The H3LIS331DL has dynamically user selectable
full scales of ±100g/±200g/±400g and it is
capable of measuring accelerations with output
data rates from 0.5 Hz to 1 kHz.
The H3LIS331DL is available in small thin plastic
land grid array package (LGA) and it is
guaranteed to operate over an extended
temperature range from -40 °C to +85 °C.
■ Shock detection
■ Impact recognition and logging
■ Concussion detection
Description
The H3LIS331DL is a low power high
performance 3-axis linear accelerometer
belonging to the “nano” family, with digital I
serial interface standard output.
The device features ultra low power operational
modes that allow advanced power saving and
smart sleep to wake-up functions.
Table 1.Device summary
Order codesTemperature range [°C]PackagePackaging
H3LIS331DL-40 to +85
H3LIS331DLTR-40 to +85
2
C/SPI
TFLGA 3x3x1.0mm
TFLGA 3x3x1.0mm3 16L
3
16L
Tr ay
Tape and reel
April 2012Doc ID 023111 Rev 11/38
This is preliminar y information on a new product now in development or undergoing evaluation. Details are subject to
change without notice.
H3LIS331DLMechanical and electrical specifications
Hz
2 Mechanical and electrical specifications
2.1 Mechanical characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
Table 3.Mechanical characteristics
SymbolParameterTest conditionsMin.Typ.
FS bit set to 00±100
FSMeasurement range
SoSensitivity
TCSo
Ty Off
TCOff
AnAcceleration noise densityFS bit set to 0015
Sensitivity change vs.
temperature
Ty p i ca l z e ro accuracy
Zero-g level change vs.
temperature
(3),(4)
(2)
g level offset
FS bit set to 01±200
FS bit set to 11±400
FS bit set to 00
12-bit representation
FS bit set to 01
12-bit representation
FS bit set to 11
12-bit representation
FS bit set to 00±0.01%/°C
FS bit set to 00±1
Max. delta from 25 °C±5mg/°C
(a)
.
(1)
Max.Unit
g
49
g/digit
98
195
m
g
mg/
NLNon linearity2%
TopOperating temperature range-40+85°C
WhProduct weight20mgram
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Typical zero-g level offset value after MSL3 preconditioning.
4. Offset can be eliminated by enabling the built-in high-pass filter.
a. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V. The
product calibration is done at +/-1g.
Doc ID 023111 Rev 19/38
Page 10
Mechanical and electrical specificationsH3LIS331DL
2.2 Electrical characteristics
@ Vdd = 2.5 V, T = 25 °C unless otherwise noted
Table 4.Electrical characteristics
SymbolParameterTest conditionsMin.Typ.
VddSupply voltage2.162.53.6V
Vdd_IOI/O pins supply voltage
(2)
(b)
.
(1)
Max.Unit
1.71Vdd+0.1V
Idd
IddLP
IddPdn
VIH
Current consumption
in normal mode
Current consumption in low
power mode
Current consumption in
power-down mode
Digital high level input
voltage
300µA
10µA
1µA
0.8*Vdd_IOV
VILDigital low level input voltage0.2*Vdd_IOV
VOHHigh level output voltage0.9*Vdd_IOV
VOLLow level output voltage0.1*Vdd_IOV
DR bit set to 0050
ODR
Output data rate
in normal mode
DR bit set to 01100
DR bit set to 10400
DR bit set to 111000
PM bit set to 0100.5
PM bit set to 0111
ODR
Output data rate in low power
LP
mode
PM bit set to 1002
PM bit set to 1015
Hz
Hz
PM bit set to 11010
(4)
(3)
ODR/2Hz
ODR = 100 Hz1/ODR+1mss
BWSystem bandwidth
TonTurn-on time
TopOperating temperature range-40+85
1. Typical specifications are not guaranteed.
2. It is possible to remove Vdd maintaining Vdd_IO without blocking the communication buses; in this condition the
measurement chain is powered off.
3. Refer to Table 20 for filter cutoff frequency.
4. Time to obtain valid data after exiting power-down mode.
b. The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
10/38Doc ID 023111 Rev 1
°C
Page 11
H3LIS331DLMechanical and electrical specifications
2.3 Communication interface characteristics
2.3.1 SPI - serial peripheral interface
Subject to general operating conditions for Vdd and Top.
Table 5.SPI slave timing values
(1)
Val ue
SymbolParameter
Min.Max.
tc(SPC)SPI clock cycle100ns
fc(SPC)SPI clock frequency10MHz
tsu(CS)CS setup time6
th(CS)CS hold time8
tsu(SI)SDI input setup time5
th(SI)SDI input hold time15
tv(SO)SDO valid output time50
th(SO)SDO output hold time9
tdis(SO)SDO output disable time50
Unit
ns
1. Values are guaranteed at 10 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results, not
tested in production.
(2)
Figure 3.SPI slave timing diagram
2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both input and output ports.
