Datasheet IRF1404S, IRF1404L Datasheet (International Rectifier)

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PD -93853C
IRF1404S
IRF1404L
HEXFET® Power MOSFET
l Advanced Process Technology l Ultra Low On-Resistance l Dynamic dv/dt Rating l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated
Description
Seventh Generation HEXFET® Power MOSFETs from
G
The D2Pak is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on­resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF1404L) is available for low­profile applications.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 162 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 115 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 200 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  5.0 V/ns T
J
T
STG
Pulsed Drain Current  650
Linear Derating Factor 1.3 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 519 m J Avalanche Current 95 A Repetitive Avalanche Energy 20 mJ
Operating Junction and -55 to +175 Storage Temperature Range -55 to +175 Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
Junction-to-Case ––– 0.75 °C/W Junction-to-Ambient (PCB mounted, steady-state)* ––– 40
D
S
D2Pak
IRF1404S
V
DSS
R
DS(on)
= 0.004
ID = 162A
TO-262
IRF1404L
= 40V
°C
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5/18/01
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IRF1404S/L
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
S
C
iss
C
oss
C
rss
C
oss
C
oss
C
eff. Effective Output Capacitance  ––– 1540 ––– VGS = 0V, VDS = 0V to 32V
oss
Source-Drain Ratings and Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. (See fig. 11)
Starting T
RG = 25, I
I
SD
TJ ≤ 175°C
Pulse width 300µs; duty cycle 2%.
Drain-to-Source Breakdown Voltage 40 ––– ––– V VGS = 0V, ID = 250µA
/T
Breakdown Voltage Temp. Coefficient ––– 0.036 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– 0.0035 0.004 VGS = 10V, ID = 95A Gate Threshold Voltage 2.0 –– – 4.0 V VDS = 10V, ID = 250µA Forward Transconductance 106 ––– ––– S VDS = 25V, ID = 60A
Drain-to-Source Leakage Current
––– ––– 20
––– ––– 250 VDS = 32V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 200 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -200
VDS = 40V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– 160 200 ID = 95A Gate-to-Source Charge ––– 35 ––– nC VDS = 32V Gate-to-Drain ("Miller") Charge – –– 42 60 VGS = 10V  Turn-On Delay Time ––– 17 – –– VDD = 20V Rise Time ––– 140 ––– ID = 95A Turn-Off Delay Time ––– 72 ––– RG = 2.5
ns
Fall Time ––– 26 ––– RD = 0.21 
Internal Source Inductance
–––
7.5
–––
Between lead,
nH
and center of die contact Input Capacitance ––– 7360 ––– VGS = 0V Output Capacitance ––– 1680 ––– VDS = 25V Reverse Transfer Capacitance ––– 240 ––– pF ƒ = 1.0MHz, See Fig. 5 Output Capacitance ––– 6630 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz Output Capacitance ––– 1490 ––– VGS = 0V, VDS = 32V, ƒ = 1.0MHz
Parameter Min. Typ. Max. Units Conditions Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
162
650
showing the
A
p-n junction diode. Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 95A, VGS = 0V Reverse Recovery Time ––– 71 110 ns TJ = 25°C, IF = 95A Reverse RecoveryCharge – –– 180 270 nC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
C
eff. is a fixed capacitance that gives the same charging time
oss
= 25°C, L = 0.12mH
J
= 95A. (See Figure 12)
AS
95A, di/dt 150A/µs, V
DD
V
(BR)DSS
as C
Calculated continuous current based on maximum allowable
junction temperature. Package limitation current is 75A
,
Use IRF1404 data and test conditions.
