This P-Channel 2.5V specified MOSFET is a rugged
gate version of Fairchild Semiconductor’s advanced
PowerTrench process. It is combined with a low
forward drop Schottky diode which is isolat ed from the
MOSFET, providing a compact power solution for
asynchronous DC/DC converter appli cations.
Applications
• DC/DC conversion
A
A
A
C
G
S
S
D
TSSOP-8
Pin 1
MOSFET Absolute Maximum RatingsT
Features
• –3.5 A, –20 V. R
R
• V
< 0.55 V @ 1 A
F
• High performance trench te chnology for extremely
low R
• Low profile TSSOP-8 package
DS(ON)
5
6
7
8
= 0.045 Ω @ VGS = –4.5 V
DS(ON)
= 0.075 Ω @ VGS = –2.5 V
DS(ON)
4
3
2
1
o
=25
C unless otherwise noted
A
Symbol Parameter Ratings Units
V
Drain-Source Voltage
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1)
– Pulsed
PD
TJ, T
STG
MOSFET Power Dissipation (minimum pad)
Schottky Power Dissi pation (minimum pad)
Operating and Storage Junction Temperature Range -55 to +150
(Note 1)
(Note 1)
–20
± 12
–3.5
–30
1.2
1.0
V
V
A
W
°C
Schottky Maximum Ratings
V
Repetitive Peak Reverse Volt age 20 V
RRM
IF Average Forward Current 1.5 A
IFM Peak Forward Current 30 A
Symbol Parameter Test Conditions MinTyp Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆T
I
Zero Gate Voltage Drain Current VDS = –16 V, VGS = 0 V –1
DSS
I
GSSF
I
GSSR
Breakdown Voltage Temperature
Coefficient
J
Gate–Body Leakage, Forward VGS = –12 V, VDS = 0 V –100 nA
Gate–Body Leakage, Reverse VGS = 12 V, VDS = 0 V 100 nA
V
= 0 V, ID = –250 µA
GS
= –250 µA, Referenced to25°C
I
D
–20 V
–16
mV/°C
µA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = –4.5 V, VDS = –5 V –15 A
D(on)
V
= VGS, ID = –250 µA
DS
= –250 µA, Referenced to25°C
I
D
V
= –4.5 V, ID = –3.5 A
GS
= –2.5 V, ID = –2.7 A
V
GS
=–4.5 V, ID =–3.5A, TJ=125°C
V
GS
–0.6 –1.0 –1.5 V
3
36
56
49
45
75
72
mV/°C
mΩ
gFS Forward Transconductance VDS = –5 V, ID = –3.5A 13.2 S
Dynamic Characteristics
C
Input Capacitance 1030 pF
iss
C
Output Capacitance 280 pF
oss
C
Reverse Transfer Capacitance
rss
= –10 V, V
V
DS
f = 1.0 MHz
= 0 V,
GS
120 pF
Switching Characteristics (Note 2)
t
Turn–On Delay Time 11 20 ns
d(on)
tr Turn–On Rise Time 18 32 ns
t
Turn–Off Delay Time 34 55 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 9.7 16 nC
Qgs Gate–Source Charge 2.2 nC
Qgd Gate–Drain Charge
= –5 V, ID = –1 A,
V
DD
= –4.5 V, R
V
GS
V
= –5V, ID = –3.5 A,
DS
= –4.5 V
V
GS
GEN
= 6 Ω
34 55 ns
2.4 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current –1.25 A
VSD Drain–Source Diode Forward
VGS = 0 V, IS = –1.25 A (Note 2) –0.6 –1.2 V
Voltage
I
Gate–Body Leakage, Reverse VGS = 12 V, VDS = 0 V 100 nA
GSSR
Schottky Diode Characteristics
IR Reverse Leakage VR = 20V
VF Forward Voltage IF = 1A
TJ=25°C
T
=125°C
J
TJ=25°C
T
=125°C
J
CT Junction Capacitance VR = 10V 50 pF
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the so lder mounting surface of
θJA
the drain pins. R
R
is 115 °C/W for the MOSFET and 130°C/W for the Schottky Diode when mounted on a minimum pad.
Thermal characterization performed using the conditions described in Note 1.
Transient thermal response will change depending on the circuit board design.
FDW6923 Rev . D (W)
Page 5
TRADEMARKS
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not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
â
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H5
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