3. When no communication is on-going, data on CS, SPC, SDI and SDO are driven by internal pull-up resistors.
Doc ID 023111 Rev 111/38
Page 12
Mechanical and electrical specificationsH3LIS331DL
SDA
SCL
t
f(SDA)
t
su(SP)
t
w(SCLL)
t
su(SDA)
t
r(SDA)
t
su(SR)
t
h(ST)
t
w(SCLH)
t
h(SDA)
t
r(SCL)tf(SCL)
t
w(SP:SR)
START
REPEATED
START
STOP
START
2.3.2 I2C - inter IC control interface
Subject to general operating conditions for Vdd and Top.
Table 6.I2C slave timing values
SymbolParameter
I2C standard mode
(1)
I2C fast mode
Min.Max.Min.Max.
(1)
Unit
f
(SCL)
t
w(SCLL)
t
w(SCLH)
t
su(SDA)
t
h(SDA)
t
r(SDA) tr(SCL)
t
f(SDA) tf(SCL)
t
h(ST)
t
su(SR)
t
su(SP)
t
w(SP:SR)
SCL clock frequency01000400KHz
SCL clock low time4.71.3
SCL clock high time4.00.6
SDA setup time250100ns
SDA data hold time0.013.450.010.9µs
SDA and SCL rise time100020 + 0.1C
SDA and SCL fall time30020 + 0.1C
START condition hold time40.6
Repeated START condition
setup time
4.70.6
STOP condition setup time40.6
Bus free time between STOP
and START condition
4.71.3
1. Data based on standard I2C protocol requirement, not tested in production.
2. Cb = total capacitance of one bus line, in pF.
Figure 4.I
2
C slave timing diagram
(c)
µs
(2)
b
(2)
b
300
ns
300
µs
c. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both ports.
12/38Doc ID 023111 Rev 1
Page 13
H3LIS331DLMechanical and electrical specifications
This is a mechanical shock sensitive device, improper handling can cause permanent
damage to the part
This is an ESD sensitive device, improper handling can cause permanent damage to
the part
2.4 Absolute maximum ratings
Stresses above those listed as “absolute maximum ratings” may cause permanent damage
to the device. This is a stress rating only and functional operation of the device under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may
affect device reliability.
Table 7.Absolute maximum ratings
SymbolRatingsMaximum valueUnit
VddSupply voltage-0.3 to 4.8V
Vdd_IOI/O pins supply voltage-0.3 to 4.8V
Vin
A
POW
A
UNP
T
T
STG
ESDElectrostatic discharge protection
Input voltage on any control pin
(CS, SCL/SPC, SDA/SDI/SDO, SDO/SA0)
Acceleration (any axis, powered, Vdd = 2.5 V)
Acceleration (any axis, unpowered)
Operating temperature range-40 to +85°C
OP
Storage temperature range-40 to +125°C
Note:Supply voltage on any pin should never exceed 4.8 V.
-0.3 to Vdd_IO +0.3V
3000 g for 0.5 ms
10000 g for 0.1 ms
3000 g for 0.5 ms
10000 g for 0.1 ms
4 (HBM)kV
1.5 (CDM)kV
200 (MM)V
Doc ID 023111 Rev 113/38
Page 14
Mechanical and electrical specificationsH3LIS331DL
2.5 Terminology
2.5.1 Sensitivity
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1 g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the earth, noting the output value, rotating
the sensor by 180 degrees (pointing to the sky) and noting the output value again. By doing
so, ±1 g acceleration is applied to the sensor. Subtracting the larger output value from the
smaller one, and dividing the result by 2, leads to the actual sensitivity of the sensor. This
value changes very little over temperature and also time. The sensitivity tolerance describes
the range of sensitivities of a large population of sensors.
2.5.2 Zero-g level
Zero-g level offset (TyOff) describes the deviation of an actual output signal from the ideal
output signal if no acceleration is present. A sensor in a steady-state on a horizontal surface
measures 0 g in X-axis and 0 g in Y-axis whereas the Z-axis measures 1 g. The output is
ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h, data
expressed as 2’s complement number). A deviation from the ideal value in this case is called
Zero-g offset. Offset is, to some extent, a result of stress to the MEMS sensor and therefore
can slightly change after mounting the sensor onto a printed circuit board or exposing it to
extensive mechanical stress. Offset changes little over temperature, see “Zero-g level
change vs. temperature”. The Zero-g level tolerance (TyOff) describes the standard
deviation of the range of Zero-g levels of a population of sensors.
2.5.3 Sleep to wake-up
The “sleep to wake-up” function, in conjunction with low power mode, allows to further
reduce the system power consumption and develop new smart applications.
The H3LIS331DL may be set in a low power operating mode, characterized by lower date
rate refreshments. In this way the device, even if sleeping, continues to sense acceleration
and generate interrupt requests.
When the “sleep to wake-up” function is activated, the H3LIS331DL is able to automatically
wake up as soon as the interrupt event has been detected, increasing the output data rate
and bandwidth.
With this feature the system may be efficiently switched from low power mode to full
performance, depending on user-selectable positioning and acceleration events, therefore
ensuring power saving and flexibility.
