Datasheet CLC021 Datasheet (National Semiconductor)

CLC021
SMPTE 259M Digital Video Serializer with EDH
Generation and Insertion

CLC021 SMPTE 259M Digital Video Serializer with EDH Generation and Insertion

July 2003

General Description

The CLC021 SMPTE 259M Digital Video Serializer with EDH
Generation and Insertion is a monolithic integrated circuit
that encodes, serializes and transmits bit-parallel digital data
conforming to SMPTE 125M and 267M component video
and SMPTE 244M composite video standards. The CLC021
can also serialize other 8- or 10-bit parallel data. The
CLC021 operates at data rates from below 100 Mbps to over
400 Mbps. The serial data clock frequency is internally gen­erated and requires no external frequency setting, trimming
or filtering components*.

Functions performed by the CLC021 include: parallel-to­serial data conversion, ITU-R BT.601-4 input data clipping,
data encoding using the SMPTE polynomial (X
format conversion from NRZ to NRZI, parallel data clock
frequency multiplication and encoding with the serial data,
and differential, serial output data driving. The CLC021 has
circuitry for automatic EDH character and flag generation
and insertion per SMPTE RP-165. The CLC021 has an
exclusive built-in self-test (BIST) and video test pattern gen­erator (TPG) with 16 component video test patterns: refer­ence black, PLL and EQ pathologicals and modified colour
bars in 4:3 and 16:9 raster formats for NTSC and PAL
formats*.

The CLC021 has inputs for enabling sync detection, non­SMPTE mode operation, enabling the EDH function, NRZ/
NRZI mode control and an external reset control. Outputs
are provided for H, V and F bits, new TRS sync character
position indication, ancilliary data header detection, NTSC/
PAL raster indication and PLL lock detect. Separate power
pins for the output driver, VCO and the serializer improve
power supply rejection, output jitter and noise performance.

The CLC021AVGZ-5.0V is powered by a single +5V supply.
The CLC021AVGZ-3.3V is powered by a single +3.3V sup­ply. Power dissipation is typically 235 mW including two 75Ω
back-matched output loads. The device is packaged in a
JEDEC metric 44-lead PQFP.

9+X4

+1), data

Features

n SMPTE 259M serial digital video standard compliant
n Supports all NTSC and PAL standard component and

composite serial video data rates

n No external serial data rate setting or VCO filtering

components required

n Fast VCO lock time:<75 µs at 270 Mbps
n Built-in self-test (BIST) and video test pattern generator

(TPG) with 16 internal patterns

n Automatic EDH character and flag generation and

insertion per SMPTE RP 165

n Non-SMPTE mode operation as parallel-to-serial

converter

n NRZ-to-NRZI conversion control
n HCMOS/LSTTL-compatible data and control inputs and

outputs for CLC021AVGZ-5.0, LVCMOS for
CLC021AVGZ-3.3

n 75Ω ECL-compatible, differential, serial cable-driver

outputs

n Single power supply operation: 5V (CLC021AVGZ-5.0)

or 3.3V (CLC021AVGZ-3.3) in TTL or ECL systems

n Low power: typically 235 mW
n JEDEC 44-lead metric PQFP package
n Commercial temperature range 0˚C to +70˚C

*

Patents applications made or pending.

*

*

Applications

n SMPTE 259M parallel-to-serial digital video interfaces

for:
— Video cameras
— VTRs
— Telecines
— Video test pattern generators and digital video test

equipment

— Video signal generators

n Non-SMPTE video applications
n Other high data rate parallel/serial video and data

applications

Typical Application

10136812

© 2003 National Semiconductor Corporation DS101368 www.national.com

Block Diagram

CLC021

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10136801

Connection Diagram

CLC021

44-Pin Metric PQFP

Order Number CLC021AVGZ-5.0 or CLC021AVGZ-3.3

See NS Package Number VGZ44A

10136802

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Absolute Maximum Ratings (Note 1) It

is anticipated that this device will not be offered in a

CLC021

military qualified version. If Military/Aerospace speci­fied devices are required, please contact the National
Semiconductor Sales Office / Distributors for availabil­ity and specifications.

Supply Voltage (V

CLC021AVGZ-5.0V 6.0V

CLC021AVGZ-3.3V 4.0V

CMOS/TTL Input Voltage (V

CLC021AVGZ-5.0V −0.5V to V

CLC021AVGZ-3.3V -0.3V to V

CMOS/TTL Output Voltage (V

CLC021AVGZ-5.0V −0.5V to V

CLC021AVGZ-3.3V -0.3V to V

CMOS/TTL Input Current (single input):

V

I=VSS

V

I=VDD

−0.5V: −5 mA

+0.5V: +5 mA

Input Current, Other Inputs:

CMOS/TTL Output Source/Sink Current:

SDO Output Source Current: 22 mA

Package Thermal Resistance

θ

44-lead Metric PQFP:

JA

@

(

0 LFM airflow) 60˚C/W

@

(

500 LFM airflow) 43˚C/W

DD−VSS

):

):

I

):

