• Logic state is preserved in the absence of power
• Over 10 Billion (1010) nonvolatile state changes
• Advanced high-reliability ferroelectric process
Op erates like conventional CMOS logic
• Transparent (573) or D-Flip-flop (574) operation
• FM573 transparent for C high, latched for C low
• FM574 data is clocked on the rising edge of C
• 33/80 ns data propagation delay (5V/3V)
• 30 MHz/12 MHz Maximum frequency (5V/3 V)
Description
The FM573 and FM574 are innovative circuits that
store inputs like conventional logic families, and then
retain the stored state in the absence of power. These
products solve three basic problems in an elegant
fashion. First, they provide continuous access to
nonvolatile system settings without performing a
memory read operation or using dedicated processor
I/O pins. Second, they allow the storage of signals or
data that may change frequently and possibly without
notice. Third, they allow the nonvolatile storage of a
few bits of data or system settings without the system
overhead and extra pins of a serial memory. The
FM573 is a transparent latch. The inputs are passed
to the outputs when the clock is high; the state is
latched when the clock goes low. The FM574 is a Dtype register. Inputs are stored and passed to the
outputs on the rising edge of the clock. The
nonvolatile latch is a unique product that serves a
variety of applications. A few ideas as follows:
ü Controls relays and valves with automatic setting
on power -up without processor intervention.
ü Interface to soft/momentary front-panel switches
and indicator lamps. Capture switch settings and
light LED’s without processor intervention.
ü Replaces jumpers & control signal routing
ü Initialize state of I/O card signals.
ü Save system errors or status codes when power
fails with a fast, no overhead write and automatic
restore on power up.
ü Eliminate the overhead of serial memory for
systems needing only a few bits of data.
The FM573 and FM574 are provided in a 20-pin DIP
or SOP. They are rated from –40C to +85C.
This data sheet contains specifications for a product under development. Ramtron International Corporation
Characterization is not complete; specifications may change without notice. 1850 Ramtron Drive, Colorado Springs, CO 80921
(800) 545-FRAM, (719) 481-7000, Fax (719) 481-7058
27 March 2001 www.ramtron.com1/10
Automatic Nonvolatile Operation
• Latched state is stored automatically
• State is automatically restored on power -up
• Power supply monitor prevents low -VDD writes
Low Power Operation
• Supply voltage of 2.7V to 5.5V
• 125 µA standby current
Industry Stand ard Configuration
• Industrial temperature -40° C to +85° C
• 20-pin SOP or DIP
Pin Configuration
20
19
18
17
16
15
14
13
12
11
VDD
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
C
D0
D1
D2
D3
D4
D5
D6
D7
1
2
3
4
5
6
7
8
9
10
OE
VSS
Pin Names Function
D0-D7 Data in
Q0-Q7 Data Out
C Clock/Latch Enable
/OE Output enable
VSS Ground
VDD Supply Voltage
/OE 1 I Output enable. When low, the outputs are driven. When high, the outputs
are tri-stated.
C 11 I Controls the latching of data according to the truth tables below.
D0-D7 2-9 I Data in.
Q0-Q7 12-19 O Data out.
VSS 10 I Ground
VDD 20 I Supply Voltage
Functional Tables
FM573 Table
/OE
1 X X X Hi-Z Tri-state outputs
0 0 X Qn Qn Outputs enabled, hold state
0 1 Dn Dn Dn Transparent
1 1 Dn Dn Hi-Z Load data, outputs tri-state
FM574 Table
/OE
1 X X X Hi-Z Tri-state outputs
0 X X Qn Qn Outputs enabled, hold state
0
1
Nonvolatile logic is a revolutionary product family
that simplifies the design of system control functions.
