Datasheet FDMS015N04B Datasheet (Fairchild)

Page 1
FDMS015N04B
N-Channel PowerTrench® MOSFET
40V, 100A, 1.5mW
FDMS015N04B N-Channel PowerTrench
February 2012
Features
• R
• Advanced Package and Silicon Combination for Low R
• Fast Switching Speed
• 100% UIL Tested
• RoHS Compliant
= 1.13mW (Typ.)@ VGS = 10V, ID = 50A
DS(on)
and High Efficiency
Top
Power 56
Bottom
D
D
D
D
DS(on)
S
S
Description
This N-Channel MOSFET is produced using Fairchild Semiconductor’s advance PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
Application
• Synchronous Rectification for Server / Telecom PSU
• Battery Charger and Battery Protection circuit
• DC motor drives and Uninterruptible Power Supplies
• Micro Solar Inverter
S
Pin 1
G
D
5
D
6
D
7
8
D
G
4
S
3
S
2
S
1
®
MOSFET
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GSS
I
D
I
DM
E
AS
P
D
TJ, T
STG
Drain to Source Voltage 40 V
Gate to Source Voltage ±20 V
Drain Current
Drain Current - Pulsed (Note 2) 400 A
Single Pulsed Avalanche Energy (Note 3) 526 mJ
Power Dissipation
Operating and Storage Temperature Range -55 to +150
= 25oC unless otherwise noted*
- Continuous (TC = 25oC) 100
- Continuous (TA = 25oC) (Note 1) 31.3
(TC = 25oC) 104 W
(TA = 25oC) (Note 1) 2.5 W
Thermal Characteristics
Symbol Parameter
R
qJC
R
qJA
©2012 Fairchild Semiconductor Corporation FDMS015N04B Rev. C1
Thermal Resistance, Junction to Case 1.2
Thermal Resistance, Junction to Ambient (Note 1) 50
1
Ratings
A
o
C
Units
o
C/W
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Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDMS015N04B FDMS015N04B Power 56 13 ” 12 mm 3000 units
FDMS015N04B N-Channel PowerTrench
Electrical Characteristics T
= 25oC unless otherwise noted
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BV DBV
DT I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = 250mA, VGS = 0V 40 - - V Breakdown Voltage Temperature
Coefficient Zero Gate Voltage Drain Current VDS = 32V, V
Gate to Body Leakage Current VGS = ±20V, V
ID = 250mA, Referenced to 25oC - 37 - mV/oC
= 0V - - 1 mA
GS
= 0V - - ±100 nA
DS
On Characteristics
V
GS(th)
R
DS(on)
g
FS
Gate Threshold Voltage VGS = VDS, ID = 250mA 2.0 - 4.0 V
Static Drain to Source On Resistance VGS = 10V, ID = 50A - 1.13 1.5 mW
Forward Transconductance
VDS = 5V, ID = 50A
- 171 - S
Dynamic Characteristics
C
iss
C
oss
C
rss
C
(er) Engry Releted Output Capacitance VDS = 20V, VGS = 0V - 3896 - pF
oss
Q
g(tot)
Q
gs
Q
gs2
Q
gd
Input Capacitance
Output Capacitance - 2795 3720 pF
Reverse Transfer Capacitance - 162 - pF
VDS = 20V, VGS = 0V f = 1MHz
Total Gate Charge at 10V
Gate to Source Gate Charge - 26 - nC
Gate Charge Threshold to Plateau - 9 - nC
Gate to Drain “Miller” Charge - 16 - nC
VDS = 20V, ID = 50A VGS = 0V to 10V
(Note 4)
- 6560 8725 pF
- 91 118 nC
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
ESR Equivalent Series Resistance Drain Open, f = 1MHZ - 1.4 - W
Turn-On Delay Time
Turn-On Rise Time - 24 58 ns
Turn-Off Delay Time - 71 152 ns
Turn-Off Fall Time - 26 62 ns
VDD = 20V, ID = 50A VGS = 10V, R
(Note 4)
GEN
= 4.7W
- 34 78 ns
®
MOSFET
Drain-Source Diode Characteristics
I
S
I
SM
V
SD
t
rr
Q
rr
Notes:
1.R
is determined with the device mounted on a 1in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
qJA
the user's board design.
