Where EMI filtering in ESD sensitive equipment is
required :
Mobile phones and communication systems
■
Computers, printers and MCU Boards
■
DESCRIPTION
The EMIF02-MIC02 is a highly integrated devices
designed to suppress EMI/RFI noise in all systems
subjected to electromagnetic interferences. The EMIF02
flip chip packaging means the packagesize is equal to the
die size.
This filter includes an ESD protection circuitry which
prevents the device from destruction when subjected to
ESD surges up 15kV.
BENEFITS
EMI symmetrical (I/O) low-pass filter
■
High efficiency in EMI filtering
■
■ Very low PCB space consuming: 1.07mm x 1.57mm
■ Very thin package: 0.65 mm
■ High efficiency in ESD suppression
■ High reliability offered by monolithic integration
■
High reducing of parasitic elements through integration
& wafer level packaging.
EMIF02-MIC02F1
2 LINES EMI FILTER
AND ESD PROTECTION
Flip Chip package
PIN CONFIGURATION (ball side)
123
GND
I2
AI1
COMPLIES WITHTHEFOLLOWINGSTANDARDS:
IEC61000-4-2
Level 4 on input pins15kV(air discharge)
8 kV(contact discharge)
Level 1 on output pins2kV(airdischarge)
2kV(contact discharge)
MIL STD 883E - Method 3015-6 Class 3
BASIC CELL CONFIGURATION
Low-pass Filter
Input
GNDGNDGND
TM : IPAD is a trademark of STMicroelectronics.
September 2003 - Ed: 4A
O2
GND
Output
O1
Ri/o = 470
B
Ω
Cline = 16pF
1/6
Page 2
EMIF02-MIC02F1
ABSOLUTE RATINGS (limiting values)
SymbolParameter and test conditionsValueUnit
T
j
T
op
T
stg
Maximum junction temperature
Operating temperature range
Storage temperature range
125°C
-40 to + 85°C
-55 to 150°C
ELECTRICAL CHARACTERISTICS (T
Symbol
V
BR
I
RM
V
RM
V
CL
R
d
I
PP
R
I/O
C
line
Breakdown voltage
Leakage current @ V
Stand-off voltage
Clamping voltage
Dynamic impedance
Peak pulse current
Series resistance between Input & Output
Input capacitance per line
Parameter
RM
=25°C)
amb
VCL
I
I
PP
IR
IRM
VRMVBR
IRM
IR
IPP
VCL
VBRVRM
SymbolTest conditionsMin.Typ.Max.Unit
V
BR
I
RM
R
I/O
C
line
IR=1mA
VRM= 12V per line
@0V
1416V
500nA
423470517Ω
16pF
V
Fig. 1: S21(dB) attenuation measurement and
Aplac simulation.
- 10.00
dB
dB
- 15.00
- 20.00
- 25.00
- 30.00
- 35.00
- 40.00
- 45.00
- 50.00
1.0M3.0M10.0M 30.0M 100.0M 300.0M1.0G3.0G
f/Hz
2/6
Measurement
Simulation
Fig. 2: Analog crosstalk measurements.
-20.00
dB
-30.00
-
-40.00
-
-50.00
-
-60.00
-
-70.00
-
-80.00
-
1.0M3.0M10.0M 30.0M100.0M 300.0M1.0G3.0G
f/Hz
I2/O1
Page 3
EMIF02-MIC02F1
Fig. 3: Digital crosstalk measurement.
Fig. 5: ESD response to IEC61000-4-2 (-15kV air
discharge) on one input V(in) and on one output
(Vout).
Fig. 4: ESD response to IEC61000-4-2 (+15kV air
discharge) on one input V(in) and on one output
(Vout).
Fig. 6: Line capacitance versus applied voltage.
C(pF)
20
18
16
14
12
10
8
6
4
2
0
0123456789101112
V (V)R
V
F=1MHz
=30mV
osc
Tj=25°C
RMS
3/6
Page 4
EMIF02-MIC02F1
Aplac model.
I1
Cox
MODEL = D01-ext
Rsubump
Rsubump
MODEL = D01-ext
Cox
I2
Aplac parameters.
Model D01-ext
BV = 7
CJO = Cz_ext
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N = 1
M = 0.3333
RS = Rs_ext
VJ = 0.6
TT = 50n
R_470R
MODEL = D01-int
MODEL = D01-int
R_470R
EMIF02-MIC02F1 model
Cox
Rsubump
MODEL = D01-gnd
Rsubump
Cox
Model D01-int
BV = 7
CJO = Cz_int
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N = 1
M = 0.3333
RS = Rs_int
VJ = 0.6
TT = 50n
O1
gnd
O2
Model D01-gnd
BV = 7
CJO = Cz_gnd
IBV = 1u
IKF = 1000
IS = 10f
ISR = 100p
N = 1
M = 0.3333
RS = Rs_gnd
VJ = 0.6
TT = 50n
Note: More packing informations are available in the application note AN1235: ''Flip-Chip: Package description and
recommandations for use''
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