Datasheet 93C46 Datasheet

Page 1
93C06/46
256 Bit/1K 5.0V CMOS Serial EEPROM

FEATURES

• 16 bit memory organization
- 6 x 16 bit organization (93C06)
- 64 x 16 bit organization (93C46)
• Single 5 volt only operation
• Self-timed ERASE and WRITE cycles
• Automatic ERASE before WRITE
• Power on/off data protection circuitry
• 1,000,000 ERASE/WRITE cycles guaranteed
• Data Retention > 200 years
• 8-pin DIP or SOIC package
• Available for extended temperature ranges:
- Commercial: 0˚C to +70˚C
- Industrial: -40˚C to +85˚C
- Automotive: -40˚C to +125˚C
• 2 ms program cycle time

DESCRIPTION

The Microchip Technology Inc. 93C06/46 family of Serial Electrically Erasable PROMs are configured in a x16 organization. Advanced CMOS technology makes these devices ideal for low-power non-volatile memory applications. The 93C06/46 is available in the standard 8-pin DIP and surface mount SOIC packages. The 93C46X comes as SOIC only.
These devices offer fast (1 ms) byte write and extended (-40˚C to +125˚C) temperature operation. It is recom­mended that all other applications use Microchip’s 93LC46.

PACKAGE TYPE

DIP
1
CS
DO
2
93C06 93C46
3
DI
4
CLK
SOIC
CC
1
2
3
4
1
2
3
4
93C06 93C46
93C46X
CS
CLK
DI
DO
NC
V 
CS
CLK

BLOCK DIAGRAM

V
CC VSS
8
V
CC
7
NC
6
NC
5
V
SS
8
V
CC
7
NC
6
NC
5
V
SS
8
NC
7
V
SS
6
DO
5
DI
MEMORY
ARRAY
DATA REGISTER
DI
MODE
DECODE
CS
CLK
1995 Microchip Technology Inc. DS11179C-page 1
LOGIC
CLOCK
GENERATOR
ADDRESS DECODER
OUTPUT
BUFFER
DO
Page 2
93C06/46
µ

1.0 ELECTRICAL CHARACTERISTICS

1.1 Maximum Ratings*

V
............................................................................7.0V
CC
SS
All inputs and outputs w.r.t. V
.........-0.6V to V
Storage temperature................................-65˚C to +150˚C
CC
+1.0V
TABLE 1-1: PIN FUNCTION TABLE
Name Function
CS Chip Select
CLK Serial Clock
DI Data In
Ambient temperature with power applied .-65˚C to +125C
Soldering temperature of leads (10 seconds)........+300˚C
ESD protection on all pins ......................................... 4 kV
*Notice: Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress rat­ing only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
DO Data Out
SS
V
Ground
NC No Connect; No Internal
Connection
V
CC
+5V Power Supply
TABLE 1-2: DC CHARACTERISTICS
V
= +5V ( ± 10%) Commercial: Tamb = 0˚C to +70˚C
CC
Industrial: Tamb = -40˚C to +85˚C Automotive: Tamb = -40˚C to +125˚C (Note 3)
Parameter Symbol Min Max Units Conditions
V
CC
detector threshold V High level input voltage V Low level input voltage V High level output voltage V Low level output voltage V Input leakage current I Output leakage current I Pin capacitance
(all inputs/outputs)
TH
IH
IL OH OL LI
LO
C
IN
, C
OUT
2.8 4.5 V
2.0 V
CC
+ 1 V
-0.3 0.8 V
2.4 — V I — 0.4 V I —10 —10
µ
AV
µ
AV
— 7 pF V
= -400 µ A
OH
= 3.2 mA
OL
= 0V to V
IN
= 0V to V
OUT IN
/V
OUT
Tamb = +25˚C, f = 1 MHz
(Note 1)
CC
(Note 1)
CC
= 0V (Note 2)
Operating current (all modes) I Standby current I
write — 4 mA F
CC
CCS
— 100
CLK
A CS = 0V, V
Note 1: Internal resistor pull-up at Pin 6. Note 2: This parameter is periodically sampled and not 100% tested. Note 3: For operation above 85˚C, endurance is rated at 10,000 ERASE/WRITE cycles.
FIGURE 1-1: SYNCHRONOUS DATA TIMING
TCKH TCKL
CLK
TDIH
TDIH
TPD
VALID
T
DIS
VALID
TPD
VALID
DS11179C-page 2
DI
CS
DO
TDIS
VALID
TCSS
= 1 MHz, V
CC
TCSH
TCZ
1995 Microchip Technology Inc.
CC
= 5.5V
TCSL
HIGH
Z
= 5.5V
Page 3
TABLE 1-3: AC CHARACTERISTICS
Parameter Symbol Min Max Units Conditions
93C06/46
Clock frequency F Clock high time T Clock low time T Chip select setup time T Chip select hold time T Chip select low time T Data input setup time T Data input hold time T Data output delay time T Data output disable time (from CS = low) T Data output disable time (from last clock) T Status valid time T Program cycle time (Auto Erase and Write) T
Erase cycle time T
CLK
CKH CKL CSS CSH CSL
DIS DIH
PD CZ
DDZ
SV
WC
EC

