Datasheet 74F573SJX, 74F573SJ, 74F573SCX, 74F573SC, 74F573PC Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS009566 www.fairchildsemi.com
April 1988 Revised August 1999
74F573 Octal D-Type Latch with 3-STATE Outputs
74F573 Octal D-Type Latch with 3-STATE Outputs
General Description
The 74F573 is a high speed octal latch with buffered com­mon Latch Enable (LE) and buffered common Output Enable (OE
) inputs.
This device is functio nally identical to the 74F373 but h as different pinouts.
Features
Inputs and outputs on opposite sides of package allowing easy interface with microprocessors
Useful as input or output port for microprocessors
Functionally identical to 74F373
3-STATE outputs for bus interfacing
Guarante ed 4000V minimum ESD protection
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F573SC M20B 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 74F573SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F573PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
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74F573
Unit Loading/Fan Out
Functional Description
The 74F573 contai ns eig ht D - type lat ches with 3-state out­put buffers. When the Latch Enable (LE) input is HIGH, data on the D
n
inputs enters the latches. In this co ndition
the latches are transparent, i.e., a latch output will chang e state each time its D input ch anges. Whe n LE is L OW the latches store the information that was present on th e D inputs a setup time preceding the HIGH-to-LOW transitio n of LE. The 3-state buffers are controlled by the Output Enable (OE
) input. When OE is LOW, the buffers are in the
bi-state mode. When OE
is HIGH the buffers are in the high impedance mode but this does not interfere with entering new data into the latches.
Function Table
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial O
0
= Value stored from previous cloc k c y cl e
Logic Diagram
Please note that this diagram is provided o nly f or t he understanding of lo gic operations and should not be used to estimate propagation delays.
Pin Names Description
U.L.
Input I
IH/IIL
HIGH/LOW
Output I
OH/IOL
D0–D
7
Data Inputs 1.0/1.0 20 µA/−0.6 mA LE Latch Enable Input (Active HIGH) 1.0/1.0 20 µA/0.6 mA OE
3-STATE Output Enable Input (Active LOW)
1.0/1.0 20 µA/−0.6 mA
O
0–O7
3-STATE Latch Outputs 150/40(33.3) 3 mA/24 mA (20 mA)
Inputs Outputs
OE
LE D O
LHHH LHLL LLXO
0
HXXZ
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74F573
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
Storage Temperature 65°C to +150°C Ambient Temperature under Bias 55°C to +125°C Junction Temperature under Bias −55°C to +150°C V
CC
Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 mA to +5.0 mA Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output 0.5V to V
CC
3-STATE Output 0.5V to +5.5V
Current Applied to Output
in LOW State (Max) twice the rated I
OL
(mA)
ESD Last Passing Voltage (Min) 4000V
Free Air Ambi ent Temperat ure 0°C to +70°C Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = 18 mA
V
OH
Output HIGH 10% V
CC
2.5
VMin
IOH = 1 mA
Voltage 10% V
CC
2.4 IOH = 3 mA
5% V
CC
2.7 IOH = 1 mA
5% V
CC
2.7 IOH = 3 mA
V
OL
Output LOW
10% V
CC
0.5 V Min IOL = 24 mA
Voltage
I
IH
Input HIGH 20.0
µAMaxVIN = 2.7V
Current 5.0
I
BVI
Input HIGH Current
7.0 µAMaxVIN = 7.0V
Breakdown Test
I
CEX
Output HIGH
50 µAMaxV
OUT
= V
CC
Leakage Current
V
ID
Input Leakage
4.75 V 0.0
IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage
3.75 µA0.0
V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V
I
OZH
Output Leakage Current 50 µAMaxV
OUT
= 2.7V
I
OZL
Output Leakage Current −50 µAMaxV
OUT
= 0.5V
I
OS
Output Short-Circuit Current 60 150 mA Max V
OUT
= 0V
I
ZZ
Bus Drainage Test 500 µA0.0VV
OUT
= 5.25V
I
CCL
Power Supply Current 35 55 mA Max VO = LOW
I
CCZ
Power Supply Current 35 55 mA Max VO = HIGH Z
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74F573
AC Electrical Characteristics
AC Operating Requirements
Symbol Parameter
TA = +25°CT
A
= 55°C to +125°CTA = 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
t
PLH
Propagation Delay 3.0 5.3 7.0 3.0 9.0 3.0 8.0
ns
t
PHL
Dn to O
n
2.03.76.02.07.02.06.5
t
PLH
Propagation Delay 5.0 9.0 11.0 5.0 13.5 5.0 12.0
ns
t
PHL
LE to O
n
3.05.27.03.07.53.07.0
t
PZH
Output Enable Time 2.0 5.0 8.0 2.0 10.0 2.0 9.0
ns
t
PZL
2.0 5.6 8.5 2.0 10.0 2.0 9.5
t
PHZ
Output Disable Time 1.5 4.5 5.5 1.5 7.0 1.5 6.5
t
PLZ
1.53.85.51.55.51.55.5
Symbol Parameter
TA = +25°CTA = 55°C to +125°CTA = 0°C to +70°C
UnitsVCC = +5.0V VCC = +5.0V VCC = +5.0V
Min Max Min Max Min Max
tS(H) Setup Time, HIGH or LOW 2.0 2.0 2.0
ns
tS(L) Dn to LE 2.0 2.0 2.0 tH(H) Hold Time, HIGH or LOW 3.0 3.0 3.0 tH(L) Dn to LE 3.5 4.0 3.5 tW(H) LE Pulse Width, HIGH 4.0 4.0 4.0 ns
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74F573
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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74F573 Octal D-Type Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component i n any compon ent of a lif e support device or system whose failu re to perform can be rea­sonably expected to ca use the fa i lure of the life su pp ort device or system, or to affect its safety or effectiveness.
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