Datasheet CD4071BCN, CD4071BCMX, CD4071BCM, CD4071BCCW Datasheet (Fairchild Semiconductor)

Page 1
October 1987 Revised January 1999
CD4071BC • CD4081BC Quad 2-Input OR Buffered B Series Gate • Quad 2-Input AND Buffered B Series Gate
© 1999 Fairchild Semiconductor Corporation DS005977.prf www.fairchildsemi.com
CD4071BC • CD4081BC Quad 2-Input OR Buffered B Series Gate •
Quad 2-Input AND Buffered B Series Gate
General Description
All inputs protected a gainst stati c discharg e with dio des to V
DD
and VSS.
Features
Low power TTL compatibility: Fan out of 2 driving 74L or 1 driving 74LS
5V–10V–15V parametric ratings
Symmetrical output characteristics
Maximum input leakage 1 µA at 15V over full
temperat ure range
Ordering Code:
Devices are also available in Tape and Reel. Specify by appending the suffix letter “X ” t o t he ordering code.
Connection Diagrams
Pin Assignments for DIP and SOIC
CD4071B
Top View
CD4081B
Top Vi ew
Order Number Package Number Package Description
CD4071BCM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow CD4071BCN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide CD4081BCM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow CD4081BCN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
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CD4071BC • CD4081BC
Schematic Diagrams
CD4071B
1
/4 of device shown
J = A + B
Logical “1” = HIGH Logical “0” = LOW *All inputs protected by sta ndard CMOS protect ion circuit.
CD4081B
1
/4 of device shown
J = A • B Logical “1” = HIGH Logical “0” = LOW All inputs protected by st andard CMOS protect ion circuit.
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CD4071BC • CD4081BC
Absolute Maximum Ratings(Note 1)
(Note 2)
Recommended Operating Conditions
Note 1: “Absolute Maximum Rat ings” are tho se values beyond which the
safety of the device cannot be guaranteed. E x c ept for “ Operating Tempera­ture Range” they are not mea nt to imply that the devices sh ould be oper­ated at these limits. The table of “Electrical Characteristics” provides conditions for actual device o peration.
Note 2: All voltages measured with res pect t o V
SS
unless otherwise s peci-
fied.
DC Electrical Characteristics (Note 2)
CD4071BC/CD4081BC
Note 3: IOH and IOL are tested one output at a ti m e.
AC Electrical Characteristics (Note 4)
CD4071BC TA = 25°C, Input tr; tf = 20 ns, CL = 50 pF, RL = 200 k, Typical temperature coefficient is 0.3%/°C
Note 4: AC Parameters are guaranteed by DC correlated testing.
Voltage at Any Pin 0.5V to VDD +0.5V Power Dissipation (P
D
) Dual-In-Line 700 mW Small Outline 500 mW
V
DD
Range 0.5 VDC to +18 V
DC
Storage Temperature (TS) 65°C to +150°C Lead Temperature (T
L
) (Soldering, 10 seconds ) 260°C
Operating Range (V
DD
)3 V
DC
to 15 V
DC
Operating Temperature Range (TA)
CD4071BC, CD4081BC −40°C to +85°C
Symbol Parameter Conditions
40°C +25°C +85°C
Units
Min Max Min Typ Max Min Max
I
DD
Quiescent Device VDD = 5V 1 0.004 1 7.5 µA Current VDD = 10V 2 0.005 2 15 µA
VDD = 15V 4 0.006 4 30 µA
V
OL
LOW Level VDD = 5V 0.05 0 0.05 0.05 V Output Voltage VDD = 10V |IO| < 1 µA 0.05 0 0.05 0.05 V
VDD = 15V 0.05 0 0.05 0.05 V
V
OH
HIGH Level VDD = 5V 4.95 4.95 5 4.95 V Output Voltage VDD = 10V |IO| < 1 µA 9.95 9.95 10 9.95 V
