The M29W640D is a 64 Mbit (8Mb x8 or 4Mb x16)
non-volatile memory that can be read, erased and
reprogrammed. These operations can be performed using a single low voltage (2.7 to 3.6V)
supply. On power-up the memory d efaults to its
Read mode where it can be read in the same way
as a ROM or EPROM.
The memory is divided into blocks that can be
erased independently so it is pos sible to pres erve
valid data while old data is erased. Blocks can be
protected in units of 256 KByte (generally groups
of four 64 KByte blocks), to prevent accidental
Program or Erase commands from modifying the
memory. Program and Erase com m ands are wri tten to the Command Interface of t he memory. An
on-chip Program/Erase Controller simplifies the
process of programming or erasing the memory by
taking care of all of the special operations that are
required to update the memory contents. The end
of a program or erase op eration can be de tected
and any error conditions identified. The command
set required to control the memory is consistent
with JEDEC standards.
The device features an asymmetrical blocked architecture. The device has an array of 135 blocks:
■ 8 Parameters Blocks of 8 KBytes each (or
4KWords each)
■ 127 Main Blocks of 64 KBytes each (or
32 KWords each)
M29W640DT has the Parameter Blocks at the top
of the memory address space while the
M29W640DB locates the Parameter Blo cks starting from the bottom.
The M29W640D has an extra block, the Extended
Block, (of 32 KWords in x16 mode or of 64 KBytes
in x8 mode) that can be accessed using a dedicated command. The Extended Block can be protected and so is useful for storing security information.
However the protection is not reversible, once protected the protection cannot be undone.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most m icroprocessors, often without additional logic.
The V
/WP signal is used to enable faster pro-
PP
gramming of the device, enabling double word
programming. If this signal is held at V
, the boot
SS
block, and its adjacent parameter blo ck, are protected from program and erase operations.
The memor y is del ivered with all t he bit s eras ed (set
to 1).
Data Input/Output or Address Input
(or Data Input/Output)
Chip Enable
Output Enable
Write Enable
Reset/Block Temporary Unprotect
Ready/Busy Output
Byte/Word Organization Select
Supply Voltage
Supply Voltage for Fast Program
(optional) or Write Protect
15
DQ0-DQ14
DQ15A–1
BYTE
RB
AI05733
V
SS
NCNot Connected Internally
Ground
5/50
Page 6
M29W640DT, M29W640DB
Figure 3. TSOP Connections
A15
1
48
A14
A13
A12
A11
A10DQ14
A9
A8
A19
A20
M29W640DT
M29W640DB
W
RP
A21
12
13
37
36
VPP/WP
RB
A18
A17
A7
A6
A5
A4
A3
A2
A1
2425
AI05734
A16
BYTE
V
SS
DQ15A–1
DQ7
DQ6
DQ13
DQ5
DQ12
DQ4
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
G
V
SS
E
A0
6/50
Page 7
Figure 4. TFBGA Connections (Top view through package)
M29W640DT, M29W640DB
8
7
6
5
4
3
2
1
NC
NC
NC
NC
(1)
(1)
(1)
(1)
NC
NC
NC
(1)
(1)
A12A13
A15A14
A16
BYTE
A11DQ7
W
RB
RP
V
/
PP
WP
A20
DQ2
DQ12DQ5A19A21
A5
A1A2
(1)
A0A4A3
CBAEDFGH
DQ15
A–1
V
SS
DQ6DQ13DQ14A10A8A9
V
CC
DQ4
DQ3DQ11DQ10A18
DQ1DQ9DQ8DQ0A6A17A7
E
G
V
SS
JKLM
NC
NC
NC
NC
(1)
(1)
(1)
(1)
NC
NC
NC
NC
(1)
(1)
(1)
(1)
Note: 1. Bal l s ar e shorted to get her via the substrate but not connec ted to the die.
AI05735
7/50
Page 8
M29W640DT, M29W640DB
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram, and T able 1, Sign al
Names, for a brief overview of the signals connected to this device.
Address Inputs (A0-A21). The Address Inputs
select the cells i n the memory array to a ccess during Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ0-DQ7). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation. During Bus Write
operations they represent the commands sent to
the Command Interface of the Program/Erase
Controller.
Data Inputs/Outputs (DQ8-DQ14). The Data I/O
outputs the data stored at the selected address
during a Bus Read operation when B Y TE
V
. When BYTE is Low, VIL, these pins are not
IH
used and are high impedance. During Bus Write
operations the Command Register does not use
these bits. When reading the Status Register
these bits should be ignored.
Data Input/Output o r Address Input (DQ15A –1).
When BYTE
is High, VIH, this pin behaves as a
Data Input/Output pin (as DQ8-DQ14). When
is Low, VIL, this pin behaves as an address
BYTE
pin; DQ15A–1 Low will select the LSB of the addressed Word, DQ15A–1 High will select the MSB.
Throughout the text consider references to the
Data Input/Output to include this pin when BYTE
High and references to the Address Inputs to include this pin when BYTE
is Low except when
stated explicitly otherwise.
Chip Enable (E
). The Chip Enable, E, activates
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
Output Enable (G
, all other pins are ignored.
IH
). The Output Enable, G, con-
trols the Bus Read operation of the memory.
Write Enable (W
). The Write Enable, W, controls
the Bus Write operation of the memory’s Command Interf a c e .
Write Protect (VPP/WP). The VPP/Write
V
PP/
Protect
pin provides two functions. The VPP function allo ws the memory to use an exte rnal high
volt age power suppl y t o reduce t he time r e quire d
for Unlock Bypass Program operations. The
Write P ro tec t func ti on pr ov i des a ha rd ware met hod of protecting the two outermost boot blocks.
The V
/Write Protect pin must not be left floating
PP
or unconnected.
When V
/Write Protect is L ow , VIL, the memory
PP
protects the two outermost boot blocks; Program
is High,
is
and Erase operations in this block are ignored
while V
When V
/Write Protect is Low.
PP
/Write Protect is High, VIH, the memo r y
PP
reverts to the previous protection status of the two
outermost boot blocks. Program and Erase operations can now modify the data in the two outermost
boot blocks unless the block is protected using
Block Protection.
When V
/Write Protect is raised to V
PP
the mem-
PP
ory automatically enters the Unlock Bypass mode.
When V
/Write Protect returns to VIH or VIL nor-
PP
mal operation resumes. During Unlock Bypass
Program operations the memory draws I
PP
from
the pin to supply the programming circuits. See the
description of the Unlock Bypass comm and in the
Command Interface section. The transitions from
V
to VPP and from VPP to VIH must be slower
IH
than t
Never raise V
, see Figure 13.