2. Repetitive Rating: Pulse width limited by maximum junction temperature
3. L = 3mH, IAS = 18.72A, Starting TJ = 25°C
4. Essentially Independent of Operating Temperature Typical Characteristics
FDMS015N04B Rev. C1
Maximum Continuous Drain to Source Diode Forward Current - - 100 A
Maximum Pulsed Drain to Source Diode Forward Current - - 400 A
Drain to Source Diode Forward Voltage VGS = 0V, I
Reverse Recovery Time
Reverse Recovery Charge - 90 - nC
a. 50 °C/W when mounted on a 1 in2 pad of 2 oz copper.
= 50A - - 1.3 V
SD
VGS = 0V, I
SD
= 50A
dIF/dt = 100A/ms
qJC
2
- 78 - ns
is guaranteed by design while R
b. 125 °C/W when mounted on a minimum pad of 2 oz copper.
is determined by
qCA
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Page 3
Typical Performance Characteristics
VGS, Gate-Source Voltage
[V]
400
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
500
400
*Notes:
1. VDS = 10V
2. 250ms Pulse Test
100
FDMS015N04B N-Channel PowerTrench
100
V
= 15.0V
GS
10.0V
, Drain Current[A]
D
I
10
0.1 1 2
*Notes:
1. 250ms Pulse Test
2. TC = 25oC
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
150oC
10
, Drain Current[A]
D
I
1
2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
25oC
-55oC
VDS, Drain-Source Voltage[V]
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperature
1.3
1.2
VGS = 10V
1.1
[mW],
DS(ON)
R
VGS = 20V
1.0
Drain-Source On-Resistance
*Note: TC = 25oC
0.9 0 50 100 150 200 250 300
ID, Drain Current [A]
100
150oC
25oC
10
, Reverse Drain Current [A]
S
I
1
0.2 0.4 0.6 0.8 1.0 1.2
*Notes:
1. VGS = 0V
2. 250ms Pulse Test
VSD, Body Diode Forward Voltage [V]
®
MOSFET
FDMS015N04B Rev. C1
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
10000
1000
*Note:
1. VGS = 0V
Capacitances [pF]
2. f = 1MHz
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
100
C
rss
50
0.1 1 10 40
= C
gd
gd
VDS, Drain-Source Voltage [V]
C
iss
C
oss
C
rss
10
8
VDS = 8V VDS = 20V VDS = 32V
6
4
, Gate-Source Voltage [V]
GS
V
2
*Note: ID = 50A
0
0 25 50 75 100
Qg, Total Gate Charge [nC]
3
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Page 4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
1.12
1.08
1.7
1.6
1.4
FDMS015N04B N-Channel PowerTrench
1.04
, [Normalized]
1.00
DSS
BV
0.96
Drain-Source Breakdown Voltage
0.92
-80 -40 0 40 80 120 160 TJ, Junction Temperature [oC]
*Notes:
1. VGS = 0V
2. ID = 250mA
1.2
, [Normalized]
1.0
DS(on)
R
0.8
Drain-Source On-Resistance
0.6
-80 -40 0 40 80 120 160 TJ, Junction Temperature [oC]
*Notes:
1. VGS = 10V
2. ID = 50A
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Ambient Temperature
1000
100
10
Operation in This Area
1
is Limited by R
, Drain Current [A]
D
I
*Notes:
1. TC = 25oC
0.1
2. TJ = 150oC
3. Single Pulse
0.01
0.01 0.1 1 10 100
DS(on)
VDS, Drain-Source Voltage [V]
10ms
100ms
DC
1ms
120
VGS= 10V
80
40
, Drain Current [A]
D
I
R
= 1.2oC/W
qJC
0
25 50 75 100 125 150
TC, Case Temperature [oC]
Figure 11. Eoss vs. Drain to Source Voltage Figure 12. Unclamped Inductive Switching Capability
2.0
1.5
50
If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS-VDD) If R = 0 tAV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]
®
MOSFET
, [mJ]
1.0
OSS
E
0.5
0
0 10 20 30 40
VDS, Drain to Source Voltage [V]
FDMS015N04B Rev. C1
10
, Avalanche Current [A]
AS
I
4
STARTING TJ = 125oC
