These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and
commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor
correction.
Figure 7. Breakdown Voltage VariationFigure 8. On-Resistance Variation
vs. Temperature vs. Temperature
FDB44N25 250V N-Channel MOSFET
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100-50050100150200
Notes :
※
1. VGS = 0 V
2. I
TJ, Junction Temperature [oC]
= 250 µA
D
3.0
2.5
2.0
1.5
, (Normal ized)
1.0
DS(ON)
R
Drain-S ource On-Resistance
0.5
0.0
-100-50050100150200
TJ, Junction Temperature [oC]
Notes :
※
1. VGS = 10 V
= 22 A
2. I
D
Figure 9. Maximum Safe Operating AreaFigure 10. Maximum Drain Current
vs. Case Temperature
3
10
2
10
1
10
Operation in This Area
0
10
, Drain Current [A]
D
I
-1
10
-2
10
10
is Limited by R
0
10 ms
100 ms
DC
DS(on)
Notes :
※
1. TC = 25 oC
2. T
3. Single Pulse
1
10
VDS, Drain-Source Voltage [V]
1 ms
= 150 oC
J
10
100 µs
2
10 µs
50
40
30
20
, Drain Current [A]
D
I
10
0
255075100125150
TC, Case Te mperature [ ]
℃
Figure 11. Transient Thermal Response Curve
D=0.5
-1
10
0.2
FDB44N25 Rev A
0.1
0.05
0.02
-2
0.01
10
(t), Thermal Response
θ JC
Z
-5
10
single pulse
-4
10
-3
10
10
t1, S q ua re W av e P u lse Du ra tion [s e c ]
N o te s :
※
1. Z
(t) = 0.41 /W M ax.
2. D uty F a c to r , D = t1/t
3. TJM - TC = PDM * Z
P
DM
-2
θ JC
10
℃
θ JC
t
1
t
2
-1
4www.fairchildsemi.com
2
(t)
0
10
1
10
Page 5
12V
12V
200nF
200nF
3mA
3mA
50K
50K
FDB44N25 250V N-Channel MOSFET
Gate Charge Test Circuit & Waveform
V
V
GS
DS
DS
GS
10V
10V
Q
Q
g
g
Q
Q
gs
gs
Q
Q
gd
gd
Charge
Charge
Same Type
Ω
Ω
300nF
300nF
V
V
GS
GS
Same Type
as DUT
as DUT
DUT
DUT
V
V
Resistive Switching Test Circuit & Waveforms
10V
10V
10V
10V
R
R
L
DUT
DUT
L
V
V
DD
DD
V
V
DS
DS
V
V
GS
GS
R
R
G
G
V
V
DS
DS
90%
90%
10%
10%
V
V
GS
GS
t
t
d(on)tr
d(on)tr
t
t
on
on
t
t
d(off)
d(off)
t
t
f
f
t
t
off
off
Unclamped Inductive Switching Test Circuit & Waveforms
BV
BV
DSS
L
LL
V
V
DS
DS
BV
BV
DSS
V
V
DSS
I
I
AS
AS
DD
DD
I
IDI
D
D
R
R
G
G
DUT
DUT
t
t
p
p
V
V
DD
DD
1
1
1
1
----
----
----
----
E
E
=LI
E
=LI
=LI
AS
AS
AS
2
2
2
2
2
2
2
AS
AS
AS
I
I
(t)
(t)
D
D
t
t
p
p
DSS
--------------------
-------------------BV
BV
DSS-VDD
DSS-VDD
Time
Time
V
(t)
V
(t)
DS
DS
FDB44N25 Rev A
5www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
DUT
DUT
I
I
SD
SD
Driver
Driver
R
R
G
G
V
V
GS
GS
+
V
V
DS
DS
_
_
L
LL
Same Type
Same Type
as DUT
as DUT
• dv/dt controlled by R
• dv/dt controlled by R
•ISDcontroll ed by pulse period
•ISDcontroll ed by pulse period
G
G
Preliminary
V
V
DD
DD
FDB44N25 250V N-Channel MOSFET
V
V
GS
GS
( Driver )
( Driver )
I
I
SD
SD
( DUT )
( DUT )
V
V
DS
DS
( DUT )
( DUT )
Gate Pulse Width
Gate Pulse Width
Gate Pulse Width
--------------------------
--------------------------
--------------------------
D =
D =
D =
Gate Pulse Period
Gate Pulse Period
Gate Pulse Period
IFM, Body Diode Forward Current
IFM, Body Diode Forward Current
I
I
RM
RM
Body Diode Reverse Current
Body Diode Reverse Current
Body Diode Recoverydv/dt
Body Diode Recoverydv/dt
V
V
SD
SD
Body Diode
Body Diode
Forward Voltage Drop
Forward Voltage Drop
di/dt
di/dt
10V
10V
V
V
DD
DD
FDB44N25 Rev A
6www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDB44N25 250V N-Channel MOSFET
D2-PAK
FDB44N25 Rev A
7www.fairchildsemi.com
Page 8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
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2
E
CMOS™
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Across the board. Around the world.™
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE T O ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PA TENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I16
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