VHVPP
/Write Protect to VPP from any
PP
mode except Read m ode, otherwise the memory
may be left in an indeterminate state.
A 0.1µF capacitor should be connected between
the V
/Write Protect pin and the VSS Ground pin
PP
to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during Unlock Bypass
Program, I
Reset/Block Temporary Unprotect (RP
PP
.
). The
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that hav e b een
protected.
Note that i f V
/WP is at VIL, then the two ou ter-
PP
most boot blocks will remain protected even if RP
ID
.
is at V
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
, the memory will be ready for Bus
IH
Read and Bus Write operations after t
t
, whichever occurs last. See the Ready/Busy
RHEL
, for at least
IL
PHEL
or
Output section, Table 15 and Figure 12, Reset/
Block Temporary Unprotect AC Characteristics,
for more details.
Holding RP
at VID will temporarily unprotect the
protected Blocks in the memory. Program and
Erase operations on all blocks will be possible.
The transition from V
t
PHPHH
.
Ready/Busy Output (RB
to VID must be slower than
IH
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
. Ready/Busy is high-im-
OL
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
8/50
Page 9
M29W640DT, M29W640DB
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedance. See Tabl e 15 and Figure
12, Reset/Block Temporary Unprotect AC Characteristics.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Byte/Word Organization Select (BYTE
). The
Byte/Word Organization Select pin is used to
switch between the x8 and x16 Bus modes of the
memory. When Byte/Word Organizati on Select is
Low, V
High, V
V
CC
, the memory is in x8 mode, when it is
IL
, the memory is in x16 mode.
IH
Supply Voltage (2.7V to 3.6V). VCC pro-
vides the power supply for all operations (Read,
Program and Erase).
The Command Interface is disabled when the V
CC
Supply Voltage is less than the L ockout Voltage,
V
. This prevents Bus Write operations from ac-
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
the V
Supply Voltage pin and the VSS Ground
CC
pin to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during Program and
Erase operations, I
Ground. VSS is the reference for all voltage
V
SS
measurements. The device f eatu res two V
CC3
.
pins
SS
which must be both connected to the system
ground.
9/50
Page 10
M29W640DT, M29W640DB
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Wri te, Output Disable, Standby and Automatic Standby. See
Table 2 and T able 3, Bus Operat ions, for a summary. Typically glitches of less than 5ns on Chip
Enable or Write Enable are ignored by the memory
and do not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 9, Read Mode AC Waveforms,
and Table 12, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latched by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
IH
Write operation. See Figure 10 and Figure 11,
Write AC Waveforms, and Table 13 and Table 14,
Write AC Characteristics, for details of the timing
requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
.
IH
Standby. When Chip Enable is High, V
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-impedance state. To reduce the S upply Current to the
Standby Supply Current, I
CC2
, to Chip Enable
IL
, during the whole Bus
, the
IH
, Chip Enable should
be held within V
± 0.2V. For the Standby current
CC
level see Table 11, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
, for Program or Erase operations un-
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
± 0.2V)
CC
are used to drive the bus and the bus is inactive for
300ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
CC2
. The
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations
Additional bus operations can be performed to
read the Electronic Signature and also to apply
and remove Block Protec tion. These bus operations are intended for use by programming equipment and are not usually used in applications.
They require V
to be applied to some pins.
ID
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Table 2 and Table 3, Bus Operations.
Block Protect and Chip Unprotect.
Groups of
blocks can be protected against accidental Program or Erase. The P rotec tion G roups are shown
in Appendix A, Table 19 and Table 20, Block Addresses. The whole chip can be unprotected to allow the data inside the blocks to be changed.
The V
the two outermost boot blocks. When V
Protect
/Write Protect pin ca n be used to prote c t
PP
is at V
the two outermost boot blocks are
IL
PP
/Write
protected an d remain pr otected regardless of t he
Block Protection Status or the Reset/Block Temporary Unprotect pin status.
Block Protect and Chip Unprote ct operations are
described in Appendix D.
10/50
Page 11
M29W640DT, M29W640DB
Table 2. Bus Operations, BYTE = V
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Extended Memory
Block Verify Code
Note: X = VIL or VIH.
V
V
V
V
V
V
V
IL
IL
IH
IL
IL
IL
IL
V
IH
V
IH
XXXHi-ZHi-Z
V
IL
V
IL
V
IL
Table 3. Bus Operations, BYTE = V
OperationE
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Extended Memory
Block Verify Code
Note: X = VIL or VIH.
V
V
V
V
V
V
GW
V
IL
IL
IH
IL
IL
IL
IL
V
IH
V
IH
XXXHi-Z
V
IL
V
IL
V
IL
IL
Address Inputs
DQ15A–1, A0-A21
V
Cell AddressHi-ZData Output
IH
V
Command AddressHi-ZData Input
IL
V
XHi-ZHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL,
V
IH
A9 = V
or V
IL
IH
, Others VIL or V
ID
DQ14-DQ8DQ7-DQ0
IH
Data Inputs/Outputs
Hi-Z20h
Hi-Z
DEh (M29W640DT)
DFh (M29W640DB)
98h (factory locked)
A0 = VIH, A1 = VIH, A6 = VIL,
V
IH
A9 = V
, Others VIL or V
ID
IH
Hi-Z
18h (not factory locked)
88h (factory locked)
08h (not factory locked)
IH
Address Inputs
A0-A21
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
IL
IL
or V
or V
IH
IH
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
22DEh (M29W640DT)
22DFh (M29W640DB)
M29W640DT
98h (factory locked)
A0 = VIH, A1 = VIH, A6 = VIL,
V
IH
A9 = V
, Others VIL or V
ID
IH
18h (not factory locked)
M29W640DB
88h (factory locked)
08h (not factory locked)
M29W640DT
M29W640DB
0020h
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Page 12
M29W640DT, M29W640DB
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
The address used for the commands changes depending on whether the memory is in 16-bit or 8bit mode. See either Table 4, or Table 5, depending on the configuration that is being used, for a
summary of the commands.
Read/Reset Command.
The Read/Reset command returns the memory to
its Read mode where it behaves like a ROM or
EPROM. It also resets the errors in the Status
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. If the Read/Reset command is issued
during the timeout of a Block erase operation then
the memory will take up to 10µs to abort. During
the abort period no valid data can be read from the
memory. The Read/Reset command will not abort
an Erase operation when issued while in Erase
Suspend.