O

+0.5V

DD

+0.3V

DD

+0.5V

DD

+0.3V

DD

±

±

16 mA

1mA

θ

44-lead Metric PQFP: 17˚C/W

JC

Storage Temp. Range: −65˚C to +150˚C

Junction Temperature: +150˚C

Lead Temperature (Soldering 4

+260˚C

Sec):

ESD Rating (HBM): 2 kV

ESD Rating (MM): 150V

Transistor Count: 33,400

Recommended Operating Conditions

Supply Voltage (VDD−VSS):

CLC021AVGZ-5.0 5.0V

CLC021AVGZ-3.3 3.3V

CMOS/TTL Input Voltage: V

Maximum DC Bias on SDO pins:

CLC021AVGZ-5.0 3.0V

CLC021AVGZ-3.3 1.3V

P

Frequency Range 10 to 40MHz

CLK

P

Duty Cycle 45 to 55%

CLK

D

N

and P

Rise/Fall Time 1.0 to 3.0 ns

CLK

Operating Free Air Temperature

):

(T

A

±

10%

±

10%

to V

SS

±

10%

±

10%

0˚C to +70˚C

DD

DC Electrical Characteristics—CLC021AVGZ-5.0

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Notes 2, 3).

Symbol Parameter Conditions Reference Min Typ Max Units

V

IH

V

IL

I

IH

I

IL

V

OH

V

OL

V

SDO

Input Voltage High Level

Input Voltage Low Level V

Input Current High Level VIH=V

Input Current Low Level VIL=V

CMOS Output Voltage

DD

SS

IOH= −10 mA

High Level

CMOS Output Voltage

IOL= +10 mA

All CMOS Inputs

All CMOS

Outputs
Low Level

Serial Driver Output
Voltage

RL=75Ω 1%,

= 1.69 kΩ 1%,

R

REF

SDO, SDO 700 800 900 mV

2.0 V

SS

+40 +60 µA

-1 -20 µA

2.4 4.7 V

0.0 0.3 V

SS

DD

0.8 V

DD

+ 0.5V V

Figure 2

I

DD

Power Supply Current,
Total

RL=75Ω 1%,

= 1.69 kΩ 1%,

R

REF

= 27 MHz, NTSC

P

CLK

47 60 mA

Colour Bar Pattern,

Figure 2

DC Electrical Characteristics—CLC021AVGZ-3.3

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Notes 2, 3).

Symbol Parameter Conditions Reference Min Typ Max Units

V

IH

V

IL

I

IH

I

IL

Input Voltage High Level

Input Voltage Low Level V

Input Current High Level VIH=V

Input Current Low Level VIL=V

DD

SS

All CMOS Inputs

2.0 V

SS

+22 +60 µA

-1 -20 µA

DD

0.6 V

V

V

P-P

V

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DC Electrical Characteristics—CLC021AVGZ-3.3 (Continued)

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Notes 2, 3).

Symbol Parameter Conditions Reference Min Typ Max Units

V

OH

V

OL

V

SDO

CMOS Output Voltage
High Level

CMOS Output Voltage
Low Level

Serial Driver Output
Voltage

IOH=−8mA

IOL=+8mA

RL=75Ω 1%,

= 1.69 kΩ 1%,

R

REF

All CMOS
Outputs

2.4 3.0 V

0.0 0.3 V

DD

+ 0.5V V

SS

SDO, SDO 720 800 880 mV

Figure 2

I

DD

Power Supply Current,
Total

RL=75Ω 1%,

= 1.69 kΩ 1%,

R

REF

= 27 MHz, NTSC

P

CLK

33 55 mA

Colour Bar Pattern,

Figure 2

AC Electrical Characteristics—CLC021AVGZ-5.0

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Note 3).

Symbol Parameter Conditions Reference Min Typ Max Units

BR

F

P

t

r,tf

t

j

t

jit

tr,t

t

LOCK

t

SU

t

HLD

L

GEN

R

GEN

SDO

CLK

f

Serial Data Rate (Note 5) SDO, SDO 100 400 Mbps

Reference Clock
Input Frequency

Reference Clock Duty
Cycle

Rise Time, Fall Time DN,P

P

CLK

P

CLK

CLK

Serial Output Jitter 270 Mbps,Figure 2, (Note 6)

Serial Output Jitter (Notes 4, 5) 100 200 ps

Rise Time, Fall Time 20%–80%, (Notes 4, 5) 500 800 1500 ps

SDO, SDO

10 40 MHz

45 50 55 %

1.0 1.5 3.0 ns

220 ps

Output Overshoot (Note 4) 1 %

Lock Time (Notes 5, 7) 75 µs

Setup Time Figure 3 (Note 4) DNto P

Hold Time Figure 3 (Note 4) DNfrom P

Output Inductance (Note 4)

Output Resistance (Note 4) 25k Ω

CLK

CLK

SDO, SDO

32 ns

32 ns

6nH

CLC021

V

P-P

P-P

P-P

AC Electrical Characteristics—CLC021AVGZ-3.3

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Note 3).

