Figure 7. Breakdown Voltage VariationFigure 8. On-Resistance Variation
vs. Temperature vs. Temperature
1.2
2.4
FDP5800 N-Channel Logic Level PowerTrench
1.1
2.0
1.6
1.0
, [Normalized]
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100-50050100150200
TJ, Junction Temperature [oC]
* Notes :
1. V
GS
2. I
= 250µA
D
= 0V
, [Normalized]
1.2
DS(on)
r
0.8
Drain-Source On-Resistance
0.4
-80-4004080120160200
TJ, Junction Temperature [oC]
Figure 9. Maximum Safe Operating AreaFigure 10. Maximum Drain Current
vs. Case Temperature
3
10
2
10
Operation in This Area
, Drain Current [A]
1
D
is Limited by R
I
10
0
10
0
10
DS(on)
* Notes :
= 25oC
1. T
C
2. T
= 175oC
J
3. Single Pulse
1
VDS, Drain-Source Voltage [V]
10
20µs
100µs
1ms
10ms
DC
10
2
125
CURRENT LIMITED
100
BY PACKAGE
75
50
, Drain Current [A]
D
I
25
0
255075100125150175
TC, Case Temperature [oC]
Figure 11. Transient Thermal Response Curve
1
D = 0.5
* Notes :
1. V
GS
2. I
= 80A
D
= 10V
®
MOSFET
FDP5800 Rev. A
(t),Thermal Response
θJC
Z
0.1
0.01
1E-3
10
0.2
0.1
0.05
0.02
0.01
-5
Single pulse
-4
10
* Notes :
1. Z
2. Duty Factor, D=t
3. TJM - TC = PDM * Z
10
-3
10
-2
10
-1
10
t1, Square Wave Pulse Duration [sec]
4
P
DM
t
1
(t) = 0.62oC/W Max.
θJC
0
10
t
2
1/t2
(t)
θJC
1
10
2
www.fairchildsemi.com
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDP5800 N-Channel Logic Level PowerTrench
Unclamped Inductive Switching Test Circuit & Waveforms
®
MOSFET
FDP5800 Rev. A
5
www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
g
p
g
p
+
+
V
V
DS
DS
_
_
L
LL
Sam e Type
Sam e Type
as DU T
as DU T
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontrolled by pulse period
•ISDcontrolled by pulse period
G
G
V
V
GS
GS
R
R
Driver
Driver
G
G
DUT
DUT
I
I
SD
SD
V
V
DD
DD
FDP5800 N-Channel Logic Level PowerTrench
®
MOSFET
V
V
GS
GS
( D riv e r )
( D riv e r )
I
I
SD
SD
( D U T )
( D U T )
V
V
DS
DS
( DUT )
( DUT )
G ate P ulse W idth
G ate P ulse W idth
G ate P ulse W idth
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, B ody D iode Forw ard C urrent
IFM, B ody D iode Forw ard C urrent
I
I
RM
RM
Body D iode Reverse C urrent
Body D iode Reverse C urrent
Body D iode R ecovery dv/dt
Body D iode R ecovery dv/dt
V
V
SD
SD
Body Diode
Body Diode
Forw ard Volta
Forw ard Volta
e D ro
e D ro
di/dt
di/dt
10V
10V
V
V
DD
DD
FDP5800 Rev. A
6
www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDP5800 N-Channel Logic Level PowerTrench
TO-220
(1.70)
9.20 ±0.2013.08 ±0.20
1.30 ±0.10
(1.46)
(1.00)
1.27 ±0.10
9.90 ±0.20
(8.70)
ø3.60 ±0.10
(3.70)(3.00)
(45°)
1.52 ±0.10
2.80 ±0.1015.90 ±0.20
18.95MAX.
4.50 ±0.20
+0.10
1.30
–0.05
®
MOSFET
FDP5800 Rev. A
2.54TYP
±0.20]
[2.54
10.00 ±0.20
0.80 ±0.10
2.54TYP
±0.20]
[2.54
10.08 ±0.30
+0.10
0.50
–0.05
7
2.40 ±0.20
www.fairchildsemi.com
Page 8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
ACEx™
ActiveArray™
Bottomless™
Build it Now™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO
IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE
OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE
RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS,
SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT
THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body, or (b) support
or sustain life, or (c) whose failure to perform when properly used
in accordance with instructions for use provided in the labeling,
can be reasonably expected to result in significant injury to the
2. A critical component is any component of a life support device
or system whose failure to perform can be reasonably expected
to cause the failure of the life support device or system, or to
affect its safety or effectiveness.
user.
®
UniFET™
UltraFET
VCX™
Wire™
®
FDP5800 N-Channel Logic Level PowerTrench
®
MOSFET
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
ObsoleteNot In ProductionThis datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
FDP5800 Rev. A
Rev. I21
www.fairchildsemi.com8
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.