Auto Select Command.
The Auto Select command is used to read the
Manufacturer Code, the Device Code , the Block
Protection Status and the Extended Memory Block
Verify Code. Three c onsecutive Bus W rite operations are required to iss ue the Auto Select command. Once the Auto Select command is issued
the memory remains in Auto Select mode until a
Read/Reset command is issued. Read CFI Query
and Read/Reset comma nds are ac cept ed i n Aut o
Select mode, all other commands are ignored.
In Auto Select mode the Manufac turer Code can
be read using a Bus Read operation with A0 = V
and A1 = VIL. The other address bits may be set to
either V
Microelectronics is 0020h.
The Device Code can be read using a B us Read
operation with A0 = V
address bits may be set to e ither V
Device Code for the M29W640DT is 22DEh and
for the M29W640DB is 22DFh.
The Bl ock Prot ection S tatus of each block can be
read using a Bus Read operation with A0 = V
A1 = V
the bl ock. The oth er addr ess bit s may b e set t o either V
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
or VIH. The Manufacturer Code f or ST-
IL
and A1 = VIL. The other
IH
, and A 12 -A 21 spec ify i n g t he address of
IH
or VIH. If t h e ad dr ess ed b loc k is pro tec te d
IL
or VIH. The
IL
IL
Read CFI Query Command
The Read CFI Query Command is used to read
data from the Common Flash Interface (CFI)
Memory Area. This command is valid when the device is in the Read Array mode, or when the device
is in Autose lec ted mode .
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read ope rations read from
the Common Flash Interface Memory Area.
The Read/Reset command m ust be issued to return the device to the previous mode (the Read Array mode or Autoselected mode). A second Read/
Reset command would be needed if the device is
to be put in the Read Array mode from Autoselected mode.
See Appendix B, Table 21 to Table 26 for details
on the information contained in the Common Flash
Interface (CFI) memory area.
Program Command.
The Program command can be used to program a
value to one address in the memory array at a
time. The command requires four Bus Write operations, the final write operation latches the address and data, and starts the Program/Erase
Controller.
If the address falls in a pro tected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operat ion the memo ry will ignore all commands. I t is n ot poss ible t o iss ue any
command to abort or pause the operation. Typical
program times are given in Table 6. Bus Read operations during the program o peration will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory will return to the Read mode, unle ss an
IL
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Fast Program Commands
There are two Fast Program com man ds availa ble
,
to improve the programming throughput, by writing
several adjacent words or bytes in parallel. The
Quadruple Byte Program command is available for
x8 operations, while the Double Word Program
command is available for x16 operations.
12/50
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M29W640DT, M29W640DB
Quadruple Byte Program Command. The Qua-
druple Byte Program command is used to write a
page of four adjacent Bytes in parallel. The four
bytes must differ only for addresses A0, DQ15A-1.
Five bus write cycles are necessary to issue the
Quadruple Byte Program command .
■ The first bus cycle sets up the Quadruple Byte
Program Command.
■ The second bus cycle latches the Address and
the Data of the first byte to be written.
■ The third bus cycle latches the Address and the
Data of the second byte to be written.
■ The fourth bus cycle latches the Address and
the Data of the third byte to be written.
■ The fifth bus cycl e latches the Addres s and th e
Data of the fourth byte to be written and starts
the Program/Erase Controller.
Double Word Program Command. The Double
Word Program command is used to write a p age
of two adjacent words in parallel. Th e two words
must differ only for the address A0.
Three bus write cycles are necessary to issue the
Double Word Program command.
■ The first bus cycle sets up the Double Word
Program Command.
■ The second bus cycle latches the Address and
the Data of the first word to be written.
■ The third bus cycle latches the Address and the
Data of the second word to be written and starts
the Program/Erase Controller.
Only one bank can be programmed at any one
time. The other b ank must be in Read mode or
Erase Suspend.
Programming should not be attempted when V
is not at V
PPH
.
PP
After programming has started, Bus Read operations in the Bank being programmed output the
Status Register content, while Bus Read operations to the other B ank outpu t the cont ents of t he
memory ar ray.
After the program operation has completed the
memory will return to the Read mode, unle ss an
error has occurred. When an error occurs Bus
Read operations to the Bank where the command
was issued will continue to output the Status Register. A Read/Reset command must be issued to
reset the error condition and return t o Read mode.
Note that the Fast Program commands cannot
change a bit set at ’0’ back to ’1’. One of the Erase
Commands must be used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Typical Program times are given in Tab le 6, Program, Erase Times and Program, Erase Endurance Cycles.
Unlock Bypass Command.
The Unlock Bypass command is used in conjunction with the Unlock Bypass Program command to
program the memory faster than with the standard
program commands. When th e cycle time to the
device is long (as with some EPROM programmers) considerable time saving can be m ade by
using these commands. Three Bus Write operations are required to issue the Unlock Bypass
command.
Once the Unlock Bypas s command has bee n issued the memory will only accept the Unloc k Bypass Program command and the Unlock Bypass
Reset command. The memory can be read as if in
Read mode.
When V
is applied to the VPP/Write Protect pin
PP
the memory automatically enters the Unlock Bypass mode and the Unlock Bypass Program command can be issued immediately.
Unlock Bypass Program Command.
The Unlock Bypass command is used in conjunction with the Unlock Bypass Program command to
program the memory. Whe n the cycle time t o the
device is long (as with some EPROM programmers) considerable time saving can be m ade by
using these commands. Three Bus Write operations are required to issue the Unlock Bypass
command.
Once the Unlock Bypas s command has bee n issued the memory will only accept the Unloc k Bypass Program command and the Unlock Bypass
Reset command. The memory can be read as if in
Read mode.
The memory offers accelerated program operations through the V
system asserts V
/Write Protect pin. When the
PP
on the VPP/Write Protect pin,
PP
the memory automatically enters the Unlock Bypass mode. The system may then write the twocycle Unlock Bypass program command sequence. The memory uses the higher voltage on
the V
/Write Protect pin, to accelerate the Unlock
PP
Bypass Program operation.
Never raise V
/Write Protect to VPP from any
PP
mode except Read m ode, otherwise the memory
may be left in an indeterminate state.
Unlock Bypass Reset Command.
The Unlock Bypass Rese t command can be used
to return to Read/Reset mode from Unlock Bypass
Mode. Two Bus Write operations are required to
issue the Unlock Bypass Reset command. Read/
Reset command does not exit from Unlock Bypass
Mode.