Symbol Parameter Conditions Reference Min Typ Max Units

BR

F

P

t

r,tf

t

j

t

jit

tr,t

t

LOCK

t

SU

t

HLD

SDO

CLK

f

Serial Data Rate (Note 5) SDO, SDO 100 400 Mbps

Reference Clock
Input Frequency

Reference Clock Duty
Cycle

Rise Time, Fall Time DN,P

P

CLK

P

CLK

CLK

Serial Output Jitter 270 Mbps,Figure 2, (Note 6)

Serial Output Jitter (Notes 4, 5) 100 200 ps

Rise Time, Fall Time 20%–80%, (Notes 4, 5) 500 800 1500 ps

SDO, SDO

10 40 MHz

45 50 55 %

1.0 1.5 3.0 ns

220 ps

Output Overshoot (Note 4) 1 %

Lock Time (Notes 5, 7) 75 µs

Setup Time Figure 3 (Note 4) DNto P

CLK

Hold Time Figure 3 (Note 4) DNfrom P

CLK

42 ns

42 ns

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P-P

P-P

AC Electrical Characteristics—CLC021AVGZ-3.3 (Continued)

Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Note 3).

CLC021

Symbol Parameter Conditions Reference Min Typ Max Units

L

GEN

R

GEN

Note 1: “Absolute Maximum Ratings” are those parameter values beyond which the life and operation of the device cannot be guaranteed. The stating herein of
these maximums shall not be construed to imply that the device can or should be operated at or beyond these values. The table of “Electrical Characteristics”
specifies acceptable device operating conditions.

Note 2: Current flow into device pins is defined as positive. Current flow out of device pins is defined as negative. All voltages are stated referenced to V

Note 3: Typical values are stated for V

Note 4: Specification is guaranteed by design.

Note 5: R

Note 6: CLC021 mounted in the SD021EVK board, configured in BIST mode (NTSC colour bars) with P

reference. Timing jitter measured with Tektronix VM700T using jitter measurement FFT mode, frame rate, 1 kHz filter bandwidth, Hanning window.

Note 7: Measured from rising-edge of first P

Output Inductance (Note 4)

Output Resistance (Note 4) 25k Ω

= +5.0V (CLC021AVGZ-5.0) or +3.3V (CLC021AVGZ-3.3) and TA= +25˚C.

DD

=75Ω, AC-coupled@270 M

L

bps,RREF

= 1.69 kΩ 1%, See Test Loads and Figure 2.

cycle until Lock Detect output goes high (true).

CLK

SDO, SDO

CLK

= 27 MHz derived from Tektronix TG2000 black-burst

6nH

Test Loads

=0V.

SS

FIGURE 1. Test Loads

10136803

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Test Loads (Continued)

CLC021

FIGURE 2. Test Circuit

10136804

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Timing Diagram

CLC021

10136805

FIGURE 3. Setup and Hold Timing

Device Operation

The CLC021 SMPTE 259M Serial Digital Video Serializer is
used in digital video signal origination equipment: cameras,
video tape recorders, telecines and video test and other
equipment. It converts parallel component or composite digi­tal video signals into serial format. Logic levels within this
equipment are normally TTL-compatible as produced by
CMOS or bipolar logic devices. The encoder produces ECL­compatible serial digital video (SDV) signals conforming to
SMPTE 259M-1997. The CLC021 operates at all standard
SMPTE and ITU-R parallel data rates. In addition, the
CLC021 can serialize other 8- and 10-bit data.

VIDEO DATA PROCESSING CIRCUITS

The input data register accepts 8- or 10-bit parallel data
and clock signals having HCMOS/LSTTL-compatible signal
levels. Parallel data may conform to any of several stan­dards: SMPTE 125M, SMPTE 267M, SMPTE 244M or
ITU-R BT.601. If the data is 8-bit, it is converted to a 10-bit
representation according to the type of data being input:
component 4:2:2 per SMPTE 259M paragraph 7.1.1, com­posite NTSC per paragraph 8.1.1 or composite PAL per
paragraph 9.1.1. Eight-bit video data corresponds to the
upper 8 bits of the 10-bit video data word and is MSB­aligned. Output from this register feeds the TRS (sync)
character detector, SMPTE polynomial generator/serializer
and the EDH polynomial generators/serializers and control
system. All parallel data and clock inputs have internal pull­down devices.

The sync detector or TRS character detector receives data
from the input register. The detection function is controlled
by Sync Detect Enable, a low-true, TTL-compatible, external
signal. Synchronization words, the timing reference signals
(TRS), start-of-active-video (SAV) and end-of-active-video
(EAV) are defined in SMPTE 125M and 244M. The sync
detector supplies control signals to the SMPTE polynomial
generator to identify the presence of valid video data, and to
the EDH control block. In SMPTE mode, TRS character
LSB-clipping as prescribed in ITU-R BT.601 is enabled. LSB­clipping causes all TRS characters with a value between
000h and 003h to be forced to 000h and all TRS characters
with a value between 3FCh and 3FFh to be forced to 3FFh.