14/38Doc ID 023111 Rev 1
Page 15
H3LIS331DLFunctionality
3 Functionality
The H3LIS331DL is a “nano”, low power, digital output 3-axis linear accelerometer
packaged in an LGA package. The complete device includes a sensing element and an IC
interface able to take the information from the sensing element and to provide a signal to the
external world through an I
3.1 Sensing element
A proprietary process is used to create a surface micro-machined accelerometer. The
technology allows suspended silicon structures to be carried out, which are attached to the
substrate in a few points called anchors and are free to move in the direction of the sensed
acceleration. To be compatible with the traditional packaging techniques, a cap is placed on
top of the sensing element to avoid blocking the moving parts during the moulding phase of
the plastic encapsulation.
When an acceleration is applied to the sensor the proof mass displaces from its nominal
position, causing an imbalance in the capacitive half bridge. This imbalance is measured
using charge integration in response to a voltage pulse applied to the capacitor.
At steady-state the nominal value of the capacitors are few pF and when an acceleration is
applied the maximum variation of the capacitive load is in the fF range.
2
C/SPI serial interface.
3.2 IC interface
The complete measurement chain is composed of a low-noise capacitive amplifier which
converts the capacitive unbalancing of the MEMS sensor into an analog voltage that is
finally available to the user through an analog-to-digital converter.
The acceleration data may be accessed through an I
particularly suitable for direct interfacing with a microcontroller.
The H3LIS331DL features a data-ready signal (RDY) which indicates when a new set of
measured acceleration data is available, therefore simplifying data synchronization in the
digital system that uses the device.
3.3 Factory calibration
The IC interface is factory calibrated for sensitivity (So) and Zero-g level (TyOff).
The trimming values are stored inside the device in a non-volatile memory. Any time the
device is turned on, the trimming parameters are downloaded into the registers to be used
during the active operation. This allows the device to be used without further calibration.
2
C/SPI interface, making the device
Doc ID 023111 Rev 115/38
Page 16
Application hintsH3LIS331DL
CS
10µF
Vdd
100nF
GND
Vdd_IO
SDO/SA0
SDA/SDI/SDO
INT 1
SCL/SPC
Digital signal from/to signal controller.Signal’s levels are defined by proper selection of Vdd_IO
1
5
8
13
TOP VIEW
6
9
1416
9
5
INT 2
AM12626V1
4 Application hints
Figure 5.H3LIS331DL electrical connection
The device core is supplied through the Vdd line while the I/O pads are supplied through the
Vdd_IO line. Power supply decoupling capacitors (100 nF ceramic, 10 µF aluminum) should
be placed as near as possible to pin 14 of the device (common design practice).
All the voltage and ground supplies must be present at the same time to have proper
behavior of the IC (refer to Figure 5). It is possible to remove Vdd maintaining Vdd_IO
without blocking the communication bus, in this condition the measurement chain is
powered off.
The functionality of the device and the measured acceleration data is selectable and
accessible through the I
2
C or SPI interfaces. When using the I2C, CS must be tied high.
The functions, the threshold and the timing of the two interrupt pins (INT 1 and INT 2) can be
completely programmed by the user through the I
4.1 Soldering information
The LGA package is compliant with the ECOPACK®, RoHS and “Green” standards.
It is qualified for soldering heat resistance according to JEDEC J-STD-020C.
Leave “pin 1 indicator” unconnected during soldering.
Land pattern and soldering recommendations are available at www.st.com
2
C/SPI interface.
.
16/38Doc ID 023111 Rev 1
Page 17
H3LIS331DLDigital interfaces
5 Digital interfaces
The registers embedded inside the H3LIS331DL may be accessed through both the I2C and
SPI serial interfaces. The latter may be SW configured to operate either in 3-wire or 4-wire
interface mode.
The serial interfaces are mapped onto the same pads. To select/exploit the I
CS line must be tied high (i.e. connected to Vdd_IO).
I2C serial clock (SCL)
SPI serial port clock (SPC)
2
I
C serial data (SDA)
SPI serial data input (SDI)
3-wire interface serial data output (SDO)
2
I
C less significant bit of the device address (SA0)
SPI serial data output (SDO)
5.1 I2C serial interface
The H3LIS331DL I2C is a bus slave. The I2C is employed to write data into registers whose
content can also be read back.
The relevant I
Table 9.Serial interface pin description
TransmitterThe device which sends data to the bus
ReceiverThe device which receives data from the bus
2
C terminology is given in the table below.
TermDescription
Master
SlaveThe device addressed by the master
The device which initiates a transfer, generates clock signals and terminates a
transfer
There are two signals associated with the I2C bus: the serial clock line (SCL) and the serial
data line (SDA). The latter is a bi-directional line used for sending and receiving the data
to/from the interface. Both the lines are connected to Vdd_IO through a pull-up resistor
embedded inside the H3LIS331DL. When the bus is free both lines are high.
2
The I
C interface is compliant with fast mode (400 kHz) I2C standards as well as with normal
mode.
