Datasheet MCTG35P60F1 Datasheet (Intersil)

Page 1
Semiconductor
MCTG35P60F1
PART WITHDRAWN
April 1999
PROCESS OBSOLETE - NO NEW DESIGNS
Features
• 35A, -600V = -1.3V(Maximum) at I = 35A and +150oC
•V
TM
• 800A Surge Current Capability
• 800A/µs di/dt Capability
• MOS Insulated Gate Control
o
• 50A Gate Turn-Off Capability at +150
C
Description
The MCT is an MOS Controlled Thyristor designed for switching currents on and off by negative and positive pulsed control of an insulated MOS gate. It is designed for use in motor controls, inverters, line switches and other power switching applications.
The MCT is especially suited for resonant (zero voltage or zero current switching) applications. The SCR like forward drop greatly reduces conduction power loss.
MCTs allow the control of high power circuits with very small amounts of input energy. They feature the high peak current capability common to SCR type thyristors, and operate at junction temperatures up to +150
PART NUMBER INFORMATION
PART NUMBER PACKAGE BRAND
MCTG35P60F1 TO-247 M35P60F1
NOTE: When ordering, use the entire part number.
o
C with active switching.
35A, 600V
P-Type MOS Controlled Thyristor (MCT)
JEDEC STYLE TO-247
A
K
G
Symbol
GA
K
Absolute Maximum Ratings T
Peak Off-State Voltage (See Figure 11). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Peak Reverse Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Continuous Cathode Current (See Figure 2)
TC = +25oC (Package Limited) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
TC = +115oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Non-Repetitive Peak Cathode Current (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Peak Controllable Current (See Figure 10) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate-Anode Voltage (Continuous) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate-Anode Voltage (Peak) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Rate of Change of Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . dv/dt See Figure 11
Rate of Change of Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . di/dt 800 A/µs
Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.43 W/oC
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, T
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
(0.063" (1.6mm) from case for 10s) NOTE:
1. Maximum Pulse Width of 250µs (Half Sine) Assume TJ (Initial) = +90oC and TJ (Final) = TJ (Max) = +150oC
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper ESD Handling Procedures. Copyright
© Harris Corporation 1999
= +25oC, Unless Otherwise Specified
C
2-2
I
K25
I
K115 KSM KC
T
DRM RRM
GA GAM
T
L
MCTG35P60F1 UNITS
-600 V +5 V
60 35
800 A
50 A
±20 V ±25 V
178 W
STG
-55 to +150 260
File Number 3602.5
A A
o
C
o
C
Page 2
Specifications MCTG35P60F1
Electrical Specifications T
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Peak Off-State Blocking Current
Peak Reverse Blocking Current
On-State Voltage V
Gate-Anode Leakage Current I
Input Capacitance C
Current Turn-On Delay Time t
Current Rise Time t
Current Turn-Off Delay Time t
Current Fall Time t
= +25oC, Unless Otherwise Specified
C
I
DRM
VKA = -600V, VGA = +18V
I
RRM
VKA = +5V VGA = +18V
TM
IK = I
K115
,
VGA = -10V
GAS
ISS
VGA = ±20V - - 100 nA
VKA = -20V, TJ = +25oC VGA = +18V
D(ON)I
L = 200µH, IK = I
K115
RG = 1, VGA = +18V, -7V
RI
TJ = +125oC VKA = -300V
D(OFF)I
FI
TC = +150oC - - 1.5 mA
TC = +25oC- - 50µA
TC = +150oC- - 2 mA
TC = +25oC- - 50µA
TC = +150oC - - 1.35 V
