500V CoolMOS™ CE Power Transistor IPP50R380CE, IPA50R380CE
IPI50R380CE
1Description
CoolMOS™ is a revolutionary technology for high voltage power
MOSFETs, designed according to the superjunction (SJ) principle and
pioneered by Infineon Technologies. CoolMOS™ CE series combines
the experience of the leading SJ MOSFET supplier with high class
innovation. The resulting devices provide all benefits of a fast switching
SJ MOSFET while not sacrificing ease of use. Extremely low switching
and conduction losses make switching applications even more efficient,
more compact, lighter, and cooler.
Features
•Extremely low losses due to very low FOM R
•Very high commutation ruggedness
•Easy to use/drive
•JEDEC
1)
qualified, Pb-free plating, Halogen free
dson*Qg and Eoss
Applications
PFC stages, hard switching PWM stages and resonant switching PWM
stages for e.g. PC Silverbox, Adapter, LCD & PDP TV
Please note: For MOSFET paralleling the use of ferrite beads on the gate
or separate totem poles is generally recommended.
Avalanche energyMin. drain-source breakdown voltage
E
=f(Tj); ID=1.8 A; VDD=50 V V
AS
=f(Tj); ID=0.25 mA
BR(DSS)
Final Data Sheet11Rev. 2.0, 2010-08-27
Page 12
Table 17
Typ. capacitancesTyp. C
500V CoolMOS™ CE Power Transistor
IPx50R380CE
Electrical characteristics diagrams
stored energy
oss
C=f(V
); VGS=0 V; f=1 MHz E
DS
Table 18
Forward characteristics of reverse diode
OSS
=f(VDS)
I
=f(VSD); parameter: T
F
j
Final Data Sheet12Rev. 2.0, 2010-08-27
Page 13
500V CoolMOS™ CE Power Transistor
V
DS
V
GS
V
DS
V
GS
t
d(on)
t
d( o f f)
t
r
t
on
t
f
t
off
10%
90%
V
DS
I
D
V
DS
V
D
V
(BR)DS
I
D
V
DS
V
DS
I
D
R
G1
R
G2
RG1= R
G2
Ι
F
dit/d
t
rr
10%
90%
Ι
RRM
RRM
Ι
t
RRM
Ι
v
SIL00088
Q
F
v
i
F
Q
S
RRM
V
S
tt
F
/didrrt
rr
ttSt
F
=+
=
rr
QQ
SF
+
Q
6Test circuits
Table 19Switching times test circuit and waveform for inductive load
Switching times test circuit for inductive loadSwitching time waveform
IPx50R380CE
Test circuits
Table 20Unclamped inductive load test circuit and waveform
Unclamped inductive load test circuitUnclamped inductive waveform
Table 21Test circuit and waveform for diode characteristics
Test circuit for diode characteristics Diode recovery waveform
Final Data Sheet13Rev. 2.0, 2010-08-27
Page 14
7Package outlines
500V CoolMOS™ CE Power Transistor
IPx50R380CE
Package outlines
Figure 1 Outlines TO-220, dimensions in mm/inches
Final Data Sheet14Rev. 2.0, 2010-08-27
Page 15
500V CoolMOS™ CE Power Transistor
IPx50R380CE
Package outlines
Figure 2 Outlines TO-220 FullPAK, dimensions in mm/inches
Final Data Sheet15Rev. 2.0, 2010-08-27
Page 16
500V CoolMOS™ CE Power Transistor
IPx50R380CE
Package outlines
Figure 3 Outlines TO-262, dimensions in mm/inches
Final Data Sheet16Rev. 2.0, 2010-08-27
Page 17
8Revision History
CoolMOS CE 500V CoolMOS™ CE Power Transistor
Revision History: 2010-08-27, Rev. 2.0
Previous Revision:
RevisionSubjects (major changes since last revision)
2.0Release of final data sheet
We Listen to Your Comments
500V CoolMOS™ CE Power Transistor
IPx50R380CE
Revision History
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Edition 2010-08-27
Published by
Infineon Technologies AG
81726 Munich, Germany
The information given in this document shall in no event be regarded as a guarantee of conditions or
characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any
information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties
and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights
of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in
question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure
of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support
devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain
and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may
be endangered.
Final Data Sheet17Rev. 2.0, 2010-08-27
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