Doc ID 023111 Rev 117/38
Page 18
Digital interfacesH3LIS331DL
5.1.1 I2C operation
The transaction on the bus is started through a START (ST) signal. A START condition is
defined as a high to low transition on the data line while the SCL line is held high. After this
has been transmitted by the master, the bus is considered busy. The next byte of data
transmitted after the START condition contains the address of the slave in the first 7 bits and
the eighth bit tells whether the master is receiving data from the slave or transmitting data to
the slave. When an address is sent, each device in the system compares the first seven bits
after a START condition with its address. If they match, the device considers itself
addressed by the master.
The slave address (SAD) associated to the H3LIS331DL is 001100xb. The SDO/SA0 pad
can be used to modify the less significant bit of the device address. If the SA0 pad is
connected to the voltage supply, LSB is ‘1’ (address 0011001b) or else, if the SA0 pad is
connected to ground, the LSB value is ‘0’ (address 0011000b). This solution allows the
connection and addressing of two different accelerometers to the same I
Data transfer with acknowledge is mandatory. The transmitter must release the SDA line
during the acknowledge pulse. The receiver must then pull the data line low so that it
remains stable low during the high period of the acknowledge clock pulse. A receiver which
has been addressed is obliged to generate an acknowledge after each byte of data
received.
2
The I
C embedded inside the H3LIS331DL behaves like a slave device and the following
protocol must be adhered to. After the START condition (ST) a slave address is sent, once a
slave acknowledge (SAK) has been returned, an 8-bit sub-address (SUB) is transmitted: the
7 LSB represent the actual register address while the MSB enables address auto increment.
If the MSB of the SUB field is ‘1’, the SUB (register address) is automatically increased to
allow multiple data read/write.
2
C lines.
The slave address is completed with a Read/Write bit. If the bit is ‘1’ (read), a repeated
START (SR) condition must be issued after the two sub-address bytes; if the bit is ‘0’ (write),
the master transmits to the slave with the direction unchanged. Ta bl e 1 0 explains how the
SAD+Read/Write bit pattern is composed, listing all the possible configurations.
Table 10.SAD+Read/Write patterns
CommandSAD[6:1]SAD[0] = SA0R/WSAD+R/W
Read0011000100110001 (31h)
Write0011000000110000 (30h)
Read0011001100110011 (33h)
Write0011001000110010 (32h)
Table 11.Transfer when master is writing one byte to slave
MasterSTSAD + WSUBDATASP
SlaveSAKSAKSAK
18/38Doc ID 023111 Rev 1
Page 19
H3LIS331DLDigital interfaces
Table 12.Transfer when master is writing multiple bytes to slave:
MasterSTSAD + WSUBDATADATASP
SlaveSAKSAKSAKSAK
Table 13.Transfer when master is receiving (reading) one byte of data from slave:
MasterSTSAD + WSUBSRSAD + RNMAKSP
SlaveSAKSAKSAKDATA
Table 14.Transfer when master is receiving (reading) multiple bytes of data from slave
Master ST SAD+WSUBSR SAD+RMAKMAKNMAK SP
SlaveSAKSAKSAK DATADATADATA
Data are transmitted in byte format (DATA). Each data transfer contains 8 bits. The number
of bytes transferred per transfer is unlimited. Data is transferred with the most significant bit
(MSB) first. If a receiver can’t receive another complete byte of data until it has performed
some other function, it can hold the clock line SCL low to force the transmitter into a wait
state. Data transfer only continues when the receiver is ready for another byte and releases
the data line. If a slave receiver doesn’t acknowledge the slave address (i.e. it is not able to
receive because it is performing some real-time function) the data line must be left high by
the slave. The master can then abort the transfer. A low to high transition on the SDA line
while the SCL line is high is defined as a STOP condition. Each data transfer must be
terminated by the generation of a STOP (SP) condition.
In order to read multiple bytes, it is necessary to assert the most significant bit of the subaddress field. In other words, SUB(7) must be equal to 1 while SUB(6-0) represents the
address of first register to be read.
In the presented communication format MAK is master acknowledge and NMAK is no
master acknowledge.
5.2 SPI bus interface
The H3LIS331DL SPI is a bus slave. The SPI allows the writing and reading of the device
registers.
The serial interface interacts with the outside world with 4 wires: CS, SPC, SDI and SDO.
Doc ID 023111 Rev 119/38
Page 20
Digital interfacesH3LIS331DL
CS
SPC
SDI
SDO
RW
AD5 AD4 AD3 AD2 AD1 AD0
DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
MS
CS
SPC
SDI
SDO
RW
DO7 DO6 DO5DO4 DO3DO2 DO1 DO0
AD5 AD4 AD3 AD2 AD1 AD0
MS
Figure 6.Read and write protocol
CS is the serial port enable and it is controlled by the SPI master. It goes low at the start of
the transmission and goes back high at the end. SPC is the serial port clock and it is
controlled by the SPI master. It is stopped high when CS is high (no transmission). SDI and
SDO are respectively the serial port data input and output. Those lines are driven at the
falling edge of SPC and should be captured at the rising edge of SPC.
