The M29W160E is a 16 Mbit (2Mb x8 or 1Mb x16)
non-volatile memory that can be read, erased and
reprogrammed. These operations can be performed using a single low voltage (2.7 to 3.6V)
supply. On power-up the memory d efaults to its
Read mode where it can be read in the same way
as a ROM or EPROM.
The memory is divided into blocks that can be
erased independently so it is possible to pres erve
valid data while old data is erased. Each block can
be protected independently to prevent accidental
Program or Erase commands from modifying the
memory. Program and Erase c omm ands are wri tten to the Command Interface of t he memory. An
on-chip Program/Erase Controller simplifies the
process of programming or erasing the memory by
taking care of all of the special operations that are
required to update the memory contents.
The end of a program or erase operation can be
detected and any error conditions identified. The
Figure 2. Logic DiagramTable 1. Signal Names
command set required to control the memory is
consistent with JEDEC standards.
The blocks in the memory are asymmetrically arranged, see Figures 5 and 6, Block Addresses.
The first or last 64 KBytes have been divided into
four additional blocks. The 16 KByte Boot Block
can be used for small initialization code to start the
microprocessor, the two 8 KByte Parameter
Blocks can be used for parameter storage and the
remaining 32K is a small Main Block where the application may be stored.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the memory.
They allow simple conne ction to most microprocessors, often without additional logic.
The memory is offered TSOP48 (12 x 20mm) and
TFBGA48 (0.8mm pitch) packages. The memory
is supplied with all the bits erased (set to ’1’).
A0-A19
W
RP
BYTE
A0-A19Address Inputs
V
CC
20
E
G
M29W160ET
M29W160EB
V
SS
15
DQ0-DQ14
DQ15A–1
RB
AI06849B
DQ0-DQ7Data Inputs/Outputs
DQ8-DQ14Data Inputs/Outputs
DQ15A–1Data Input/Output or Address Input
E
G
W
RP
RB
BYTE
V
Figure 4. TFBGA Connections (Top view through package)
M29W160ET, M29W160EB
654321
A
B
C
D
E
F
G
H
A3
A4
A2
A1
A0
E
G
V
SS
A7
A17
A6
A5NC
DQ0
DQ8
DQ9
DQ1
RB
NC
A18
DQ2
DQ10
DQ11
DQ3
W
RP
NC
A19
DQ5
DQ12
V
CC
DQ4
A9
A8
A10
A11
DQ7
DQ14
DQ13
DQ6
A13
A12
A14
A15
A16
BYTE
DQ15
A–1
V
SS
AI02985B
7/40
Page 8
M29W160ET, M29W160EB
Figure 5. Block Addresses (x8)
M29W160ET
Top Boot Block Addresses (x8)
1FFFFFh
1FC000h
1FBFFFh
1FA000h
1F9FFFh
1F8000h
1F7FFFh
1F0000h
1EFFFFh
1E0000h
01FFFFh
010000h
00FFFFh
000000h
16 KByte
8 KByte
8 KByte
32 KByte
64 KByte
64 KByte
64 KByte
Total of 31
64 KByte Blocks
Bottom Boot Block Addresses (x8)
1FFFFFh
1F0000h
1EFFFFh
1E0000h
01FFFFh
010000h
00FFFFh
008000h
007FFFh
006000h
005FFFh
004000h
003FFFh
000000h
M29W160EB
64 KByte
64 KByte
64 KByte
32 KByte
8 KByte
8 KByte
16 KByte
Total of 31
64 KByte Blocks
Note: Also see Appendi x A, Tables 19 and 20 for a full l is t i ng of the Block A ddresses .
AI06851
8/40
Page 9
Figure 6. Block Addresses (x16)
M29W160ET, M29W160EB
Top Boot Block Addresses (x16)
FFFFFh
FE000h
FDFFFh
FD000h
FCFFFh
FC000h
FBFFFh
F8000h
F7FFFh
F0000h
0FFFFh
08000h
07FFFh
00000h
M29W160ET
8 KWord
4 KWord
4 KWord
16 KWord
32 KWord
32 KWord
32 KWord
Total of 31
32 KWord Blocks
Bottom Boot Block Addresses (x16)
FFFFFh
F8000h
F7FFFh
F0000h
0FFFFh
08000h
07FFFh
04000h
03FFFh
03000h
02FFFh
02000h
01FFFh
00000h
M29W160EB
32 KWord
32 KWord
32 KWord
16 KWord
4 KWord
4 KWord
8 KWord
Total of 31
32 KWord Blocks
Note: Also see Appendi x A, Tables 19 and 20 for a full l is t i ng of the Block A ddresses .
AI06852
9/40
Page 10
M29W160ET, M29W160EB
SIGNAL DESCRIPTIONS
See Figure 2, Logic Diagram, and Table 1, Sign al
Names, for a brief overview of the signals connected to this de vice.
Address Inputs (A0-A19). The Address Inputs
select the cell s in the memory arra y to access du ring Bus Read operations. During Bus Write operations they control the commands sent to the
Command Interface of the Program/Erase Controller.
Data Inputs/Outputs (DQ0-DQ7). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation. During Bus
Write operations they represent the commands
sent to the Command Interface of the Program/
Erase Controller.
Data Inputs/Outputs (DQ8-DQ14). The Data Inputs/Outputs output the data stored at the selected
address during a Bus Read operation when BYTE
is High, VIH. When BYTE is Low, VIL, these pins
are not used and are high impedance. During Bus
Write operations the Command Register does not
use these bits. When reading the S tatus Register
these bits should be ignored.
Data Input/Ou tput or Address Input (DQ15A-1).
When BYTE
Data Input/Output pin (as DQ8-DQ14). When
BYTE
pin; DQ15A–1 Low will select the LSB of the Word
on the other addresses, DQ15A–1 High will select
the MSB. Throughout the text consider references
to the Data Input/Output to include this pin when
BYTE
puts to include this pin when BYTE
when stated explicitly otherwise.
Chip Enable (E
the memory, allowing Bus Read and Bus Write operations to be performed. When Chip Enable is
High, V
Output Enable (G
trols the Bus Read operation of the memory.
Write Enable (W
the Bus Write operation of the memory’s Command Interf a ce .
Reset/Block Temporary Unprotect (RP
Reset/Block Temporary Unprotect pin can be
used to apply a Hardware Reset to the memory or
to temporarily unprotect all Blocks that have b een
protected.
A Hardware Reset is achieved by holding Reset/
Block Temporary Unprotect Low, V
. After Reset/Block Temporary Unprotect
t
PLPX
goes High, V
is High, VIH, this pin behaves as a
is Low, VIL, this pin behaves as an address
is High and ref erences to the Address In-
is Low except
). The Chip Enable, E, activates
, all other pins are ignored.