The FM573 is a transparent octal latch; the FM574 is
an octal D-type register. These products are unique
because the stored values also are retained in the
absence of power. They are pin and functionally
compatible with their industry standard CMOS
equivalents. Any change in the latched state
automatically is written into a nonvolatile
ferroelectric latch. This function is possible due to the
fast write time and extremely high write endurance of
the underlying ferroelectric memory technology. A
This power up sequence occurs as follows. On
detection of a power-up, the internal nonvolatile latch
is read. This value is then placed on an internal
version of the Dn input. A single internal clock is
generated to cause the user latch to accept the
restored data. After this process is complete, the latch
provides normal user-controlled operation. Users
should not attempt to latch externally supplied data
prior to t
after VDD reaches V
PUH
. The following
MIN
diagram illustrates the power-up and down
sequences.
Figure 2. Power Cycle Flow Chart
new state becomes nonvolatile no more than 500 ns
(VDD=5V) after the write begins.
Users interface to a conventional latch rather than
System VDD rises,
bandgap begins to function
directly to the nonvolatile latch. Equivalent
ferroelectric nonvolatile latches shadow the user’s
latches. They offer a very high but not unlimited
No
number of write-cycles. Therefore, the internal state
machine writes to the nonvolatile latch only if the
latched state has changed in order to minimize the
VDD > VMIN?
VDD < VMIN
actual number of nonvolatile write-cycles. This
determination is made independently for each bit.
Yes
Yes
Due to the short write-time and realistic power slew
rates, it is virtually impossible for the system to lose
power before the nonvolatile state is acquired.
Read nonvolatile
store
Complete NV-
writes in progress
No
Power Down Sequence
An internal power monitor blocks updates to the
nonvolatile latch when VDD is below V
(internal
MIN
voltage reference). The power supply monitor also
blocks write access to the user latch when VDD is
below V
of the last value, state changes should cease t
before VDD reaches V
. To guarantee a proper nonvolatile write
MIN
MIN
. The V
threshold is low
MIN
PDS
enough that no special action may be needed in
systems with slow slew rates. For fast power supply
slew-rates or for systems that run down to relatively
low supply voltages, the user should employ some
form of low -VDD reset that trips above V
MIN
.
Power Up
The V
threshold is a critical parameter for several
MIN
aspects of product operations. On power-up, the
FM573/574 automatically restores the Qn outputs
(and internal latches) to the previously stored state.
This process begins as VDD rises to V
completed t
afterward. Thus for all practical
RES
MIN
and is
purposes, the nonvolatile values have been restored
as soon as the system logic is functional on powerup. After the restore process, the latch is
indistinguishable from its last state prior to power
down and operates normally.
No
Read
complete?
Yes
Restore data to
user latch, drive
pins
Restore
complete?
Yes
Allow user access
to latch, normal
operation
No
Block new writes to
NV-Latch, user latch
27 March 2001 3/10
Page 4
Ramtron FM573/574
Functional Description - FM573
The FM573 is an octal transparent latch. The Qn
outputs track the Dn inputs while the Clock C signal
is logic 1. When the C signal goes to logic 0, the Dn
inputs are latched. In this aspect, the FM573 operates
identically to a conventional latch of the same type.
As shown above, it has the same functional truth
table as an ordinary 573-type product. The FM573 is
unique in its behavior during power up and power
down. It also is unique in providing behind the scenes
intelligence to manage the storage of settings.
Each latched state is compared to the stored
nonvolatile state. Comparison is made for each
individual bit. If any bit has changed from its stored
power is lost, the nonvolatile shadow-latches retain
the last latched state.
On power up, the ferroelectric latches are read. The
outputs of these latches will be placed on the internal
Dn inputs. The power control circuit will then cause
the internal ‘C’ signal to go high. This rising edge
passes the nonvolatile value instead of the external
input into the user register. The internal Clock will
then be released and the nonvolatile value will be
stored into the user register. This entire restore
process takes t
from VDD > V
RES
. After the
MIN
restored nonvolatile value is loaded into the user
register, normal operation begins. The first user write
should occur t
after VDD > V
PUH
MIN
.
value, the new bit value automatically is written to
the corresponding nonvolatile ferroelectric latch.