Both the read register and write register commands are completed in 16 clock pulses or in
multiples of 8 in the case of multiple byte read/write. Bit duration is the time between two
falling edges of SPC. The first bit (bit 0) starts at the first falling edge of SPC after the falling
edge of CS while the last bit (bit 15, bit 23, ...) starts at the last falling edge of SPC just
before the rising edge of CS.
bit 0: RW
from the device is read. In the latter case, the chip drives SDO at the start of bit 8.
bit 1: MS
When 1, the address is auto incremented in multiple read/write commands.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DI(7:0) (write mode). This is the data that is written into the device (MSB first).
bit 8-15: data DO(7:0) (read mode). This is the data that is read from the device (MSB first).
In multiple read/write commands further blocks of 8 clock periods are added. When the MS
bit is ‘0’, the address used to read/write data remains the same for every block. When the
MS
bit is ‘1’ the address used to read/write data is increased at every block.
The function and the behavior of SDI and SDO remain unchanged.
5.2.1 SPI read
Figure 7.SPI read protocol
bit. When 0, the data DI(7:0) is written into the device. When 1, the data DO(7:0)
bit. When 0, the address remains unchanged in multiple read/write commands.
20/38Doc ID 023111 Rev 1
Page 21
H3LIS331DLDigital interfaces
CS
SPC
SDI
SDO
RW
DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0
AD5 AD4 AD3 AD2 AD1 AD0
DO15 DO14 DO13 DO 12 DO11 DO10 DO9 DO8
MS
CS
SPC
SDI
RW
DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0
AD5 AD4 AD3 AD2 AD1 AD0MS
The SPI read command is performed with 16 clock pulses. A multiple byte read command is
performed adding blocks of 8 clock pulses to the previous one.
bit 0: READ bit. The value is 1.
bit 1: MS
bit. When 0, do not increment the address. When 1, increment the address in a
multiple reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that is read from the device (MSB first).
bit 16-... : data DO(...-8). Further data in multiple byte reading.
The SPI write command is performed with 16 clock pulses. A multiple byte write command is
performed adding blocks of 8 clock pulses to the previous one.
bit 0: WRITE bit. The value is 0.
bit 1: MS
bit. When 0, do not increment the address. When 1, increment the address in a
multiple writing.
bit 2 -7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DI(7:0) (write mode). This is the data that is written inside the device (MSB
first).
bit 16-... : data DI(...-8). Further data in multiple byte writing.
3-wire mode is entered by setting to ‘1’ bit SIM (SPI serial interface mode selection) in
CTRL_REG4.
Figure 11. SPI read protocol in 3-wire mode
The SPI read command is performed with 16 clock pulses:
bit 0: READ bit. The value is 1.
bit 1: MS
bit. When 0, do not increment the address. When 1, increment the address in a
multiple reading.
bit 2-7: address AD(5:0). This is the address field of the indexed register.
bit 8-15: data DO(7:0) (read mode). This is the data that is read from the device (MSB first).
Multiple read command is also available in 3-wire mode.
22/38Doc ID 023111 Rev 1
Page 23
H3LIS331DLRegister mapping
6 Register mapping
Ta bl e 1 5 provides a listing of the 8-bit registers embedded in the device and the related
addresses:
Table 15.Register address map
Register address
NameType
HexBinary
Reserved (do not modify)00 - 0EReserved
WHO_AM_Ir0F000 1111 00110010Dummy register
Reserved (do not modify)10 - 1FReserved
CTRL_REG1rw20010 0000 00000111
CTRL_REG2rw21010 0001 00000000
CTRL_REG3rw22010 0010 00000000
CTRL_REG4rw23010 0011 00000000
CTRL_REG5rw24010 0100 00000000
DefaultComment
HP_FILTER_RESETr25010 0101Dummy register
REFERENCErw26010 0110 00000000
STATUS_REGr27010 0111 00000000
OUT_X_Lr28010 1000Output
OUT_X_Hr29010 1001Output
OUT_Y_Lr2A010 1010Output
OUT_Y_Hr2B010 1011Output
OUT_Z_Lr2C010 1100Output
OUT_Z_Hr2D010 1101Output
Reserved (do not modify)2E - 2FReserved
INT1_CFGrw30011 0000 00000000
INT1_SOURCEr31011 0001 00000000
INT1_THSrw32011 0010 00000000
INT1_DURATIONrw33011 0011 00000000
INT2_CFGrw34011 0100 00000000
INT2_SOURCEr35011 0101 00000000
INT2_THSrw36011 0110 00000000
INT2_DURATIONrw37011 0111 00000000
Reserved (do not modify)38 - 3FReserved
Registers marked as Reserved must not be changed as they contain the factory calibration
values. Their content is automatically restored when the device is powered up. Writing to
those registers may change calibration data and thus lead to improper functioning of the
device.
Doc ID 023111 Rev 123/38
Page 24
Register descriptionH3LIS331DL
7 Register description
The device contains a set of registers which are used to control its behavior and to retrieve
acceleration data. The register address, made of 7 bits, is used to identify them and to write
the data through the serial interface.
7.1 WHO_AM_I (0Fh)
Table 16.WHO_AM_I register
00110010
Device identification register.
This register contains the device identifier that for H3LIS331DL is set to 32h.
