l Advanced Process Technology
l Ultra Low On-Resistance
l 175°C Operating Temperature
l Fast Switching
l Repetitive Avalanche Allowed up to Tjmax
IRF2805PbF
HEXFET® Power MOSFET
V
= 55V
DSS
R
DS(on)
I
D
= 4.7mΩ
= 75A
Description
Specifically designed for Automotive applications, this HEXFET
MOSFET utilizes the latest processing techniques to achieve extremely
low on-resistance per silicon area. Additional features of this design are
a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this
design an extremely efficient and reliable device for use in Automotive
applications and a wide variety of other applications.
®
Power
TO-220AB
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V (Silicon limited)175
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V (See Fig.9)120A
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V (Package limited)75
I
DM
PD @TC = 25°CPower Dissipation330W
V
GS
E
AS
E
(6 sigma)Single Pulse Avalanche Energy Tested Value1220
AS
I
AR
E
AR
T
J
T
STG
Pulsed Drain Current 700
Linear Derating Factor2.2W/°C
Gate-to-Source Voltage ± 20V
Single Pulse Avalanche Energy450mJ
Avalanche CurrentSee Fig.12a, 12b, 15, 16A
Repetitive Avalanche EnergymJ
Operating Junction and-55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
Mounting Torque, 6-32 or M3 screw1.1 (10)N•m (lbf•in)
Allowed avalanche Current vs
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
aval anche losses. Note: In no
case should Tj be allowed to
exceed Tjmax
500
TOP Single Pulse
BOTTOM 10% Duty Cycle
)
400
J
m
(
y
g
r
e
n
300
E
e
h
c
n
a
l
200
a
v
A
,
R
A
100
E
ID = 104A
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
every part type.
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
. This is validated for
jmax
jmax
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
avalanche pulse.
= Average power dissipation per single
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
0
255075100125150175
Starting TJ , Junction Temperature (°C)
Fig 16. Maximum Avalanche Energy
Vs. Temperature
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
P
= 1/2 ( 1.3·BV·Iav) = DT/ Z
D (ave)
I
2DT/ [1.3·BV·Zth]
av =
E
= P
AS (AR)
·f
av
D (ave)·tav
thJC
www.irf.com7
is
Page 8
IRF2805PbF
R
V
+
-
V
9
1
V
+
-
Reverse
Recovery
Current
Driver Gate Drive
P.W.
D.U.T. ISDWaveform
D.U.T. VDSWaveform
Inductor Curent
* V
GS
D.U.T
+
-
R
G
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
-
• Low Leakage Inductance
Current Transformer
-
• dv/dt controlled by R
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
G
+
V
DD
e-Applied
oltage
Period
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
= 5V for Logic Level Devices
D =
P.W.
Period
VGS=10V
V
DD
I
SD
*
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
R
D.U.T.
D
V
DD
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
Fig 18a. Switching Time Test Circuit
DS
0%
0%
GS
t
d(on)tr
t
d(off)tf
Fig 18b. Switching Time Waveforms
8www.irf.com
Page 9
K
TO-220AB Package Outline
R
Dimensions are shown in millimeters (inches)
IRF2805PbF
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
NOTES:
1 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 OUTLINE CONFORMS TO JEDEC OUTLINE TO-220AB.
2 CONTROLLING DI M E NSION : INCH 4 HEATSINK & LEAD MEAS UREMENTS DO NOT INCLUDE BURRS.