Datasheet IRF1310NS-L Datasheet (IOR)

Page 1
查询IRF1310NL供应商
l Advanced Process Technology l Surface Mount (IRF1310NS) l Low-profile through-hole (IRF1310NL) l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
2
Pak is a surface mount power package capable of
The D accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on­resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF1310NL) is available for low­profile applications.
Absolute Maximum Ratings
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 42 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 30 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 160 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  5.0 V/ns T
J
T
STG
Thermal Resistance
R
θJC
R
θJA
PD - 91514B
IRF1310NS/L
HEXFET® Power MOSFET
D
V
=100V
DSS
G
R
S
2
D Pak
Parameter Max. Units
Pulsed Drain Current  140
Linear Derating Factor 1.1 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 420 mJ Avalanche Current 22 A Repetitive Avalanche Energy 16 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Parameter Typ. Max. Units
Junction-to-Case ––– 0.95 Junction-to-Ambient ( PCB Mounted,steady-state)** –– – 40
TO-262
DS(on)
ID = 42A
= 0.036
°C
°C/W
5/13/98
Page 2
IRF1310NS/L
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
S
C
iss
C
oss
C
rss
(BR)DSS
Drain-to-Source Breakdown Voltage 100 ––– ––– V VGS = 0V, ID = 250µA
/T
Breakdown Voltage Temp. Coefficient ––– 0.11 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.036 VGS = 10V, ID = 22A Gate Threshold Voltage 2 .0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 14 ––– ––– S VDS = 25V, ID = 22A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 80V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 100V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– ––– 110 ID = 22A Gate-to-Source Charge ––– ––– 15 nC VDS = 80V Gate-to-Drain ("Miller") Charge ––– ––– 58 VGS = 10V, See Fig. 6 and 13  Turn-On Delay Time ––– 11 ––– VDD = 50V Rise Time ––– 56 ––– ID = 22A Turn-Off Delay Time ––– 45 ––– RG = 3.6
ns
Fall Time ––– 40 ––– RD = 2.9Ω, See Fig. 10 
Internal Source Inductance
––– –––
7.5
Between lead,
nH
and center of die contact Input Capacitance ––– 1900 ––– VGS = 0V Output Capacitance ––– 450 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 230 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25, I
I
SD
TJ ≤ 175°C
** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended soldering techniques refer to application note #AN-994.
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode) 
––– –––
––– –––
42
140
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS =22A, VGS = 0V Reverse Recovery Time ––– 180 270 ns TJ = 25°C, IF = 22A Reverse Recovery Charge ––– 1.2 1.8 µC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width 300µs; duty cycle 2%.
= 25°C, L = 1.7mH
J
= 22A. (See Figure 12)
AS
22A, di/dt 180A/µs, V
DD
V
(BR)DSS
Uses IRF1310N data and test conditions
,
showing the
A
p-n junction diode.

D
G
S
Page 3
IRF1310NS/L
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
1000
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20us PULSE WIDTH T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
o
1000
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20us PULSE WIDTH T = 175 C
J
V , Drain-to-Source Voltage (V)
DS
o
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
3.0
I =
D
36A
100
10
D
I , Drain-to-Source Current (A)
o
T = 25 C
J
o
T = 175 C
J
VDS= 50V 20µS PULSE WIDTH
1
4.0 5.0 6.0 7.0 8.0 9.0 10.0
V , Gate-to-Source Voltage (V)
GS
Fig 3. Typical Transfer Characteristics
2.5
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
Fig 4. Normalized On-Resistance
Vs. Temperature
V =
GS
o
10V
Page 4
IRF1310NS/L
gsg
3500
3000
2500
2000
1500
C, Capacitance (pF)
1000
500
0
1 10 100
V
=
0V,
GS
C
=
iss
C
=
rssgd
C
=
oss dsgd
C
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
f = 1MHz
C
+ C
C SHORTED C C
d , ds
+ C
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I =
22A
D
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
V = 80V
DS
V = 50V
DS
V = 20V
DS
FOR TEST CIRCUIT
0
0 20 40 60 80 100 120
Q , Total Gate Charge (nC)
G
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
13
100
10
1
SD
I , Reverse Drain Current (A)
V = 0 V
0.1
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
V ,Source-to-Drain Voltage (V)
SD
GS
Fig 7. Typical Source-Drain Diode
Forward Voltage
100
10
D
I , Drain Current (A)I , Drain Current (A)
o
= 25 C
C
T T= 175 C Single Pulse
1
1 10 100 1000
o
J
V , Drain-to-Source Voltage (V)
DS
10us
100us
1ms
10ms
Fig 8. Maximum Safe Operating Area
Page 5
IRF1310NS/L
50
40
30
20
D
I , Drain Current (A)
10
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
Fig 9. Maximum Drain Current Vs.