oss
while V
is rising from 0 to 80% V
DS
DSS
D
G
S

* When mounted on 1" square PCB ( FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
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IRF1404S/L
1000
100
D
I , Drain-to-Source Current (A)
10
0.1 1 10 100
1000
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
°
T = 25 C
J
°
T = 175 C
J
1000
100
D
I , Drain-to-Source Current (A)
10
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH T = 175 C
V , Drain-to-Source Voltage (V)
DS
°
J
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
2.5
°
2.0
159A
I =
D
1.5
100
1.0
(Normalized)
D
I , Drain-to-Source Current (A)
V = 25V
DS
10
4.0 5.0 6.0 7.0 8.0 9.0
V , Gate-to-Source Voltage (V)
GS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
Fig 4. Normalized On-Resistance
V =
10V
GS
°
Vs. Temperature
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IRF1404S/L
12000
10000
8000
6000
4000
C, Capacitance (pF)
2000
0
1 10 100
V
=
0V,
C
C
C C C
iss
oss
rss
f = 1MHz
+ C + C
C SHORTED
GS
C
=
issgsgd , ds
C
=
rssgd
C
=
oss dsgd
C
V , Drain-to-Source Voltage (V)
DS
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
°
T = 175 C
J
100
20
I =
95A
D
V = 32V
DS
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
0
0 40 80 120 160 200 240
Q , Total Gate Charge (nC)
G
V = 20V
DS
FOR TEST CIRCUIT
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
10000
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
10us
13
100us
1ms
10ms
°
T = 25 C
J
10
SD
I , Reverse Drain Current (A)
V = 0 V
1
0.4 0.8 1.2 1.6 2.0 2.4
V ,Source-to-Drain Voltage (V)
SD
GS
Fig 7. Typical Source-Drain Diode
100
D
I , Drain Current (A)I , Drain Current (A)
10
°
= 25 C
C
T T= 175 C Single Pulse
1
1 10 100
°
J
V , Drain-to-Source Voltage (V)
DS
Fig 8. Maximum Safe Operating Area
Forward Voltage
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200
LIMITED BY PACKAGE
160
120
80
D
I , Drain Current (A)
40
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
IRF1404S/L
R
D.U.T.
t
d(off)tf
D
V
DS
V
GS
R
G
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
Fig 10b. Switching Time Waveforms
+
V
DD
-
1
D = 0.50
thJC
0.20
0.1
0.10 P
0.05
Thermal Response(Z )
0.01
0.02
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
DM
t
1 2
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRF1404S/L
A
15V
DRIVER
+
-
V
R
20V
V
DS
G
t
L
D.U.T
I
AS
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
Q
GD
DD
1200
TOP
1000
800
600
400
200
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature( C)
J
BOTTOM
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
50
I
D 39A 67A 95A
°
V
G
Charge
48
46
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50K
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
+
V
DS
-
I
D
Fig 13b. Gate Charge Test Circuit
44
, Avalanche Voltage ( V )
42
DSav
V
40
0 20 40 60 80 100
I
, Avalanche Current ( A)
AV
Fig 12d. Typical Drain-to-Source Voltage
Vs. Avalanche Current
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IRF1404S/L
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance Current Transformer
-
-
dv/dt controlled by R
Driver same type as D.U.T.
G
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
Period
D =
P.W.
Period
+
+
V
DD
-
VGS=10V
*
D.U.T. ISDWaveform
Reverse Recovery Current
Re-Applied Voltage
D.U.T. VDSWaveform
Inductor Curent
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-channel HEXFET
Body Diode Forward
Current
di/dt
Diode Recovery
dv/dt
Body Diode Forward Drop
Ripple 5%
V
DD
I
SD
®
Power MOSFETs
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Page 8
IRF1404S/L
F530S
THIS IS AN IRF530S WITH
LO T CO D E 8024 ASSEMBLED O N WW 02, 2000 IN THE AS SEMBLY LINE "L"
ASSEMBLY LOT CODE
INTERNATIONAL
RECT IFIE R
LOGO
PART NUMBER
DA TE CODE YEA R 0 = 2000 WEEK 0 2 LINE L
D2Pak Package Outline
2
D
Pak Part Marking Information
8 www.irf.com
Page 9
TO-262 Package Outline
EXAMPLE:
THIS IS AN IRL3103 L LOT CODE 1789
ASSEMBLY
PART NUMBER
DATE CODE
WEEK 19 LINE C
LOT CODE
YEAR 7 = 1997
ASSEMBLED ON WW 19, 1997 IN THE ASSEMBLY LINE "C"
LOGO
RECTIFIER
INTERNATIONAL
IRF1404S/L
TO-262 Part Marking Information
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Page 10
IRF1404S/L
D2Pak Tape & Reel Information
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
FEED DIRECTION
TRL
FEED DIRECTION
1.85 (.073)
1.65 (.065)
10.90 (.429)
10.70 (.421)
11.60 (.457)
11.40 (.449)
16.10 (.634)
15.90 (.626)
1.60 (.063)
1.50 (.059)
1.75 (.069)
1.25 (.049)
15.42 (.609 )
15.22 (.601 )
0.368 (.0145)
0.342 (.0135)
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
13.50 (.532)
12.80 (.504)
330.00 (14.173) MA X.
NOTES :
1. COMFORMS TO EIA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
27.40 (1.079)
23.90 (.941)
4
60.00 (2.362) MIN.
30.40 (1.197)
26.40 (1.0 39 )
24.40 (.961) 3
MAX.
4
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.5/01
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