2.0 PIN DESCRIPTION

2.1 Chip Select (CS)

A HIGH level selects the device. A LOW level dese­lects the device and forces it into standby mode. How­ever, a programming cycle which is already initiated and/or in progress will be completed, regardless of the CS input signal. If CS is brought LOW during a pro­gram cycle, the device will go into standby mode as soon as the programming cycle is completed.
CS must be LOW for 100 ns minimum (T consecutive instructions. If CS is LOW, the internal control logic is held in a RESET status.

2.2 Serial Clock (CLK)

The Serial Clock is used to synchronize the communi­cation between a master device and the 93C06/46. Opcode, address, and data bits are clocked in on the positive edge of CLK. Data bits are also clocked out on the positive edge of CLK.
CLK can be stopped anywhere in the transmission sequence (at HIGH or LOW level) and can be contin­ued anytime (with respect to clock HIGH time (T and clock LOW time (T master freedom in preparing opcode, address and data.
CLK is a “Don't Care” if CS is LOW (device deselected). If CS is HIGH, but START condition has not been detected, any number of clock cycles can be received by the device without changing its status. (i.e., waiting for START condition).
CKL
). This gives the controlling
CSL
) between
CKH
500 — ns 500 — ns
50 — ns
0— ns 100 — ns 100 — ns 100 — ns
— 400 ns CL = 100 pF
0 100 ns CL = 100 pF
0 400 ns CL = 100 pF
— 100 ns CL = 100 pF —215ms
—1 ms
CLK cycles are not required during the self-timed WRITE (i.e., auto ERASE/WRITE) cycle.
After detection of a start condition, the specified num­ber of clock cycles (respectively LOW to HIGH transi­tions of CLK) must be provided. These clock cycles are required to clock in all required opcode, address, and data bits before an instruction is executed (see instruc­tion set truth table). CLK and DI then become “Don't Care” inputs waiting for a new start condition to be detected.
Note: CS must go LOW between consecutive

2.3 Data In (DI)

Data In is used to clock in a START bit, opcode, address, and data synchronously with the CLK input.

2.4 Data Out (DO)

Data Out is used in the READ mode to output data synchronously with the CLK input (T tive edge of CLK).
This pin also provides READY/BUSY
)
tion during ERASE and WRITE cycles. READY/BUSY status information is available on the DO pin if CS is brought HIGH after being LOW for minimum chip select LOW time (T clocked in the last DI bit (D0 for WRITE, A0 for ERASE) and an ERASE or WRITE operation has been initiated.
1 MHz
ms For ERAL and WRAL
instructions.
PD
) from the falling edge of the CLK which
CSL
after the posi-
status informa-
1995 Microchip Technology Inc. DS11179C-page 3
Page 4
93C06/46
The status signal is not available on DO, if CS is held LOW or HIGH during the entire WRITE or ERASE cycle. In all other cases DO is in the HIGH-Z mode. If status is checked after the WRITE/ERASE cycle, a pull-up resistor on DO is required to read the READY signal.
Care must be taken with the leading dummy zero which is outputted after a READ command has been detected. Also, the controlling device must not drive the DI/DO bus during Erase and Write cycles if the READY/BUSY
status information is outputted by the
93C06/46.
DI and DO can be connected together to perform a 3­wire interface (CS, CLK, DI/DO).
INSTRUCTION SET - 93C06
Instruction Start BIT
READ 1 1 0 0 0 A3 A2 A1 A0 — D15 - D0 25 WRITE 1 0 1 0 0 A3 A2 A1 A0 D15 - D0 (RDY/BSY ERASE 1 1 1 0 0 A3 A2 A1 A0 — (RDY/BSY)9 EWEN 1 0 0 1 1 X X X X — High-Z 9 EWDS 1 0 0 0 0 X X X X — High-Z 9 ERAL 1 0 0 1 0 X X X X — (RDY/BSY)9 WRAL 1 0 0 0 1 X X X X D15 - D0 (RDY/BSY)25
Opcode
OP1 OP2
Address
Number of
Data In
Data Out
Req. CLK
Cycles
)25
INSTRUCTION SET - 93C46
Instruction Start BIT
READ 1 1 0 A5 A4 A3 A2 A1 A0 — D15 - D0 25 WRITE 1 0 1 A5 A4 A3 A2 A1 A0 D15 - D0 (RDY/BSY)25 ERASE 1 1 1 A5 A4 A3 A2 A1 A0 — (RDY/BSY)9 EWEN 1 0 0 1 1 X X X X — High-Z 9 EWDS 1 0 0 0 0 X X X X — High-Z 9 ERAL 1 0 0 1 0 X X X X — (RDY/BSY)9 WRAL 1 0 0 0 1 X X X X D15 - D0 (RDY/BSY)25
Opcode
OP1 OP2
Address
Number of
Data In
Data Out
Req. CLK
Cycles