Chip Erase Command.
The Chip Erase command can be used to erase
the entire chip. Six Bus Write operations a re re-
13/50
Page 14
M29W640DT, M29W640DB
quired to issue the Chip Erase Command and start
the Program/Erase Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protect e d th e Chip Erase op erat i on ap-
pears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands, including the Erase Suspen d command. It is not possible to i ssue any c ommand t o
abort the operation. Typical chip erase tim es are
given in Table 6. All Bus Read operations during
the Chip Erase operation will output the Status
Register on the Data Inputs/Outputs. See the section on the Status Register for more details.
After the Chip Erase operation has completed t he
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command.
The Block Erase com mand can be used to erase
a list of one or more blocks. Six Bus Write operations are required to select the first block in the li st.
Each additional block in the list can be selected by
repeating the sixth Bus Write operation using the
address of the additional block. The B lock Erase
operation starts the Program/Erase Controller
about 50µs after the last Bus Write operation.
Once the Pr ogram /Erase Co ntroller st arts it is not
possible to select any more blocks. Each additional block must therefore be selected within 50µs of
the last block. The 50µs timer restarts when an additional block is selected. The Status Register can
be read after the sixth B us Write operation. See
the Status Register section for details on how to
identify if the Program/ Erase Con troller has st arted the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are p rotected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the me mory wi ll
ignore all commands except the Erase Susp end
command. Typical b lock era se tim es are g iven in
Table 6. All Bus Read operations during the Block
Erase ope ra tion will outp ut the S t atus R e gister on
the Data Inputs/Outputs. See the section on the
Status Register for more details.
After the Block Erase operation has completed the
memory will return to the Read Mode, unle ss an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
The Block Erase Command sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command.
The Erase Suspend Command may be used to
temporarily suspend a B lock Eras e operation and
return the memory to Read mode. T he comm and
requires one Bus Write operation.
The Program/Erase Controller will sus pend within
the Erase Suspend Latency time of the Erase Suspend Command being issued. Once the Program/
Erase Controller has stopped the mem ory will be
set to Read mode and the E ras e wi ll be s uspended. If the Erase Suspend command is issued during the period when the memory is waiting for an
additional block (before the Program/Er ase Controller starts) then the Erase is suspended immediately and will start immediately when the Erase
Resume Command is issued. It is not possibl e to
select any further blocks to erase after the Erase
Resume.
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program comm and is ignored and
the data remains unchanged. The Status Register
is not read and no error condi tion is given. Reading from blocks that are being erased will output
the Status Register.
It is also possible to issue the Auto Select, Read
CFI Query and Unlock Bypass commands du ring
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepte d.
Erase Resume Command.
The Erase Resume command must be used to restart the Program/Erase Controller after an Erase
Suspend. The device must be in Read Array mode
before the Resume command will be accepted. An
erase can be suspe nded and resumed mo re t han
once.
Enter Extended Block Command
The device has an extra 64 KByte block (Extended
Block) that can on ly be acc essed usin g the Enter
Extended Block command. Three Bus write cycles
are required to issue the Extended Block command. Once the c ommand has been issued the
device enters Extended Block mode where all Bus
14/50
Page 15
M29W640DT, M29W640DB
Read or Write operations to the Boot Block addresses access the Extended Bloc k. The Extended Block (with the same address as the Boot
Blocks) cannot be erased, and can be t reated as
one-time programmable (OTP) memory. In Extended Block mode the Boot Blocks are not accessible.
To exit from the Extended Block mode the Exit Extended Block command must be issued.
The Extended Block can be protected, however
once protected the protection cannot be undone.
Exit Extended Block Com m a n d
The Exit Extended Block command is used to exit
from the Extended Block mod e and ret urn the de-
vice to Read mode. Four Bus Write operations are
required to issue the command.
Block Protect andChip Unprotect Commands
Groups of blocks can be protected against acci-
dental Program or Erase. The Protection Groups
are shown in Appendix A, T able 1 9 and T able 20,
Block Addresses. The whole chip can be unprotected to allow the data inside the blocks to be
changed.
Block Protect and Chip Unprote ct operations are
described in Appendix D.
15/50
Page 16
M29W640DT, M29W640DB
Table 4. Commands, 16-bit mode, BYTE = V
IH
Bus Write Operations
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr DataAddrData Addr Data Addr Data Addr Dat a
1X F0
Read/Reset
3555AA2AA55XF0
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Double Word Program355550PA0PD0PA1PD1
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Note: X Don’t Care, PA Prog ram Addre ss , P D Program Data, BA An y address in the Block. All values in the table are in hexadecimal .
The Com ma nd In terf ace o nly us es A –1, A0-A 10 a nd DQ 0-DQ 7 t o ver ify the com man ds; A 11-A 2 0, D Q8-DQ1 4 a nd DQ 15 ar e D on’t
Care. DQ15A–1 is A– 1 when BYTE
Note: X Don’t Care, PA Prog ram Addre ss , P D Program Data, BA An y address in the Block. All values in the table are in hexadecimal .
The Com ma nd In terf ace o nly us es A –1, A0-A 10 a nd DQ 0-DQ 7 t o ver ify the com man ds; A 11-A 2 0, D Q8-DQ1 4 a nd DQ 15 ar e D on’t
Care. DQ15A–1 is A– 1 when BYTE
is VIL or DQ15 when BYTE is VIH.
Table 6. Program, Erase Times and Progra m , Erase Endurance Cycles
ParameterMin
Typ
(1, 2)
Chip Erase80
Block Erase (64 KBytes)0.8
Erase Suspend Latency Time
Program (Byte or Word)10
Double Word Program (Byte or Word)10
Chip Program (Byte by Byte)80
Chip Program (Word by Word)40
Chip Program (Quadruple Byte or Double Word)20
Program/Erase Cycles (per Block)100,000cycles
Data Retention20years
Note: 1. Typi cal values measured at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value m easured at worst case conditions for both temperature and V
4. Maximum value m easured at worst case conditions for both temperature and V
after 100,0 0 program/erase cycle s.
CC
.
CC
Max
400
6
50
200
200
400
200
100
(4)
(4)
(3)
(3)
(3)
(3)
(3)
(3)
(2)
Unit
µs
µs
µs
s
s
s
s
s
17/50
Page 18
M29W640DT, M29W640DB
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status Register are summarized in
Table 7, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is output on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed o utput DQ7, not its complement.
