The 74VHC574 is an advanced high-speed
CMOS OCT AL D- TYP E FL I P FL O P wi th 3 S TAT E
OUTPUTS NON INVERTING fabricated with
sub-micron silicon gate and double-layer metal
wiring C
2
MOS technology.
These 8 bit D-Type flip-flop is controlled by a clock
input (CK) and an output enable input (OE
).
On the positive transition of the clock, the Q
outputs will be set to the logic states that were
setup at the D inputs.
While the (OE
) input is low, the 8 outputs will be in
a normal logic state (high or low logic level) and
TSSOPSOP
Table 1: Order Codes
PACKAGET & R
SOP74VHC574MTR
TSSOP74VHC574TTR
while high level the outputs will be in a high
impedance state.
The Output control does not affect the internal
operation of flip flop; that is, the old data can be
retained or the new data can be entered even
while the outputs are off.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage. This device can be
used to interface 5V to 3V.
All inputs and outputs are equipped with
protection circuits against static disc harge, giving
them 2KV ESD immunity and transient excess
voltage.
(*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ±
Note 1: Parameter guaranteed by design. t
0.5V
soLH
= |t
pLHm
- t
pLHn
|, t
soHL
= |t
pHLm
- t
pHLn
|
Table 8: Capacitive Characteristics
Test ConditionValue
= 25°C
SymbolParameter
T
A
Min.Typ. Max.Min.Max. Min. Max.
C
C
C
Input Capacitance
IN
Output
OUT
Capacitance
Power Dissipation
PD
Capacitance
7101010pF
9pF
28pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (R ef er to Test Circ ui t). Averag e operating current can be obtained by t he following equation. I
Flip-Flop)
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/8 (per
CC(opr)
Unit
5/14
Page 6
74VHC574
Table 9: Dynamic Switching Characteristics
Test ConditionValue
= 25°C
SymbolParameter
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
V
(V)
5.0
CC
T
A
Min.Typ. Max.Min.Max. Min.Max.
0.60.9
-0.9-0.6
Dynamic High
V
IHD
Voltage Input
5.03.5V
= 50 pF
C
L
(note 1, 3)
Dynamic Low
V
ILD
Voltage Input
5.01.5V
(note 1, 3)
1) Worst cas e package.
2) Max number of outputs defined as (n ). Data input s are driven 0V to 5.0V, (n-1) outputs sw i t ching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (V
(V
), f=1MHz .
IHD
Figure 4: Test Circuit
-40 to 85°C -55 to 125°C
ILD
Unit
V
), 0V to thresh ol d
TESTSWITCH
t
, t
PLH
PHL
, t
t
PZL
PLZ
t
, t
PZH
PHZ
CL =15/50pF or equivalent (i ncludes jig and probe capac i t ance)
R
= R1 = 1KΩ or equiva l ent
L
R
= Z
of pulse gen erator (typi cally 50Ω)
T
OUT
6/14
Open
V
CC
GND
Page 7
74VHC574
Figure 5: Waveform - Propagation Delays, Setup And Hold Times (f=1MHz; 50% duty cycle)
Figure 6: Waveform 2: Output Enable And Disable Times (f=1MHz; 50% duty cycle)
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