High-Current 3-State True Outputs Can
Drive up to 15 LSTTL Loads
D
Full Parallel Access for Loading
D
Package Options Include Plastic
Small-Outline (DW) and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These 8-bit flip-flops feature 3-state outputs
designed specifically for driving highly capacitive
or relatively low-impedance loads. They are
particularly suitable for implementing buffer
registers, I/O ports, bidirectional bus drivers, and
working registers.
The eight flip-flops of the ’HCT374 are
edge-triggered D-type flip-flops. On the positive
transition of the clock (CLK) input, the Q outputs
are set to the logic levels that were set up at the
data (D) inputs.
An output-enable (OE
outputs in either a normal logic state (high or low
logic levels) or the high-impedance state. In the
high-impedance state, the outputs neither load
nor drive the bus lines significantly. The
high-impedance state and increased drive
provide the capability to drive bus lines without
interface or pullup components.
) input places the eight
SN54HCT374 ...J OR W PACKAGE
SN74HCT374 . . . DW OR N PACKAGE
SN54HCT374 . . . FK PACKAGE
2D
2Q
3Q
3D
4D
(TOP VIEW)
OE
1
1Q
2
1D
3
2D
4
2Q
5
3Q
6
3D
7
4D
8
4Q
9
GND
10
(TOP VIEW)
1D1QOE
3212019
4
5
6
7
8
910111213
4Q
GND
20
19
18
17
16
15
14
13
12
11
CLK
CC
V
5Q
V
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
8Q
18
17
16
15
14
5D
CC
8D
7D
7Q
6Q
6D
OE
does not affect the internal operations of the flip-flops. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
The SN54HCT374 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HCT374 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each flip-flop)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
INPUTS
OECLKD
L↑HH
L↑LL
LH or LXQ
HXXZ
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
OUTPUT
Q
0
Copyright 1997, Texas Instruments Incorporated
1
Page 2
SN54HCT374, SN74HCT374
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS005B – MARCH 1984 – REVISED MA Y 1997
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
OE
CLK
1D
2D
3D
4D
5D
6D
7D
8D
1
11
3
4
7
8
13
14
17
18
EN
C1
1D
logic diagram (positive logic)
1
OE
11
CLK
12
15
16
19
2
1Q
5
2Q
6
3Q
9
4Q
5Q
6Q
7Q
8Q
C1
1D
1D
3
To Seven Other Channels
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
†
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC.
Supply voltage4.555.54.555.5V
CC
High-level input voltageVCC = 4.5 V to 5.5 V22V
IH
Low-level input voltageVCC = 4.5 V to 5.5 V00.800.8V
IL
Input voltage0V
I
Output voltage0V
O
Input transition (rise and fall) time05000500ns
Operating free-air temperature–55125–4085°C
A
TA = 25°CSN54HCT374SN74HCT374
MINTYPMAXMINMAXMINMAX
4.44.4994.44.4
3.984.33.73.84
0.0010.10.10.1
0.170.260.40.33
3101010pF
I
I
I
∆I
C
OH
OL
I
OZ
CC
i
CC
CC
=
I
IH
=
or
I
IH
VI = VCC or 05.5 V±0.1±100±1000±1000nA
VO = VCC or 05.5 V±0.01±0.5±10±5µA
VI = VCC or 0,IO = 05.5 V816080µA
One input at 0.5 V or 2.4 V,
†
Other inputs at 0 or V
IL
IL
IOH = –20 µA
IOH = –6 mA
IOL = 20 µA
IOL = 6 mA
CC
5.5 V1.42.432.9mA
4.5 V
to 5.5 V
CC
CC
0V
0V
CC
CC
V
V
timing requirements over recommended operating free-air temperature range (unless otherwise
noted)
TA = 25°CSN54HCT374SN74HCT374
CC
MINMAXMINMAXMINMAX
clock
y
w
p
4.5 V031021025
5.5 V
4.5 V162420
5.5 V
4.5 V203025
5.5 V172723
4.5 V101010
5.5 V101010
036023028
142218
z
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
Page 4
SN54HCT374, SN74HCT374
PARAMETER
V
UNIT
f
MH
tpdCLK
Any Q
ns
t
OE
Any Q
ns
t
OE
Any Q
ns
ttAny Q
ns
PARAMETER
V
UNIT
tpdCLK
Any Q
ns
t
OE
Any Q
ns
ttAny Q
ns
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS005B – MARCH 1984 – REVISED MA Y 1997
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
max
en
dis
CC
4.5 V31362125
5.5 V36402328
4.5 V30365445
5.5 V25324941
4.5 V26304538
5.5 V23274134
4.5 V23304538
5.5 V22274134
4.5 V10121815
5.5 V9111614
switching characteristics over recommended operating free-air temperature range, CL = 150 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
en
CC
4.5 V40466958
5.5 V35416252
4.5 V34406050
5.5 V29365445
4.5 V18426353
5.5 V16385748
TA = 25°CSN54HCT374SN74HCT374
MINTYPMAXMINMAXMINMAX
z
TA = 25°CSN54HCT374SN74HCT374
MINTYPMAXMINMAXMINMAX
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per flip-flopNo load85pF
pd
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Page 5
SN54HCT374, SN74HCT374
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS005B – MARCH 1984 – REVISED MA Y 1997
PARAMETER MEASUREMENT INFORMATION
V
From Output
Under Test
(see Note A)
Test
Point
C
L
LOAD CIRCUIT
CC
S1
R
L
S2
PARAMETERC
t
t
PZH
t
PZL
t
PHZ
t
PLZ
t
en
t
dis
tpd or t
R
1 kΩ
1 kΩ
L
50 pF
150 pF
50 pF
50 pF
150 pF
L
or
ClosedOpen
ClosedOpen
or
S1
OpenClosed
OpenClosed
OpenOpen––
S2
High-Level
Pulse
Low-Level
Pulse
Input
In-Phase
Output
Out-of-
Phase
Output
PROPAGATION DELAY AND OUTPUT RISE AND FALL TIMES
1.3 V
t
t
1.3 V
t
w
1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V
PLH
90%90%
t
r
PHL
1.3 V1.3 V
10%10%
t
f
VOLTAGE WAVEFORMS
1.3 V
1.3 V
t
PHL
t
PLH
3 V
0 V
3 V
0 V
1.3 V1.3 V
10%10%
90%90%
t
f
t
r
Reference
Input
t
su
Data
Input
SETUP AND HOLD AND INPUT RISE AND FALL TIMES
3 V
0 V
V
V
V
V
OH
OL
OH
OL
Output
Control
(Low-Level
Enabling)
Output
Waveform 1
(See Note B)
Output
Waveform 2
(See Note B)
ENABLE AND DISABLE TIMES FOR 3-STATE OUTPUTS
2.7 V2.7 V
VOLTAGE WAVEFORMS
t
PZL
t
PZH
VOLTAGE WAVEFORMS
t
r
1.3 V
1.3 V
1.3 V
1.3 V
t
h
1.3 V
1.3 V1.3 V
10%
90%
0.3 V0.3 V
t
PLZ
t
PHZ
3 V
0 V
3 V
0 V
t
f
3 V
0 V
≈ V
CC
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and test-fixture capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
D. For clock inputs, f
E. The outputs are measured one at a time with one input transition per measurement.
F. t
G. t
H. t
PLZ
PZL
PLH
and t
and t
and t
PHZ
PZH
PHL
is measured when the input duty cycle is 50%.
max
are the same as t
are the same as ten.
are the same as tpd.
dis
.
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
Page 6
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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