During Er ase ope rations the Data Polling Bit ou t-
puts ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 5, Data Polling Flowchart, gives an example of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
address within the block being erased.
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspen d. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’ 0’, et c., with su ccessive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
Figure 6, Dat a Toggle Flowchart, gives an example of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error B it is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t command must be iss ued
before other commands are issued. The E rror bit
is output on DQ5 when the Status Register is read.
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is s ti ll ‘0’. One o f t he E r as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’.
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional block s to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will ou tput
the memory cell data as if in Read mode.
After an Erase operation that c auses t he Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive Bus Re ad Operations from addresses within blocks that have not
erased correctly. The Alternative Togg le Bit does
not change if the addressed block has erased correctly.
18/50
Page 19
M29W640DT, M29W640DB
Table 7. Status Register Bits
OperationAddressDQ7DQ6DQ5DQ3DQ2
ProgramAny AddressDQ7Toggle0––0
Program During Erase
Suspend
Any AddressDQ7
Program ErrorAny AddressDQ7
Toggle0––0
Toggle1––0
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
RB
Block Erase
Erasing Block0Toggle01Toggle0
Non-Erasing Block0Toggle01No Toggle0
Erasing Block1No Toggle0–Toggle1
Erase Suspend
Non-Erasing BlockData read as normal1
Good Block Address0Toggle11No Toggle0
Erase Error
Faulty Block Address0Toggle11Toggle0
Note: Unspecif ied data bit s should be ignored.
Figure 5. Dat a Po ll i ng Fl o wc h a rtFigure 6. Data Toggle Fl owchart
READ DQ6
DQ5 & DQ6
TOGGLE
NO
READ DQ6
TOGGLE
START
READ
DQ6
=
DQ5
= 1
TWICE
DQ6
=
NO
YES
YES
NO
YES
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
NO
DQ5
= 1
YES
READ DQ7
at VALID ADDRESS
DQ7
YES
=
DATA
NO
FAILPASS
AI90194
FAILPASS
AI90195B
19/50
Page 20
M29W640DT, M29W640DB
MAXIMUM RATIN G
Stressing the device ab ove the rating listed in t he
Absolute Maximum Ratings table m ay cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
stress ratings only and operation of the dev ice at
Table 8. Absolute Maximum Ratings
SymbolParameterMinMaxUn it
T
BIAS
T
STG
V
IO
V
CC
V
ID
(3)
V
PP
Note: 1. M in i m um voltage ma y undershoot to –2V during transitio n and for less t han 20ns during transitions.
2. Maximum volta ge m ay oversho ot to V
3. V
PP
Temperature Under Bias–50125°C
Storage Temperature
Input or Output Voltage
(1,2)
Supply Voltage–0.64V
Identification Voltage–0.613.5V
Program Voltage–0.613.5V
+2V during transition and for less than 20ns during transitions.
must not rem ai n at 12V for more than a total of 80hrs.
CC
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and ot her relevant quality documents.
–65150°C
V
–0.6
CC
+0.6
V
20/50
Page 21
M29W640DT, M29W640DB
DC AND AC PARAMETERS
This section summarizes the operat ing and measurement conditions, and the DC and AC characteristics of the device. The parameters in t he DC
and AC Characteristic tables that follow are derived from tests performed under the Measure-
Table 9. Operating and AC Measurement Conditions
Parameter
MinMaxMinMax
V
Supply Voltage
CC
Ambient Operating Temperature–4085–4085°C
ment Conditions summarized in the relevant
tables. Designers should chec k th at the o perat ing
conditions in their circuit matc h the meas urement
conditions when relying on the quoted parameters.
M29W640D
3.03.62.73.6V
Unit7090
Load Capacitance (C
)
L
3030pF
Input Rise and Fall Times1010ns
Input Pulse Voltages
Input and Output Timing Ref. Voltages
0 to V
CC
V
/2VCC/2
CC
0 to V
CC
Figure 7. AC Measurement I/O WaveformFigure 8. AC Measurement Load Circuit
V
PP
V
CC
VCC/2
0V
AI05557
V
CC
DEVICE
UNDER
TEST
0.1µF
0.1µF
CL includes JIG capacitance
V
C
L
V
V
CC
25kΩ
25kΩ
AI05558
Table 10. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 10 0% tested.
Input Capacitance
Output Capacitance
21/50
Page 22
M29W640DT, M29W640DB
Table 11. DC Characteristics
SymbolParameterTest ConditionMinMaxUnit
I
I
LO
I
CC1
I
CC2
I
CC3
V
V
V
I
PP
V
V
V
V
LKO
Note: 1. Sampled only, not 100% tested.
Input Leakage Current
LI
Output Leakage Current
Supply Current (Read)
Supply Current (Standby)
Supply Current (Program/
Erase)
Input Low Voltage–0.50.8V
IL
Input High Voltage
IH
PP
Voltage for V
Acceleration
Current for V
/WP Program
PP
/WP Program
PP
Acceleration
Output Low Voltage
OL
Output High Voltage
OH
Identification Voltage11.512.5V
ID
Program/Erase Lockout Supply
(1)
V oltage
0V ≤ V
0V ≤ V
E
= VIL, G = VIH,
f = 6MHz
E
= VCC ±0.2V,
RP
= VCC ±0.2V
Program/Erase
Controller active
= 3.0V ±10%
V
CC
= 3.0V ±10%
V
CC
I
= 1.8mA
OL
= –100µA
I
OH
IN
OUT
≤ V
≤ V
V
CC
CC
V
PP
V
IL
/WP = V
PP
/WP =
or V
IH
PP
±1
±1
10mA
100
20mA
20mA
0.7V
CC
VCC +0.3
11.512.5V
15mA
0.45V
V
–0.4
CC
1.82.3V
µA
µA
µA
V
V
22/50
Page 23
Figure 9. Read Mode AC Waveforms
A0-A20/
A–1
tAVQVtAXQX
E
G
DQ0-DQ7/
DQ8-DQ15
tBHQV
BYTE
tELBL/tELBHtBLQZ
M29W640DT, M29W640DB
tAVAV
VALID
tELQVtEHQX
tELQXtEHQZ
tGLQXtGHQX
tGLQV
tGHQZ
VALID
AI05559
Table 12. Read AC Characteristics
SymbolAltParameterTest Condition
E
t
AVAV
t
AVQV
(1)
t
ELQX
t
ELQV
(1)
t
GLQX
t
GLQV
(1)
t
EHQZ
(1)
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
t
ELBL
t
ELBH
t
BLQZ
t
BHQV
Note: 1. Sampled only, not 100% tested.
