words
(Intersil
Corporation,
P-Channel
Power
MOSFET,
TO220AB
)
Cre-
ator ()
DOCI
NFO
pdfmark
Data SheetJuly 1999
3.0A, 100V, 1.200 Ohm, P-Channel Power
MOSFET
This P-Channel enhancement mode silicon gate power field
effect transistor is an advanced power MOSFET designed,
tested and guaranteed to withstand a specified level of
energy in the breakdown avalanchemodeofoperation.Allof
these power MOSFETs are designed for applications such
as switching regulators, switching converters, motor drivers,
relay drivers, and drivers for high power bipolar switching
transistors requiring high speed and low gate drive power.
These types can be operated directly from integrated
circuits.
Formerly developmental type TA17541.
Ordering Information
PART NUMBERPACKAGEBRAND
IRF9510TO-220ABIRF9510
NOTE: When ordering, include the entire part number.
Packaging
JEDEC TO-220AB
DRAIN
(FLANGE)
File Number
Features
• 3.0A, 100V
•r
DS(ON)
• Single Pulse Avalanche Energy Rated
• SOA is Power Dissipation Limited
• Nanosecond Switching Speeds
• Linear Transfer Characteristics
• High Input Impedance
= 1.200Ω
Symbol
D
G
S
SOURCE
DRAIN
GATE
2214.4
[
5-3
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DS
DGR
D
D
DM
GS
D
AS
, T
J
STG
L
pkg
-100V
-100V
-3.0A
-2.0A
-12A
±20V
20W
190mJ
-55 to 150
300
260
o
C
o
C
o
C
o
C
NOTE:
1. TJ = 25oC to 125oC.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Threshold VoltageV
Gate to Source Leakage CurrentI
Zero-Gate Voltage Drain CurrentI
On-State Drain Current (Note 2)I
DSSVGS
GS(TH)VGS
GSS
DSS
D(ON)
= 0V, ID = -250µA, (Figure 10)-100--V
= VDS, ID = -250µA-2.0--4.0V
VGS = ±20V--±100nA
VDS = Rated BV
VDS= 0.8x Rated BV
VDS> I
D(ON) xrDS(ON)MAX,VGS
, VGS = 0V---25µA
DSS
DSS,VGS
= 0V,TC= 125oC---250µA
= -10V,
-3.0--A
(Figure 7)
Drain to Source On Resistance (Note 2)r
DS(ON)VGS
Forward Transconductance (Note 2)g
fs
= -10V, ID = -1.5A, (Figures 8, 9)-1.0001.200Ω
VDS>I
FIGURE 6. SATURATION CHARACTERISTICSFIGURE 7. TRANSFER CHARACTERISTICS
5
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
4
3
VGS = -10V
2
1
, DRAIN TO SOURCE ON RESISTANCE
0
DS(ON)
r
0-20
-4-8
VGS = -20V
-12
ID,DRAIN CURRENT (A)
-16
2.5
2.0
1.5
1.0
0.5
ON RESISTANCE VOLTAGE
NORMALIZED DRAIN TO SOURCE
V
= -10V, ID = -1.5A
GS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0
040120160
TJ, JUNCTION TEMPERATURE (oC)
-8-6-4-20-10
80-40
FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE
VOLTAGE AND DRAIN CURRENT
5-6
FIGURE 9. NORMALIZED DRAIN TOSOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
Page 5
IRF9510
Typical Performance Curves
1.25
1.15
1.05
0.95
BREAKDOWN VOLTAGE
0.85
NORMALIZED DRAIN TO SOURCE
0.75
040120160
TJ, JUNCTION TEMPERATURE (oC)
Unless Otherwise Specified (Continued)
80-40
FIGURE 10. NORMALIZED DRAIN TOSOURCE BREAKDOWN
VOLTAGE vs JUNCTION TEMPERATURE
2.5
2.0
1.5
1.0
, TRANSCONDUCTANCE (S)
0.5
fs
g
0
-1.2-2.4-3.6-4.80-6.0
ID,DRAIN CURRENT (A)
TJ = -55oC
TJ = 25oC
V
> I
D(ON)
x R
DS
80µs PULSE TEST
TJ = 125oC
DS(ON) MAX.
500
VGS = 0V, f = 1MHz
C
= CGS + C
ISS
C
= C
RSS
400
C
OSS
300
200
C, CAPACITANCE (pF)
100
0
0-10-20-30-40-50
GD
GD
≈ CDS + C
GD
C
ISS
C
OSS
C
RSS
V
DRAIN TO SOURCE VOLTAGE (V)
DS,
FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE
2
-10
-10
TJ = 150oC
TJ = 25oC
-1
, SOURCE TO DRAIN CURRENT (A)
SD
I
-0.1
-0.4-0.6-0.8-1.0-1.2-1.8-1.4-1.6
VSD, SOURCE TO DRAIN VOLTAGE (V)
FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENTFIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE
0
-5
-10
GATE TO SOURCE VOLTAGE (V)
GS,
-15
V
V
= -20V
DS
VDS = -50V
VDS = -80V
2468010
Q
TOTAL GATE CHARGE (nC)
g(TOT),
ID = -4A
FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE
5-7
Page 6
IRF9510
Test Circuits and Waveforms
V
DS
VARY t
TO OBTAIN
P
REQUIRED PEAK I
0V
V
GS
t
P
AS
L
R
G
V
DD
+
DUT
I
AS
0.01Ω
0
V
DD
I
AS
t
P
FIGURE 15. UNCLAMPED ENERGY TEST CIRCUITFIGURE 16. UNCLAMPED ENERGY WAVEFORMS
BV
t
AV
DSS
V
DS
V
GS
12V
BATTERY
t
ON
t
d(ON)
t
R
L
DUT
R
G
V
DD
+
0
V
DS
V
GS
0
10%
r
10%
90%
50%
t
d(OFF)
t
OFF
90%
50%
t
f
10%
PULSE WIDTH
90%
FIGURE 17. SWITCHING TIME TEST CIRCUITFIGURE 18. RESISTIVE SWITCHING WAVEFORMS
-V
DS
D
(ISOLATED
SUPPLY)
DUT
0
V
DS
Q
gs
Q
gd
V
GS
0.2µF
50kΩ
CURRENT
REGULATOR
0.3µF
Q
G
0
I
G(REF)
IG CURRENT
SAMPLING
RESISTORRESISTOR
DUT
S
CURRENT
I
D
SAMPLING
+V
DS
V
DD
0
I
G(REF)
g(TOT)
FIGURE 19. GATE CHARGE TEST CIRCUITFIGURE 20. GATE CHARGE WAVEFORMS
5-8
Page 7
IRF9510
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold bydescription only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly , the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.inter sil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (407) 724-7000
FAX: (407) 724-7240
5-9
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
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