Clipping is done prior to encoding or EDH character genera­tion. This function is disabled in non-SMPTE mode opera­tion.

Outputs from the sync detector are:

1. H, V, and F or Line/Field ID —For component video,
these are registered outputs corresponding to input TRS
data bits 6, 7 and 8, respectively. These outputs are
disabled in non-SMPTE mode. The outputs are active
HIGH-true. For composite video, these outputs corre­spond to the line and field ID encoded as input parallel
data bits 2 (MSB) through 0. These outputs are regis­tered for the duration of the applicable field.

2. NSP— New Sync Position: A function and output indi­cating that a new or out-of-place TRS character has
been detected. This output remains active for at least
one horizontal line period (reset by EAV) or unless re­activated by a subsequent new or out-of-place TRS.
Activation of this function flushes the existing state of the
machine reseting the EDH generator, SMPTE polyno­mial generator, serializer and NRZ-NRZI converter. This
function is disabled in non-SMPTE mode operation. The
output is active HIGH-true.

3. ANC— Ancilliary data location output: Indicates that the
ancilliary data header (component) or flag (composite)
has been detected. The output is a pulse having a
duration of one P

period. The output is active HIGH-

CLK

true.

SMPTE POLYNOMIAL GENERATOR AND CONTROLS

The SMPTE Mode input allows the CLC021 to function both
as a full SMPTE 259M encoder or general-purpose 8- or
10-bit serializer. SMPTE mode is enabled when this input is
LOW. Non-SMPTE mode is enabled when this pin is HIGH.
This pin is pulled internally to V

when unconnected. When

SS

in SMPTE mode, the SMPTE polynomial generator; TRS
sync detection circuitry; EDH control circuitry; H, V, F and
NSP outputs and TRS clipping are enabled.

The SMPTE polynomial generator accepts the parallel
video data and encodes it using the polynomial X

9+X4

+1
as specified in SMPTE 259M (1997 rev.), paragraph 5 and
Annex C. The transmission bit order is LSB-first, per para­graph 6.

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Device Operation (Continued)

NRZ-TO-NRZI CONVERTER

The NRZ-to-NRZI converter accepts NRZ serial data from
the SMPTE and EDH polynomial genertors and converts it to
NRZI using the polynomial (X + 1) per SMPTE 259M, para­graph 5.2 and Annex C. The converter’s output goes to the
output buffer amplifier. The NRZ/NRZI input enables this
conversion function. Conversion from NRZ to NRZI is en­abled when the input is a logic LOW. Conversion to NRZI is
disabled when this input is a logic-HIGH. This function is not
affected by the SMPTE mode control input. The input pin is
pulled internally to V

EDH SYSTEM OPERATION

The CLC021 has EDH character and flag generation and
insertion circuitry which operates as proposed in SMPTE
RP-165. Inputs and circuitry are provided to control genera­tion and automatic insertion of the EDH check words at
proper locations in the serial data output.

The EDH polynomial generators accept parallel data from
the input register and generate 16-bit serial check words
using the polynomial X
tions are made for each video field prior to serialization.
Separate CRCs for the full-field and active picture along with
status flags are inserted and serially transmitted with the
other data. Upon being reset, the initial state of all EDH
check characters is 00h.

The EDH control system accepts input from the sync detec­tor and controls the EDH polynomial generator and SMPTE/
EDH polynomial insertion multiplexer. EDH Enable,anex­ternal TTL-compatible, low-true input, enables this circuitry.
The controller inserts the EDH check words in the serial data
stream at the correct positions in the ancilliary data space
per SMPTE 259M paragraph 7.3, 8.4.4 or 9.4.4 and per
SMPTE RP-165. Ancilliary data space is formatted per
SMPTE 291M.

The EDH Force control input causes the insertion of new
EDH checkwords and flags into the serial output regardless
of the previous condition of EDH checkwords and flags in the
input parallel data. This function may be used in situations
where video content has been editted thus making the pre­vious EDH information invalid.

The NTSC/PAL output indicates the type of component or
composite data standard being input to the CLC021. This
output is useful for troubleshooting or may be used to drive a
panel indicator. The output is high when 625-line PAL data is
being input and low when 525-line NTSC data is being input.

PHASE-LOCKED LOOP AND VCO

The phase-locked loop (PLL) system generates the output
serial data clock at 10x the parallel data clock frequency.
This system consists of a VCO, divider chain, phase­frequency detector and internal loop filter. The VCO free-

(NRZI enabled) when unconnected.

SS

16+X12+X6

+ 1. Separate calcula-

running frequency is internally set. The PLL automatically
generates the appropriate frequency for the serial clock rate
using the parallel data clock (P

) frequency as its refer-

CLK

ence. Loop filtering is internal to the CLC021. The VCO halts
when no P

signal is present or is inactive. P

CLK

CLK

should be

applied after power to the device.
The VCO has separate V

SSO

and V

power supply feeds,

DDO

pins 27 and 28, which may be supplied power via an external
low-pass filter, if desired. The PLL acquisition (lock) time is

@

less than 75 µs

270 Mbps.

LOCK DETECT

The lock detect output (pin 26) of the phase-frequency de­tector is a logic HIGH when the loop is locked. The output is
CMOS/TTL-compatible and is suitable for driving other
CMOS devices or an LED indicator. The Lock Detect pin
reports the status of the PLL. When P

is lost, it will switch

CLK

low at the event.

