•High impedance NPN base inputs for reduced loading
(20µA in High and Low states)
•Stores 16-bit–wide Data inputs, multiplexed 8-bit outputs
•3-State outputs
•Power supply current 75mA typical
DESCRIPTION
The 74F604 multiplexed latch is ideal for storing data from two input
buses, A or B, and providing data from either the A or B latches to
the output bus. Organized as 8-bit A and B latches, the latch outputs
are connected by pairs to eight 2-input multiplexers. A Select
(SELECT A/B
are multiplexed to the eight 3-State outputs. Data entered from the B
inputs are selected when SELECT A/B
inputs are selected when SELECT A/B
latches when the Latch Enable (LE
the LE
disabled when LE
) input determines whether the A or B latch contents
is Low; data from the A
is High. Data enters the
) input is Low and is latched on
rising edge. The outputs are enabled when LE is High and
One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOAD VALUE
HIGH/LOW
1990 Mar 01853–0029 98991
1
Page 2
Philips SemiconductorsProduct specification
74F604Dual octal latch (3-State)
LOGIC SYMBOL
3
456
B0B1B2B3B4B5B6B7
A0A1A2A3
LE
1
SELECT A/B
2
VCC= Pin 28
GND = Pin 14
8910
Q0 Q1 Q2 Q3
15
13 12 11
27 26 25 24 23
A4A5A67A7
Q4 Q5 Q616Q7
17 18 19
22 21 20
FUNCTION TABLE
INPUTSOUTPUTS
A0–A7B0–B7SELECT A/BLEQ0–Q7
A dataB dataL↑B data
A dataB dataH↑B data
XXXLZ
XXLHB latched data
XXHHA latched data
H = High voltage level
L = Low voltage level
X = Don’t care
Z = High impedance “off” state
↑ = Low-to-High clock transition
SF01116
IEC/IEEE SYMBOL (IEEE/IEC)
2
1
3
4
5
6
7
8
9
10
27
26
25
24
23
22
21
20
G2
E1
EN
1D 2
1D 2
≥1
15
13
12
11
16
17
18
19
SF01117
1990 Mar 01
2
Page 3
Philips SemiconductorsProduct specification
74F604Dual octal latch (3-State)
LOGIC DIAGRAM
SELECT A/B
2
1
LE
3
A0
4
B0
5
A1
6
B1
7
A2
8
B2
9
A3
10
B3
27
A4
26
B4
D
E
D
E
D
E
D
E
D
E
D
E
15
Q0
D
E
13
Q1
D
E
12
Q2
D
E
11
Q3
D
E
16
Q4
VCC = Pin 28
GND = Pin 14
1990 Mar 01
25
A5
24
B5
23
A6
22
B6
21
A7
20
B7
D
E
D
E
D
E
D
E
17
Q5
D
E
18
Q6
D
E
19
Q7
SF01118
3
Page 4
Philips SemiconductorsProduct specification
SYMBOL
PARAMETER
UNIT
74F604Dual octal latch (3-State)
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
I
OUT
T
T
CC
IN
OUT
amb
stg
Supply voltage–0.5 to +7.0V
Input voltage –0.5 to +7.0V
Input current–30 to +5mA
Voltage applied to output in High output state–0.5 to +V
Current applied to output in Low output state48mA
Operating free-air temperature range0 to +70°C
Storage temperature range–65 to +150°C
(Over recommended operating free-air temperature range unless otherwise noted.)
1
MINTYP
±10%V
±5%V
±10%V
±5%V
CC
CC
CC
CC
V
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
evel output voltage
ow-level output voltage
IK
Input clamp voltageVCC = MIN, II = I
Input current at maximum input
voltage
VCC = MIN, VIL = MAX,
V
IH
= MIN, I
OH
= MAX
VCC = MIN, VIL = MAX,
VIH = MIN, I
OL
IK
= MAX
VCC = 0.0V, VI = 7.0V100µA
High-level input currentVCC = MAX, VI = 2.7V20µA
Low-level input currentVCC = MAX, VI = 0.5V–20µA
Off state output current,
High-level voltage applied
Off state output current,
Low-level voltage applied
Short-circuit output current
Supply current (total)
I
I
I
VCC = MAX, VO = 2.7V50µA
VCC = MAX, V
3
VCC = MAX–60–150mA
CCH
CCL
V
= MAX
=
CCZ
= 0.5V–50µA
O
An, Bn, SELECT A/B = 4.5V, LE = ↑6082mA
An, Bn, SELECT A/B=GND, LE = ↑75100mA
An, Bn, SELECT A/B = GND,
= GND
LE
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
CC
= 5V, T
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
tests should be performed last.
