Datasheet 74ACTQ10SCX, 74ACTQ10SC, 74ACTQ10PC, 74ACTQ10MTCX, 74ACTQ10MTC Datasheet (Fairchild Semiconductor)

© 2000 Fairchild Semiconductor Corporation DS010892 www.fairchildsemi.com

August 1990
Revised August 2000

74ACTQ10 Quiet Series



Tripl e 3-Input NAND Gate

74ACTQ10
Quiet Series

 Triple 3-Input NAND Gate

General Description

The ACTQ10 contains three, 3-in put NAND gat es and uti­lizes Fairchild FACT Quiet Series

 technology to guaran-

tee quiet output switching and impr ove d dyna mic thr esh old
performance. FACT Quiet Series features GTO

 output

control and undershoot corrector in addition to a split
ground bus for superior ACMOS performance.

Features

■ ICC reduced by 50%

■ Guaranteed simultaneous switching noise level and

dynamic threshold performan ce

■ Improved latch-up immunity

■ Outputs source/sink 24 mA

■ ACTQ 10 has TTL-compatible in put s

Ordering Code:

Device also available in Tape and Reel. Specify by appending s uffix let te r “X” to the ordering code.

Logic Symbol

IEEE/IEC

Connection Diagram

Pin Descriptions

FACT, Qui et Series , FACT Quiet Series, an d GTO are trademarks of Fairchild Semiconductor Corporation.

Order Number Package Number Package Description

74ACTQ10SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow Body
74ACTQ10MTC MTC14 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74ACTQ10PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide

Pin Names Descriptions

A

n

, Bn, C

n

Inputs

O

n

Outputs

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74ACTQ10

Absolute Maximum Ratings(Note 1) Recommended Operating

Conditions

Note 1: Absolute maximum ratings are values beyond which damage to the

device may occur. The databo ok specifications should be met, with out
exception, to ensure that the system design is reliable over its power sup­ply, temperature, and output/input loading variables. Fairchild does not rec­ommend operation outside of databook sp ec if ic ations.

DC Electrical Characteristics

Note 2: All outputs loaded; thresholds on input assoc iat ed with output under tes t.
Note 3: Maximum test duratio n 2. 0 ms, one output loaded at a time.
Note 4: DIP Package .
Note 5: Max number of output s d ef ined as (n). Data inputs are 0V to 3V. One output @ GND.
Note 6: Max number of data inputs (n) switching. (n-1) inputs switching 0V to 3V. Input-under -te s t swit c hing:

3V to threshold (V

ILD

), 0V to threshold (V

IHD

), f = 1MHZ.

Supply Voltage (VCC) −0.5V to +7.0V
DC Input Diode Current (I

IK

)

V

I

= −0.5V −20 mA

V

I

= VCC + 0.5V +20 mA

DC Input Voltage (V

I

) −0.5V to VCC + 0.5V

DC Output Diode Current (I

OK

)

V

O

= −0.5V −20 mA

V

O

= VCC + 0.5V +20 mA

DC Output Voltage (V

O

) −0.5V to VCC + 0.5V

DC Output Source

or Sink Current (I

O

) ± 50 mA

DC V

CC

or Ground Current

per Output Pin (I

CC

or I

GND

) ± 50 mA

Storage Temperature (T

STG

) −65°C to +150°C

DC Latch-Up Source or Sink Current

± 300 mA

Junction Temperature (T

J

)

PDIP 140

°C

Supply Voltage (V

CC

) 4.5V to 5.5V

Input Voltage (V

I

) 0V to V

CC

Output Voltage (VO) 0V to V

CC

Operating Temperature (TA) −40°C to +85°C
Minimum Input Edge Rate (

∆V/∆t) 125 mV/ns

V

IN

from 0.8V to 2.0V

V

CC

@ 4.5V, 5.5V

Symbol Parameter

V

CC

TA = +25°CTA = −40°C to +85°C

Units Conditions

(V) Typ Guaranteed Limits

V

IH

Minimum HIGH Level 4.5 1.5 2.0 2.0

V

V

OUT

= 0.1V

Input Voltage 5.5 1.5 2.0 2.0 or VCC − 0.1V

V

IL

Maximum LOW Level 4.5 1.5 0.8 0.8

V

V

OUT

= 0.1V

Input Voltage 5.5 1.5 0.8 0.8 or VCC − 0.1V

V

OH

Minimum HIGH Level 4.5 4.49 4.4 4.4

VI

OUT

= −50 µA

Output Voltage 5.5 5.49 5.4 5.4

VIN = VILor V

IH

4.5 3.86 3.76 V IOH = − 24 mA

5.5 4.86 4.76 I

OH

= − 24 mA (Note 2)

V

OL

Maximum LOW Level 4.5 0.001 0.1 0.1

VI

OUT

= 50 µA

Output Voltage 5.5 0.001 0.1 0.1

VIN = VILor V

IH

4.5 0.36 0.44 V IOL = 24 mA

5.5 0.36 0.44 IOL = 24 mA (Note 2)

