Datasheet DM7426N, DM7426CW Datasheet (Fairchild Semiconductor)

© 2000 Fairchild Semiconductor Corporation DS006508 www.fairchildsemi.com

August 1986
Revised February 2000

DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs

DM7426
Quad 2-Input NAND Gates with

High Voltage Open-Collector Outputs

General Description

This device contains four independent gates each of which
performs the logic NA ND functio n. The open -collector out­puts require external pull-up resistors for proper logical
operation.

Pull-Up Resistor Equations

Where: N1 (IOH) = total maximum output high c urrent

for all outputs tied to pull-up resistor

N

2

(IIH) = total maximum input high current for
all inputs tied to pull-up resistor
N

3

(IIL) = total maximum input low current for
all inputs tied to pull-up resistor

Ordering Code:

Connection Diagram Function Table

Y = AB

H = HIGH Logic Level
L = LOW Logic Level

Order Number Package Number Package Description

DM7426N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Inputs Output

ABY

LLH
LHH
HLH
HHL

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DM7426

Absolute Maximum Ratings(Note 1)

Note 1: The “Absolute Maximum Ratin gs” are those v alues beyon d which

the safety of the dev ice cannot be guaranteed. T he device sh ould not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommend ed O peratin g Cond itions” t able w ill defin e the co ndition s
for actual device operation.

Recommended Operating Conditions

Electrical Characteristics

over recommended operating free air temperature range (unless otherwise noted)

Note 2: All typicals are at VCC = 5V, TA = 25°C.

Switching Characteristics

at VCC = 5V and TA = 25°C

Supply Voltage 7V
Input Voltage 5.5V
Output Voltage 15V
Operating Free Air Temperature Range 0°C to +70°C
Storage Temperature Range −65°C to +150°C

Symbol Parameter Min Nom Max Units

V

CC

Supply Voltage 4.75 5 5.25 V

V

IH

HIGH Level Input Voltage 2 V

V

IL

LOW Level Input Voltage 0.8 V

V

OH

HIGH Level Output Voltage 15 V

I

OL

LOW Level Output Current 16 mA

T

A

Free Air Operating Temperature 0 70 °C

Symbol Parameter Conditions Min

Typ

Max Units

(Note 2)

V

I

Input Clamp Voltage VCC = Min, II = −12 mA −1.5 V

I

CEX

HIGH Level VCC = Min VO = 15V 1000

µA

Output Current VIL = Max VO = 12V 50

V

OL

LOW Level VCC = Min, IOL = Max

0.4 V

Output Voltage VIH = Min

I

I

Input Current @ Max VCC = Max,

1mA

Input Voltage VI = 5.5V

I

IH

High Level Input Current VCC = Max, VI = 2.4V 40 µA

I

IL

Low Level Input Current VCC = Max, VI = 0.4V −1.6 mA

I

CCH

Supply Current with Outputs HIGH VCC = Max 4 8 mA

I

CCL

Supply Current with Outputs LOW VCC = Max 12 22 mA

Symbol Parameter Conditions Min Max Units

t

PLH

Propagation Delay Time CL = 15 pF

24 ns

LOW-to-HIGH Level Output RL = 1 kΩ (t

PLH

)

t

PHL

Propagation Delay Time

17 ns

HIGH-to-LOW Level Output

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DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs

Physical Dimensions inches (millimeters) unless otherwise noted

14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

Package Number N14A

Fairchild does not assume any responsibility for use of any circu itry described, no circuit patent license s are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:

1. Life sup por t de vices o r syst ems are dev ic es or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided i n the labe li ng, can be re a­sonably expected to result in a significant injury to the
user.

2. A c ritica l com ponent i n any compo nent o f a life s upp ort
device or system whose failu re to perform can b e rea­sonably expected to c ause th e fa i lure of the li fe s upp or t
device or system, or to affect its safety or effectiveness.

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