VDD = 15V 14.95 14.95 15 14.95 V
V
IL
LOW Level VDD = 5V, VO = 0.5V 1.5 2 1.5 1.5 V Input Voltage VDD = 10V, VO = 1.0V 3.0 4 3.0 3.0 V
VDD = 15V, VO = 1.5V 4.0 6 4.0 4.0 V
V
IH
HIGH Level VDD = 5V, VO = 4.5V 3.5 3.5 3 3.5 V Input Voltage VDD = 10V, VO = 9.0V 7.0 7.0 6 7.0 V
VDD = 15V, VO = 13.5V 11.0 11.0 9 11.0 V
I
OL
LOW Level Output VDD = 5V, VO = 0.4V 0.52 0.44 0.88 0.36 mA Current VDD = 10V, VO = 0.5V 1.3 1.1 2.25 0.9 mA (Note 3) VDD = 15V, VO = 1.5V 3.6 3.0 8.8 2.4 mA
I
OH
HIGH Level Output VDD = 5V, VO = 4.6V 0.52 0.44 0.88 0.36 mA Current VDD = 10V, VO = 9.5V 1.3 1.1 2.25 0.9 mA (Note 3) VDD = 15V, VO = 13.5V 3.6 3.0 8.8 2.4 mA
I
IN
Input Current VDD = 15V, VIN = 0V 0.30 10−5−0.30 −1.0 µA
VDD = 15V, VIN = 15V 0.30 10−50.30 1.0 µA
Symbol Parameter Conditions Typ Max Units
t
PHL
Propagation Delay Time, VDD = 5V 100 250 ns HIGH-to-LOW Lev el VDD = 10V 40 100 ns
VDD = 15V 3070ns
t
PLH
Propagation Delay Time, VDD = 5V 90 250 ns LOW-to-HIGH Le vel VDD = 10V 40 100 ns
VDD = 15V 3070ns
t
THL
, t
TLH
Transition Time VDD = 5V 90 200 ns
VDD = 10V 50 100 ns VDD = 15V 4080ns
C
IN
Average Input Capacitance Any Input 5 7.5 pF
C
PD
Power Dissipation Capacity Any Gate 18 pF
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CD4071BC • CD4081BC
AC Electrical Charac teristics (Note 5)
CD4081BC TA = 25°C, Input tr; tf = 20 ns, CL = 50 pF, RL = 200 k, Typical temperature coefficient is 0.3%/°C
Note 5: AC Parameters are guara nt eed by DC correlated testing.
Typical Performance Characteristics
Typical Transfer Characteristics
Typical Transfer Characteristics
Typical Transfer
Characteristics
Typical Transfer
Characteristics
Symbol Parameter Conditions Typ Max Units
t
PHL
Propagation Delay Time, VDD = 5V 100 250 ns HIGH-to-LOW Level VDD = 10V 40 100 ns
VDD = 15V 30 70 ns
t
PLH
Propagation Delay Time, VDD = 5V 120 250 ns LOW-to-HIGH Level VDD = 10V 50 100 ns
VDD = 15V 35 70 ns
t
THL
, t
TLH
Transition Time VDD = 5V 90 200 ns
VDD = 10V 50 100 ns VDD = 15V 40 80 ns
C
IN
Average Input Capacitance Any Input 5 7.5 pF
C
PD
Power Dissipation Capacity Any Gate 18 pF
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CD4071BC • CD4081BC
Typical Performance Characteristics (Continued)
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CD4071BC • CD4081BC
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150” Narrow
Package Number M14A
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Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are i mplied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
CD4071BC • CD4081BC Quad 2-Input OR Buffered B Series Gate • Quad 2-Input AND Buffered B Series Gate
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or system s a re devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant injur y to the user.
2. A critical compon ent in any com ponent of a li fe support device or system whose failure to p erform can be r ea­sonably expected to cause the failure of the life suppor t device or system, or to affect its safety or effectiveness.
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Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
Package Number N14A
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