SERIAL DATA OUTPUT BUFFER

The current-mode serial data outputs provide low-skew
complimentary or differential signals. The output buffer de­sign can drive 75Ω coaxial cables (AC-coupled) or 10K/100K
ECL/PECL-compatible devices (DC-coupled). Output levels

±

are 800 mV
loads. The output level is 400 mV

10% into 75Ω AC-coupled, back-matched

P-P

±

10% when DC-

P-P

coupled into 75Ω. (See Application Information for details.)
The 75Ω resistors connected to the SDO outputs are back­matching resistors. No series back-matching resistors
should be used. Output level is controlled by the value of

connected to pin 35. The value of R

R

REF

±

1.69 kΩ,

1%. The output buffer is static when the device is

in an out-of-lock condition. Separate V

REF

SSSD

is normally

and V

DDSD

power feeds, pins, 37 and 40 are provided for the serial
output driver.

POWER-ON RESET AND RESET INPUT The CLC021 has an internally controlled, automatic, power-

on-reset circuit. Reset clears TRS detection circuitry, all

latches, registers, counters and polynomial generators, sets
the EDH characters to 00h and disables the serial output.
The SDO outputs are tri-stated during power-on reset. The
part will remain in the reset condition until the parallel input
clock is applied.

An active-HIGH-true, manual reset input is available at
pin 1. It resets both the digital and PLL blocks. The reset
input has an internal pull-down device and is inactive when
unconnected.

It is recommended that P
30 µs after power has reached V
manual reset is used during power-on, then P

not be asserted until at least

CLK

min. See Figure 4.If

DD

CLK

may be
asserted at any time as long as manual reset is not de­asserted until V

min is reached. See Figure 5.

DD

CLC021

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Device Operation (Continued)

CLC021

10136815

FIGURE 4. Power-On Reset Sequence

FIGURE 5. Power-On Reset Sequence with Manual Reset

BUILT-IN SELF-TEST (BIST)

The CLC021 has a built-in self-test (BIST) function. The
BIST performs a comprehensive go/no-go test of the device.
The test uses either a full-field colour bar for NTSC or a PLL
pathological for PAL as the test data pattern. Data is input
internally in the input data register, processed through the
device and tested for errors. A go/no-go indication is given at
the Test_Output. Table 1 gives device pin functions and
Table 2 gives the test pattern codes used for this function.
The signal level at Test_Output, pin 3, indicates a pass or fail
condition.

The BIST is initiated by applying the code for the desired
BIST to D0 through D3 (D9 through D4 are 00h) and a 27
MHz clock at the P

input. Since all parallel data inputs are

CLK

10136814

equipped with an internal pull-down device, only those inputs
D0 through D3 which require a logic-1 need be pulled high.
After the Lock_Detect output goes high indicating the VCO is
locked on frequency, TPG_Enable, pin 29, is taken to a logic
high. The Lock_Detect output may be temporarily connected
to TPG_Enable to automate BIST operation. Test_Output,
pin 3, is monitored for a pass/fail indication. If no errors have
been detected, this output will go to a logic high level ap­proximately 2 field intervals after TPG_Enable is taken high.
If errors have been detected in the internal circuitry of the
CLC021, Test_Output will remain low until the test is termi­nated. The BIST is terminated by taking TPG _Enable to a
logic low. Continuous serial data output is available during
the test.

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Device Operation (Continued)

FIGURE 6. Built-In Self-Test Control Sequence

CLC021

10136806

TEST PATTERN GENERATOR The CLC021 includes an on-board test pattern generator

(TPG). Four full-field component video test patterns for both

NTSC and PAL standards, and 4x3 and 16x9 raster sizes are
produced. The test patterns are: flat-field black, PLL patho­logical, equalizer (EQ) pathological and a modified 75%,
8-colour vertical bar pattern. The pathologicals follow recom­mendations contained in SMPTE RP 178–1996 regarding
the test data used. The colour bar pattern does not incorpo­rate bandwidth limiting coding in the chroma and luma data
when transitioning between the bars. For this reason, it may
not be suitable for use as a visual test pattern or for input to
video D-to-A conversion devices unless measures are taken
to restrict the production of out-of-band frequency compo­nents.

The TPG is operated by applying the code for the desired
test pattern to D0 through D3 (D4 through D9 are 00h). Since
all parallel data inputs are equipped with internal pull-down
devices, only those inputs D0 through D3 which require a
logic-1 need be pulled high. Next, apply a 27 MHz or 36 MHz
signal, appropriate to the raster size desired, at the P

CLK

input and wait until the Lock_Detect output goes true indi­cating the VCO is locked on frequency. Then, take
TPG_Enable, pin 29, to a logic high. The serial test pattern
data appears on the SDO outputs. The Lock_Detect output
may be temporarily connected to TPG_Enable to automate
TPG operation. The TPG mode is exited by taking TPG_En­able to a logic low. Table 1 gives device pin functions for this
mode. Table 2 gives the available test patterns and selection
codes.

