• 35A, -600V
= -1.3V(Maximum) at I = 35A and +150oC
•V
TM
• 800A Surge Current Capability
• 800A/µs di/dt Capability
• MOS Insulated Gate Control
o
• 50A Gate Turn-Off Capability at +150
C
Description
The MCT is an MOS Controlled Thyristor designed for
switching currents on and off by negative and positive pulsed
control of an insulated MOS gate. It is designed for use in
motor controls, inverters, line switches and other power
switching applications.
The MCT is especially suited for resonant (zero voltage or
zero current switching) applications. The SCR like forward
drop greatly reduces conduction power loss.
MCTs allow the control of high power circuits with very small
amounts of input energy. They feature the high peak current
capability common to SCR type thyristors, and operate at
junction temperatures up to +150
FIGURE 11. BLOCKING VOLTAGE vs dv/dtFIGURE 12. SPIKE VOLTAGE vs di/dt (TYPICAL)
Operating Frequency Information
Operating frequency information for a typical device
(Figure 9) is presented as a guide for estimating device performance for a specific application. Other typical frequency
vs cathode current (I
tion shown for a typical unit in Figure 3 to Figure 8. The operating frequency plot (Figure 9) of a typical device shows
f
or f
MAX1
MAX2
mation is based on measurements of a typical device and is
bounded by the maximum rated junction temperature.
f
is defined by f
MAX1
+t
D(OFF)I
deadtime (the denominator) has been arbitrarily
held to 10% of the on-state time for a 50% duty factor. Other
definitions are possible. t
the leading edge of the input pulse and the point where the
cathode current rises to 10% of its maximum value. t
is defined as the 90% point of the trailing edge of the input
pulse and the point where the cathode current falls to 90% of
) plots are possible using the informa-
AK
whichever is lower at each point. The infor-
MAX1
= 0.05 / (t
D(ON)I
D(ON)I+tD(OFF)I
is defined as the 10% point of
). t
D(OFF)I
D(ON)I
its maximum value. Device delay can establish an additional
frequency limiting condition for an application other than
T
JMAX.tD(OFF)I
is important when controlling output ripple
under a lightly loaded condition.
f
is defined by f
MAX2
allowable dissipation (P
R
. The sum of device switching and conduction losses
θJC
must not exceed P
. A 50% duty factor was used (Figure 10)
D
and the conduction losses (P
(V
AK•IAK
) / (duty factor/100). EONis defined as the sum of
=(PD-PC)/(EON+E
MAX2
) is defined by PD=(T
D
) are approximated by PC =
C
OFF
JMAX-TC
the instantaneous power loss starting at the leading edge of
the input pulse and ending at the point where the anodecathode voltage equals saturation voltage (V
AK=VTM
is defined as the sum of the instantaneous power loss starting at the trailing edge of the input pulse and ending at the
point where the cathode current equals zero (I
= 0).
K
2-5
). The
). E
)/
OFF
Page 5
Test Circuits
200µH
I
K
DUT
V
K
RURG3060
MCTG35P60F1
+
500Ω
-
20V
+
10kΩ
V
G
+
-
V
A
C
S
DUT
9V
+
4.7kΩ
I
K
-
FIGURE 13. SWITCHING TEST CIRCUITFIGURE 14. V
MAXIMUM RISE AND FALL TIME OF VG IS 200ns
V
G
10%
-V
KA
90%
I
K
10%
t
D(OFF)I
t
FI
90%
t
D(ON)I
t
RI
FIGURE 15. SWITCHING TEST WAVEFORMS
Handling Precautions for MCTs
MOS Controlled Thyristors are susceptible to gate-insulation
damage by the electrostatic discharge of energy through the
devices. When handling these devices, care should be exercised to assure that the static charge built in the handler's
body capacitance is not discharged through the device.
MCT's can be handled safely if the following basic precautions are taken:
1. Prior to assembly into a circuit, all leads should be kept
shorted together either by the use of metal shorting
springs or by the insertion into conductive material such
*
as
“ECCOSORB LD26” or equivalent.
2.When devices are removed by hand from their carriers,
the hand being used should be grounded by any suitable
means - for example, with a metallic wristband.
3.Tips of soldering irons should be grounded.
TEST CIRCUIT
SPIKE
V
G
di/dt
I
K
V
AK
FIGURE 16. V
V
SPIKE
TEST WAVEFORMS
SPIKE
V
TM
4.Devices should neverbe inserted into or removed from circuits with power on.
5.Gate Voltage Rating - Never exceed the gate-voltage
rating of V
. Exceeding the rated VGAcan result in
GA
permanent damage to the oxide layer in the gate region.
6.Gate Termination - The gates of these devices are essentially capacitors. Circuits that leave the gate open-circuited
or floating should be avoided. These conditions can result
in turn-on of the device due to voltage buildup on the input
capacitor due to leakage currents or pickup.
7.Gate Protection - These devices do not have an internal
monolithic zener diode from gate to emitter. If gate protection is required an external zener is recommended.
† Trademark Emerson and Cumming, Inc.
2-6
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