated on the die for improved noise immunity.
B8, D858, 64
F8, M7, A71, 18, 33VDDSupply Power Supply: +2.5V ±0.2V.
A1, A3, F2,34, 48, 66VSSSupply Ground.
M3
F149VREFSupply SSTL_2 reference voltage.
F917A13IAddress input A13 for 1Gb devices.
2, 4, 5,DQ0-2I/OData Input/Output: Data bus for x16
7, 8, 10DQ3-5
11, 13, 54DQ6-8
56, 57, 59DQ9-11
60, 62, 63,DQ12-14
65DQ15
2, 5, 8,DQ0-2I/OData Input/Output: Data bus for x8
11, 56, 59DQ3-5
62, 65DQ6-7
5, 11, 56DQ0-2I/OData Input/Output: Data bus for x4
51DQSI/OData Strobe: Output with read data, input with write data. DQS is
16, 51
14, 17, 25,
43, 53
19, 50DNU–Do Not Use: Must float to minimize noise on Vref
LDQS, UDQS
NC-
edge-aligned with read data, centered in write data. It is used to
capture data. For the x16 , LDQS is DQS for DQ0-DQ7 and UDQS
IS DQS for DQ8-DQ15. Pin 16 (H7) is NC on x4 and x8.
No Connect: These pins should be left unconnected.
The DDR333 SDRAM is a high-speed CMOS, dynamic random-access memory that operates at a frequency of 167 MHz (tCK=6ns) with a peak data transfer rate of 333Mb/s/p. DDR333 continues to use the
JEDEC standard SSTL_2 interface and the 2n-prefetch
architecture.
The standard DDR200/DDR266 data sheets also
pertain to the DDR333 device and should be referenced
for a complete description of DDR SDRAM function-
CAPACITANCE (FBGA)
(Notes: 1-5, 14-17, 33; notes appear in DDR200/266 data sheets)
(0°C ≤ T
PARAMETERSYMBOLMINMAXUNITSNOTES
Delta Input/Output Capacitance:
DQs, DQS, DM (for x4 or x8 devices)DCIO–0.50pF13, 24
Input Capacitance: Command and AddressCI11.502.50pF13
Input Capacitance: CK, CK#CI21.502.50p F13
Input Capacitance: CKECI31.502.50pF13
≤ 70°C; VDDQ = +2.5V ±0.2V, VDD = +2.5V ±0.2V)
A
ality and operating modes. However, to meet the faster
DDR333 operating frequencies, some of the AC timing
parameters are slightly tighter. This addendum data
sheet will concentrate on the key differences required
to support the enhanced speeds.
In addition to the standard 66-pin TSOP package,
a 60-ball FBGA package is utilized for DDR333. This
JEDEC-defined package promotes better package parasitic parameters and a smaller footprint.
CAPACITANCE (TSOP)
(Notes: 1-5, 14-17, 33; notes appear in DDR200/266 data sheets)
(0°C ≤ TA ≤ 70°C; VDDQ = +2.5V ±0.2V, VDD = +2.5V ±0.2V)
PARAMETERSYMBOLMINMAXUNITSNOTES
Delta Input/Output Capacitance:
DQs, DQS, DM (for x4 or x8 devices)DCIO–0.50pF13, 24
DQ0-DQ7, LDQS, LDM (for lower byte of x16 devices),DCIO–0.50pF13, 24
DQ8-DQ15, UDQS, UDM (for upper byte of x16 devices)DCIO–0.50pF13, 24
Delta Input Capacitance: Command and AddressDCI1–0.50pF13, 29
CL = 2
DQ and DM input hold time relative to DQS
DQ and DM input setup time relative to DQS
DQ and DM input pulse width (for each input)
Access window of DQS from CK/CK#
DQS input high pulse width
DQS input low pulse width
DQS-DQ skew, DQS to last DQ valid, per group, per accesstDQSQ0.350.450.50ns25, 26
Write command to first DQS latching transition
DQS falling edge to CK rising - setup time
DQS falling edge from CK rising - hold time
Half clock period
Data-out high-impedance window from CK/CK#
Data-out low-impedance window from CK/CK#
Address and control input hold time (fast slew rate)
Address and control input setup time (fast slew rate)
Address and control input hold time (slow slew rate)
Address and control input setup time (slow slew rate)
Address and control input pulse width
LOAD MODE REGISTER command cycle time
DQ-DQS hold, DQS to first DQ to go non-valid, per access
Data Hold Skew Factor
ACTIVE to AUTOPRECHARGE command
ACTIVE to PRECHARGE command
ACTIVE to ACTIVE/AUTO REFRESH command period
AUTO REFRESH command period
ACTIVE to READ or WRITE delay
PRECHARGE command period
DQS read preamble
DQS read postamble
ACTIVE bank a to ACTIVE bank b command
DQS write preamble
DQS write preamble setup time
DQS write postamble
Write recovery time
Internal WRITE to READ command delay
Data valid output windowna
REFRESH to REFRESH command interval
Average periodic refresh interval
Terminating voltage delay to VDD