Datasheet HM-6516 Datasheet (Intersil Corporation)

Page 1
HM-6516
March 1997
Features
• Low Power Standby. . . . . . . . . . . . . . . . . . . 275µW Max
• Low Power Operation . . . . . . . . . . . . . 55mW/MHz Max
• Fast Access Time. . . . . . . . . . . . . . . . . . 120/200ns Max
• Industry Standard Pinout
• TTL Compatible
• Static Memory Cells
• High Output Drive
• On-Chip Address Latches
• Easy Microprocessor Interfacing
Ordering Information
2K x 8 CMOS RAM
Description
The HM-6516 is a CMOS 2048 x 8 Static Random Access Memory. Extremely low power operation is achieved by the use of complementary MOS design techniques. This low power is further enhanced by the use of synchronous circuit techniques that keep the active (operating) power low, which also gives fast access times. The pinout of the HM-6516 is the popular 24 pin, 8-bit wide JEDEC standard, which allows
CC
easy memory board layouts, flexible enough to accommo­date a variety of PROMs, RAMS, EPROMs, and ROMs.
The HM-6516 is ideally suited for use in microprocessor based systems. The byte wide organization simplifies the memory array design, and keeps operating power down to a minimum, because only one device is enabled at a time . The address latches allow very simple interfacing to recent gen­eration microprocessors which employ a multiplexed address/data bus. The convenient output enable control also simplifies multiplexed bus interfacing by allowing the data outputs to be controlled independent of the chip enable.
120ns 200ns TEMP. RANGE PACKAGE PKG. NO.
HM1-6516B-9 HM1-6516-9 -40oC to +85oC CERDIP F24.6
- 29102BJA -55oC to +125oC JAN# F24.6
8403607JA 8403601JA -55oC to +125oC SMD# F24.6
- HM4-6516-9 -40oC to +85oC CLCC J32.A
8403607ZA 8403601ZA -55oC to +125oC SMD# J32.A
Pinouts
A7 A6 A5 A4 A3 A2 A1
A0 DQ0 DQ1 DQ2
GND
1 2 3 4 5 6 7 8
9 10 11 12
HM-6516
(CERDIP)
TOP VIEW
24
V
CC
23
A8
22
A9
21
W
20
G
19
A10
18
E
17
DQ7
16
DQ6
15
DQ5
14
DQ4
13
DQ3
A6 A5
A4 A3 A2 A1 A0
NC
DQ0
5 6
7 8
9 10 11 12 13
14
HM-6516
(CLCC)
TOP VIEW
CC
V
NC
NC
A7
NC
1
3 2
4 32 31 30
16 17 18 19 20
15
DQ1
DQ2
GND
NC
DQ3
NC
DQ4
NC
DQ5
PIN DESCRIPTION
29
A8
28
A9
27
NC
26
W G
25
A10
24
E
23 22
DQ7 DQ6
21
NC No Connect
A0 - A10 Address Inputs
E Chip Enable/Power Down
VSS/GND Ground
DQ0 - DQ7 Data In/Data Out
V
CC
Power (+5V)
W Write Enable
G Output Enable
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. http://www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
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File Number 2998.1
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Functional Diagram
HM-6516
A10
A9 A8 A7 A6 A5 A4
G
W
E
LATCHED
ADDRESS
REGISTER
A
7
GATED
ROW
DECODER
A
7
LG
128
16
G
L
A3 A2 A1 A0
128 x 128
MATRIX
16
16
16
16
GATED COLUMN
DECODER
44
A
LATCHED ADDRESS
REGISTER
16 16
A
1 OF 8
16
A
8
A
DQ0 THRU
8
DQ7
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Page 3
HM-6516
Absolute Maximum Ratings Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+7.0V
Input or Output Voltage Applied for all Grades. . . . . . .GND -0.3V to
VCC +0.3V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Ranges:
HM-6516B-9, HM-6516-9 . . . . . . . . . . . . . . . . . . . -40oC to +85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Thermal Resistance θ
CERDIP Package . . . . . . . . . . . . . . . . 48oC/W 8oC/W