IH
). T he Output Enable, G, con-
). The Write Enable, W, controls
). The
, for at least
IL
, the memory will be ready for Bus
IH
Read and Bus Write operations after t
, whichever occurs last. See the Ready/Busy
t
RHEL
PHEL
or
Output section, Table 15 and Figure 14, Reset/
Temporary Unprotect AC Characteristics for more
details.
Holding RP
at VID will temporarily unprotect the
protected Blocks in the memory. Program and
Erase operations on all blocks will be possible.
The transition from V
PHPHH
.
t
Ready/Busy Output (RB
to VID must be slower than
IH
). The Ready/Busy pin
is an open-drain output that can be used to identify
when the device is performing a Program or Erase
operation. During Program or Erase operations
Ready/Busy is Low, V
. Ready/Busy is high-im-
OL
pedance during Read mode, Auto Select mode
and Erase Suspend mode.
After a Hardware Reset, Bus Read and Bus Write
operations cannot begin until Ready/Busy becomes high-impedance. See Tabl e 15 and Figure
14, Reset/Temporary Unprotect AC Characteristics.
The use of an open-drain output allows the Ready/
Busy pins from several memories to be connected
to a single pull-up resistor. A Low will then indicate
that one, or more, of the memories is busy.
Byte/Word Organization Select (BYTE
). The
Byte/Word Organization Select pin is used to
switch between the 8-bit and 16-bit Bus modes of
the memory. When Byte/Word Organization Select is Low, V
it is High, V
Supply Voltage. The VCC Supply Voltage
V
CC
, the memory is in 8-bit mode, when
IL
, the memory is in 16-bit mode.
IH
supplies the power for all operations (Read, Program, Erase etc.).
The Command Interface is disabled when the V
CC
Supply Voltage is less than the L ockout Voltage,
. This prevents Bus Write operations from ac-
V
LKO
cidentally damaging the data during power up,
power down and power surges. If the Program/
Erase Controller is programming or erasing during
this time then the operation aborts and the memory contents being altered will be invalid.
A 0.1µF capacitor should be connected between
the V
Supply Voltage pin and the VSS Ground
CC
pin to decouple the current surges from the power
supply. The PCB track widths must be sufficient to
carry the currents required during program and
erase operations, I
Ground. The VSS Ground is the reference for
V
SS
all voltage measurements. The two V
CC3
.
pins of the
SS
device must be connected to the system ground.
10/40
Page 11
BUS OPERATIONS
There are five standard bus operations that control
the device. These are Bus Read, Bus Write, Ou tput Disable, Standby and Automatic Standby. See
Tables 2 and 3, Bus Operat ions, for a summary.
Typically glitches of less than 5ns on Chip Enable
or Write Enable are ignored by the memory and do
not affect bus operations.
Bus Read. Bus Read operations read from the
memory cells, or specific registers in the Command Interface. A valid Bus Read operation involves setting the desired address on the Address
Inputs, applying a Low sig nal, V
, to Chip Enable
IL
and Output Enable and keeping Write Enable
High, V
. The Data Inputs/Outputs will output the
IH
value, see Figure 11, Read Mode AC Waveforms,
and Table 12, Read AC Characteristics, for details
of when the output becomes valid.
Bus Write. Bus Write operations write to the
Command Interface. A valid Bus Write operation
begins by setting the desire d address on t he Address Inputs. The Address Inputs are latc hed by
the Command Interface on the falling edge of Chip
Enable or Write Enable, whichever occurs last.
The Data Inputs/Outputs a re latched by the Command Interface on the rising edge of Chip Enable
or Write Enable, whichever occurs first. Output Enable must remain High, V
, during the whole Bus
IH
Write operation. See Figures 12 and 13, Write AC
Waveforms, and Tables 13 and 14, Write AC
Characteristics, for details of the timing requirements.
Output Disa bl e . The Data Inputs/Outputs are in
the high impedance s tate when Output Enable is
High, V
Standby. When Chip Enable is High, V
.
IH
, the
IH
memory enters Standby mode and the Data Inputs/Outputs pins are placed in the high-imped-
M29W160ET, M29W160EB
ance state. To reduce t he Supply Current to the
Standby Supply Current, I
be held within V
± 0.2V. For the Standby current
CC
level see Table 11, DC Characteristics.
During program or erase operations the memory
will continue to use the Program/Erase Supply
Current, I
, for Program or Erase operations un-
CC3
til the operation completes.
Automatic Standby. If CMOS levels (V
are used to drive the bus and the bus is inactive for
150ns or more the memory enters Automatic
Standby where the internal Supply Current is reduced to the Standby Supply Current, I
Data Inputs/Outputs will still output data if a Bus
Read operation is in progress.
Special Bus Operations. Additional bus operations can be performed to read the Electronic Signature and also to apply and remove Block
Protection. These bus operations are intended for
use by programming equipment and are not usually used in applications. They require V
applied to some pins.
Electronic Signature. The memory has two
codes, the manufacturer code and the device
code, that can be read to identify the memory.
These codes can be read by applying t he signals
listed in Tables 2 and 3, Bus Operations.
Block Protection and Blocks Unprotection.
Each block can be separately protected against
accidental Program or Erase. Protected blocks
can be unprotected to allow data to be changed.
There are two methods available for protecting
and unprotecting the blocks, one for use on programming equipment and the other for in-system
use. Block Protect and Blocks Unprotect operations are described in Appendix C.
, Chip Enable should
CC2
CC
CC2
± 0.2V)
. The
to be
ID
Table 2. Bus Operations, BYTE
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
= V
IL
Address Inputs
DQ15A–1, A0-A19
V
IL
V
IH
V
IH
XXXHi-ZHi-Z
V
IL
V
IL
V
Cell AddressHi-ZData Output
IH
V
Command AddressHi-ZData Input
IL
V
XHi-ZHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
IL
IL
or V
or V
IH
IH
Data Inputs/Outputs
DQ14-DQ8DQ7-DQ0
Hi-Z20h
Hi-Z
C4h (M29W160ET)
49h (M29W160EB)
11/40
Page 12
M29W160ET, M29W160EB
Table 3. Bus Operations, BYTE = V
OperationEGW
Bus Read
Bus Write
Output DisableX
Standby
Read Manufacturer
Code
Read Device Code
Note: X = VIL or VIH.
V
IL
V
IL
V
IH
V
IL
V
IL
IH
V
IL
V
IH
V
IH
XXXHi-Z
V
IL
V
IL
V
Cell AddressData Output
IH
V
Command AddressData Input
IL
V
XHi-Z
IH
A0 = VIL, A1 = VIL, A9 = VID,
V
IH
Others V
A0 = VIH, A1 = VIL, A9 = VID,
V
IH
Others V
COMMAND INTERFACE
All Bus Write operations t o the me mory are in terpreted by the Command Interface. Commands
consist of one or more sequential Bus Write operations. Failure to observe a valid sequence of Bus
Write operations will result in the memory returning to Read mode. The long command sequences
are imposed to maximize data security.