FIGURE 7. Test Pattern Generator Control Sequence

10136807

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Device Operation (Continued)

CLC021

Standard Frame Test Pattern D3 D2 D1 D0

NTSC 4x3 Flat-Field Black 0 0 0 0

NTSC 4x3 PLL Pathological 0 0 0 1

NTSC 4x3 EQ Pathological 0 0 1 0

NTSC 4x3 Colour Bars, 75%, 8-Bars (modified, see text), BIST 0 0 1 1

PAL 4x3 Flat-Field Black 0 1 0 0

PAL 4x3 PLL Pathological, BIST 0 1 0 1

PAL 4x3 EQ Pathological 0 1 1 0

PAL 4x3 Colour Bars, 75%, 8-Bars (modified, see text) 0 1 1 1

NTSC 16x9 Flat-Field Black 1 0 0 0

NTSC 16x9 PLL Pathological 1 0 0 1

NTSC 16x9 EQ Pathological 1 0 1 0

NTSC 16x9 Colour Bars, 75%, 8-bars (modified, see text) 1 0 1 1

PAL 16x9 Flat-Field Black 1 1 0 0

PAL 16x9 PLL Pathological 1 1 0 1

PAL 16x9 EQ Pathological 1 1 1 0

PAL 16x9 Colour Bars, 75%, 8-Bars (modified, see text) 1 1 1 1

Note: D9 through D4 = 0 (binary)

TABLE 1. BIST and Test Pattern Generator Control Functions

Pin Name Function

12 D0 TPG Code Input LSB

13 D1 TPG Code Input

14 D2 TPG Code Input

15 D3 TPG Code Input MSB

29 TPG_EN TPG Enable, Active High True

3 Test_Out BIST Pass/Fail Output. Pass=High

(See text for Timing Requirements)

TABLE 2. Component Video Test Pattern Selection

www.national.com 12

Pin Descriptions

Pin Name Description

1 Reset Manual Reset Input (High True)

2 NRZ-NRZI

3 Test Out Test Out (BIST Pass/Fail Indicator)

4V

5V

6V

7V

SS

SS

DD

DD

8 EDH Force Force Insertion of New EDH and Flags in Serial Output Data (High True)

9 EDH Enable

10 SMPTE Mode

11 N/C No Connect

12 D0 Parallel Data Input (Internal Pull-Down to V

13 D1 Parallel Data Input (Internal Pull-Down to V

14 D2 Parallel Data Input (Internal Pull-Down to V

15 D3 Parallel Data Input (Internal Pull-Down to V

16 D4 Parallel Data Input (Internal Pull-Down to V

17 D5 Parallel Data Input (Internal Pull-Down to V

18 D6 Parallel Data Input (Internal Pull-Down to V

19 D7 Parallel Data Input (Internal Pull-Down to V

20 D8 Parallel Data Input (Internal Pull-Down to V

21 D9 Parallel Data Input (Internal Pull-Down to V

22 P

CLK

23 H/Line-Field b0 (LSB) H-Bit Output (Component); Line-Field ID (Composite)

24 V/Line-Field b1 V-Bit Output (Component); Line-Field ID (Composite)

25 F/Line-Field b2 (MSB) F-Bit Output (Component); Line-Field ID (Composite)

26 Lock Detect Lock Detector Output (High True)

27 V

28 V

SSO

DDO

29 TPG Enable TPG Enable (High True)

30 V

31 V

32 V

33 V

SSOD

SSOD

DDOD

DDOD

34 N/C No Connect

35 R

36 V

37 V

REF

DDOD

SSSD

38 SDO Serial Data True Output

39 SDO

40 V

DDSD

41 Sync Detect Enable

42 NSP New Sync Position Output

43 ANC Ancilliary Data Header Flag Output

44 NTSC/PAL

Note: All CMOS/TTL inputs have internal pull-down devices.

NRZ-to-NRZI Conversion Control (NRZ=High, NRZI=Low)

Negative Power Supply Input (Digital Logic)

Negative Power Supply Input (Digital Logic)

Positive Power Supply Input (Digital Logic)

Positive Power Supply Input (Digital Logic)

EDH Enable Input (Low True)

SMPTE/non-SMPTE Mode Select Input (SMPTE Mode=Low)

)

SS

)

SS

)

SS

)

SS

)

SS

)

SS

)

SS

)

SS

)

SS

)

SS

Parallel Clock Input (Internal Pull-Down to VSS)

Negative Power Supply Input (PLL Supply)

Positive Power Supply Input (PLL Supply)

Negative Power Supply Input (PLL Digital Supply)

Negative Power Supply Input (PLL Digital Supply)

Positive Power Supply Input (PLL Digital Supply)

Positive Power Supply Input (PLL Digital Supply)

