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© 1999 Fairchild Semiconductor Corporation DS009493 www.fairchildsemi.com
April 1988
Revised July 1999
74F189 64-Bit Random Access Memory with 3-STATE Outputs
74F189
64-Bit Random Access Memory with 3-STATE Outputs
General Description
The F189 is a high-s peed 64-bit R AM organized as a 16word by 4-bit array. Address inputs are buffered to minimize loading and are full y decoded on-chip. The outputs
are 3-STATE and are in the hig h impedance state whenever the Chip Sele ct (CS
) input is HIGH. The outputs are
active only in the Read mode and the outp ut data is the
complement of the stored data.
Features
■ 3-STATE outputs for data bus applications
■ Buffered inputs minimize loading
■ Address decoding on-chip
■ Diode clamped inputs minimize ringing
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending su ffix “X” t o t he ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Order Number Package Number Package Description
74F189SC M16B 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide
74F189SJ M16D 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74F189PC N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide
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74F189
Unit Loading/Fan Out
Function Table
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Block Diagram
Pin Names Description
U.L. Input I
IH/IIL
HIGH/LOW Output IOH/I
OL
A0–A
3
Address Inputs 1.0/1.0 20 µA/−0.6 mA
CS
Chip Select Input (Active LOW) 1.0/1.0 20 µA/−1.2 mA
WE
Write Enable Input (Active LOW) 1.0/1.0 20 µA/−0.6 mA
D
0–D3
Data Inputs 1.0/1.0 20 µA/−0.6 mA
O
0–O 3Inverted Data Outputs 150/40 (33.3) −3.0 mA/24 mA (20 mA)
Inputs
Operation Condition of Outputs
CS
WE
L L Write High Impedance
L H Read Complement of Stored Data
H X Inhibit High Impedance
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74F189
Absolute Maximum Ratings(Note 1) Recommended Operating
Conditions
Note 1: Absolute maximum ratings are values beyon d which the device
may be damaged or have its useful life impaired . Functional operation
under these condit ions is not implied.
Note 2: Either voltage limit or curren t limit is sufficient to protect in puts.
DC Electrical Characteristics
Storage Temperature −65°C to +150°C
Ambient Temperature under Bias −55°C to +125°C
Junction Temperature under Bias −55°C to +175°C
V
CC
Pin Potential to
Ground Pin −0.5V to +7.0V
Input Voltage (Note 2) −0.5V to +7.0V
Input Current (Note 2) −30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with V
CC
= 0V)
Standard Output −0.5V to V
CC
3-STATE Output −0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
Free Air Ambi ent Temperature 0°C to +70°C
Supply Voltage +4.5V to +5.5V
Symbol Parameter Min Typ Max Units
V
CC
Conditions
V
IH
Input HIGH Voltage 2.0 V Recognized as a HIGH Signal
V
IL
Input LOW Voltage 0.8 V Recognized as a LOW Signal
V
CD
Input Clamp Diode Voltage −1.2 V Min IIN = −18 mA
V
OH
Output HIGH 10% V
CC
2.5
VMin
IOH = −1 mA
Voltage 10% V
CC
2.4 IOH = −3 mA
5% V
CC
2.7 IOH = −1 mA
5% V
CC
2.7 IOH = −3 mA
V
OL
Output LOW
Voltage 10% V
CC
0.5 V Min IOL = 24 mA
I
IH
Input HIGH
Current 5.0 µAMaxV
IN
= 2.7V
I
BVI
Input HIGH Current
Breakdown Test 7.0 µAMaxVIN = 7.0V
I
CEX
Output HIGH
Leakage Current 50 µAMaxV
OUT
= V
CC
V
ID
Input Leakage 4.75 V 0.0 IID = 1.9 µA
Test All Other Pins Grounded
I
OD
Output Leakage 3.75 µA0.0V
IOD
= 150 mV
Circuit Current All Other Pins Grounded
I
IL
Input LOW Current −0.6 mA Max VIN = 0.5V (except CS)
−1.2 VIN = 0.5V (CS)
I
OZH
Output Leakage Current 50 µAMaxV
OUT
= 2.7V
I
OZL
Output Leakage Current −50 µAMaxV
OUT
= 0.5V
I
OS
Output Short-Circuit Current −60 −150 mA Max V
OUT
= 0V
I
ZZ
Bus Drainage Test 500 µA0.0VV
OUT
= 5.25V
I
CCZ
Power Supply Current 37 55 mA Max VO = HIGH Z
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74F189
AC Electrical Characteristics
AC Operating Requirements
Symbol Parameter
TA = +25°CT
A
= −55°C to +125°CTA = 0°C to +70°C
Units
VCC = +5.0V VCC = +5.0V VCC = +5.0V
CL = 50 pF CL = 50 pF CL = 50 pF
Min Typ Max Min Max Min Max
t
PLH
Access Time, HIGH or LOW 10.0 18.5 26.0 9.0 32.0 10.0 27.0
ns
t
PHL
An to O
n
8.0 13.5 19.0 8.0 23.0 8.0 20.0
t
PZH
Access Time, HIGH or LOW 3.5 6.0 8.5 3.5 10.5 3.5 9.5
ns
t
PZL
CS to O
n
5.0 9.0 13.0 5.0 15.0 5.0 14.0
t
PHZ
Disable Time, HIGH or LOW 2.0 4.0 6.0 2.0 8.0 2.0 7.0
ns
t
PLZ
CS to O
n
3.0 5.5 8.0 2.5 10.0 3.0 9.0
t
PZH
Write Recovery Time, 6.5 15.0 28.0 6.5 37.5 6.5 29.0
ns
t
PZL
HIGH or LOW WE to On 6.5 11.0 15.5 6.5 17.5 6.5 16.5
t
PHZ
Disable Time, HIGH or LOW 4.0 7.0 10.0 3.5 12.0 4.0 11.0
ns
t
PLZ
WE to On 5.0 9.0 13.0 5.0 15.0 5.0 14.0
Symbol Parameter
TA = +25°CTA = −55°C to +125°CTA = 0°C to +70°C
UnitsVCC = +5.0V VCC = +5.0V VCC = +5.0V
Min Max Min Max Min Max
tS(H) Setup Time, HIGH or LOW 0 0 0
ns
tS(L) An to WE 000
tH(H) Hold Time, HIGH or LOW 2.0 2.0 2.0
tH(L) An to WE 2.0 2.0 2.0
tS(H) Setup Time, HIGH or LOW 10.0 11.0 10.0
ns
tS(L) Dn to WE 10.0 11.0 10.0
tH(H) Hold Time, HIGH or LOW 0 2.0 0
tH(L) Dn to WE 02.00
tS(L) Setup Time, LOW 0 0 0
ns
CS to WE
tH(L) Hold Time, LOW 6.0 7.5 6.0
CS to WE
tW(L) WE Pulse Width, LOW 6.0 15.0 6.0 ns
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74F189
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS013, 0.300” Wide Body
Package Number M16B
16-Lead Plastic Dual-In-Li ne Package (PDIP), JEDEC MS-OO1, 0.300” Wide
Package Number N16E
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74F189 64-Bit Random Access Memory with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Small Outline Package (SOP), EIAJ TYPE ll, 5.3mm Wide
Package Number M16D
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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which, (a) are intended for surgical implant into the
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to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant inju ry to the
user.
2. A critical component in any compon ent of a lif e supp ort
device or system whose failu re to perform can be reasonably expected to ca use the fa i lure of the life su pp ort
device or system, or to affect its safety or effectiveness.
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