The address used for the commands changes depending on whether the memory is in 16-bit or 8bit mode. See either Table 4, or 5, de pending on
the configuration that is being used, for a summary
of the commands.
Read/Reset Command. The Read/Reset command returns the memory to its Read mode where
it behaves like a ROM or EPROM, unless otherwise stated. It also resets the errors in th e Status
Register. Either one or three Bus Write operations
can be used to issue the Read/Reset command.
The Read/Reset Command can be issued, between Bus Write cycles before the start of a program or erase operation, to return the device to
read mode. Once the program or erase operation
has started the Read/Reset command is no longer
accepted. The Read/Reset command will not
abort an Erase operation when issued while in
Erase Suspend.
Auto Select Command. The Auto Select command is used to read the Manufacturer Code, the
Device Code and the Block Protection Status.
Three consecutive Bus Write operations are required to issue the Auto Select command. Once
the Auto Select comma nd is issued the memory
remains in Auto Select mode until a Read/Reset
command is issued. Read CFI Query and Read/
Reset commands are accepted in Auto Select
mode, all other commands are ignored.
Address Inputs
A0-A19
or V
IL
IH
or V
IL
IH
Data Inputs/Outputs
DQ15A–1, DQ14-DQ0
0020h
22C4h (M29W160ET)
2249h (M29W160EB)
From the Auto Select mode the Manufacturer
Code can be read using a Bus Read operation
with A0 = V
may be set to either V
and A1 = VIL. The other address bits
IL
or VIH. The Manufa cturer
IL
Code for STMicroelectronics is 0020h.
The Device Code can be read using a Bus Read
operation with A0 = V
address bits may be set to e ither V
and A1 = VIL. The other
IH
or VIH. The
IL
Device Code for the M29W160ET is 22C4h and
for the M29W160EB is 2249h.
The B lock Prot ection S tatus of each block can be
read using a Bus Read operation with A0 = V
A1 = V
, and A 12 - A19 spec ify i ng the ad dress of
IH
the bl ock. T he oth er addr ess bit s may b e set t o either V
or VIH. If the ad dress ed bloc k is pro tecte d
IL
then 01h is output on Data Inputs/Outputs DQ0DQ7, otherwise 00h is output.
Program Command. The Program command
can be used to program a value to one address in
the memory array at a time. The command requires four Bus Write operations, the final write operation latches the address and data, and starts
the Program/Erase Controller.
If the address falls in a pro tected block then the
Program command is ignored, the data remains
unchanged. The Status Register is never read and
no error condition is given.
During the program operat ion the memo ry will ignore all commands. I t is not possible to issue any
command to abort or pause the operation. Typical
program times are given in Table 6. Bus Read operations during the program o peration will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the program operation has completed the
memory returns to the Read mode, unless an error
,
IL
12/40
Page 13
M29W160ET, M29W160EB
has occurred. When an error occurs the me mory
continues to output the St atus Register. A Read/
Reset command must be issued to reset the error
condition and return to Read mode.
Note that the Program command cannot change a
bit set at ’0’ bac k to ’1’. One of the E rase Commands must be used to set all the bits in a block or
in the whole memory from ’0’ to ’1’.
Unlock Bypass Command. The Unlock Bypass
command is used in conjunction with the Unlock
Bypass Program command to program the memory. When the access time to the device is long (as
with some EPROM programmers) considerable
time saving can be made by using these commands. Three Bus Write operations are requ ired
to issue the Unlock Bypass command.
Once the Unlock Bypas s command has bee n issued the memory will only accept the Unl ock Bypass Program command and the Unlock Bypass
Reset command. The memory can be read as if in
Read mode.
Unlock Bypass Program Command. The Unlock Bypass Prog ram comma nd can be used to
program one address in memory at a time. The
command requires two Bus Write operations, the
final write operation latches the address and data,
and starts the Program/Erase Controller.
The Program operation using the Unlock Bypass
Program command behaves identically to the Program operation using the Program command. A
protected block cannot be programmed; the operation cannot be aborted and the Status Register is
read. Errors must be res et using the Rea d/Reset
command, which leav es the de vice in Unlo ck Bypass Mode. See the Program command for details
on the behavior.
Unlock Bypass Reset Command. The Unlock
Bypass Reset command can be used to ret urn to
Read/Reset mode from Unlock Bypass Mode.
Two Bus Write operations are required to issue the
Unlock Bypass Reset command. Read/Reset
command does not exit from Unlock Bypass
Mode.
Chip Erase Command. The Chip Erase command can be used to erase the entire chip. Six Bus
Write operations are required to issue the Chip
Erase Command and start the Program/Erase
Controller.
If any blocks are protected then these are ignored
and all the other blocks are erased. If all of the
blocks are protect e d th e Chip Erase op erat i on appears to start but will terminate within about 100µs,
leaving the data unchanged. No error condition is
given when protected blocks are ignored.
During the erase operation the memory will ignore
all commands. It is not possible to issue any command to abort the operation. Typical chip erase
times are given in Tabl e 6. All Bus Read operations during the Chip E rase operation will output
the Status Register on the Data Inputs/Outputs.
See the section on the S tatus Register for more
details.
After the Chip Erase operation has com pleted the
memory will retu rn to the Read Mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read Mode.
The Chip Erase Command sets all of the bits in unprotected blocks of the memory to ’1’. All previous
data is lost.
Block Erase Command. The Block Erase command can be u sed to erase a list of one or more
blocks. Six Bus Write operations are required to
select the first block in the list. Each additional
block in the list can be selected by repeating the
sixth Bus Write operation using the address of the
additional block. The Block Erase operation starts
the Program/Erase Controller about 50µs after the
last Bus Write operation. Once the Program/Erase
Controller starts it is not possible to select any
more blocks. Each additional block must therefore
be selected within 50µs of the last block. The 50µs
timer restarts when an additional block is selected.
The Status Register can be read after the sixth
Bus Write operation. See the Status Register section for details on how t o identify if the Program/
Erase Controller has started the Block Erase operation.
If any selected blocks are protected then these are
ignored and all the other selected blocks are
erased. If all of the selected blocks are pro tected
the Block Erase operation appears to start but will
terminate within about 100µs, leaving the data unchanged. No error condition is given when protected blocks are ignored.
During the Block Erase operation the me mory wi ll
ignore all commands except the Erase Susp end
command. Typical b lock e rase times a re g iven in
Table 6. All Bus Read operations during the Block
Erase ope ration will ou t p ut the S t a tus R eg i st er on
the Data Inputs/Outputs. See the sec tion on the
Status Register for more details.
After the Block Erase operation has completed the
memory will retu rn to the Read Mode, unless an
error has occurred. When an error occurs the
memory will continue to output the Status Register. A Read/Reset command must be issued to reset the error condition and return to Read mode.