OS
LIMITS
2
MAX
2.4V
2.73.4V
0.350.50V
0.350.50V
–0.73–1.2V
75100mA
AC ELECTRICAL CHARACTERISTICS
SYMBOLPARAMETER
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
1990 Mar 01
Propagation delay
SELECT A/B
to Qn (B latch)
Propagation delay
SELECT A/B
to Qn (A latch)
Output Enable time
to High or Low level
Output Disable time
from High or Low level
TEST
CONDITION
Waveform 1
Waveform 2
Waveform 4
Waveform 5
Waveform 4
Waveform 5
LIMITS
VCC = +5V
= +25°C
T
amb
= 50pF, RL = 500Ω
C
L
VCC = +5V ± 10%
T
amb
= 50pF, RL = 500Ω
C
L
MINTYPMAXMINMAX
5.0
6.0
6.0
4.0
5.0
5.0
5.0
5.0
7.0
8.5
8.0
6.5
7.5
7.5
7.0
7.0
9.0
10.5
10.0
8.5
9.5
9.5
9.5
9.5
4.5
5.5
5.5
3.5
4.5
4.5
4.5
4.5
5
= 0°C to +70°C
10.0
11.5
11.5
9.0
10.5
11.0
11.0
11.0
UNIT
ns
ns
ns
ns
Page 6
Philips SemiconductorsProduct specification
74F604Dual octal latch (3-State)
AC SETUP REQUIREMENTS
LIMITS
SYMBOLPARAMETER
TEST
CONDITION
VCC = +5V
= +25°C
T
amb
= 50pF, RL = 500Ω
C
L
MINTYPMAXMINMAX
ts(H)
(L)
t
s
th(H)
(L)
t
h
Setup time, High or Low
An, Bn to LE
Hold time, High or Low
An, Bn to LE
Waveform 3
Waveform 3
1.0
2.0
0
1.0
tW(L)LE Pulse width, LowWaveform 35.06.0ns
AC WAVEFORMS
For all waveforms, VM = 1.5V.
The shaded areas indicate when the input is permitted to change for predictable output performance.
VCC = +5V ± 10%
= 0°C to +70°C
T
amb
= 50pF, RL = 500Ω
C
L
2.0
3.0
0
1.5
UNIT
ns
ns
SELECT A/B
Qn
V
M
t
PHL
V
M
t
PLH
V
M
V
M
SF01119
Waveform 1. Propagation Delay, SELECT A/B To Output
tw(L)
=H)
V
V
M
M
V
M
SF01121
An, Bn
(B latched data=Low. LE
V
V
M
M
ts(H)ts(L)th(L)th(H)
LE
V
M
V
M
Waveform 3. Data Setup and Hold Times,
Latch Enable Pulse Width
LE
Qn
V
M
t
PZH
V
M
t
PHZ
V
M
VOH -0.3V
0V
SF01122
Waveform 4. 3-State Output Enable Time to High Level and
Output Disable Time from High Level
SELECT A/B
Qn
V
M
t
PHL
V
M
t
PLH
V
M
V
M
SF01120
Waveform 2. Propagation Delay, SELECT A/B to Output
=H)
V
M
t
PLZ
V
+0.3V
OL
SF01123
LE
Qn
(A latched data=Low. LE
V
M
t
PZL
V
M
Waveform 5. 3-State Output Enable Time to Low Level and
Output Disable Time from Low Level
1990 Mar 01
6
Page 7
Philips SemiconductorsProduct specification
74F604Dual octal latch (3-State)
TEST CIRCUIT AND WAVEFORMS
V
V
PULSE
GENERATOR
IN
R
Test Circuit for 3-State Outputs
SWITCH POSITION
TESTSWITCH
t
t
PLZ
PZL
closed
closed
All otheropen
T
D.U.T.
CC
V
OUT
7.0V
R
L
R
C
L
L
NEGATIVE
PULSE
POSITIVE
PULSE
90%
10%
V
M
10%
t
THL (tf
t
TLH (tr
90%
V
M
Input Pulse Definition
t
w
V
M
10%
)
)
t
w
t
TLH (tr
t
THL (tf
)
)
90%
V
M
90%
10%
AMP (V)
0V
AMP (V)
0V
DEFINITIONS:
= Load resistor;
R
L
see AC electrical characteristics for value.
= Load capacitance includes jig and probe capacitance;
C
L
see AC electrical characteristics for value.
= Termination resistance should be equal to Z
R
T
pulse generators.
OUT
of
family
74F
INPUT PULSE REQUIREMENTS
V
amplitude
3.0V
M
1.5V
rep. rate
1MHz500ns
t
w
t
TLHtTHL
2.5ns2.5ns
SF00777
1990 Mar 01
7
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