Specifically designed for Automotive applications, this
Stripe Planar design of HEXFET
utilizes the lastest processing techniques to achieve
extremely low on-resistance per silicon area. Additional
features of this HEXFET power MOSFET are a 175°C
junction operating temperature, fast switching speed
and improved repetitive avalanche rating. These benefits
combine to make this design an extremely efficient and
reliable device for use in Automotive applications and a
wide variety of other applications.
®
Power MOSFETs
TO-220AB
Absolute Maximum Ratings
ParameterMax.Units
ID @ TC = 25°CContinuous Drain Current, VGS @ 10V142
ID @ TC = 100°CContinuous Drain Current, VGS @ 10V100A
I
DM
PD @TC = 25°CPower Dissipation380W
V
GS
E
AS
I
AR
E
AR
dv/dtPeak Diode Recovery dv/dt 5.2V/ns
T
J
T
STG
Pulsed Drain Current 570
Linear Derating Factor2.5W/°C
Gate-to-Source Voltage ± 20V
Single Pulse Avalanche Energy1250mJ
Avalanche CurrentSee Fig.12a, 12b, 15, 16A
Repetitive Avalanche EnergymJ
Operating Junction and-55 to + 175
Storage Temperature Range
Soldering Temperature, for 10 seconds300 (1.6mm from case )
Mounting Torque, 6-32 or M3 screw10 lbf•in (1.1N•m)
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
www.irf.com5
Page 6
IRF1607
A
15V
DRIVER
+
-
V
DD
R
V
20V
V
DS
G
GS
L
D.U.T
I
AS
0.01
t
p
Ω
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
3000
TOP
2500
2000
1500
1000
500
AS
E , Single Pulse Avalanche Energy (mJ)
0
255075100125150175
Starting T , Junction Temperature ( C)
J
BOTTOM
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
5.0
I
°
D
35A
60A
85A
V
G
4.0
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
3.0
ID = 250µA
Gate threshold Voltage (V)
50KΩ
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
-
I
D
Fig 13b. Gate Charge Test Circuit
DS
2.0
GS(th)
V
1.0
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( °C )
Fig 14. Threshold Voltage Vs. Temperature
6www.irf.com
Page 7
1000
IRF1607
Duty Cycle = Single Pulse
Allowed avalanche Current vs
100
0.01
avalanche pulsewidth, tav
assuming ∆Tj = 25°C due to
avalanche losses
0.05
10
0.10
Avalanche Current (A)
1
1.0E-071.0E-061.0E-051.0E-041.0E-031.0E-021.0E-01
tav (sec)
Fig 15. Typical Avalanche Current Vs.Pulsewidth
1400
1200
1000
800
600
, Avalanche Energy (mJ)
400
AR
E
200
0
255075100125150175
TOP Single Pulse
BOTTOM 10% Duty Cycle
ID = 85A
Starting TJ , Junction Temperature (°C)
Notes on Repetitive Avalanche Curves , Figures 15, 16:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a
temperature far in excess of T
every part type.
. This is validated for
jmax
2. Safe operation in Avalanche is allowed as long asT
not exceeded.
3. Equation below based on circuit and waveforms shown in
Figures 12a, 12b.
4. P
avalanche pulse.
= Average power dissipation per single
D (ave)
5. BV = Rated breakdown voltage (1.3 factor accounts for
voltage increase during avalanche).
6. I
= Allowable avalanche current.
av
7. ∆T = Allowable rise in junction temperature, not to exceed
T
(assumed as 25°C in Figure 15, 16).
jmax
t
Average time in avalanche.
av =
D = Duty cycle in avalanche = t
Z
(D, tav) = Transient thermal resistance, see figure 11)
thJC
av
·f
jmax
is
D (ave)·tav
∆∆
∆T/ Z
∆∆
thJC
Fig 16. Maximum Avalanche Energy
Vs. Temperature
P
= 1/2 ( 1.3·BV·Iav) =
D (ave)
I
av =
E
AS (AR)
∆∆
2
∆T/ [1.3·BV·Zth]
∆∆
= P
www.irf.com7
Page 8
IRF1607
Peak Diode Recovery dv/dt Test Circuit
D.U.T*
+
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
-
+
-
-
+
R
G
V
GS
• dv/dt controlled by R
• ISD controlled by Duty Factor "D"
G
• D.U.T. - Device Under Test
+
V
DD
-
* Reverse Polarity of D.U.T for P-Channel
Driver Gate Drive
P.W.
Period
D =
P.W.
Period
VGS=10V
[ ] ***
D.U.T. ISDWaveform
Reverse
Recovery
Current
Re-Applied
Voltage
D.U.T. VDSWaveform
Inductor Curent
*** V
= 5.0V for Logic Level and 3V Drive Devices
GS
Fig 17. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple ≤ 5%
®
power MOSFETs
V
DD
[ ]
I
[ ]
SD
8www.irf.com
Page 9
Package Outline
A
TO-220AB
Dimensions are shown in millimeters (inches)
10.54 (.415)
2.87 (.113)
2.62 (.103)
15.24 (.600)
14.84 (.584)
14.09 (.555)
13.47 (.530)
10.29 (.405)
1 2 3
6.47 (.255)
6.10 (.240)
4
1.15 (.045)
M IN
4.06 (.160)
3.55 (.140)
3.78 (.149)
3.54 (.139)
- A -
4.69 (.185)
4.20 (.165)
- B -
1.32 (.052)
1.22 (.048)
IRF1607
LEAD ASSIGNMENTS
1 - GAT E
2 - DRA IN
3 - SOU RC E
4 - DRA IN
1.40 (.055)
3X
1.15 (.045)
2.54 (.100)
NOTES:
1 DIM E N S IO N IN G & T O L E R A N C I N G P E R A N S I Y 1 4 . 5 M , 1 9 8 2 . 3 OU T L IN E C O N F O R M S T O JE D E C OU T L IN E T O - 2 2 0 A B .
2 CONTROLLING DIMENSION : INCH 4 HEATSINK & LEAD MEASUREMENTS DO NOT INCLUDE BURRS.
2X
Part Marking Information
TO-220AB
EXAMPLE : THIS IS AN IRF1010
W IT H A SSEMB L Y
LOT CO D E 9 B1M
This product has been designed and qualified for the Automotive [Q101] market.
0.93 (.037)
3X
0.69 (.027)
0.36 (.01 4) M B A M
INTERN A TION A L
RE CTIFIER
L OGO
ASSEMBLY
LOT COD E
Data and specifications subject to change without notice.
0.55 (.022)
3X
0.46 (.018)
2.92 (.115)
2.64 (.104)
PART NUMB ER
I RF1010
9246
9B 1 M
DATE CODE
(YYWW)
YY = YEAR
WW = WEEK
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 9/01
www.irf.com9
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