7.2 CTRL_REG1 (20h)
Table 17.CTRL_REG1 register
PM2PM1PM0DR1DR0ZenYenXen
Table 18.CTRL_REG1 description
PM2 - PM0
DR1, DR0
Zen
Ye n
Xen
Power mode selection. Default value: 000
(000: power-down; Others: refer to Ta b l e 1 9 )
Data rate selection. Default value: 00
(00:50 Hz; Others: refer to Ta bl e 20 )
The PM bits allow the user to select between power-down and two operating active modes.
The device is in power-down mode when the PD bits are set to “000” (default value after
boot). Ta bl e 1 9 shows all the possible power mode configurations and respective output
data rates. Output data in the low power modes are computed with low-pass filter cutoff
frequency defined by DR1, DR0 bits.
The DR bits, in normal mode operation, select the data rate at which acceleration samples
are produced. In low power mode they define the output data resolution. Ta b l e 2 0 shows all
the possible configurations for DR1 and DR0 bits.
24/38Doc ID 023111 Rev 1
Page 25
H3LIS331DLRegister description
Table 19.Power mode and low power output data rate configurations
PM2PM1PM0Power mode selection
000Power-down--
001Normal modeODR
010Low power0.5
011Low power1
100Low power2
101Low power5
110Low power10
Output data rate [Hz]
ODR
LP
Table 20.Normal mode output data rate configurations and low-pass cutoff
The BOOT bit is used to refresh the content of internal registers stored in the Flash memory
block. At the device power-up, the content of the Flash memory block is transferred to the
internal registers related to trimming functions in order to permit a good behavior of the
device itself. If for any reason the content of trimming registers is changed, it is sufficient to
use this bit to restore the correct values. When the BOOT bit is set to ‘1’ the content of the
internal Flash is copied inside corresponding internal registers and it is used to calibrate the
device. These values are factory trimmed and they are different for every accelerometer.
They permit a good behavior of the device and normally they do not have to be changed. At
the end of the boot process the BOOT bit is set again to ‘0’.
Table 23.High-pass filter mode configuration
HPM1HPM0High-pass filter mode
00Normal mode (reset reading HP_RESET_FILTER)
01Reference signal for filtering
10Normal mode (reset reading HP_RESET_FILTER)
HPCF[1:0]. These bits are used to configure high-pass filter cutoff frequency f
which is
t
given by:
The equation can be simplified to the following approximated equation:
Table 24.High-pass filter cutoff frequency configuration
[Hz]
f
HPcoeff2,1
t
Data rate = 50 Hz
0012820
010.51410
100.250.525
110.1250.2512.5
26/38Doc ID 023111 Rev 1
ft [Hz]
Data rate = 100 Hz
ft [Hz]
Data rate = 400 Hz
ft [Hz]
Data rate = 1000 Hz
Page 27
H3LIS331DLRegister description
7.4 CTRL_REG3 [Interrupt CTRL register] (22h)
Table 25.CTRL_REG3 register
IHLPP_ODLIR2I2_CFG1I2_CFG0LIR1I1_CFG1I1_CFG0
Table 26.CTRL_REG3 description
IHL
Interrupt active high, low. Default value: 0
(0: active high; 1: active low)
PP_OD
LIR2
I2_CFG1,
I2_CFG0
LIR1
I1_CFG1,
I1_CFG0
Push-pull/open drain selection on interrupt pad. Default value 0.
(0: push-pull; 1: open drain)
Latch interrupt request on INT2_SRC register, with INT2_SRC register cleared by
reading INT2_SRC itself. Default value: 0.
(0: interrupt request not latched; 1: interrupt request latched)
Data signal on INT 2 pad control bits. Default value: 00.
(see Ta bl e 27 )
Latch interrupt request on the INT1_SRC register, with the INT1_SRC register
cleared by reading the INT1_SRC register. Default value: 0.
(0: interrupt request not latched; 1: interrupt request latched)
Data signal on INT 1 pad control bits. Default value: 00.
(see Ta bl e 27 )
Table 27.Data signal on INT 1 and INT 2 pad
I1(2)_CFG1I1(2)_CFG0INT 1(2) Pad
00Interrupt 1 (2) source
01Interrupt 1 source OR interrupt 2 source
10Data ready
11Boot running
7.5 CTRL_REG4 (23h)
Table 28.CTRL_REG4 register
BDUBLEFS1FS00n00SIM
Doc ID 023111 Rev 127/38
Page 28
Register descriptionH3LIS331DL
Table 29.CTRL_REG4 description
Block data update. Default value: 0
BDU
(0: continuous update; 1: output registers not updated between MSB and LSB
reading)
BLE
FS1, FS0
SIM
Big/little endian data selection. Default value 0.
(0: data LSB @ lower address; 1: data MSB @ lower address)
The BDU bit is used to inhibit output register updates between the reading of upper and
lower register parts. In default mode (BDU = ‘0’), the lower and upper register parts are
updated continuously. If it is not clear whether to read faster than the output data rate, it is
recommended to set the BDU bit to ‘1’. In this way, after the reading of the lower (upper)
register part, the content of that output registers is not updated until the upper (lower) part is
read too.