3.0 FUNCTIONAL DESCRIPTION

3.1 ST
The START bit is detected by the device if CS and DI are both HIGH with respect to the positive edge of CLK for the first time.
Before a STAR T condition is detected, CS, CLK, and DI may change in any combination (except to that of a STAR T condition), without resulting in any device oper­ation (READ, WRITE, ERASE, EWEN, EWDS, ERAL, and WRAL). As soon as CS is HIGH, the device is no longer in the standby mode.
An instruction following a START condition will only be executed if the required amount of opcode, address and data bits for any particular instruction is clocked in.
After execution of an instruction (i.e., clock in or out of the last required address or data bit) CLK and DI become don't care bits until a new start condition is detected.

3.2 DI/DO

It is possible to connect the Data In and Data Out pins together. However, with this configuration it is possible for a “bus conflict” to occur during the “dummy zero”
ART Condition
that precedes the READ operation, if A0 is a logic HIGH level. Under such a condition the voltage level seen at Data Out is undefined and will depend upon the relative impedances of Data Out and the signal source driving A0. The higher the current sourcing capability of A0, the higher the voltage at the Data Out pin.

3.3 Data Protection

During power-up, all modes of operation are inhibited until V
CC
has reached 2.8V. During power-down, the source data protection circuitry acts to inhibit all modes when V
The EWEN and EWDS commands give additional pro­tection against accidentally programming during nor­mal operation.
After power-up, the device is automatically in the EWDS mode. Therefore, an EWEN instruction must be performed before any ERASE or WRITE instruction can be executed. After programming is completed, the EWDS instruction offers added protection against unin­tended data changes.
has fallen below 2.8V.
CC
DS11179C-page 4
1995 Microchip Technology Inc.
Page 5
93C06/46

3.4 READ Mode

The READ instruction outputs the serial data of the addressed memory location on the DO pin. A dummy bit (logical 0) precedes the 16-bit output string. The output data changes during the HIGH state of the sys­tem clock (CLK). The dummy bit is output TPD after the positive edge of CLK, which was used to clock in the last address bit (A0). Therefore, care must be taken if DI and DO are connected together as a bus contention will occur for one clock cycle if A0 has been a one.
DO will go into HIGH-Z mode with the positive edge of the next CLK cycle. This follows the output of the last data bit D0 or the low going edge of CS, which ever occurs first.
DO remains stable between CLK cycles for an unlim­ited time as long as CS stays HIGH.
The most significant data bit (D15) is always output first, followed by the lower significant bits (D14 - D0).
FIGURE 3-1: READ MODE
CLK

