Datasheet GLT6400M08SLI-120ST, GLT6400M08SL-120ST, GLT6400M08LL-120ST Datasheet (G-LINK)

Page 1
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 1 -
Features : Description :
Low-power consumption.
-active: 30mA at 120ns.
-stand by : 20 µA (CMOS input / output) 5 µA (CMOS input / output, SL)
Single +2.3 to 2.7V power supply. Equal access and cycle time. 120 ns access time. 1.0V data retention mode. TTL compatible, tri-state input/output. Automatic power-down when deselected. Industrial grade (-40°C ~ 85°C)
availabel.
Package available: sTSOP.
The GLT6400M08 is a low power CMOS Static
RAM organized as 524,288 x 8 bits. Easy memory expansion is provided by an active LOW CE1 an
active LOW OE , and Tri-state I/O’s. This device has an automatic power-down mode feature when
deselected.
Writing to the device is accomplished by taking
chip Enable 1 ( CE1 ) with Write Enable ( WE ) LOW. Reading from the device is performed by taking Chip
Enable 1 ( CE1 ) with Output Enable ( OE ) LOW while Write Enable ( WE ) and Chip Enable 2 (CE2)
is HIGH. The I/O pins are placed in a high-impedance state when the device is deselected : the outputs are disabled during a write cycle.
The GLT6400M08 comes with a 1V data retention feature and Lower Standby Power. The GLT6400M08 is available in a 32-pin sTSOP packages.
Function Block Diagram :
ROW DECODER
Cell
Array
SENSE AMP
INPUT BUFFER
COLUMN DECODER
CONTROL
CIRCUIT
OE WE CE1 CE2
I/O7
I/O1
Column Address
Row Address
Page 2
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 2 -
Pin Configurations :
sTSOPI
GLT6400M08
A
16
A
7
1 2 3 4 5 6
8 9 10 11 12 13
22 21
19 18 17
26 25 2423GND
OE
A
10
14
27
28
I/O
7
I/O
6
20 A
0
7
WE
V
CC
15 16
29
30
31
32A
11
A
9
A
8
A
13
A
17
A
15
A
14
A
12
A
6
A
5
A
4
A
3
A
2
A
1
I/O
0
I/O
1
I/O
2
I/O
3
I/O
4
I/O
5
CE
1
A
18
Pin Descriptions:
Name
Function
A0 – A
18
Address Inputs
CE
1
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
I/O0 – I/O
7
Data Input and Data Output
V
CC
2.5V Power Supply
GND Ground NC No Connection
Truth Table:
CE
1
WE
OE
Data Mode
HXX
High-Z
Standby
XXX
High-Z
Standby
LHL
Data Out
Active, Read
LHH
High-Z
Active, Output Disable
LLX
Data Out
Active, Write
*Key : X = Don’t Care, L = Low, H = High
Page 3
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 3 -
Absolute Maximum Ratings*
Parameter Symbol Minimum Maximum Unit
Voltage on Any Pin Relative to Gnd Vt -0.5 Vcc+0.3 V Power Dissipation P
T
- 1.0 W
Storage Temperature (Plastic) Tstg -55 +150
°C
Temperature Under Bias Tbias -40 +85
°C
*Note : Stresses greater than those listed above Absolute Maximum Ratings may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Recommended Operating Conditions ( TA = -25°C to + 85°C)
Parameter Symbol Min Typ Max Unit
V
CC
2.3 2.5 2.7 V
Supply Voltage
Gnd 0.0 0.0 0.0 V
V
IH
2.0 - VCC+0.2 V
Input Voltage
V
IL
-0.5* - 0.6 V
* VIL min = -1.0V for pulse width less than tRC/2.
Page 4
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 4 -
DC Operating Characteristics ( Vcc=2.3V to 2.7V, T
A
=-25°C to + 85°C)
120
Parameter Sym. Test Conditions
Min Max
Unit
Input Leakage Current
I
LI
VCC = Max, Vin = Gnd to V
CC
- 1
µA
Output Leakage Current
I
LO
CE
1
=V
IH
VCC = Max, V
OUT
= Gnd to V
CC
- 1
µA
Operating Power Supply Current
I
CC
CE
1
=VIL ,
VIN=VIH or VIL, I
OUT
=0mA
- 5 mA
I
CC1
CE
1
=VIL ,
I
OUT
= 0mA,
Min Cycle, 100% Duty
- 30 mA
Average Operating Current
I
CC2
CE
1
=0.2V
I
OUT
= 0mA,
Cycle Time=1µs, 100% Duty
- 3 mA
Standby Power Supply
Current(TTL Level)
I
SB
CE
1
=V
IH
- 0.3 mA
GLT6400M 08LL
­20
µA
Standby Power Supply Current (CMOS Level)
I
SB1
CE
1
VCC-0.2V or f=0 VIN 0.2V or V
IN
VCC-0.2V
GLT6400M 08SL
­5
µA
Output Low Voltage V
OLIOL
= 2 mA - 0.4 V
Output High Voltage V
OHIOH
= -1 mA 2.0 - V
Data Retention
Parameter Sym. Test Conditions Min. Max. Unit
VCC for Data retention
V
DR
1.0 - V
Data Retention Current
I
CCDR
- 4
µA
Chip Deselect to Data Retention Time
t
CDR
0 - ns
Operating Recovery Time
(2)
t
R
CE
1
VCC -0.2V or
V
IN
VCC -0.2V or
V
IN
0.2V
t
RC
- ns
Page 5
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 5 -
Data Retention Waveform (TA = -25°C to + 85°C)