Only the changed bits are written. For the transparent
version, unlatched changes on the Qn outputs are not
written to nonvolatile storage. This operation
continues as long as power is within tolerance (above
V
). The nonvolatile circuit operates entirely in the
MIN
background and has no operating impact. When
power is lost, the nonvolatile shadow-latches retain
the final latched state.
On power up, the ferroelectric latches are read. The
outputs of these latches will be placed on the internal
Dn inputs. The power control circuit will then cause
the internal ‘C’ signal to go high. Rather than passing
the inputs signal to the output in transparent fashion,
it will pass the nonvolatile value instead. After
satisfying the minimum high clock-time, the internal
Clock is released and the nonvolatile value is loaded
into the user latch. This entire restore process takes
t
RES
from V
DD
> V
. After the restored nonvolatile
MIN
value is loaded into the user latch, normal operation
begins. The first user write should occur t
VDD > V
MIN
.
PUH
after
Applications
The FM573/FM574 runs at a speed that is
comparable to the industry standard HC family logic.
However, the nonvolatile -write operations, while fast
in nonvolatile memory terms, are slower. Therefore,
the nonvolatile logic runs ‘behind’ the user logic.
Three practical scenarios are identified in this data
sheet. One scenario that is not practical is to have
rapidly changing states, at high speed, continuing
indefinitely. For example, an address latch on a
microprocessor bus is not feasible due to limited
nonvolatile write endurance.
First, a free running clock in the kHz (or less) range
is applied to the FM574. In this application, the
nonvolatile logic can keep pace with state changes
and continue for relatively long periods to
indefinitely depending on the clock frequency. Slow
mechanisms such as relays and valves can be
controlled, and front panel interfaces can be made.
The second scenario is to employ an event driven
clock. The host issues one clock or a high-speed burst
as needed to an FM573 or FM574. In the case of a
Functional Description - FM574
The FM574 is an octal D-register. Its behavior is
similar to the FM573 except that Qn outputs do not
change until the rising edge of the Clock. On the
rising edge of the clock signal, the inputs are loaded
and passed to the Qn outputs. In this aspect, the
FM574 operates identically to a conventional latch of
the same type.
The latched state is compared to the stored
nonvolatile state fo r each bit. If any bit has changed
from its stored value, the new value automatically is
written to the nonvolatile ferroelectric latch. This
operation continues as long as power is within
tolerance. The nonvolatile circuit operates entirely in
the backgro und and has no operating impact. When
high speed burst, the nonvolatile logic may get
behind, but will catch up when the burst is
completed. A special variation is to connect the clock
input to a power-down reset device. This circuit
captures a snapshot of the inputs on power-down. In
this application, care must be taken in the system
design to avoid capturing the inputs on power -up and
thereby losing the old setting. A clock that is either
software generated or controlled by other logic may
be used as well.
The third scenario is to monitor a continuous data
stream and to hold it when an event occurs. This is
analogous to a nonvolatile track-and-hold function.
For this case, the hold signal is applied to an FM573.
Diagrams of these applications are shown below.
27 March 2001 4/10
Page 5
Ramtron FM573/574
Figure 3. Applications
kHz Control & Monitoring
a1
b1
VDD1
a2
b2
a3
b3
a4
b4
MCU
a1
b1
a2
b2
a3
b3
a4
b4GND
Timer output
= 1 kHz
Relay
0
7
Relay
D
D
0
7
FM574
Q
Q
FM574
Q
Q
D0
0
D7
7
Nonvolatile Track & Hold
Selector
Power-fail & Watchdog Reset
Event Capture
Microprocessor
RST
Dog
PB
TD
TOL
VDD
GND
8
4
FM574
Timing
ST
RST
RST
VDD
RST
7
6
5
4.5V
2.5V
2.0V
1232
1
2
3
D
D
0
7
FM574
Q
0
Q
7
4.5V
2.5V
2.0V
Joystick
A/D
DAC
DAC
D0-7
1
2
8
3
A
1
A
2
A
3
A
4
D
D
0
7
FM573
Q
0
To
Controller
Q
7
Hold
This figure is a conceptual illustration of different modes of operation, not a complete circuit design.