Output Level Reference Resistor (1.69 kΩ, 1% Nominal Value)

Positive Power Supply Input (PLL Digital Supply)

Negative Power Supply Input (Output Driver)

Serial Data Complement Output

Positive Power Supply Input (Output Driver)

Parallel Data Sync Detection Enable Input (Low True)

NTSC/PAL Mode Indicator Output (PAL=High, NTSC=Low)

CLC021

www.national.com13

Application Information

A typical application circuit for the CLC021 is shown in

CLC021

Figure 8. This circuit demonstrates the capabilities of the
CLC021 and allows its evaluation in a variety of configura­tions. Assembled demonstration boards with more compre­hensive evaluation options are available, part number
SD021-5EVK (5V device) or SD021-3EVK (3.3V device).

APPLICATION CIRCUIT

The boards may be ordered through any of National’s sales
offices. Complete circuit board layouts and schematics in­cluding Gerber photoplot files, for the demonstration boards
are available on National’s WEB site in the application infor­mation for this device. For latest information, please see:
www.national.com/appinfo/interface.

FIGURE 8. Typical Application Circuit

The SD021EVK application circuit boards, Figure 9, can
accommodate different input and output drive and loading
options. Pin headers are provided for input and control I/O
signal access. Install the appropriate value resistor packs,
220Ω at RP1 and RP3 and 330Ω at RP2 and RP4, for TTL
cabled interfaces before applying input signals. Install 51Ω
resistor packs at RP2 and RP4 for signal sources requiring
such loading. Remove any resistor packs at RP1 and RP3
when using 50Ω source loading.

The board’s outputs may be DC interfaced to PECL inputs by
first installing 124Ω resistors at R1B and R2B, changing R1A
and R2A to 187Ω and replacing C1 and C2 with short
circuits. The PECL inputs should be directly connected to J1
and J2 without cabling. If 75Ω cabling is used to connect the
CLC021 to the PECL inputs, the voltage dividers used on the

www.national.com 14

10136808

CLC021 outputs must be removed and re-installed on the
circuit board where the PECL device is mounted. This will
provide correct termination for the cable and biasing for both
the CLC021’s outputs and the PECL inputs. It is most impor­tant to note that a 75Ω or equivalent DC loading (measured
with respect to the negative supply rail) must always be
installed at both of the CLC021’s SDO outputs to obtain
proper signal levels from device. When using 75Ω Thevenin­equivalent load circuits, the DC bias applied to the SDO
outputs should not exceed +3V (+1.3V for CLC021AVGZ-

3.3) with respect to the negative supply rail. Serial output
levels should be reduced to 400 mV

by changing R

p-p

REF

3.4 kΩ. This may be done by removing the Output Level
shorting jumper on the post header.

to

Application Information (Continued)

The Test Out output is intended for monitoring by equipment
having high impedance test loading (

>

500Ω). If the Lock

CLC021

Detect output is to be externally monitored, the attached
monitoring circuit should present a DC resistance greater
than 5 kΩ so as not to affect Lock Detect indicator operation.

Connect LOCK DETECT to TPG ENABLE for test pattern generator function.
Remove RP1 & RP3 and replace RP2 & RP4 with 50Ω resistor packs for coax interfacing.
Install RP1-4 when using ribbon cable for input interfacing.
This board is designed for use with TTL power supplies only.

FIGURE 9. SD021EVK Schematic Diagram

MEASURING JITTER

The test method used to obtain the timing jitter value given in
the AC Electrical Specification table is based on procedures
and equipment described in SMPTE RP 192-1996. The rec­ommended practice discusses several methods and indica­tor devices. An FFT method performed by standard video
test equipment was used to obtain the data given in this data
sheet. As such, the jitter characteristics (or jitter floor) of the
measurement equipment, particularly the measurement ana­lyzer, become integral to the resulting jitter value. The

method and equipment were chosen so that the test can be
easily duplicated by the design engineer using most stan­dard digital video test equipment. In so doing, similar results
should be achieved. The intrinsic jitter floor of the CLC021’s
PLL is approximately 25% of the typical jitter given in the
electrical specifications. In production, device jitter is mea­sured on automatic IC test equipment (ATE) using a different
method compatible with that equipment. Jitter measured
using this ATE yields values approximately 50% of those
obtained using the video test equipment.

10136809

www.national.com15

Application Information (Continued)

The jitter test setup used to obtain values quoted in the data

CLC021

sheet consists of:

National Semiconductor SD021-5EVK (SD021-3EVK),

•

CLC021 evaluation kit
Tektronix TG2000 signal generation platform with DVG1

•

option
Tektronix VM700T Option 1S Video Measurement Set

•

Tektronix TDS 794D, Option C2 oscilloscope

•

Tektronix P6339A passive probe

•

75Ω coaxial cable, 3 ft., Belden 8281 or RG59 (2 re-

•

quired)
ECL-to-TTL/CMOS level converter/amplifier, (see

•

Figure 11).