TC = +25oC - - 1.4 V
-5-nF
- 140 - ns
- 180 - ns
- 640 - ns
- 1.1 1.4 µs
Turn-Off Energy E
Thermal Resistance R
OFF
θJC
Typical Performance Curves
100
PULSE TEST PULSE DURATION = 250µs
50
DUTY CYCLE < 2%
30 20
10
TJ = +150oC
5 3
, CATHODE CURRENT (A)
K
I
2
1
0 0.5 1.0 1.5 2.0
V
, CATHODE VOLTAGE (V)
TM
FIGURE 1. CATHODE CURRENT vs SATURATIONVOLTAGE
(TYPICAL)
TJ = -40oC
TJ = +25oC
- 5.6 - mJ
o
C/W
100
90 80 70 60 50 40 30 20
, DC CATHODE CURRENT (A)
K
I
10
0
20
PACKAGE LIMIT
40
30
50 60
- 0.6 0.7
70 80 90
TC, CASE TEMPERATURE (oC)
100
110 120 130 140 150
FIGURE 2. MAXIMUM CONTINUOUS CATHODE CURRENT
2-3
Page 3
MCTG35P60F1
Typical Performance Curves
T
= +150oC, RG = 1, L = 200µH
200
175
150
125
100
, TURN-ON DELAY (ns)
D(ON)I
75
t
50
0 102030405060
VKA = -200V
IK, CATHODE CURRENT (A)
J
(Continued)
VKA = -300V
FIGURE 3. TURN-ON DELAY vs CATHODE CURRENT
(TYPICAL)
300
250
200
TJ = +150oC, RG = 1, L = 200µH
VKA = -200V
1100
1000
900
800
700
, TURN-OFF DELAY (ns)
600
D(OFF)I
500
t
400
0102030
VKA = -200V
IK, CATHODE CURRENT (A)
TJ = +150oC, RG = 1, L = 200µH
VKA = -300V
40
50
FIGURE 4. TURN-OFF DELAY vs CATHODE CURRENT
(TYPICAL)
1.5
1.25
VKA = -200V
TJ = +150oC, RG = 1, L = 200µH
60
150
, RISE TIME (ns)
100
RI
t
50
0
0 102030405060
VKA = -300V
, CATHODE CURRENT (A)
I
K
FIGURE 5. TURN-ON RISE TIME vs CATHODE CURRENT
(TYPICAL)
2
1
VKA = -300V
0.5
, TURN-ON SWITCHING LOSS (mJ)
ON
E
0.1 0
10
I
, CATHODE CURRENT (A)
K
TJ = +150oC, RG = 1, L = 200µH
VKA = -200V
20
30 40 50
1
, FALL TIME (µs)
FI
t
0.75
0.5 0102030
I
VKA = -300V
40
, CATHODE CURRENT (A)
K
50 60
FIGURE 6. TURN-OFF FALL TIME vs CATHODE CURRENT
(TYPICAL)
T
= +150oC, RG = 1, L = 200µH
10
5
VKA = -300V
1
0.5
, TURN-OFF SWITCHING LOSS (mJ)
OFF
E
0.1
60
0
10
20
IK, CATHODE CURRENT (A)
J
VKA = -200V
30 40 50 60
FIGURE 7. TURN-ON ENERGY LOSS vsCATHODE CURRENT
(TYPICAL)
FIGURE8. TURN-OFFENERGY LOSSvsCATHODE CURRENT
(TYPICAL)
2-4
Page 4
MCTG35P60F1
Typical Performance Curves
100
50 30
20
10
f
= 0.05 / t
MAX1
5
f
MAX2
PD: ALLOWABLE DISSIPATION
3
P
: CONDUCTION DISSIPATION
C
2
(P
DUTY FACTOR = 50%)
C
, MAX OPERATING FREQUENCY (kHz)
R
= 0.6oC/W
θJC
1
MAX
f
51020
D(OFF)I
= (PD - PC) / E
IK, CATHODE CURRENT (A)
SWITCH
(Continued)
T
= +115oC, L = 200µH
C
VKA = -300V
VKA = -200V
30 50 100
FIGURE9. OPERATINGFREQUENCY vsCATHODECURRENT
(TYPICAL)
-725
-700
-675
-650
-625
-600
-575
-550
-525
-500
, BREAKDOWN VOLTAGE (V)
-475
DRM
-450
V
-425
0.1 1 10 100 1000 10000
dv/dt (V/µs)
TJ = +150oC, VGA = 18V
60
50
40
30
20
10
PEAK CATHODE CURRENT (A)
0
SAFE OPERATING AREA
0
-100 -200 VKA, PEAK TURN OFF VOLTAGE (V)
TURN-OFF
TJ = +150oC, VGA = 18V, L = 100µH
-300 -400
-500
FIGURE 10. TURN-OFF CAPABILITY vsANODE-CATHODE
VOLTAGE
200
CS = 0.1µF, TJ = +150oC
100
= 0.1µF, TJ = +25oC
C
S
= 1µF, TJ = +150oC
C
S
50
20
10
, SPIKE VOLTAGE (V)
SPIKE
5
V
2
0 5 10 15 20 25 30 35 40
CS = 2µF, TJ = +150oC
= 1µF, TJ = +25oC
C
S
C
= 2µF, TJ = +25oC
S
di/dt (A/µs)
-600
FIGURE 11. BLOCKING VOLTAGE vs dv/dt FIGURE 12. SPIKE VOLTAGE vs di/dt (TYPICAL)
Operating Frequency Information
Operating frequency information for a typical device (Figure 9) is presented as a guide for estimating device per­formance for a specific application. Other typical frequency vs cathode current (I tion shown for a typical unit in Figure 3 to Figure 8. The oper­ating frequency plot (Figure 9) of a typical device shows f
or f
MAX1
MAX2
mation is based on measurements of a typical device and is bounded by the maximum rated junction temperature.