3.5 WRITE Mode

The WRITE instruction is followed by 16 bits of data which are written into the specified address. The most significant data bit (D15) has to be clocked in first, fol­lowed by the lower significant data bits (D14 – D0). If a WRITE instruction is recognized by the device and all data bits have been clocked in, the device performs an automatic ERASE cycle on the specified address before the data are written. The WRITE cycle is com­pletely self-timed and commences automatically after the rising edge of the CLK for the last data bit (D0).
The WRITE cycle takes 2 ms maximum.
CS
OP1SB A5 A0
DI
10
DO
FIGURE 3-2: WRITE MODE
CLK
CS
SB A3
DI
101
DO
OP2 A4 A3
1
OP2
HIGH - Z
HIGH - Z
A4A5OP1
TPD
0
A0 D15 D0
TDDZ
D0D15
NEW INSTRUCTION
OR STANDBY (CS = 0)
TCSL
STATUS
CHECK
TSV
BSY
RDY
TCSL
TCSL
TDDZ
TWC
NEW INSTRUCTION
OR STANDBY (CS = 0)
1995 Microchip Technology Inc. DS11179C-page 5
Page 6
93C06/46

3.6 ERASE Mode

The ERASE instruction forces all the data bits of the specified address to logical "1s". The ERASE cycle is completely self-timed and commences automatically after the last address bit has been clocked in.
The ERASE cycle takes 1 ms maximum.
FIGURE 3-3: ERASE MODE
CLK
CS
OP2SB
DI
1
DO
11
HIGH - Z