I

IN

Maximum Input Leakage Current 5.5 ± 0.1 ± 1.0 µAVI = VCC, GND

I

CCT

Maximum ICC/Input 5.5 0.6 1.5 mA VI = VCC − 2.1V

I

OLD

Minimum Dynamic 5.5 75 mA V

OLD

= 1.65V Max

I

OHD

Output Current (Note 3) 5.5 −75 mA V

OHD

= 3.85V Min

I

CC

Maximum Quiescent Supply Current 5.5 2.0 20.0 µAVIN = VCC or GND

V

OLP

Quiet Output

5.0 1.1 1.5 V

Figures 1, 2

Maximum Dynamic V

OL

(Note 4)(Note 5)

V

OLV

Quiet Output

5.0 −0.6 −1.2 V

Figures 1, 2

Minimum Dynamic V

OL

(Note 4)(Note 5)

V

IHD

Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 4)(Note 6)

V

ILD

Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 4)(Note 6)

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74ACTQ10

AC Electrical Characteristics

Note 7: Voltage Range 5.0 is 5.0V ± 0.5V.
Note 8: Skew is defined as t he absolute value of t he difference between the actual propagation delay for any two separate outputs of the same device. The

specification applies to any outputs switching in the same direction, either HIGH-to-LOW (t

OSHL

) or LOW-to-HIGH (t

OSLH

). Parameter guaranteed by design.

Capacitance

V

CC

TA = +25°CT

A

= −40°C to +85°C

Symbol Parameter (V)

C

L

= 50 pF CL = 50 pF

Units

(Note 7) Min Typ Max Min Max

t

PLH

Propagation Delay 5.0 2.0 6.0 7.5 2.0 8.5 ns

t

PHL

Propagation Delay 5.0 2.0 6.0 7.5 2.0 8.5 ns

t

OSHL

Output to Output

5.0 0.5 1.0 1.0 ns

t

OSLH

Skew (Note 8)

Symbol Parameter Typ Units Conditions

C

IN

Input Capacitance 4.5 pF VCC = OPEN

C

PD

Power Dissipation Capacitance 85 pF VCC = 5.0V

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74ACTQ10

FACT Noise Characteristics

The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT

.

Equipment:

Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope

Procedure:

1. Verify Test Fixture Loading: Standard Load 50 pF,
500

Ω.

2. Deskew the HFS generator so that no two channels
have greater than 15 0 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs sw itch
simultaneously.

3. Terminate all inputs and outputs to ens ure pro per load ­ing of the outputs a nd that the input levels a re at the
correct voltage.

4. Set the HFS ge nerato r to togg le all bu t one out put at a
frequency of 1 MHz. Greater fre quencies will increa se
DUT heating and effect the results of the measure­ment.

V

OHV

and V

OLP

are measured with respect to ground reference.

Input pulses have the following characteristics: f = 1MHz, t

r

= 3ns, tf =

3 ns, skew < 150 ps.

FIGURE 1. Quiet Output Noise Voltage Waveforms

5. Set the HFS gene rator input lev els at 0V LOW a nd 3V
HIGH for ACTQ devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.

V

OLP/VOLV

and V

OHP/VOHV

:

• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the gr ound pin. Monitor th e o utp ut volt­ages using a 50

Ω coaxial cable plugged into a standa rd

SMB type connector on the te st fixture. Do not use an
active FET probe.

• Measure V

OLP

and V

OLV

on the quiet output du ring the

worst case transition for active and enable. Measure
V

OHP

and V

OHV

on the quiet output during the worst

case transition.

• Verify that the GND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.

V

ILD

and V

IHD

:

• Monitor one of the switching outputs using a 50

Ω coaxial

cable plugged into a standard SMB type connec tor on
the test fixture. Do not use an active FET probe.

• First increase the input LOW voltage level , V

IL

, until the

output begins to oscillate or steps ou t a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V

IL

limits, or on output HIGH levels that

exceed V

IH

limits. The input LOW voltage level at which

oscillation occurs is defined as V

ILD

.

• Next decrease the input HIGH voltage level, V

IH

, until

the output begins to oscillate or step s out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V

IL

limits, or on output HIGH levels that

exceed V

IH

limits. The input HIGH voltage level at which

oscillation occurs is defined as V

IHD

.

• Verify that the GND reference recorded on the oscillo­scope has not drifted to ensure the accuracy and repeat­ability of the measurements.

FIGURE 2. Simultaneous Switching Test Circuit

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74ACTQ10

Physical Dimensions inches (millimeters) unless otherwise noted

14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150” Narrow Body

Package Number M14A

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74ACTQ10

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide

Package Number MTC14

7 www.fairchildsemi.com

74ACTQ10 Quiet Series



Tripl e 3-Input NAND Gate

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide

Package Number N14A

Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.

LIFE SUPPORT POLICY

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are dev ic es or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provide d in the labe l ing, can be re a­sonably expected to result in a significant injury to the
user.

2. A critical compo nent in any com ponen t of a life s upp ort
device or system whose failure to perform can be rea­sonably expected to cause the failure of the l ife support
device or system, or to affect its safety or effectiveness.

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