This feature avoids the reading of LSB and MSB related to different samples.
7.6 CTRL_REG5 (24h)
Table 30.CTRL_REG5 register
000000TurnOn1TurnOn0
Table 31.CTRL_REG5 description
TurnOn1,
Tu r nO n 0
Turn-on mode selection for sleep to wake function. Default value: 00.
Turn- on bits are used for turning on the sleep to wake function.
Table 32.Sleep to wake configuration
TurnOn1TurnOn0Sleep to wake status
00Sleep to wake function is disabled
11
Turned on: The device is in low power mode (ODR is defined in
Setting TurnOn[1:0] bits to 11, the “sleep to wake” function is enabled. When an interrupt
event occurs the device is turned to normal mode, increasing the ODR to the value defined
in CTRL_REG1. Although the device is in normal mode, CTRL_REG1 content is not
automatically changed to “normal mode” configuration.
28/38Doc ID 023111 Rev 1
CTRL_REG1)
Page 29
H3LIS331DLRegister description
7.7 HP_FILTER_RESET (25h)
Dummy register. Reading at this address zeroes instantaneously the content of the internal
high-pass filter. If the high-pass filter is enabled all three axes are instantaneously set to 0 g.
This allows the settling time of the high-pass filter to be overcome.
7.8 REFERENCE (26h)
Table 33.REFERENCE register
Ref7Ref6Ref5Ref4Ref3Ref2Ref1Ref0
Table 34.REFERENCE description
Ref7 - Ref0Reference value for high-pass filter. Default value: 00h.
This register sets the acceleration value taken as a reference for the high-pass filter output.
When the filter is turned on (at least one of FDS, HPen2, or HPen1 bits is equal to ‘1’) and
HPM bits are set to “01”, filter-out is generated taking this value as a reference.
7.9 STATUS_REG (27h)
Table 35.STATUS_REG register
ZYXORZORYORXORZYXDAZDAYDAXDA
Table 36.STATUS_REG description
X, Y and Z-axis data overrun. Default value: 0
ZYXOR
ZOR
YOR
XOR
ZYXDAX, Y and Z-axis new data available. Default value: 0
(0: no overrun has occurred;
1: new data has overwritten the previous one before it was read)
Z-axis data overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the Z-axis has overwritten the previous one)
Y-axis data overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the Y-axis has overwritten the previous one)
X-axis data overrun. Default value: 0
(0: no overrun has occurred;
1: a new data for the X-axis has overwritten the previous one)
(0: a new set of data is not yet available; 1: a new set of data is available)
Doc ID 023111 Rev 129/38
Page 30
Register descriptionH3LIS331DL
Table 36.STATUS_REG description (continued)
ZDAZ-axis new data available. Default value: 0
(0: a new data for the Z-axis is not yet available;
1: a new data for the Z-axis is available)
YDAY-axis new data available. Default value: 0
(0: a new data for the Y-axis is not yet available;
1: a new data for the Y-axis is available)
XDAX-axis new data available. Default value: 0
(0: a new data for the X-axis is not yet available;
1: a new data for the X-axis is available)
7.10 OUT_X_L (28h), OUT_X_H (29)
X-axis acceleration data. The value is expressed as 2’s complement.
7.11 OUT_Y_L (2Ah), OUT_Y_H (2Bh)
Y-axis acceleration data. The value is expressed as 2’s complement.
7.12 OUT_Z_L (2Ch), OUT_Z_H (2Dh)
Z-axis acceleration data. The value is expressed as 2’s complement.
7.13 INT1_CFG (30h)
Table 37.INT1_CFG register
AOI0ZHIEZLIEYHIEYLIEXHIEXLIE
Table 38.INT1_CFG description
AOI
ZHIE
ZLIE
YHIE
AND/OR combination of interrupt events. Default value: 0.
(See Ta bl e 39)
Enable interrupt generation on Z high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Z low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on Y high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Y low event. Default value: 0
YLIE
30/38Doc ID 023111 Rev 1
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Page 31
H3LIS331DLRegister description
Table 38.INT1_CFG description (continued)
Enable interrupt generation on X high event. Default value: 0
XHIE
XLIE
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on X low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Configuration register for interrupt 1 source.
Table 39.Interrupt 1 source configurations
AOIInterrupt mode
0OR combination of interrupt events
1AND combination of interrupt events
7.14 INT1_SRC (31h)
Table 40.INT1_SRC register
0 IA ZHZLYHYLXHXL
Table 41.INT1_SRC description
IA
ZH
ZL
YH
YL
XH
XL
Interrupt active. Default value: 0
(0: no interrupt has been generated; 1: one or more interrupts have been generated)
Z high. Default value: 0
(0: no interrupt, 1: Z high event has occurred)
Z low. Default value: 0
(0: no interrupt; 1: Z low event has occurred)
Y high. Default value: 0
(0: no interrupt, 1: Y high event has occurred)
Y low. Default value: 0
(0: no interrupt, 1: Y low event has occurred)
X high. Default value: 0
(0: no interrupt, 1: X high event has occurred)
X low. Default value: 0
(0: no interrupt, 1: X low event has occurred)
Interrupt 1 source register. Read only register.