The Block Erase Command sets all of the bits in
the unprotected selected blocks to ’1’. All previous
data in the selected blocks is lost.
Erase Suspend Command. The Erase Suspend
Command may be used to temporarily suspend a
13/40
Page 14
M29W160ET, M29W160EB
Block Erase operation and return the memory to
Read mode. The command requires one Bus
Write operation.
The Program/Erase Controller will sus pend within
the Erase Suspend Latency Time (refer to Table 6
for value) of the Erase Suspend Command being
issued. Once the Program/Erase Controller has
stopped the memory will be set to Read mode and
the Erase will be suspended. If the Erase Suspend
command is issued during the period when the
memory is waiting for an additional block (before
the Program/Erase Controller starts) then the
Erase is suspended immedi ately and wi ll start immediately when the Erase Resume Comm and is
issued. It is not possible to select any further
blocks to erase after the Era se Resume.
During Erase Suspend it is possible to Read and
Program cells in blocks that are not being erased;
both Read and Program operations behave as
normal on these blocks. If any attempt is made to
program in a protected block or in the suspended
block then the Program command is ignored and
the data remains unchanged. The Status Register
is not read and no error condi tion is given. Reading from blocks that are being erased will output
the Status Register.
It is also possible t o issue the Auto Select, Read
CFI Query and Unlock Bypass commands during
an Erase Suspend. The Read/Reset command
must be issued to return the device to Read Array
mode before the Resume command will be accepted.
Erase Resume Command. The Erase Resume
command must be used to restart the Program/
Erase Controller from Erase Susp end. An erase
can be suspended and resumed more than once.
Read CFI Query Command. The Read CFI
Query Command is used to read data from the
Common Flash Interface (CFI) Memory Area. This
command is valid when the device is in the Read
Array mode, or when the device is in Aut o Sel ect
mode.
One Bus Write cycle is required to issue the Read
CFI Query Command. Once the command is issued subsequent Bus Read ope rations read from
the Common Flash Interface Memory Area.
The Read/Reset command m ust be issued to return the device to the previous mode (the Read Array mode or Auto Select mode). A second Read/
Reset command would be needed if the device is
to be put in the Read Array mode from Auto Select
mode.
See Appendix B, Tables 21, 22, 23, 24, 25 and 26
for details on the information contained in the
Common Flash Interface (CFI) memory area.
14/40
Page 15
M29W160ET, M29W160EB
Table 4. Commands, 16-bit mode, BYTE = V
IH
Bus Write Operations
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
1X F0
Read/Reset
3555 AA2AA 55 X F0
Auto Select3555AA2AA5555590
Program4555AA2AA55555A0PAPD
Unlock Bypass3555AA2AA5555520
Unlock Bypass
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block.
All values in the table are in hexadecim al .
The Comm and In terf ace o nly uses A– 1, A 0-A1 0 a nd DQ0-D Q7 to v er ify t he co mm ands ; A1 1-A1 9, D Q8- DQ1 4 and DQ 15 are D on’t
Care. DQ15A–1 is A– 1 when BYTE
Read/Reset. After a Read/Re set command, read the mem ory as normal until another command is issued.
Auto Select. After an Auto Sel ect command, read Manu facturer ID , Device ID or Block Protection Status.
Program, Unlo ck Byp ass Prog ra m, Ch ip Eras e, Block E ras e. A fte r thes e comm an ds rea d the S tat us Reg ister unti l the Pr og ram/
Erase Controller completes and the memory returns to Read Mode. Add additional Blocks during Block Erase Command with additional
Bus Write Operations until Timeou t Bit is set.
Unloc k By p as s. After th e Unlock Byp ass comman d i ssue Unlock Bypass Program or Unlock Bypass Reset comm ands.
Unloc k By p as s Reset. After the Unlock Bypass Reset command read the memory as normal until another command is issued.
Erase Suspend. After the Erase Suspend command read non-erasing memory blocks as normal, issue Auto Select and Program com-
mands on no n-erasin g bl oc ks as normal.
Erase Resume. A f ter the Erase Resume command the su spended Er ase operat i on resume s, read the S t atus Register unti l the Pro-
gram/ Erase Controll e r c o m pl e t e s an d t h e m em ory ret ur ns to Read Mode.
CFI Query. Command is valid when device is ready to rea d array data or when device i s i n A uto Select mode.
is VIL or DQ15 when BYTE is VIH.
15/40
Page 16
M29W160ET, M29W160EB
Table 5. Commands, 8-bit mode, BYTE = V
IL
Bus Write Operations
Command
1st2nd3rd4th5th6th
Length
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
1X F0
Read/Reset
3AAAAA55555XF0
Auto Select3AAAAA55555AAA90
Program4AAAAA55555AAAA0PAPD
Unlock Bypass3AAAAA55555AAA20
Unlock Bypass
Note: X Don’t Care, PA Program Address, PD Program Data, BA Any address in the Block.
All values in the table are in hexadecim al .
The Comm and In terf ace o nly uses A– 1, A 0-A1 0 a nd DQ0-D Q7 to v er ify t he co mm ands ; A1 1-A1 9, D Q8- DQ1 4 and DQ 15 are D on’t
Care. DQ15A–1 is A– 1 when BYTE
Read/Reset. After a Read/Re set command, read the mem ory as normal until another command is issued.
Auto Select. After an Auto Sel ect command, read Manu facturer ID , Device ID or Block Protection Status.
Program, Unlo ck Byp ass Prog ra m, Ch ip Eras e, Block E ras e. A fte r thes e comm an ds rea d the S tat us Reg ister unti l the Pr og ram/
Erase Controller completes and the memory returns to Read Mode. Add additional Blocks during Block Erase Command with additional
Bus Write Operations until Timeou t Bit is set.
Unloc k By p as s. After th e Unlock Byp ass comman d i ssue Unlock Bypass Program or Unlock Bypass Reset comm ands.
Unloc k By p as s Reset. After the Unlock Bypass Reset command read the memory as normal until another command is issued.
Erase Suspend. After the Erase Suspend command read non-erasing memory blocks as normal, issue Auto Select and Program com-
mands on no n-erasin g bl oc ks as normal.
Erase Resume. A f ter the Erase Resume command the su spended Er ase operat i on resume s, read the S t atus Register unti l the Pro-
gram/ Erase Controll e r c o m pl e t e s an d t h e m em ory ret ur ns to Read Mode.
CFI Query. Command is valid when device is ready to rea d array data or when device i s i n A uto Select mode.
is VIL or DQ15 when BYTE is VIH.