Case Temperature
10
R
V
DS
V
GS
R
G
D
D.U.T.
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
Fig 10a. Switching Time Test Circuit
V
DS
90%
10% V
GS
t
d(on)tr
t
d(off)tf
Fig 10b. Switching Time Waveforms
+
V
DD
-
thJC
1
D = 0.50
0.20
0.10
0.1
0.05
Thermal Response (Z )
0.01
0.02
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
1 2
P
DM
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Page 6
IRF1310NS/L
A
15V
DRIVER
+
-
R
20V
V
DS
G
t
L
D.U.T
I
AS
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
1000
TOP
I
D
9.0A 16A
800
600
V
DD
400
200
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( C)
J
BOTTOM
22A
o
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50K
12V
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
D
Fig 13b. Gate Charge Test Circuit
+
V
DS
-
Page 7
IRF1310NS/L
Peak Diode Recovery dv/dt Test Circuit
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance Current Transformer
-
-
dv/dt controlled by R
Driver same type as D.U.T.
G
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
Period
D =
Period
P.W.
+
+
V
DD
-
VGS=10V
*
Reverse Recovery Current
Re-Applied Voltage
D.U.T. ISDWaveform
Body Diode Forward
D.U.T. VDSWaveform
Body Diode Forward Drop
Inductor Curent
Ripple 5%
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-Channel HEXFETS
Current
di/dt
Diode Recovery
dv/dt
V
DD
I
SD
Page 8
IRF1310NS/L
A
D2Pak Package Outline
10.54 (.415)
1.40 (.055) MAX.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S: 1 DIMENSIONS AFTER SOLDER DIP. 2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 CONTROLLING DIMENSION : INCH. 4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A ­2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10) M B A M
Part Marking Information
D2Pak
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS 1 - G ATE 2 - D RAIN 3 - S OU R CE
10.16 (.400) REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350) REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082) 2X
2.54 (.100) 2X
INTERNATIONAL RE CTIFIE R LO G O
A S SEMBLY LO T CO D E
F530S
9246
9 B 1 M
PART NUM B ER
DATE CODE (YYW W ) YY = YEAR WW = WEEK
Page 9
Package Outline
TO-262 Outline
IRF1310NS/L
Part Marking Information
TO-262
Page 10
IRF1310NS/L
Tape & Reel Information
D2Pak
TRR
1.60 (.063)
1.50 (.059)
4.10 (.161)
3.90 (.153)
1.60 (.063)
1.50 (.059)
0.368 (.0145)
0.342 (.0135)
FEED D IRECTION
1.85 (.073)
1.65 (.065)
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.50 (.532)
12.80 (.504)
330.00 (14.173) MAX.
NOTES :
1. COM FO R M S TO E IA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HU B.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457)
11.40 (.449)
1.75 (.069)
1.25 (.049)
16.10 (.634)
15.90 (.626)
15.42 (.609)
15.22 (.601)
27.40 (1.079)
23.90 (.941)
4
26.4 0 (1.039)
24.40 (.961 )
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.00 (2.362) MIN.
30.40 (1.197) MAX .
4
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
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http://www.irf.com/ Data and specifications subject to change without notice. 5/98
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