Reading at this address clears the INT1_SRC IA bit (and the interrupt signal on the INT 1
pin) and allows the refreshment of data in the INT1_SRC register if the latched option is
chosen.
The D6 - D0 bits set the minimum duration of the interrupt 2 event to be recognized.
Duration steps and maximum values depend on the ODR chosen.
7.17 INT2_CFG (34h)
Table 46.INT2_CFG register
AOI0ZHIEZLIEYHIEYLIEXHIEXLIE
Table 47.INT2_CFG description
AOI
ZHIE
ZLIE
YHIE
AND/OR combination of interrupt events. Default value: 0.
(See Ta bl e 48)
Enable interrupt generation on Z high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Z low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Enable interrupt generation on Y high event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on Y low event. Default value: 0
YLIE
32/38Doc ID 023111 Rev 1
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Page 33
H3LIS331DLRegister description
Table 47.INT2_CFG description (continued)
Enable interrupt generation on X high event. Default value: 0
XHIE
XLIE
(0: disable interrupt request;
1: enable interrupt request on measured accel. value higher than preset threshold)
Enable interrupt generation on X low event. Default value: 0
(0: disable interrupt request;
1: enable interrupt request on measured accel. value lower than preset threshold)
Configuration register for interrupt 2 source.
Table 48.Interrupt mode configuration
AOIInterrupt mode
0OR combination of interrupt events
1AND combination of interrupt events
7.18 INT2_SRC (35h)
Table 49.INT2_SRC register
0 IA ZHZLYHYLXHXL
Table 50.INT2_SRC description
IA
ZH
ZL
YH
YL
XH
XL
Interrupt active. Default value: 0
(0: no interrupt has been generated; 1: one or more interrupts have been generated)
Z high. Default value: 0
(0: no interrupt, 1: Z high event has occurred)
Z low. Default value: 0
(0: no interrupt; 1: Z low event has occurred)
Y high. Default value: 0
(0: no interrupt, 1: Y high event has occurred)
Y low. Default value: 0
(0: no interrupt, 1: Y low event has occurred)
X high. Default value: 0
(0: no interrupt, 1: X high event has occurred)
X Low. Default value: 0
(0: no interrupt, 1: X low event has occurred)
Interrupt 2 source register. Read only register.
Reading at this address clears the INT2_SRC IA bit (and the interrupt signal on the INT 2
pin) and allows the refreshment of data in the INT2_SRC register if the latched option is
chosen.
The D6 - D0 bits set the minimum duration of the interrupt 2 event to be recognized.
Duration time steps and maximum values depend on the ODR chosen.
34/38Doc ID 023111 Rev 1
Page 35
H3LIS331DLPackage information
8 Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK is an ST trademark.
®
packages, depending on their level of environmental compliance. ECOPACK
Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries (“ST”) reserve the
right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any
time, without notice.
All ST products are sold pursuant to ST’s terms and conditions of sale.
Purchasers are solely responsible for the choice, selection and use of the ST products and services described herein, and ST assumes no
liability whatsoever relating to the choice, selection or use of the ST products and services described herein.
No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted under this document. If any part of this
document refers to any third party products or services it shall not be deemed a license grant by ST for the use of such third party products
or services, or any intellectual property contained therein or considered as a warranty covering the use in any manner whatsoever of such
third party products or services or any intellectual property contained therein.
UNLESS OTHERWISE SET FORTH IN ST’S TERMS AND CONDITIONS OF SALE ST DISCLAIMS ANY EXPRESS OR IMPLIED
WARRANTY WITH RESPECT TO THE USE AND/OR SALE OF ST PRODUCTS INCLUDING WITHOUT LIMITATION IMPLIED
WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE (AND THEIR EQUIVALENTS UNDER THE LAWS
OF ANY JURISDICTION), OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
UNLESS EXPRESSLY APPROVED IN WRITING BY TWO AUTHORIZED ST REPRESENTATIVES, ST PRODUCTS ARE NOT
RECOMMENDED, AUTHORIZED OR WARRANTED FOR USE IN MILITARY, AIR CRAFT, SPACE, LIFE SAVING, OR LIFE SUSTAINING
APPLICATIONS, NOR IN PRODUCTS OR SYSTEMS WHERE FAILURE OR MALFUNCTION MAY RESULT IN PERSONAL INJURY,
DEATH, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE. ST PRODUCTS WHICH ARE NOT SPECIFIED AS "AUTOMOTIVE
GRADE" MAY ONLY BE USED IN AUTOMOTIVE APPLICATIONS AT USER’S OWN RISK.
Resale of ST products with provisions different from the statements and/or technical features set forth in this document shall immediately void
any warranty granted by ST for the ST product or service described herein and shall not create or extend in any manner whatsoever, any
liability of ST.
ST and the ST logo are trademarks or registered trademarks of ST in various countries.
Information in this document supersedes and replaces all information previously supplied.
The ST logo is a registered trademark of STMicroelectronics. All other names are the property of their respective owners.