The 74VHC174 is an advanced high-speed
CMOS HEX D-TYPE FLIP FLOP WITH CLEAR
fabricated with sub-micron silicon gate and
double-layer metal wiring C
2
MOS technology.
Information signals applied to D inputs are
transferred to the Q o utputs on the positive going
edge of the clock pulse.
TSSOPSOP
Table 1: Order Codes
PACKAGET & R
SOP74VHC174MTR
TSSOP74VHC174TTR
When the CLE AR
input is held low, the Q outputs
are held low independently of the other inputs.
Power down protection is provided on all inputs
and 0 to 7V can be accepted on inputs with no
regard to the supply voltage. This device can be
used to interface 5V to 3V.
All inputs and outputs are equipped with
protection circuits against static disc harge, giving
them 2KV ESD immunity and transient excess
voltage.
Figure 1: Pi n C onnect ion And I E C Logic Sym bols
(*) Voltage range is 3.3V ± 0.3V
(**) Voltage range is 5.0V ±
0.5V
Table 8: Capacitive Characteristics
Test ConditionValue
= 25°C
SymbolParameter
T
A
Min.Typ. Max.Min.Max. Min. Max.
C
C
Input Capacitance
IN
Power Dissipation
PD
Capacitance
6101010pF
15pF
(note 1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (R ef er to Test Circ ui t). Averag e operating current can be obtained by t he following equation. I
Flip-Flop)
-40 to 85°C -55 to 125°C
= CPD x VCC x fIN + ICC/6 (per
CC(opr)
Unit
5/14
Page 6
74VHC174
Table 9: Dynamic Switching Characteristics
Test ConditionValue
= 25°C
SymbolParameter
V
V
Dynamic Low
OLP
Voltage Quiet
OLV
Output (note 1, 2)
V
CC
(V)
5.0
T
A
Min.Typ. Max.Min.Max. Min. Max.
0.30.8
-0.8-0.3
Dynamic High
V
IHD
Voltage Input
5.03.5V
= 50 pF
C
L
(note 1, 3)
Dynamic Low
V
ILD
Voltage Input
5.01.5V
(note 1, 3)
1) Worst case package.
2) Max number of outp ut s defined as (n). Data inpu t s are driven 0V to 5.0V, (n-1) outputs switc hi ng and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 5.0V. Inputs under test switching: 5.0V to threshold (V
(V
), f=1MHz.
IHD
Figure 4: Te st Circuit
-40 to 85°C -55 to 125°C
ILD
Unit
V
), 0V to thresho l d
CL =15/50pF or equivalent (i ncludes jig an d probe capac i tance)
= Z
R
of pulse generator (typically 50Ω)
T
OUT
6/14
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74VHC174
Figure 5: Waveform - Propagation Delays, Setup And Hold Times (f=1MHz; 50% duty cycle)
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