CLCC Package . . . . . . . . . . . . . . . . . . 66oC/W 12oC/W
Maximum Storage Temperature Range . . . . . . . . .-65oC to +150oC
Maximum Junction Temperature. . . . . . . . . . . . . . . . . . . . . . +175oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . +300oC
JA
θ
JC
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25953 Gates
DC Electrical Specifications V
SYMBOL PARAMETER
ICCSB Standby Supply Current - 50 µA IO = 0mA, VI = VCC or GND,
ICCOP Operating Supply Current (Note 1) - 10 mA f = 1MHz, IO = 0mA, G = VCC, VCC =
ICCDR Data Retention Supply Current - 25 µAVCC = 2.0V, IO = 0mA, VI = VCC or
VCCDR Data Retention Supply Voltage 2.0 - V
II Input Leakage Current -1.0 +1.0 µA VI = VCC or GND, VCC = 5.5V
IIOZ Input/Output Leakage Current -1.0 +1.0 µA VIO = VCC or GND, VCC = 5.5V
V
IL
V
IH
VOL Output Low Voltage - 0.4 V IO = 3.2mA, VCC = 4.5V
Input Low Voltage -0.3 0.8 V VCC= 4.5V Input High Voltage 2.4 VCC +0.3 V VCC = 5.5V
= 5V ±10%; TA = -40oC to +85oC (HM-6516B-9, HM-6516-9)
CC
LIMITS
UNITS TEST CONDITIONSMIN MAX
- 100 µA IO = 0mA, VI = VCC or GND,
-50µAVCC = 2.0V, IO = 0mA, VI = VCC or
VCC = 5.5V, HM-6516B-9
HM-6516-9
5.5V, VI = VCC or GND
GND, E = VCC, HM-6516B-9
GND, E = VCC, HM-6516-9
VOH1 Output High Voltage 2.4 - V IO = -1.0mA, VCC = 4.5V VOH2 Output High Voltage (Note 2) VCC -0.4 - V IO = -100µA, VCC = 4.5V
Capacitance T
SYMBOL PARAMETER MAX UNITS TEST CONDITIONS
CI Input Capacitance (Note 2) 8 pF f = 1MHz, All measurements are
CIO Input/Output Capacitance (Note 2) 10 pF
NOTES:
1. Typical derating 5mA/MHz increase in ICCOP.
2. Tested at initial design and after major design changes.
= +25oC
A
referenced to device GND
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HM-6516
AC Electrical Specifications V
SYMBOL PARAMETER
(1)
TELQV Chip Enable Access Time - 120 - 200 ns (Notes 1, 3)
(2)
TAVQV Address Access Time - 120 - 200 ns (Notes 1, 3, 4)
(3)
TELQX Chip Enable Output Enable Time 10 - 10 - ns (Notes 2, 3)
(4)
TWLQZ Write Enable Output Disable Time - 50 - 80 ns (Notes 2, 3)
(5)
TEHQZ Chip Enable Output Disable Time - 50 - 80 ns (Notes 2, 3)
(6)
TGLQV Output Enable Output Valid Time - 80 - 80 ns (Notes 1, 3)
(7)
TGLQX Output Enable Output Enable Time 10 - 10 - ns (Notes 2, 3)
(8)
TGHQZ Output Enable Output DisableTime - 50 - 80 ns (Notes 2, 3)
(9)
TELEH Chip Enable Pulse Negative Width 120 - 200 - ns (Notes 1, 3)
(10)
TEHEL Chip Enable Pulse Positive Width 50 - 80 - ns (Notes 1, 3)
(11)
TAVEL Address Setup Time 0 - 0 - ns (Notes 1, 3)
(12)
TELAX Address Hold Time 30 - 50 - ns (Notes 1, 3)
(13)
TWLWH Write Enable Pulse Width 120 - 200 - ns (Notes 1, 3)
= 5V ±10%; TA = -40oC to +85oC (HM-6516B-9, HM-6516-9)
CC
LIMITS
HM-6516B-9 HM-6516-9
MIN MAX MIN MAX
UNITS
TEST
CONDITIONS
(14)
TWLEH Write Enable Pulse Setup Time 120 - 200 - ns (Notes 1, 3)
(15)
TELWH Write Enable Pulse Hold Time 120 - 200 - ns (Notes 1, 3)
(16)
TDVWH Data Setup Time 50 - 80 - ns (Notes 1, 3)
(17)
TWHDX Data Hold Time 10 - 10 - ns (Notes 1, 3)
(18)
TELEL Read or Write Cycle Time 170 - 280 - ns (Notes 1, 3)
NOTES:
1. Input pulse levels: 0.8V to VCC - 2.0V; Input rise and fall times: 5ns (max); Input and output timing reference level: 1.5V; Output load: 1 TTL gate equivalent, CL = 50pF (min) - for CL greater than 50pF, access time is derated by 0.15ns per pF.