1
0.1 1 10 100 1000
tAV, Time In Avalanche [ms]
STARTING TJ = 25oC
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Page 5
Typical Performance Characteristics (Continued)
Figure 13. Transient Thermal Response Curve
FDMS015N04B N-Channel PowerTrench
]
2
qJA
1
0.5
0.2
0.1
0.1
0.05
0.02
0.01
0.01
Single pulse
0.005
Thermal Response [Normalized] [Z
0.01 0.1 1 10 100 1000
P
*Notes:
1. Z
2. Duty Factor, D= t1/t
3. TJM - TC = PDM * Z
Rectangular Pulse Duration [sec]
DM
t
(t) = 125oC/W Max.
qJA
1
t
2
2
qJC
(t)
®
MOSFET
FDMS015N04B Rev. C1
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Page 6
Gate Charge Test Circuit & Waveform
FDMS015N04B N-Channel PowerTrench
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
®
MOSFET
FDMS015N04B Rev. C1
6
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Page 7
Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
DUT
DUT
I
I
SD
SD
Driver
Driver
R
R
G
G
V
V
GS
GS
+
V
V
DS
DS
_
_
L
LL
Same Type
Same Type
as DUT
as DUT
• dv/dt controlled by R
• dv/dt controlled by R
• ISDcontrolled by pulse period
• ISDcontrolled by pulse period
G
G
FDMS015N04B N-Channel PowerTrench
V
V
DD
DD
®
MOSFET
V
V
GS
GS
( Driver )
( Driver )
I
I
SD
SD
( DUT )
( DUT )
V
V
DS
DS
( DUT )
( DUT )
Gate Pulse Width
Gate Pulse Width
Gate Pulse Width
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forward Current
IFM, Body Diode Forward Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode Recovery dv/dt
Body Diode Recovery dv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Voltage Drop
Forward Voltage Drop
di/dt
di/dt
10V
10V
V
V
DD
DD
FDMS015N04B Rev. C1
7
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Page 8
Dimensional Outline and Pad Layout
FDMS015N04B N-Channel PowerTrench
®
MOSFET
FDMS015N04B Rev. C1
8
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Page 9
TRADEMARKS
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.
2Cool™ AccuPower™ Auto-SPM™ AX-CAP™*
®
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®
®
ESBC™
®
®
Fairchild Fairchild Semiconductor FACT Quiet Series™
®
FACT
®
FAST FastvCore™ FETBench™ FlashWriter® *
®
FPS™ F-PFS™
®
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®
®
®
SM
PDP SPM™ Power-SPM™ PowerTrench PowerXS™ Programmable Active Droop™ QFET QS™ Quiet Series™ RapidConfigure™
®
®
Saving our world, 1mW/W/kW at a time™ SignalWise™ SmartMax™ SMART START™ Solutions for Your Success™
®
SPM STEALTH™ SuperFET SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS SyncFET™ Sync-Lock™
®
®
®*
The Power Franchise
TinyBoost™ TinyBuck™ TinyCalc™
®
TinyLogic TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™
®
TranSiC TriFault Detect™ TRUECURRENT®* mSerDes™
®
UHC Ultra FRFET™ UniFET™ VCX™ VisualMax™ VoltagePlus™ XS™
®
®
FDMS015N04B N-Channel PowerTrench
®
MOSFET
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device o r system, or to affect its safety or effectiveness.
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support. Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards f or handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
FDMS015N04B Rev. C1
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
9
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Rev. I58
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