16/40
Page 17
M29W160ET, M29W160EB
Table 6. Program, Erase Times and Progra m , Erase Endu ran ce Cycle s
ParameterMin
Chip Erase29
Block Erase (64 KBytes)0.8
Erase Suspend Latency Time20
Program (Byte or Word)13
Chip Program (Byte by Byte)26
Chip Program (Word by Word)13
Program/Erase Cycles (per Block)100,000cycles
Data Retention20years
Note: 1. Typical value s m easured at room tempera ture and nom i nal voltages.
2. Sampled, but no t 100% tested.
3. Maximum valu e m easured at worst case conditions for both temperature and V
4. Maximum valu e m easured at worst case conditions for both temperature and V
(1,2)
Typ
after 100,000 program/erase cycles .
CC
.
CC
STATUS REGISTER
Bus Read operations from any address always
read the Status Register during Program and
Erase operations. It is also read during Erase Suspend when an address within a block being erased
is accessed.
The bits in the Status Register are summari zed in
Table 7, Status Register Bits.
Data Polling Bit (DQ7). The Data Polling Bit can
be used to identify whether the Program/Erase
Controller has successfully completed its operation or if it has responded to an Erase Suspend.
The Data Polling Bit is out put on DQ7 when the
Status Register is read.
During Program operations the Data Polling Bit
outputs the complement of the bit being programmed to DQ7. After successful completion of
the Program operation the memory returns to
Read mode and Bus Read operations from the address just programmed o utput DQ7, not its complement.
During Er ase ope ratio ns the D ata Pollin g Bit ou tputs ’0’, the complement of the erased state of
DQ7. After successful completion of the Erase operation the memory returns to Read Mode.
In Erase Suspend mode the Data Polling Bit will
output a ’1’ during a Bus Read operation within a
block being erased. The Data Polling Bit will
change from a ’0’ to a ’1’ when the Program/Erase
Controller has suspended the Erase operation.
Figure 7, Data Polling Flowchart, gives an e xample of how to use the Data Polling Bit. A Valid Address is the address being programmed or an
Toggle Bit (DQ6). The Toggle Bit can be used to
identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspen d. The Toggle Bit is
output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle
Bit changes from ’0’ to ’ 1’ to ’0’, etc., with successive Bus Read operations at any address. After
successful completion of the operation the memory returns to Read mode.
During Erase Suspend mode the Toggle Bit will
output when addressing a cell within a block being
erased. The Toggle Bit will stop toggling when the
Program/Erase Controller has suspended the
Erase operation.
If any attempt is made to erase a protected bl ock,
the operation is abort ed, no error is s ig nalled and
DQ6 toggles for approximately 100µs. If any attempt is made to program a protected block or a
suspended block, the operation is abort ed, no error is signalled and DQ6 toggles for approximately
1µs.
Figure 8, Data Toggle Flowchart, g ives an e xample of how to use the Data Toggle Bit.
Error Bit (DQ5). The Error Bit can be used to
identify errors detected by the Program/Erase
Controller. The Error Bit i s set to ’1’ when a P rogram, Block Erase or Chip Erase operation fails to
write the correct data to the memory. If the Error
Bit is set a Read/Rese t comm and must be issued
before other commands are issued. The Error bit
is output on DQ5 when the Status Register is read.
address within the block being erased.
Max
120
6
25
200
120
60
(4)
(4)
(3)
(3)
(3)
(3)
(2)
Unit
µs
µs
s
s
s
s
17/40
Page 18
M29W160ET, M29W160EB
Note that the Program command cannot change a
bit set to ’0’ back to ’1’ and attempting to do so will
set DQ5 to ‘1’. A Bus Read operation to that address will s h ow the bit is still ‘ 0 ’. One of the Er as e
commands must b e used to set all the bits in a
block or in the whole memory from ’0’ to ’1’
Erase Timer Bit (DQ3). The Erase Timer Bit can
be used to identify the start of Program/Erase
Controller operation during a Block Erase command. Once the Program/Erase Controller starts
erasing the Erase Timer Bit is set to ’1’. Before the
Program/Erase Controller starts the Erase Timer
Bit is set to ’0’ and additional blocks to be erased
may be written to the Command Interface. The
Erase Timer Bit is output on DQ3 when the Status
Register is read.
Alternative Toggle Bit (DQ2). The Alternative
Toggle Bit can be used to monitor the Program/
Erase controller during Erase operations. The Alternative Toggle Bit is output on DQ2 when the
Status Register is read.
During Chip Erase and Block Erase operations the
Toggle Bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations from addresses
within the blocks being erased. A protected block
is treated the same as a block not being erased.
Once the operation completes the memory returns
to Read mode.
During Erase Suspend the Alternative Toggle Bit
changes from ’0’ to ’1’ to ’0’, etc. with successive
Bus Read operations from addresses within the
blocks being erased. Bus Read operations to addresses within blocks not being erased will ou tput
the memory cell data as if in Read mode.
After an Erase operation that c auses the Error Bit
to be set the Alternative Toggle Bit can be used to
identify which block or blocks have caused the error. The Alternative Toggle Bit changes from ’0’ to
’1’ to ’0’, etc. with successive B us Read Operations from addresses within blocks that have not
erased correctly. The Alternative Toggle B it does
not change if the addressed block has erased correctly.
Table 7. Status Register Bits
OperationAddressDQ7DQ6DQ5DQ3DQ2RB
ProgramAny AddressDQ7Toggle0––0
Program During Erase
Suspend
Program ErrorAny AddressDQ7
Chip EraseAny Address0Toggle01Toggle0
Block Erase before
timeout
Block Erase
Erase Suspend
Erase Er ror
Note: Unspecified data bits should be ignored.
Any AddressDQ7
Erasing Block0Toggle00Toggle0
Non-Erasing Block0Toggle00No Toggle0
Erasing Block0Toggle01Toggle0
Non-Erasing Block0Toggle01No Toggle0
Erasing Block1No Toggle0–Toggle1
Non-Erasing BlockData read as normal1
Good Block Address0Toggle11No Toggle0
Faulty Block Address0Toggle11Toggle0
Toggle0––0
Toggle1––0
18/40
Page 19
M29W160ET, M29W160EB
Figure 7. Dat a Po ll i ng Fl o w chartFigure 8. Dat a Toggle Flowchart
START
READ DQ5 & DQ7
at VALID ADDRESS
DQ7
DATA
NO
DQ5
READ DQ7
at VALID ADDRESS
DQ7
DATA
FAILPASS
= 1
YES
=
NO
YES
YES
=
NO
AI03598
START
READ DQ6
READ
DQ5 & DQ6
DQ6
=
TOGGLE
YES
NO
DQ5
= 1
YES
READ DQ6
TWICE
DQ6
=
TOGGLE
YES
FAILPASS
NO
NO
AI01370C
MAXIMUM RATIN G
Stressing the device above the rating l isted in the
Absolute Maximum Ratings" table may cause permanent damage to the device. Exposure to Absolute Maximum Rating conditions for extended
periods may affect device reliability. These are
these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Refer also to the STMicroelectronics
SURE Program and other relevan t quality documents.
stress ratings only and operation of the device at
Table 8. Absolute Maximum Ratings
SymbolParameterMinMaxUnit
T
BIAS
T
STG
V
IO
V
CC
V
ID
Note: 1. Minimum volta ge may under shoot to –2V during trans i tion and for l ess than 20ns during transitions.