3.7 ERASE/WRITE Enable/Disable (EWEN, EWDS)

The device is automatically in the ERASE/WRITE Disable mode (EWDS) after power-up. Therefore, an EWEN instruction has to be performed before any ERASE, WRITE, ERAL, WRAL instruction is exe­cuted by the device. For added data protection, the device should be put in the ERASE/WRITE Disable mode (EWDS) after programming operations are completed.
A4A5OP1
A3 A0
TCSL
STATUS CHECK
TSV
BSY
TEC
NEW INSTRUCTION
OR STANDBY (CS = 0)
TCSL
TDDZ
RDY
FIGURE 3-4: ERASE/WRITE ENABLE/DISABLE
CLK
CS
OP1SB
OP2
DI
10000
DS11179C-page 6
11
XX
XX
(EWDS) (EWEN)
TCSL
SB
NEW INSTRUCTION
OR STANDBY (CS = 0)
1995 Microchip Technology Inc.
Page 7
93C06/46
3.8 ERASE
All (ERAL)
The entire chip will be erased to logical "1s" if this instruction is received by the device and it is in the EWEN mode. The ERAL cycle is completely self-timed and commences after the last dummy address bit has been clocked in.
ERAL takes 15 ms maximum.
FIGURE 3-5: ERASE ALL
CLK
CS
OP1
SB
DI
11000XX
DO
OP2
HIGH - Z
TCSL
STATUS
CHECK
XX
TSV
TWC
NEW INSTRUCTION
OR STANDBY (CS = 0)
T
BSY
DDZ
TCSL
RDY
3.9 WRITE
All (WRAL)
The entire chip will be written with the data specified in that command. The WRAL cycle is completely self­timed and commences after the rising edge of the CLK for the last data bit (DO). WRAL takes 15 ms maxi­mum.
FIGURE 3-6: WRITE ALL
CLK
CS
OP1SB OP2
DI
DO
0
1
0
01
HIGH - Z
Note: The WRAL does not include an automatic
ERASE cycle for the chip. Therefore, the WRAL instruction must be preceded by an ERAL instruction and the chip must be in the EWEN status in both cases.
The WRAL instruction is used for testing and/or device initialization.
T
CSL
STATUS
TWC
CHECK
BSY
TSV
RDY
D15
X
X
XX
D0
NEW INSTRUCTION
OR STANDBY (CS = 0)
TCSL
1995 Microchip Technology Inc. DS11179C-page 7
Page 8
93C06/46
93C06/46
To order or to obtain information, e.g., on pricing or delivery, please use the listed part numbers, and refer to the factory or the listed sales offices.
Product Identification System
93C06/46 - /P
AMERICAS
Corporate Office
Microchip T echnology Inc. 2355 West Chandler Blvd. Chandler, AZ 85224-6199 Tel: 602 786-7200 Fax: 602 786-7277
Technical Support: Web:
http://www.mchip.com/biz/mchip
Atlanta
Microchip T echnology Inc. 500 Sugar Mill Road, Suite 200B Atlanta, GA 30350 Tel: 770 640-0034 Fax: 770 640-0307
Boston
Microchip T echnology Inc. 5 Mount Royal Avenue Marlborough, MA 01752 Tel: 508 480-9990 Fax: 508 480-8575
Chicago
Microchip T echnology Inc. 333 Pierce Road, Suite 180 Itasca, IL 60143 Tel: 708 285-0071 Fax: 708 285-0075
Dallas
Microchip T echnology Inc. 14651 Dallas Parkway, Suite 816 Dallas, TX 75240-8809 Tel: 214 991-7177 Fax: 214 991-8588
Dayton
Microchip T echnology Inc. 35 Rockridge Road Englewood, OH 45322 Tel: 513 832-2543 Fax: 513 832-2841
Los Angeles
Microchip T echnology Inc. 18201 Von Karman, Suite 455 Irvine, CA 92715 Tel: 714 263-1888 Fax: 714 263-1338
New York
Microchip T echnology Inc. 150 Motor Parkway, Suite 416 Hauppauge, NY 11788 Tel: 516 273-5305 Fax: 516 273-5335
602 786-7627
Package: P = Plastic DIP (300 mil Body)
Temperature Blank = 0°C to +70°C Range: I = -40°C to +85°C
Device: Configuration
AMERICAS (continued)
San Jose
Microchip T echnology Inc. 2107 North First Street, Suite 590 San Jose, CA 95131 Tel: 408 436-7950 Fax: 408 436-7955
ASIA/PACIFIC
Hong Kong
Microchip T echnology Unit No. 3002-3004, Tower 1 Metroplaza 223 Hing Fong Road Kwai Fong, N.T. Hong Kong Tel: 852 2 401 1200 Fax: 852 2 401 3431
Korea
Microchip T echnology 168-1, Youngbo Bldg. 3 Floor Samsung-Dong, Kangnam-Ku, Seoul, Korea Tel: 82 2 554 7200 Fax: 82 2 558 5934
Singapore
Microchip T echnology 200 Middle Road #10-03 Prime Centre Singapore 188980 Tel: 65 334 8870 Fax: 65 334 8850
Taiwan
Microchip T echnology 10F-1C 207 Tung Hua North Road Taipei, T aiwan, ROC Tel: 886 2 717 7175 Fax: 886 2 545 0139
SN = Plastic SOIC (150 mil Body)
SM = Plastic SOIC (207 mil Body)
E = -40°C to +125°C
93C06 256 bit CMOS Serial EEPROM 93C46 1K CMOS Serial EEPROM
93C46X 1K CMOS Serial EEPROM in alternate pinouts (SN
package only) 93C06T CMOS Serial EEPROM (Tape and Reel) 93C46T CMOS Serial EEPROM (Tape and Reel)
93C46XT CMOS Serial EEPROM (Tape and Reel)
EUROPE
United Kingdom
Arizona Microchip Technology Ltd. Unit 6, The Courtyard Meadow Bank, Furlong Road Bourne End, Buckinghamshire SL8 5AJ T el: 44 0 1628 851077 Fax: 44 0 1628 850259
France
Arizona Microchip Technology SARL 2 Rue du Buisson aux Fraises 91300 Massy - France Tel: 33 1 69 53 63 20 Fax: 33 1 69 30 90 79
Germany
Arizona Microchip Technology GmbH Gustav-Heinemann-Ring 125 D-81739 Muenchen, Germany Tel: 49 89 627 144 0 Fax: 49 89 627 144 44
Italy
Arizona Microchip Technology SRL Centro Direzionale Colleoni Palazzo Pegaso Ingresso No. 2 Via Paracelso 23, 20041 Agrate Brianza (MI) Italy Tel: 39 039 689 9939 Fax: 39 039 689 9883
JAPAN
Microchip Technology Intl. Inc. Benex S-1 6F 3-18-20, Shin Yokohama Kohoku-Ku, Y okohama Kanagawa 222 Japan Tel: 81 45 471 6166 Fax: 81 45 471 6122
9/5/95
Printed in the USA, 9/95
1995, Microchip Technology Incorporated
"Information contained in this publication regarding device applications and the like is intended through suggestion only and may be superseded by updates. No representation or warranty is given and no liability is assumed by Microchip Technology Incorporated with respect to the accuracy or use of such information, or infringement of patents arising from such use or otherwise. Use of Microchip's products as critical components in life support systems is not authorized except with express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property rights." The Microchip logo and name are registered trademarks of Microchip Technology Inc. All rights reserved. All other trademarks mentioned herein are the property of their respective companies.
DS11179C-page 8
1995 Microchip Technology Inc.
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