t
RC
t
ACC
t
LZ
t
CE
t
OLZ
t
OE
t
HZ
t
DF
t
OH
t
ELFL
t
ELFH
t
FLQZ
t
FHQV
Address Valid to Next Address Valid
Address Valid to Output Valid
Chip Enable Low to Output Transition
Chip Enable Low to Output Valid
Output Enable Low to Output Transition
Output Enable Low to Output Valid
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z
Chip Enable, Output Enable or Address
Transition to Output Transition
Chip Enable to BYTE Low or HighMax55ns
BYTE Low to Output Hi-ZMax2530ns
BYTE High to Output ValidMax3040ns
= VIL,
G
= V
E
= VIL,
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
M29W640D
Unit
7090
Min7090ns
Max7090ns
Min00ns
Max7090ns
Min00ns
Max3035ns
Max2530ns
Max2530ns
Min00ns
23/50
Page 24
M29W640DT, M29W640DB
Figure 10. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A20/
A–1
tAVWL
E
VALID
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHEL
VALID
tWHRL
Table 13. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin7090ns
Chip Enable Low to Write Enable LowMin00ns
Write Enable Low to Write Enable HighMin4550ns
Input Valid to Write Enable HighMin4550ns
Write Enable High to Input TransitionMin00ns
Write Enable High to Chip Enable HighMin00ns
Write Enable High to Write Enable LowMin3030ns
Address Valid to Write Enable LowMin00ns
Write Enable Low to Address TransitionMin4550ns
Output Enable High to Write Enable LowMin00ns
Write Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3035ns
VCC High to Chip Enable Low
tWHGL
tWHWL
tWHDX
AI05560
M29W640D
Unit
7090
Min5050µs
24/50
Page 25
Figure 11. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A20/
A–1
tAVEL
W
VALID
M29W640DT, M29W640DB
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHWL
VALID
tEHRL
Table 14. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin7090ns
Write Enable Low to Chip Enable LowMin00ns
Chip Enable Low to Chip Enable HighMin4550ns
Input Valid to Chip Enable HighMin4550ns
Chip Enable High to Input TransitionMin00ns
Chip Enable High to Write Enable HighMin00ns
Chip Enable High to Chip Enable LowMin3030ns
Address Valid to Chip Enable LowMin00ns
Chip Enable Low to Address TransitionMin4550ns
Output Enable High Chip Enable LowMin00ns
Chip Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3035ns
VCC High to Write Enable Low
tEHGL
tEHEL
tEHDX
AI05561
M29W640D
Unit
7090
Min5050µs
25/50
Page 26
M29W640DT, M29W640DB
Figure 12. Reset/Block Temporary Unp rotec t AC Waveforms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
Table 15. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
t
PLYH
(1)
t
PHPHH
(1)
t
VHVPP
Note: 1. Sampled only, not 100% tested.
t
RH
t
RB
t
RP
t
READY
t
VIDR
tPLPX
tPLYH
RP High to Write Enable Low, Chip Enable Low,
Output Enable Low
RB High to Write Enable Low, Chip Enable Low,
Output Enable Low
RP Pulse WidthMin500500ns
RP Low to Read ModeMax5050µs
RP Rise Time to V
ID
VPP Rise and Fall Time
tRHWL, tRHEL, tRHGL
tPHPHH
AI02931B
M29W640D
Unit
7090
Min5050ns
Min00ns
Min500500ns
Min250250ns
Figure 13. Accelerated Program Timing Waveforms
V
PP
VPP/WP
V
or V
IL
IH
26/50
tVHVPP
tVHVPP
AI05563
Page 27
M29W640DT, M29W640DB
PACKAGE MECHANICAL
Figure 14. TSO P48 – 48 lead Plastic Thin Smal l Outline, 12 x 20mm, Package Outline
A2
1N
e
E
B
N/2
D1
D
DIE
A
CP
C
TSOP-a
Note: Drawing is not to scale.
LA1α
Table 16. TSOP48 – 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Me chan ica l Data
N = TSOP48: 12 x 20 mm
ZA = TFBGA63: 7x11mm, 0.80 mm pitch
Temperature Range
1 = 0 to 70 °C
6 = –40 to 85 °C
Option
T = Tape & Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Note: This product is also available with the Extended Block factory locked. For further details and ordering
information contact your nearest ST sales office.
Devices are shipped from the factory with the memory content bits erased to 1. For a list of available options (Speed, Package, et c.) or for further i nformation on any as pect of t his device, p lease contact your
nearest ST Sales Office.
Note: 1. Used as the Extended Block Addresses in Ext ended Block m ode.
38/50
Protection Group
Page 39
M29W640DT, M29W640DB
APPENDIX B. COMMON FLASH INTERFACE (CFI)
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to det ermine
various electrical and t iming parameters, density
information and functions supported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
Table 21. Query Structure Overvi ew
Address
Sub-section NameDescription
x16x8
10h20hCFI Query Identification StringCommand set ID and algorithm data offset
1Bh36hSystem Interface InformationDevice timing & voltage information
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
is read from the memory. Table 21 to Table 26
show the addresses used to retrieve the data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 26, Security Code Area). This area
can be accessed only in Read mode by the final
user. It is impossible to change t he secu rity number after it has been written by ST.
40h80h
61hC2hSecurity Code Area64 bit unique device number
Note: Query data are always presented on the lowest order data outputs.
Primary Algorithm-specific Extended
Query table
Additional information specific to the Primary
Algorithm (optional)
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
Logic Supply Maximum Program/Erase voltage
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
[Programming] Supply Minimum Program/Erase voltage
V
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Maximum Program/Erase voltage
PP
bit 7 to 4HEX value in volts
bit 3 to 0BCD value in 100 mV
Typical timeout per single byte/word program = 2
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full chip erase = 2
Maximum timeout for byte/word program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
ms
n
ms
n
times typical
n
n
times typical
n
µs
n
times typical
n
times typical
µs
2.7V
3.6V
11.5V
12.5V
16µs
NA
1s
NA
256 µs
NA
8s
NA
40/50
Page 41
Table 24. Device Geometry Definition
Address
x16x8
27h4Eh0017h
DataDes cripti onValue
Device Size = 2
n
in number of bytes
M29W640DT, M29W640DB
8 MByte
28h
29h
2Ah
2Bh
2Ch58h0002h
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
Note: The region info rmat ion cont aine d in add re sses 2Dh to 34h ( or 5Ah to 68h) is co rre ct for t he M29 W6 40DB . Fo r the M29 W6 40D T the
regions must be revers ed.