2. Maximum voltage may overshoot to V
Temperature Under Bias–50125°C
Storage Temperature–65150°C
+2V durin g tr ansition an d fo r l ess than 20n s during trans i tions.
CC
V
19/40
Page 20
M29W160ET, M29W160EB
DC AND AC PARAMETERS
This section summarizes t he operating m easurement conditions, and the DC and AC characteristics of the device. The parameters in the D C and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 9. Operating and AC Measurement Conditions
Parameter
MinMaxMinMax
V
Supply Voltage
CC
Ambient Operating Temperature–408 5–4085°C
Conditions summarized in Table 9, Operating and
AC Measurement Conditions. Designers should
check that the operating cond itions in their circuit
match the operating conditions when relying on
the quoted parameters.
M29W160E
2.73.62.73.6V
Unit7090
Load Capacitance (C
)
L
3030pF
Input Rise and Fall Times1010ns
Input Pulse Voltages
Input and Output Timing Ref. Voltages
0 to V
CC
V
/2VCC/2
CC
0 to V
CC
Figure 9. AC Measurement I/O WaveformFigure 10. AC Measurement Load Circuit
V
CC
V
CC
VCC/2
0V
AI04498
CL includes JIG capacitance
DEVICE
UNDER
TEST
0.1µF
V
CC
C
L
AI04499
V
V
25kΩ
25kΩ
Table 10. Device Capacitance
SymbolParameterTest ConditionMinMaxUnit
V
V
IN
OUT
= 0V
= 0V
6pF
12pF
C
IN
C
OUT
Note: Sampled only, not 100% test ed.
Input Capacitance
Output Capacitance
20/40
Page 21
M29W160ET, M29W160EB
Table 11. DC Characteristics
SymbolParameterTest ConditionMinTypMaxUnit
I
LI
I
LO
I
CC1
I
CC2
I
CC3
V
IL
V
IH
V
OL
V
OH
V
ID
I
ID
V
LKO
Note: 1. Sampled only, not 100% tested.
Input Leakage Current
Output Leakage Curren t
Supply Current (Read)
Supply Current (Standby)
Supply Current
(1)
(Program/Erase)
Input Low Voltage–0.50.8V
Input High Voltage
Output Low Voltage
Output High VoltageIOH = –100µA
Identification Voltage11.512.5V
Identification Current
Program/Erase Lockout
Supply Voltage
0V
≤ V
≤ V
IN
CC
0V
≤ V
≤ V
OUT
E
= VIL, G = VIH,
f = 6MHz
= VCC ±0.2V,
E
RP
= VCC ±0.2V
Program/Erase
Controller active
I
= 1.8mA
OL
A9 = V
ID
CC
±1
±1
4.510mA
35100
20mA
0.7V
CC
VCC +0.3
0.45V
V
–0.4
CC
100
1.82.3V
µA
µA
µA
V
V
µA
21/40
Page 22
M29W160ET, M29W160EB
Figure 11. Read Mode AC Waveforms
A0-A19/
A–1
tAVQVtAXQX
E
G
DQ0-DQ7/
DQ8-DQ15
tBHQV
BYTE
tAVAV
VALID
tELQVtEHQX
tELQXtEHQZ
tGLQXtGHQX
tGLQV
tGHQZ
VALID
tELBL/tELBHtBLQZ
Table 12. Read AC Characteristics
SymbolAltParameterTest Condition
= VIL,
t
AVAV
t
AVQV
(1)
t
ELQX
t
ELQV
(1)
t
GLQX
t
GLQV
(1)
t
EHQZ
(1)
t
GHQZ
t
EHQX
t
GHQX
t
AXQX
t
ELBL
t
ELBH
t
BLQZ
t
BHQV
Note: 1. Sampled only, not 100% tested.
t
RC
t
ACC
t
LZ
t
CE
t
OLZ
t
OE
t
HZ
t
DF
t
OH
t
ELFL
t
ELFH
t
FLQZ
t
FHQV
Address Valid to Next Address Valid
Address Valid to Output Valid
Chip Enable Low to Output Transition
Chip Enable Low to Output Valid
Output Enable Low to Output Transition
Output Enable Low to Output Valid
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z
Chip Enable, Output Enable or Address
Transition to Output Transition
Chip Enable to BYTE Low or HighMax55ns
BYTE Low to Output Hi-ZMax2530ns
BYTE High to Output ValidMax3040ns
E
G
= V
= VIL,
E
G
= V
G
= V
G
= V
E
= V
E
= V
G
= V
E
= V
IL
IL
IL
IL
IL
IL
IL
IL
AI02922
M29W160E
Unit
7090
Min7090ns
Max7090ns
Min00ns
Max7090ns
Min00ns
Max3035ns
Max2530ns
Max2530ns
Min00ns
22/40
Page 23
Figure 12. Write AC Waveforms, Write Enable Controlled
tAVAV
A0-A19/
A–1
tAVWL
E
VALID
M29W160ET, M29W160EB
tWLAX
tWHEH
tELWL
G
tWLWHtGHWL
W
tDVWH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHEL
VALID
tWHRL
Table 13. Write AC Characteristics, Write Enable Controlled
SymbolAltParameter
t
AVAV
t
ELWL
t
WLWH
t
DVWH
t
WHDX
t
WHEH
t
WHWL
t
AVWL
t
WLAX
t
GHWL
t
WHGL
(1)
t
WHRL
t
VCHEL
Note: 1. Sampled only, not 100% tested.
t
WC
t
CS
t
WP
t
DS
t
DH
t
CH
t
WPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin7090ns
Chip Enable Low to Write Enable LowMin00ns
Write Enable Low to Write Enable HighMin4550ns
Input Valid to Write Enable HighMin4550ns
Write Enable High to Input TransitionMin00ns
Write Enable High to Chip Enable HighMin00ns
Write Enable High to Write Enable LowMin3030ns
Address Valid to Write Enable LowMin00ns
Write Enable Low to Address TransitionMin4550ns
Output Enable High to Write Enable LowMin00ns
Write Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3035ns
VCC High to Chip Enable Low
tWHGL
tWHWL
tWHDX
AI02923
M29W160E
Unit
7090
Min5050µs
23/40
Page 24
M29W160ET, M29W160EB
Figure 13. Write AC Waveforms, Chip Enable Controlled
tAVAV
A0-A19/
A–1
tAVEL
W
VALID
tELAX
tEHWH
tWLEL
G
tELEHtGHEL
E
tDVEH
DQ0-DQ7/
DQ8-DQ15
V
CC
RB
tVCHWL
VALID
tEHRL
Table 14. Write AC Characteristics, Chip Enable Controlled
SymbolAltParameter
t
AVAV
t
WLEL
t
ELEH
t
DVEH
t
EHDX
t
EHWH
t
EHEL
t
AVEL
t
ELAX
t
GHEL
t
EHGL
(1)
t
EHRL
t
VCHWL
Note: 1. Sampled only, not 100% tested.