Data Retention Mode
Vcc
CE
VDR
VDR >= 1.0V
tRtCDR
2.7V
2.7V
VIH
V
IH
AC Test Conditions AC Test Loads and Waveforms
CL*
TTL
Output Load Condition *Including Scope and Jig Capacitance
CL = 30pf + 1TTL Load
Read Cycle
(3,9)
( Vcc=2.3V to 2.7V, TA =-25°C to + 85°C)
120
Unit NoteParameter Symbol
Min Max
Read Cycle Time t
RC
120 ns
Address Access Time t
AA
120 ns
Chip Enable Access Time t
ACE
120 ns
Output Enable Access Time t
OE
60 ns
Output Hold from address Change t
OH
15 ns
Chip Enable to Output in Low-Z t
CLZ
10 ns 4,5
Chip Disable to Output in High-Z t
CHZ
0 35 ns 4,5
Output Enable to Output in Low-Z t
OLZ
5 ns 4,5
Output Disable to Output in High-Z t
OHZ
0 35 ns 4,5
Power-Up Time t
PU
0 ns 5
Power-Down Time t
PD
120 ns 5
Input Pulse Levels 0.4V to 2.2V Input Rise and Fall Time Input and Output Timing Reference Level
5 ns
1.1V
Page 6
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 6 -
Timing Waveform of Read Cycle 1
(3,6,7,9)
(Address Controlled)
DOUT
tAA tOH
tRC
Data Valid
Address
Timing Waveform of Read Cycle 2
(5,6,8,9)
( CE1 Controlled)
t
OE
t
RC
Data Valid
CE1
t
OHZ
t
CHZ
t
PD
50%
50%
t
OLZ
t
ACE
t
CLZ
t
PU
Supply Current
OE
D
OUT
I
CC
I
SB
Write Cycle
(3,11)
( Vcc=2.3V to 2.7V, TA =-25°C to + 85°C)
120
Parameter Symbol
Min Max
Unit Note
Write Cycle Time t
WC
120 ns
Chip Enable to Write End t
CW
100 ns
Address Setup to Write End t
AW
100 ns
Address Setup Time t
AS
0 ns
Write Pulse Width t
WP
80 ns
Write Recovering Time t
WR
0 ns
Data Valid to Write End t
DW
50 ns
Data Hold Time t
DH
0 ns
Write Enable to Output in High-Z t
WZ
0 35 ns 4,5
Output Active from Write End t
OW
5 ns 4,5
Page 7
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 7 -
Timing Waveform of Write Cycle 1
(10,11)
( WE Controlled)
tWP
tAW
WE
tWC
tWR
tAS
tDW tDH
tOW
tWZ
Data Valid
Address
DIN
DOUT
Timing Waveform of Write Cycle 2
(10,11)
( CE1 Controlled)
tAW
WE
tWC
tWR
tDW tDH
Data Valid
Address
DIN
tAS tCW
t
WP
tWZ
CE1
DOUT
Page 8
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 8 -
Notes :
1. L-version includes this feature.
2. This Parameter is samples and not 100% tested.
3. For test conditions, see AC Test Condition.
4. This parameter is tested with CL = 5pF. Transition is measured ± 500mV from steady – state voltage.
5. This parameter is guaranteed, but is not tested.
6. WE is HIGH for read cycle.
7. CE1 and OE are LOW and for read cycle.
8. Address valid prior to or coincident with CE1 transition LOW .
9. All read cycle timings are referenced from the last valid address to the first transition address.
10. CE1 or WE must be HIGH during address transition.
11. All write cycle timings are referenced from the last valid address to the first transition address.
Page 9
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 9 -
Ordering Information
GLT6400M08LL-120 ST
120ns
Normal
sTSOPI 32L
GLT6400M08SL-120 ST
120ns
Normal
sTSOPI 32L
GLT6400M08SLI-120 ST
120ns
Normal
sTSOPI 32L
GLT6400M08SLI-120 ST
120ns
Normal
sTSOPI 32L
Parts Numbers (Top Mark) Definition :
GLT 6 400 M 08 LL I - 120 TC
4 : DRAM 6 : Standard SRAM 7 : Cache SRAM 8 : Synchronous Burst SRAM
-SRAM
064 : 64K 256 : 256K 512 : 512K 100 : 1M
-DRAM
10 : 1M(C/EDO)* 11 : 1M(C/FPM)* 12 : 1M(H/EDO)* 13 : 1M(H/FPM)* 20 : 2M(EDO) 21 : 2M(FPM) 40 : 4M(EDO) 41 : 4M(FPM) 80 : 8M(EDO) 81 : 8M(FPM) *See note
VOLTAGE
Blank : 5V L : 3.3V M : 2.5V N : 2.1V
CONFIG.
04 : x04 08 : x08 16 : x16 32 : x32
SPEED
-SRAM
10 : 10ns 12 : 12ns 15 : 15ns 20 : 20ns 70 : 70ns
-DRAM
35 : 35ns 40 : 40ns 45 : 45ns 50 : 50ns 60 : 60ns
PACKAGE
T : PDIP(300mil) TS : TSOP(Type I) ST : sTSOP (Type I) TC : TSOP(Type ll) PL : PLCC FA : 300mil SOP FB : 330mil SOP FC : 445mil SOP J3 : 300mil SOJ J4 : 400mil SOJ P : PDIP(600mil) Q : PQFP TQ : TQFP FG : 48-fpBGA
LL : Low Low power L : Low power SL : Super Low power
I : Industrial Temperature
Page 10
G-LINK
GLT6400M08
Ultra Low Power 512k x 8 CMOS SRAM
Nov 2000(Rev. 2.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 10 -
Package Information
32 pin 8x13.4mm Small Outline J-form Package (sTSOP)
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