f
is defined by f
MAX1
+t
D(OFF)I
deadtime (the denominator) has been arbitrarily held to 10% of the on-state time for a 50% duty factor. Other definitions are possible. t the leading edge of the input pulse and the point where the cathode current rises to 10% of its maximum value. t is defined as the 90% point of the trailing edge of the input pulse and the point where the cathode current falls to 90% of
) plots are possible using the informa-
AK
whichever is lower at each point. The infor-
MAX1
= 0.05 / (t
D(ON)I
D(ON)I+tD(OFF)I
is defined as the 10% point of
). t
D(OFF)I
D(ON)I
its maximum value. Device delay can establish an additional frequency limiting condition for an application other than T
JMAX.tD(OFF)I
is important when controlling output ripple
under a lightly loaded condition. f
is defined by f
MAX2
allowable dissipation (P R
. The sum of device switching and conduction losses
θJC
must not exceed P
. A 50% duty factor was used (Figure 10)
D
and the conduction losses (P (V
AK•IAK
) / (duty factor/100). EONis defined as the sum of
=(PD-PC)/(EON+E
MAX2
) is defined by PD=(T
D
) are approximated by PC =
C
OFF
JMAX-TC
the instantaneous power loss starting at the leading edge of the input pulse and ending at the point where the anode­cathode voltage equals saturation voltage (V
AK=VTM
is defined as the sum of the instantaneous power loss start­ing at the trailing edge of the input pulse and ending at the point where the cathode current equals zero (I
= 0).
K
2-5
). The
). E
)/
OFF
Page 5
Test Circuits
200µH
I
K
DUT
V
K
RURG3060
MCTG35P60F1
­+
500
-
20V
+
10k
V
G
+
-
V
A
C
S
DUT
9V
+
4.7k
I
K
-
FIGURE 13. SWITCHING TEST CIRCUIT FIGURE 14. V
MAXIMUM RISE AND FALL TIME OF VG IS 200ns
V
G
10%
-V
KA
90%
I
K
10%
t
D(OFF)I
t
FI
90%
t
D(ON)I
t
RI
FIGURE 15. SWITCHING TEST WAVEFORMS
Handling Precautions for MCTs
MOS Controlled Thyristors are susceptible to gate-insulation damage by the electrostatic discharge of energy through the devices. When handling these devices, care should be exer­cised to assure that the static charge built in the handler's body capacitance is not discharged through the device. MCT's can be handled safely if the following basic precau­tions are taken:
1. Prior to assembly into a circuit, all leads should be kept
shorted together either by the use of metal shorting springs or by the insertion into conductive material such
*
as
“ECCOSORB LD26” or equivalent.
2.When devices are removed by hand from their carriers,
the hand being used should be grounded by any suitable means - for example, with a metallic wristband.
3.Tips of soldering irons should be grounded.
TEST CIRCUIT
SPIKE
V
G
di/dt
I
K
V
AK
FIGURE 16. V
V
SPIKE
TEST WAVEFORMS
SPIKE
V
TM
4.Devices should neverbe inserted into or removed from cir­cuits with power on.
5.Gate Voltage Rating - Never exceed the gate-voltage rating of V
. Exceeding the rated VGAcan result in
GA
permanent damage to the oxide layer in the gate region.
6.Gate Termination - The gates of these devices are essen­tially capacitors. Circuits that leave the gate open-circuited or floating should be avoided. These conditions can result in turn-on of the device due to voltage buildup on the input capacitor due to leakage currents or pickup.
7.Gate Protection - These devices do not have an internal monolithic zener diode from gate to emitter. If gate protec­tion is required an external zener is recommended.
Trademark Emerson and Cumming, Inc.
2-6
Loading...