2. Tested at initial design and after major design changes.
3. VCC = 4.5V and 5.5V.
4. TAVQV = TELQV + TAVEL.
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Page 5
Timing Waveforms
A
E
W
DQ
G
TIME
REFERENCE
(11) TAVEL
(10)
TEHEL
HIGH
(5)
TEHQZ
-1 012345
TELAX
VALID ADD
(2)
TAVQV
(12)
(3)
TELQX
HM-6516
(9)
TELEH
(1)
TELQV
(6)
TGLQV
(7)
TGLQX
(18)
TELEL
VALID DATA OUT
(5)
TEHQZ
(10)
TEHEL
TAVEL
(8)TGHQZ
(11)
NEXT
ADD
FIGURE 1. READ CYCLE
The address information is latched in the on-chip registers on the falling edge of
E (T = 0), minimum address setup and hold time requirements must be met. After the required hold time, the addresses may change state without affecting device operation. During time (T = 1), the outputs become enabled but data is not valid until time (T = 2),
Timing Waveforms
A
E
W
(Continued)
(10)
TEHEL
TAVEL
W must
TELAX
(11)
VALID ADD
(12)
TELWH
remain high throughout the read cycle. After the data has been read,
E may return high (T = 3). This will force the out­put buffers into a high impedance mode at time (T = 4). used to disable the output buffers when in a logical “1” state (T = -1, 0, 3, 4, 5). After (T = 4) time, the memory is ready for the next cycle.
(11)
TAVEL
NEXT ADD
(18)
(15)
(9)
TELEH
TWLWH
TELEL
(14)
TWLEH
(13)
(16)
TDVWH
TEHEL
(17)
TWHDX
(10)
G is
DQ
TIME
REFERENCE
VALID DATA IN
G
HIGH
-1
012345
FIGURE 2. WRITE CYCLE
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Page 6
HM-6516
The write cycle is initiated on the falling edge of E (T = 0), which latches the address information in the on-chip registers. If a write cycle is to be performed where the output is not to become active,
G can be held high (inactive). TDVWH and TWHDX must be met for proper device opera­tion regardless of mode), a possible bus conflict may exist. If
G. If E and G fall before W falls (read
E rises before W
Typical Performance Curve
-3
-4
-5
-6
/(1A))
-7
CC
-8
LOG (I
-9
-10
-11
-12
-55 -35 -15 5 25 45 65 85 105 125
rises, reference data setup and hold times to the edge. The write operation is terminated by the first rising edge of
W (T = 2) or E (T = 3). After the minimum E high time (TEHEL), the next cycle may begin. If a series of consecutive write cycles are to be performed, the
W line may be held low until all desired locations have been written. In this case, data setup and hold times must be referenced to the rising of
= 2.0V
V
CC
E rising
E.
FIGURE 3. TYPICAL ICCDR vs T
A
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Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries f or its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under an y patent or patent rights of Intersil or its subsidiaries.
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