27 March 2001 5/10
Page 6
Ramtron FM573/574
Electrical Specifications
Absolute Maximum Ratings
Description Ratings
Ambient storage or operating temperature
Voltage on any pin with respect to ground -1.0V to +7.0V
D.C. output current on any pin TBD
Lead temperature (Soldering, 10 seconds)
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only, and the functional operation of the device at these or any other conditions above those listed in the
operational section of this specification is not implied. Exposure to absolute maximum ratings conditions for
extended periods may affect device reliability.
DC Operating Conditions TA = -40° C to + 85° C, VDD = 2.7V to 5.5V unless otherwise specified
Symbol Parameter Min Typ Max Units Notes
VDD Main Power Supply 2.7 5.5 V 1
V
State change blocked/restored 2.40 2.5 2.54 V 1,8
MIN
ISB Quiescent Supply Current 125
I
Dynamic Supply Current
DDDY
ex. 3.3V, 10 MHz, 8 inputs
I
State Change Supply Current 500
DDNV
ILI Input Leakage Current 10
ILO Output Leakage Current 10
VIL Input Low Voltage -0.3 0.3*VDD V 1
VIH Input High Voltage 0.7*VDD VDD + 0.5 V 1
VOH Output High Voltage
@ IOH = -8 mA VDD>4V
@ IOH = -8 mA VDD<4V
VOL Output Low Voltage
@ IOL = 8 mA
Notes
1. Referenced to VSS.
2. C = VSS, all other inputs at VDD or VSS
3. Dynamic supply current depends on the clock frequency, the frequency of inputs toggling, and the number of
bits toggling. In the formula, V = VDD; f is clock frequency; n is the number of bits switching. The Dn inputs
toggle at approximately a 50% duty-cycle at ½ of the frequency of C and comply with the minimum setup time.
Outputs are tri-stated. All input levels at VDD and VSS. If C is static but the inputs toggle (573 in transparent
mode), then the f should be the frequency of the inputs.
4. In a realistic system, the IDD needed to drive the loads also should be considered. IL = CL*V*fo *n where CL is
the load capacitance, V is the output swing voltage, fo is the output frequency, and n is the number of bits
switching.
5. Changes in state cause a nonvolatile write which adds a DC current component to the static power or dynamic
for the duration of the nonvolatile write operation. The total current consumption after each state change = ISB +
I
DDNV
+ I
. After the state change is recorded, total current consumption = ISB + I
DDDY
6. VIN or VOUT = VSS to VDD
7. This parameter is characterized but not tested.
8. All state changes will be ignored when VDD is below V
restored from the nonvolatile latch.
-40°C to + 85°C
300° C
2
3,4,5
5
6
6
20pF*V*f*n
5.28
V 1,7
µA
A
mA
µA
µA
µA
VDD-0.8
VDD-1.0
0.8 V 1,7
DDDY.
. VDD rising above V
MIN
causes the user latch to be
MIN
27 March 2001 6/10
Page 7
Ramtron FM573/574
AC Parameters TA = -40° C to + 85° C, CL = 50 pF unless otherwise specified
Propagation delay C to Qn
tEN Output enable time /OE to Qn 70 28 ns
t
Output disable /OE to Qn Hi-Z 60 25 ns 1
DIS
tDS Data setup Dn to C low (573)
5 5 ns
Data setup Dn to C ↑ (574)
tDH Data hold Dn after C low (573)
7 5 ns
Data hold after C high (574)
Notes:
1 This parameter is characterized but not tested.
Power Cycling and Data Retention TA = -40° C to + 85° C, VDD = 2.7V to 5.5V unless otherwise specified
VDD=2.7V – 3.6V VDD=5.0V +/- 10%
Symbol Parameter Min Max Min Max Units Notes
Nonvolatile data retention 1 1 Year 1
Latched state changes 1E10 1E10 Changes 2
t
Last state change to V
PDS
t
RES
t
PUH
V
V
to output valid 1 1
MIN
to first user write 1.5 1.5
MIN
2 1
MIN
µS
µS
µS
3
4
4,5
Notes:
1. Data retention is measured from the last state change, and is the time that a state will be retained at 85° C and
correctly restored on power-up. The process of powering up (and reading the nonvolatile state) refreshes the
store d state and re-starts the data retention period even if the state is unchanged.