50h
52h
54h
56h
5Ah
5Ch
5Eh
60h
62h
64h
66h
68h
0002h
0000h
0000h
0000h
0007h
0000h
0020h
0000h
007Eh
0000h
0000h
0001h
Flash Device Interface Code description
Maximum number of bytes in multi-byte program or page = 2
Number of Erase Block Regions. It specifies the number of
regions containing contiguous Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 0007h+1
Region 1 Information
Block size in Region 1 = 0020h * 256 byte
Region 2 Information
Number of identical size erase block = 007Eh+1
Region 2 Information
Block size in Region 2 = 0100h * 256 byte
x8, x16
Async.
n
NA
2
8
8Kbyte
127
64Kbyte
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Page 42
M29W640DT, M29W640DB
Table 25. Primary Algorithm-Sp ecific Extend ed Qu ery Ta ble
Address
x16x8
DataDescriptionValue
40h8 0h0050h
41h82h0052h"R"
42h84h0049h"I"
43h86h0030hMajor version number, ASCII"0"
44h88h0030hMinor version number, ASCII"0"
45h8Ah0000hAddress Sensitive Unlock (bits 1 to 0)
46h8Ch0002hErase Suspend
47h8Eh0004hBlock Protection
48h90h0001hTemporary Block Unprotect
49h92h0004hBlock Protect /Unprotect
4Ah94h0000hSimultaneous Operations, 00 = not supportedNo
4Bh96h0000hBurst Mode, 00 = not supported, 01 = supportedNo
4Ch98h0000hPage Mode, 00 = not supported, 01 = 4 page word, 02 = 8 page wordNo
4Dh9Ah00B5hV
The M29W640D has an extra block, the Extended
Block, that can be accessed using a dedicated
command.
This Extended Block is 32 KWords in x16 mode
and 64 KBytes in x8 mode. It is used as a security
block (to provide a permanent security identification number) or to store additional information.
The Extended Block is either Factory Locked or
Customer Lockable, its status is indicated by bit
DQ7. This bit is permane ntly set t o either ‘ 1’ or ‘ 0’
at the factory and cannot be changed. When set to
‘1’, it indicates that the device is factory locked and
the Extended Block is protected. When set to ‘0’, it
indicates that the device is customer lockable and
the Extended Block is unprotected. Bit DQ7 being
permanently locked to either ‘1’ or ‘0’ is another
security feature which ensures that a customer
lockable device cannot be used instead of a factory locked one.
Bit DQ7 is the most significant bit in the Extended
Block Verify Code and a specific proced ure must
be followed to read it. See “Extended Memory
Block Verify Code
tions, BYTE = V
V
, respectively, for details of how to read bit
IH
” in Table s 2 a nd 3, Bus O pera-
and Bus Operat ions, BYTE =
IL
DQ7.
The Extended Block can only be accessed when
the device is in Extended Block mode. Fo r det ails
of how the Extended Block mode is entered and
exited, refer to the Enter Extended Block Command and Exit E xtended Block Command para-
graphs, and to Tables 4 and 5, “Commands, 16-bit
mode, B YTE = V
BYTE = V
”, respectively.
IL
” and “Commands, 8-bit m ode,
IH
M29W640DT, M29W640DB
Factory Locked Extended Block
In devices where the Extended Block is factory
locked, the Security Identification Number is written to the Extended Block address space (see Table 27, Extended Block Address and Data) in the
factory. The DQ7 bit is set to ‘1’ and the Extended
Block cannot be unprotected.
Customer Lockable Extended Block
A device where the Extended Block is customer
lockable is delivered with the DQ7 bit set to ‘0’ and
the Extended Block unprotected. It is up to the
customer to program and protect the Extended
Block but care must be taken because the protection of the Extended Block is not reversible.
There are two ways of protecting the Extended
Block:
■ Issue the Enter Extended Block command t o
place the device in Extended Block mode, then
use the In-System Technique (refer to Appendix
D, In-System Technique and to the
corresponding flowcharts, Figures 18 and 19,
for a detailed explanation of the technique).
■ Issue the Enter Extended Block command to
place the device in Extended Block mode, then
use the Programmer Technique (refer to
Appendix D, Programmer Technique and to the
corresponding flowcharts, Figures 16 and 17,
for a detailed explanation of the technique).
Once the Extended Block is programmed and protected, the Exit Extended Block command must be
issued to exit the Extended Block mode and return
the device to Read mode.
Table 27. Extended Block Address and Data
Device
7F0000h-7F000Fh3F8000h-3F8007h
M29W640DT
7F0010h-7FFFFFh3F8008h-3FFFFFhUnavailable
000000h-00000Fh000000h-000007h
M29W640DB
000010h-00FFFFh000008h-007FFFhUnavailable
Note: 1. See Tables 19 and 20, Top and Bottom Boot Block Addresses.
Address
x8x16Factory LockedCustomer Lockable
(1)
Security Identification
Number
Security Identification
Number
Data
Determined by
Customer
Determined by
Customer
43/50
Page 44
M29W640DT, M29W640DB
APPENDIX D. BLOCK PROTECTION
Block protection can be used to prevent any operation from modifying the data stored in the memory. The blocks are protected in groups, refer to
Appendix A, Table 19 and Tab le 20 for details of
the Protection Groups . Once protected, Program
and Erase operations w ithin the protected group
fail to change the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/B lock Temporary Unprotection pin, RP
scriptions section.
Progra m me r Technique
The Programmer techniq ue uses high (V
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended on ly for
use in Programming Equipment.
To protect a group of blocks follow the flowchart in
Figure 16, Program me r E quipm ent Group Protect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all
groups can be unprotected at the same time. To
unprotect the chip follow Figure 17, Programmer
Equipment Chip Unprotect Flowchart. Table 28,
Programmer Technique Bus Ope rations, BYTE =
or VIL, gives a summary of each operation.
V
IH
; this is described in the Signal De-
) volt-
ID
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not abort the procedure be fore reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high volt age
level on the Reset/Blocks Temporary Unprotect
pin, RP
. This can be achieved without violating the
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the memory has been fitted to the system.
To protect a group of blocks follow the flowchart in
Figure 18, In-System Equipment Group Protect
Flowchart. To unprotect the whole chip it is necessary to protect all of the groups first, then all the
groups can be unprotected at the same time. To
unprotect the chip follow Figure 19, In-System
Equipment Chip Unprotect Flowchart.