Apply the black-burst reference clock from the TG2000 sig­nal generator’s BG1 module 27 MHz clock output to the level
converter input. The clock amplitude converter schematic is
shown in Figure 11. Adjust the input bias control to give a
50% duty cycle output as measured on the oscilloscope/
probe system. Connect the level translator to the SD021EVK
board, connector P1, P

pins (the outer-most row of pins

CLK

is ground). Configure the SD021EVK to operate in the NTSC
colour bars, BIST mode. Configure the VM700T to make the
jitter measurement in the jitter FFT mode at the frame rate
with 1 kHz filter bandwidth and Hanning window. Configure
the setup as shown in Figure 10. Switch the test equipment
on (from standby mode) and allow all equipment tempera­tures stabilize per manufacturer’s recommendation. Mea­sure the jitter value after allowing the instrument’s reading to
stabilize (about 1 minute). Consult the VM700T Video Mea­surement Set Option 1S Serial Digital Measurements User
Manual (document number 071-0074-00) for details of
equipment operation.

The VM700T measurement system’s jitter floor specification

±

at 270 Mbps is given as 200 ps

20% (100 ps±5% typical)
of actual components from 50 Hz to 1 MHz and 200 ps
+60%, -30% of actual components from 1 MHz to 10 MHz.
To obtain the actual residual jitter of the CLC021, a root-sum­square adjustment of the jitter reading must be made to
compensate for the measurement system’s jitter floor speci­fication. For example, if the jitter reading is 250 ps, the
CLC021 residual jitter is the square root of (250

2

− 2002)=
150 ps. The accuracy limits of the reading as given above
apply.

FIGURE 10. Jitter Test Circuit

FIGURE 11. ECL-to-TTL/CMOS Level Converter/Amplifer

10136810

10136813

www.national.com 16

Application Information (Continued)

CLC021

FIGURE 12. Jitter Plots

PCB LAYOUT AND POWER SYSTEM BYPASS RECOMMENDATIONS

Circuit board layout and stack-up for the CLC021 should be
designed to provide noise-free power to the device. Good
layout practice also will separate high frequency or high level
inputs and outputs to minimize unwanted stray noise pickup,
feedback and interference. Power system performance may
be greatly improved by using thin dielectrics (4 to 10 mils) for
power/ground sandwiches. This increases the intrinsic ca­pacitance of the PCB power system which improves power
supply filtering, especially at high frequencies, and makes
the value and placement of external bypass capacitors less
critical. External bypass capacitors should include both RF
ceramic and tantalum electrolytic types. RF capacitors may
use values in the range 0.01 µF to 0.1 µF. Tantalum capaci­tors may be in the range 2.2 µF to 10 µF. Voltage rating for
tantalum capacitors should be at least 5X the power supply
voltage being used. It is recommended practice to use two
vias at each power pin of the CLC021 as well as all RF
bypass capacitor terminals. Dual vias reduce the intercon­nect inductance by up to half, thereby reducing interconnect
inductance and extending the effective frequency range of
the bypass components.

The outer layers of the PCB may be flooded with additional

(ground) plane. These planes will improve shielding and

V

SS

isolation as well as increase the intrinsic capacitance of the
power supply plane system. Naturally, to be effective, these

10136811

planes must be tied to the V

power supply plane at fre-

SS

quent intervals with vias. Frequent via placement also im­proves signal integrity on signal transmission lines by pro­viding short paths for image currents which reduces signal
distortion. The planes should be pulled back from all trans­mission lines and component mounting pads a distance
equal to the width of the widest transmission line or the
thickness of the dielectric separating the transmission line
from the internal power or ground plane(s) whichever is
greater. Doing so minimizes effects on transmission line
impedances and reduces unwanted parasitic capacitances
at component mounting pads.

In especially noisy power supply environments, such as is
often the case when using switching power supplies, sepa­rate filtering may be used at the CLC021’s VCO and output
driver power pins. The CLC021 was designed for this situa­tion. The digital section, VCO and output driver power supply
feeds are independent (see pinout description table and
pinout drawing for details). Supply filtering may take the form
of L-section or pi-section, L-C filters in series with these V

DD

inputs. Such filters are available in a single package from
several manufacturers. Despite being independent feeds, all
device power supplies should be applied simultaneously as
from a common source. The CLC021 is free from power
supply latch-up caused by circuit-induced delays between
the device’s three separate power feed systems.

www.national.com17

Physical Dimensions inches (millimeters) unless otherwise noted

44-Pin Metric PQFP

Order Number CLC021AVGZ-5.0 or CLC21AVGZ-3.3

NS Package Number VGZ44A

LIFE SUPPORT POLICY

NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or

CLC021 SMPTE 259M Digital Video Serializer with EDH Generation and Insertion

systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the

2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.

labeling, can be reasonably expected to result in a
significant injury to the user.

National Semiconductor
Americas Customer
Support Center

Email: [email protected]
Tel: [phone]

www.national.com

National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.

National Semiconductor
Europe Customer Support Center

Fax: [phone]

Email: [email protected]
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Support Center

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Email: [email protected]
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