2. The nonvolatile elements are written when the latched state changes. Changes on either Dn or Qn that are not
latched have no effect.
3. The last write to the nonvolatile latch element must occur prior to reaching V
4. After the power supply reaches approximately V
during a power up, the nonvolatile latch is read and the
MIN
during a power down.
MIN
value restored to the user latch. This spec. provides the time needed to restore the FM573/FM574 pins to the
restored state depending on the state of /OE.
5. The user should not attempt to write during the restore process. In particular, powering up in transparent mode
(FM573) defeats the purpose of using a nonvolatile latch.
Capacitance TA = 25° C , f=1.0 MHz, VDD = 5V
Symbol Parameter Max Units Notes
CIN Input capacitance 6 pF 1
Notes
1 This parameter is characterized but not tested. Equivalent AC Load Circuit
AC Test Conditions
1.3V
Input Pulse Levels 0.1VDD to 0.9VDD
Input rise and fall times 10 ns
Input and output timing levels 0.3VDD, 0.7 VDD
Output
3300Ω
50 pF
27 March 2001 7/10
Page 8
Ramtron FM573/574
FM573 Timing
1/f
t
CW
MAX
C
t
DS
t
DH
FM574 Timing
Dn
Qn
OE
C
Dn
Qn
D1D2
t
PD
D1D2
t
DS
old
t
t
PD
EN
D1
old
t
EN
1/f
MAX
t
t
DIS
t
CW
t
DH
PD
D1
t
DIS
OE
Power Cycle Timing (574-timing shown)
~
~
~
~
~
~
~
~
t
RES
V
MIN
t
PUH
D0D1
Q0Q1
Dn
Qn
VDD
C
D0D1DLAST
Q0Q1QLASTQLAST
V
t
PDS
MIN
27 March 2001 8/10
Page 9
Ramtron FM573/574
α
20-pin SOP
Index
Area
EH
Pin 1
D
A
B
e
A1
.10 mm
.004 in.
h
45
L
C
Controlling dimensions is in millimeters . Conversions to inches are
not exact.
Symbol Dim Min Nom. Max
A mm
in.
A1 mm
in.
B mm
in.
C mm
in.
D mm
in.
E mm
in.
e mm
in.
H mm
in.
h mm
in.
L mm
in.
α
2.35
2.65
0.0926
0.10
0.30
0.004
0.33
0.51
0.013
0.23
0.32
0.0091
12.6
13.0
0.4961
7.40
7.60
0.2914
1.27 BSC
0.050 BSC
10.00
10.65
0.394
0.25
0.75
0.010
.40
1.27
0.016
0°
0.1043
0.0118
0.020
0.0125
0.5118
0.2992
0.419
0.029
0.050
8°
27 March 2001 9/10
Page 10
Ramtron FM573/574
20-pin DIP
E1
Index
Area
D
A2
A1
D1
Controlling dimensions is in inches. Conversions to millimeters are
not exact.
e
Symbol Dim Min Nom. Max
A in.
A1 in.
A2 in.
B in.
B2 in.
D in.
E in.
E1 in.
e in.
eA in.
eB in.
mm
mm
mm
mm
mm
mm
mm
mm
mm
mm
mm
b
B1
.140
3.56
.015
.381
.120
3.05
.015
.381
.055
1.40
.970
24.64
.280
7.11
.250
6.35
.090
2.29
.300 BSC
.310
7.87
.190
4.83
.060
1.52
.140
3.56
.020
.508
.065
1.65
1.04
26.42
.325
8.26
.270
6.86
.100
2.54
7.62 BSC
.385
.110
2.79
9.78
E
A
eA
eB
27 March 2001 10/10
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