l Advanced Process Technology
l Ultra Low On-Resistance
l 175°C Operating Temperature
l Fast Switching
l Repetitive Avalanche Allowed up to Tjmax
G
Description
Specifically designed for Automotive applications,
this HEXFET® Power MOSFET utilizes the latest
processing techniques to achieve extremely low onresistance per silicon area. Additional features of
this design are a 175°C junction operating temperature, fast switching speed and improved repetitive
avalanche rating . These features combine to make
this design an extremely efficient and reliable device
for use in Automotive applications and a wide variety
of other applications.
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRF2903Z/S/L
A
15V
L
D.U.T
I
AS
0.01
t
p
Ω
R
V
20V
V
DS
G
GS
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
DRIVER
+
-
V
DD
1200
)
J
m
(
y
1000
g
r
e
n
E
e
800
h
c
n
a
l
a
v
600
A
e
s
l
u
P
400
e
l
g
n
i
S
200
,
S
A
E
0
255075100125150175
I
TOP
42A
BOTTOM
Starting TJ, Junction Temperature (°C)
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
D
26A
75A
10 V
Q
GS
V
G
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
.2µF
12V
V
GS
Fig 13b. Gate Charge Test Circuit
Q
GD
Charge
50KΩ
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
4.5
ID = 1.0A
)
V
4.0
(
e
g
a
t
l
3.5
o
V
d
l
o
3.0
h
s
e
r
h
t
2.5
e
t
a
G
)
2.0
h
t
(
S
G
1.5
+
V
DS
-
V
1.0
-75 -50 -25 025 50 75 100 125 150 175
ID = 1.0mA
ID = 250µA
ID = 150µA
TJ , Temperature ( °C )
I
D
Fig 14. Threshold Voltage Vs. Temperature
6www.irf.com
Page 7
1000
IRF2903Z/S/L
Duty Cycle = Single Pulse
)
A
(
100
t
n
e
r
r
u
C
e
h
c
n
a
l
a
10
v
A
1
1.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
0.01
0.05
0.10
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
300
TOP Single Pulse
250
)
J
m
(
y
g
200
r
e
n
E
e
h
150
c
n
a
l
a
v
A
100
,
R
A
E
50
0
255075100125150175
BOTTOM 1% Duty Cycle
ID = 75A
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
. This is validated for
jmax
every part type.
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
= Average power dissipation per single
D (ave)
avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
·f
av
jmax
is
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
Fig 16. Maximum Avalanche Energy
Vs. Temperature
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
D (ave)·tav
thJC
www.irf.com7
Page 8
IRF2903Z/S/L
Reverse
Recovery
Current
Driver Gate Drive
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
Re-Applied
Voltage
+
-
Period
P.W.
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P. W .
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
+
V
DD
-
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
V
DS
90%
10%
V
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8www.irf.com
Page 9
TO-220AB Package Outline
IRF2903Z/S/L
TO-220AB Part Marking Information
EXAMPLE: THIS IS AN IRF1010
LOT CODE 1789
AS S E MBLED ON WW 19, 2000
IN THE ASSEMBLY LINE "C"
Note: "P" in as s embly line position
i ndi cates " L ead - F r ee"
TO-220AB package is not recommended for Surface Mount Application.
INTERNATIONAL
RECTIF IER
LOGO
ASSEMBLY
LOT CODE
www.irf.com9
PART NUMBER
DATE CODE
YEAR 0 = 2000
WEEK 19
LINE C
Page 10
IRF2903Z/S/L
2
D
Pak Package Outline (Dimensions are shown in millimeters (inches))
D2Pak Part Marking Information
T HIS IS AN IRF 530S WIT H
LOT CODE 8024
ASS EMBLE D ON WW 02, 2000
IN THE ASSEMBLY LINE "L"
Note: "P" in ass embly line
posi tion indicates "Lead-F ree"
INTE RNATIONAL
RECTIF IER
LOGO
ASSEMBLY
LOT CODE
F530S
OR
INTE RNATIONAL
RECTIFIER
LOGO
ASSEMBLY
LOT CODE
10www.irf.com
F530S
PART NUMBER
DATE CODE
YEAR 0 = 2000
WEEK 02
LINE L
PART NUMBER
DATE CODE
P = D ES I GN AT ES L E AD- F RE E
PRODUCT (OPTIONAL )
YEAR 0 = 2000
WEEK 02
A = ASSEMBLY SITE CODE
Page 11
IRF2903Z/S/L
TO-262 Package Outline (Dimensions are shown in millimeters (inches))
IGBT
1- GATE
2- COLLECTOR
3- EMITTER
4- COLLECTOR
TO-262 Part Marking Information
TH IS I S AN IRL 3103L
EXAMPLE:
LOT CODE 1789
ASS EMBL ED ON WW 19, 1997
IN THE ASSEMBLY LINE "C"
Note: "P" in assembly line
pos i tio n in dicates "L ead-F r ee"
INTERNATIONAL
RECTIFIE R
LOGO
AS S E MB L Y
LOT CODE
PART NUMBER
DATE CODE
YEAR 7 = 1997
WE EK 19
LINE C
OR
INTERNATIONAL
RECTIFIE R
LOGO
AS S E MB L Y
LOT CODE
www.irf.com11
PART NUMBER
DATE CODE
P = DE S IGN ATE S L EAD -F RE E
PRODUCT (OPTIONAL)
YEAR 7 = 1997
WEEK 19
A = AS S E MB LY SI T E COD E
Page 12
IRF2903Z/S/L
D2Pak Tape & Reel Information
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
FEED DIRECTION
TRL
FEED DIRECTION
1.85 (.073)
1.65 (.065)
10.90 (.429)
10.70 (.421)
11.60 (.457)
11.40 (.449)
16.10 (.634)
15.90 (.626)
1.60 (.063)
1.50 (.059)
1.75 (.069)
1.25 (.049)
15.42 (.609)
15.22 (.601)
0.368 (.0145)
0.342 (.0135)
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
13.50 (.532)
12.80 (.504)
330.00
(14.173)
MAX.
NOTES :
1. COMFOR MS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11).
Limited by T
RG = 25Ω, I
, starting TJ = 25°C, L = 0.10mH
Jmax
= 75A, VGS =10V. Part not
AS
recommended for use above this value.
Pulse width ≤ 1.0ms; duty cycle ≤ 2%.
C
eff. is a fixed capacitance that gives the
oss
same charging time as C
from 0 to 80% V
DSS
.
oss
while V
DS
is rising
This product has been designed and qualified for the Automotive [Q101]market.
27.40 (1.079)
23.90 (.941)
4
60.00 (2.362)
MIN.
30.40 (1.197)
MAX.
4
3
, see Fig.12a, 12b, 15, 16 for typical repetitive
Limited by T
26.40 (1.039)
24.40 (.961)
Jmax
avalanche performance.
This value determined from sample failure population. 100%
tested to this value in production.
This is only applied to TO-220AB pakcage.
This is applied to D
4 or G-10 Material). For recommended footprint and soldering
techniques refer to application note #AN-994.
R
is measured at TJ approximately 90°C
θ
2
Pak, when mounted on 1" square PCB (FR-
Data and specifications subject to change without notice.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 08/05
12www.irf.com
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