t
WC
t
WS
t
CP
t
DS
t
DH
t
WH
t
CPH
t
AS
t
AH
t
OEH
t
BUSY
t
VCS
Address Valid to Next Address ValidMin7090ns
Write Enable Low to Chip Enable LowMin00ns
Chip Enable Low to Chip Enable HighMin4550ns
Input Valid to Chip Enable HighMin4550ns
Chip Enable High to Input TransitionMin00ns
Chip Enable High to Write Enable HighMin00ns
Chip Enable High to Chip Enable LowMin3030ns
Address Valid to Chip Enable LowMin00ns
Chip Enable Low to Address TransitionMin4550ns
Output Enable High Chip Enable LowMin00ns
Chip Enable High to Output Enable LowMin00ns
Program/Erase Valid to RB LowMax3035ns
VCC High to Write Enable Low
tEHGL
tEHEL
tEHDX
AI02924
M29W160E
Unit
7090
Min5050µs
24/40
Page 25
Figure 14. Reset/Block Temporary Unprotect AC Waveforms
E, G
W,
tPHWL, tPHEL, tPHGL
RB
RP
tPLPX
tPLYH
Table 15. Reset/Block Temporary Unprotect AC Characteristics
SymbolAltParameter
(1)
t
PHWL
t
PHEL
(1)
t
PHGL
(1)
t
RHWL
(1)
t
RHEL
(1)
t
RHGL
t
PLPX
(1)
t
PLYH
(1)
t
PHPHH
Note: 1. Sampled only, not 100% tested.
t
RH
t
RB
t
RP
t
READY
t
VIDR
RP High to Write Enable Low, Chip Enable Low,
Output E nable Low
RB High to Write Enable Low, Chip Enable Low,
Output E nable Low
RP Pulse WidthMin500500ns
RP Low to Read ModeMax1010µs
RP Rise Time to V
ID
M29W160ET, M29W160EB
tRHWL, tRHEL, tRHGL
tPHPHH
AI02931B
M29W160E
Unit
7090
Min5050ns
Min00ns
Min500500ns
25/40
Page 26
M29W160ET, M29W160EB
PACKAGE MECHANICAL
Figure 15. TSOP48 – 48 lead Plastic Thin Small Outline, 12 x 20mm, Pa ckage Outline
1
48
e
D1
24
E1
B
25
L1
A2
E
DIE
LA1α
C
CP
Note: Drawing is not to scale.
TSOP-G
Table 16. TSOP48 – 48 lead Plastic Thin Small Outline, 12 x 20mm, Package Mechan ical Data
N = TSOP48: 12 x 20 mm
ZA = TFBGA48: 6x8 mm, 0.80mm pitch
Temperature Range
6 = –40 to 85 °C
Option
Blank = Standard Packing
T = Tape and Reel Packing
E = Lead-free Package, Standard Packing
F = Lead-free Package, Tape & Reel Packing
Devices are shipped from the factory with the memory content bits erased to ’1’.
For a list of available options (Speed, Package, etc.) or for further information on any aspect of this device,
please contact the ST Sales Office nearest to you.
The Common Flash Interface is a JEDEC approved, standardized data structure that can be
read from the Flash memory device. It allows a
system software to query the device to det ermine
various electrical and timing p arameters, density
information and functions su pported by the memory. The system can interface easily with the device, enabling the software to upgrade itself when
necessary.
When the CFI Query Command is issued the device enters CFI Query mode and the data structure
is read from the memory. Tables 21, 22, 23, 24, 25
Table 21. Query Structure Overview
Address
x16x8
10h20hCFI Query Identification StringCommand set ID and algorithm data offset
1Bh36hSystem Interface InformationDevice timing & voltage information
61hC2hSecurity Code Area64 bit unique device number
Note: Query data are always pr esented on the lowest or der data outputs.
Primary Algorithm-specific Extended
Query table
Sub-section NameDescription
and 26 show the addres ses used to retrieve the
data.
The CFI data structure also contains a security
area where a 64 bit unique security number is written (see Table 26, Security Code area). This area
can be accessed only in Read mode by the final
user. It is impossible to change the security num ber after it has been written by ST. Issue a Read
command to return to Read mode.
Note: The Common Fl ash Interface is only available for Temperature range 6 (–40 to 85°C).
Additional information specific to the Primary
Algorithm (optional)
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
Logic Supply Maximum Program/Erase voltage
CC
bit 7 to 4BCD value in volts
bit 3 to 0BCD value in 100 mV
V
[Programming] Supply Minimum Program/Erase voltage
PP
V
[Programming] Supply Maximum Program/Erase voltage
PP
Typical timeout per single Byte/Word program = 2
Typical timeout for minimum size write buffer program = 2
Typical timeout per individual block erase = 2
Typical timeout for full chip erase = 2
Maximum timeout for Byte/Word program = 2
Maximum timeout for write buffer program = 2
Maximum timeout per individual block erase = 2
Maximum timeout for chip erase = 2
n
ms
n
ms
n
times typical
n
n
times typical
M29W160ET, M29W160EB
2.7V
3.6V
NA
NA
n
µs
n
µs
times typical
n
times typical
16µs
NA
1s
NA
256µs
NA
8s
NA
31/40
Page 32
M29W160ET, M29W160EB
Table 24. Device Geometry Definition
Address
x16x8
27h4Eh0015h
DataDescriptionValue
Device Size = 2
n
in number of Bytes
2 MByte
28h
29h
2Ah
2Bh
2Ch58h0004h
2Dh
2Eh
2Fh
30h
31h
32h
33h
34h
35h
36h
37h
38h
39h
3Ah
3Bh
3Ch
50h
52h
54h
56h
5Ah
5Ch
5Eh
60h
62h
64h
66h
68h
6Ah
6Ch
6Eh
70h
72h
74h
76h
78h
0002h
0000h
0000h
0000h
0000h
0000h
0040h
0000h
0001h
0000h
0020h
0000h
0000h
0000h
0080h
0000h
001Eh
0000h
0000h
0001h
Flash Device Interface Code description
Maximum number of Bytes in multi-Byte program or page = 2
Number of Erase Block Regions within the device.
It specifies the number of regions within the device containing
contiguous Erase Blocks of the same size.