The timing on these flowcharts is critical. Care
should be taken to en sure that, where a pau se is
specified, it is followed as closely as possible. Do
not allow the microprocessor to s ervice interrupts
that will upset the timing and do not abort the procedure before reaching the end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
Table 28. Programmer Tech niqu e Bus Op erati ons, BYTE
OperationEGW
Block (Group)
(1)
Protect
Chip Unprotect
Block (Group)
Protection Verify
Block (Group)
Unprotection Verify
Note: 1. Block Pr otection Gr oups are show n i n A ppendix A, Tables 19 and 20.
44/50
V
VIDVIL Pulse
IL
V
IDVIDVIL
V
V
IL
IL
V
V
IL
IL
Pulse
V
IH
V
IH
A9 = V
A0 = VIL, A1 = VIH, A6 = VIL, A9=VID,
A0 = VIL, A1 = VIH, A6 = VIH, A9 = VID,
Address Inputs
A0-A21
, A12-A21 Block Address
ID
Others = X
A9 = V
, A12 = VIH, A15 = VIH
ID
Others = X
A12-A21 Block Address
Others = X
A12-A21 Block Address
Others = X
= VIH or V
IL
Data Inputs/Outputs
DQ15A–1, DQ14 -DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
Page 45
Figure 16. Programmer Equipment Group Protect Flowchart
START
ADDRESS = GROUP ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
W = V
IL
Wait 100µs
W = V
IH
M29W640DT, M29W640DB
VerifyProtectSet-upEnd
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
Read DATA
DATA
=
01h
YES
A9 = V
IH
E, G = V
IH
PASS
NO
++n
= 25
A9 = V
E, G = V
NO
YES
IH
IH
Note: Block Protection Groups are shown in Appendix D, Table 19 and Table 20.
FAIL
AI05574
45/50
Page 46
M29W640DT, M29W640DB
Figure 17. Pro gramme r E quipme nt Chip Unprotect Flowchart
START
PROTECT ALL GROUPS
CURRENT GROUP = 0
ADDRESS = CURRENT GROUP ADDRESS
n = 0
A6, A12, A15 = V
E, G, A9 = V
Wait 4µs
W = V
Wait 10ms
W = V
E, G = V
A0 = VIL, A1, A6 = V
E = V
Wait 4µs
IH
ID
IL
IH
IH
IL
(1)
IH
G = V
IL
Wait 60ns
VerifyUnprotectSet-upEnd
++n
NO
= 1000
YES
A9 = V
IH
E, G = V
IH
FAILPASS
Note: Block Protection Groups are shown in Appendix D, Table 19 and Table 20.
Read DATA
DATA
=
00h
YESNO
46/50
INCREMENT
CURRENT GROUP
LAST
GROUP
YES
A9 = V
IH
E, G = V
IH
NO
AI05575
Page 47
Figure 18. I n-System Eq ui pm ent Group Prot ec t Fl owchart
START
n = 0
RP = V
ID
M29W640DT, M29W640DB
VerifyProtectSet-upEnd
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
ADDRESS = GROUP ADDRESS
WRITE 60h
A0 = VIL, A1 = VIH, A6 = V
WRITE 60h
A0 = VIL, A1 = VIH, A6 = V
Wait 100µs
WRITE 40h
A0 = VIL, A1 = VIH, A6 = V
Wait 4µs
READ DATA
A0 = VIL, A1 = VIH, A6 = V
DATA
RP = V
01h
NO
=
YES
IH
IL
IL
IL
IL
++n
= 25
NO
ISSUE READ/RESET
COMMAND
PASS
Note: Block Protection Groups are shown in Appendix D, Table 19 and Table 20.
Note: Block Protection Groups are shown in Appendix D, Table 19 and Table 20.
48/50
YESNO
LAST
GROUP
RP = V
ISSUE READ/RESET
COMMAND
PASS
NO
YES
IH
AI05577
Page 49
REVISION HIST ORY
Table 29. Document Revision History
DateVersionRevision Details
14-Dec-2001-01Document released
Description of Ready/Busy signal clarified (and Figure 12 modified)
19-Apr-2002-02
Clarified allowable commands during block erase
Clarified the mode the device returns to in the CFI Read Query command section
tPLYH (time to reset device) respecified. Correction to table of Commands.
M29W640DT, M29W640DB
24-Apr-2002-03
05-Sep-20023.1
08-Jan-20033.2
04-Apr-20033.3
Values for addresses 23h and 25h corrected in CFI Query System Interface Information
table in Appendix B
When in Extended Block mode, the block at the boot block address can be used as OTP.
Value of electronic signature changed. Data Toggle Flow chart corrected. SO44 package
removed. Double Word Program Time (typ) changed to 20s. Revision numbering
modified: a minor revision will be indicated by incrementing the digit after the dot, and a
major revision, by incrementing the digit before the dot (revision version 03 equals 3.0).
Values corrected for typical times for Double Word Program (Byte or Word) and Chip
Program (Quadruple Byte, Double Word) in the Program, Erase Times and Program,
Erase Endurance Cycles table.
Document promoted from Product Preview to Preliminary Data.
Data Retention and Erase Suspend Latency Time parameters added to T able 6, Program,
Erase Times and Program, Erase Endurance Cycles, and Typical after 100k W/E Cycles
column removed.
(Identification) current removed from Table 11, DC Characteristics. Data modified at
I
ID
addresses 2Eh, 31h, 32h in Table 24.
Extended Memory Block Verify Codes modified in T ables 2 and 3, “Bus Operations, BYTE
” and “Bus Operations, BYTE = VIH”, respectively. Block 75 address space corrected
= V
IL
for x8 mode in Table 19, Top Boot Block Addresses, M29W640DT, and Block 71 address
space corrected for x8 mode in Table 20, Bottom Boot Block Addresses, M29W640DB.
Appendix C, EXTENDED MEMORY BLOCK, added. V
pin connection to ground
SS
clarified.
Lead-free package options E and F added to Table 18, Ordering Information Scheme.
49/50
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M29W640DT, M29W640DB
Information furnished is believed to be ac curate and reli able. Howev er, STMicroel ectronics assumes no responsibilit y for the consequence s
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent rights of STMi croelectr onics. Specifications mentioned in thi s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout express written ap proval of STMi croelect ro nics.
The ST log o i s registered trademark of STMicroelectronics
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