Region 1 Information
Number of identical size erase block = 0000h+1
Region 1 Information
Block size in Region 1 = 0040h * 256 Byte
Region 2 Information
Number of identical size erase block = 0001h+1
Region 2 Information
Block size in Region 2 = 0020h * 256 Byte
Region 3 Information
Number of identical size erase block = 0000h+1
Region 3 Information
Block size in Region 3 = 0080h * 256 Byte
Region 4 Information
Number of identical-size erase block = 001Eh+1
Region 4 Information
Block size in Region 4 = 0100h * 256 Byte
x8, x16
Async.
n
NA
4
1
16 KByte
2
8 KByte
1
32 KByte
31
64 KByte
32/40
Page 33
Table 25. Primary Algorithm-Specific Extended Qu ery Ta ble
Address
DataDescriptionValue
x16x8
M29W160ET, M29W160EB
40h80h0050h
41h82h0052h"R"
42h84h0049h"I"
43h86h0031hMajor version number, ASCII"1"
44h88h0030hMinor version number, ASCII"0"
45h8Ah0000hAddress Sensitive Unlock (bits 1 to 0)
46h8Ch0002hErase Suspend
47h8Eh0001hBlock Protection
48h90h0001hTemporary Block Unprotect
49h92h0004hBlock Protect /Unprotect
4Ah94h0000hSimultaneous Operations, 00 = not supportedNo
4Bh96h0000hBurst Mode, 00 = not supported, 01 = supportedNo
4Ch98h0000hPage Mode, 00 = not supported, 01 = 4 page Word, 02 = 8 page WordNo
Block protection can be used to prevent any operation from modifying the data stored in the Flash
memory. Each Block can be protected individually.
Once protected, Program and Erase operations
on the block fail to change the data.
There are three techniques that can be used to
control Block Protection, these are the Programmer technique, the In-System technique and Temporary Unprotection. Temporary Unprotection is
controlled by the Reset/Block Temporary Unprotection pin, RP
scriptions section.
Unlike the Command Interface of the Program/
Erase Controller, the techniques for protecting and
unprotecting blocks could change between different Flash memory suppliers.
Programm er Te chnique
The Programmer techniq ue uses high (V
age levels on some of the bus pins. These cannot
be achieved using a standard microprocessor bus,
therefore the technique is recommended on ly for
use in Programming Equipment.
To protect a block follow the flowchart in Figure 17,
Programmer Equipment Block Protec t Flowchart.
During the Block Protect algorithm, the A19-A12
Address Inputs indicate the address of the block to
be protected. The block will be correctly protected
only if A19-A12 remain valid and stable, and if
Chip Enable is kept Low, V
and Verify phases.
The Chip Unprotect algorithm is used to unprotect
all the memory blocks at the same time. This algorithm can only be used if all of t he bl ocks are protected first. To unprotect the chip follow Figure 18,
; this is described in the Signal De-
) volt-
ID
, all along the Protect
IL
Programmer Equipment Chip Unprotect Flowchart. Table 27, Programmer Technique Bus Operations, gives a summary of each operation.
The timing on these flowcharts is critical. Care
should be taken t o ensure t hat, where a pause is
specified, it is followed as closely as possible. Do
not abort the procedure be fore reaching the end.
Chip Unprotect can take several seconds and a
user message should be provided to show that the
operation is progressing.
In-System Technique
The In-System technique requires a high voltage
level on the Reset/Blocks Temporary Unprotect
pin, RP
. This can be achieved without violating the
maximum ratings of the components on the microprocessor bus, therefore this technique is suitable
for use after the Flash memory has been fitted to
the system.
To protect a block follow the flowchart in Figure 19,
In-System Block Protect Flowchart. To unprot ect
the whole chip it is necessary to protect all of the
blocks first, then all the blocks can be unprotected
at the same time. To unprotect the chip follow Figure 20, In-System Chip Unprotect Flowchart.
The timing on these flowcharts is critical. Care
should be taken t o ensure t hat, where a pause is
specified, it is followed as closely as possible. Do
not allow the microprocessor to serv ice interrupts
that will upset the timing and do not abort the procedure before reaching t he end. Chip Unprotect
can take several seconds and a user message
should be provided to show that the operation is
progressing.
Table 27. Programmer Technique Bus Op erati ons, BYTE
OperationEGW
Block Protect
Chip Unprotect
Block Protection
Verify
Block Unprotection
Verify
34/40
V
IL
V
IDVIDVIL
V
IL
V
IL
VIDVIL Pulse
Pulse
V
V
V
IL
IL
IH
V
IH
A9 = V
A0 = VIL, A1 =VIH, A6 = VIL, A9 = VID,
A0 = VIL, A1 = VIH, A6 =VIH, A9 = VID,
Address Inputs
A0-A19
, A12-A19 Block Address
ID
Others = X
A9 = V
, A12 = VIH, A15 = VIH
ID
Others = X
A12-A19 Block Address
Others = X
A12-A19 Block Address
Others = X
= VIH or V
IL
Data Inputs/Outputs
DQ15A–1, DQ14 -DQ0
X
X
Pass = XX01h
Retry = XX00h
Retry = XX01h
Pass = XX00h
Page 35
Figure 17. Programmer Equipment Bl oc k P rot ect Flowchart
START
ADDRESS = BLOCK ADDRESS
W = V
IH
n = 0
G, A9 = VID,
E = V
IL
Wait 4µs
(1)
W = V
IL
Wait 100µs
W = V
IH
M29W160ET, M29W160EB
VerifyProtectSet-upEnd
E, G = VIH,
A0, A6 = VIL,
A1 = V
IH
(1)
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
Read DATA
DATA
=
01h
YES
A9 = V
IH
E, G = V
IH
PASS
NO
++n
= 25
A9 = V
E, G = V
NO
YES
IH
IH
FAIL
Note: 1. Address In puts A1 9-A12 g ive the a ddres s of th e bloc k t hat is to be pr ot ecte d. I t is imp era tive t hat they rem ain st able d urin g the
operation.
2. During the Protect and Verify phases of the algorithm, Chip Enable E
06-Aug-2002-01First Issue: originates from M29W160D datasheet dated 24-Jun-2002
9x8mm FBGA48 package replaced by 6x8mm. VDD(min) reduced for -70ns speed class.
27-Nov-20021.1
03-Dec-20021.2Package information corrected in ordering information table.
21-Mar-20032.0
27-Jun-20032.1TSOP48 package information updated (see Figure 15 and Table 16).
26-Jan-20043.0Block Erase Command clarified.
Erase Suspend Latency Time (typical and maximum) added to Program, Erase Times
and Program, Erase Endurance Cycles table. Logic Diagram corrected.
Document promoted to full Datasheet status. Block Protect and Chip Unprotect
algorithms specified in Appendix C, BLOCK PROTECTION.
39/40
Page 40
M29W160ET, M29W160EB
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