18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
Product specification
Supersedes data of 1997 Mar 28
IC23 Data Handbook
1998 Feb 25
Page 2
Philips Semiconductors Product specification
Quiescent supply current
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
FEA TURES
•Symmetrical (A and B bus functions are identical)
•Selectable generate parity or ”feed-through” parity for A-to-B and
B-to-A directions
•Independent transparent latches for A-to-B and B-to-A directions
•Selectable ODD/EVEN parity
•Continuously checks parity of both A bus and B bus latches as
and ERRB
ERRA
•Open-collector ERR output
•Ability to simultaneously generate and check parity
•Can simultaneously read/latch A and B bus data
•Output capability: +64 mA/–32mA
•Latch-up protection exceeds 500mA per Jedec Std 17
•ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
•Power up 3-State
•Power-up reset
•Live insertion/extraction permitted
•Bus-hold data inputs eliminate the need for external pull-up
resistors to hold unused inputs
DESCRIPTION
The 74ABT/H16899 is a 16-bit to 16-bit parity transceiver with
separate transparent latches for the A bus and B bus. Either bus
can generate or check parity. The parity bit can be fed-through with
no change or the generated parity can be substituted with the SEL
input.
74ABT16899
74ABTH16899
Parity error checking of the A and B bus latches is continuously
provided with ERRA
The 74ABT/H16899 features independent latch enables for the A
and B bus latches, a select pin for ODD/EVEN
error signal output pins for checking parity.
FUNCTIONAL DESCRIPTION
The 74ABT/H16899 has three principal modes of operation which
are outlined below. All modes apply to both the A-to-B and B-to-A
directions.
Transparent latch, Generate parity, Check A and B bus parity:
Bus A (B) communicates to Bus B (A), parity is generated and
passed on to the B (A) Bus as BPAR (APAR). If LEA and LEB are
High and the Mode Select (SEL
A0-A7 and B0-B7 can be checked and monitored by ERRA
ERRB
. (Fault detection on both input and output buses.)
Transparent latch, Feed-through parity, Check A and B bus
parity:
Bus A (B) communicates to Bus B (A) in a feed-through mode if SEL
is High. Parity is still generated and checked as ERRA and ERRB
and can be used as an interrupt to signal a data/parity bit error to the
CPU.
Latched input, Generate/Feed-through parity, Check A (and B)
bus parity:
Independent latch enables (LEA and LEB) allow other permutations
of:
•Transparent latch / 1 bus latched / both buses latched
•Feed-through parity / generate parity
•Check in bus parity / check out bus parity / check in and out bus
parity
and ERRB, even with both buses in 3-State.
parity, and separate
) is Low, the parity generated from
and
QUICK REFERENCE DATA
SYMBOLPARAMETER
t
PLH
t
PHL
t
PLH
t
PHL
C
IN
C
I/O
I
CCZ
I
CCL
ORDERING INFORMATION
56-Pin Plastic SSOP Type III–40°C to +85°C74ABT16899 DLBT16899 DLSOT371-1
56-Pin Plastic TSSOP Type II–40°C to +85°C74ABT16899 DGGBT16899 DGGSOT364-1
56-Pin Plastic SSOP Type III–40°C to +85°C74ABTH16899 DLBH16899 DLSOT371-1
56-Pin Plastic TSSOP Type II–40°C to +85°C74ABTH16899 DGGBH16899 DGGSOT364-1
1998 Feb 25853-1960 19018
CONDITIONS
T
= 25°C; GND = 0V
amb
Propagation delay
An to Bn or Bn to An
Propagation delay
An to ERRA
Input capacitanceVI = 0V or V
Output capacitanceOutputs disabled; VO = 0V or V
pp
PACKAGESTEMPERATURE RANGE OUTSIDE NORTH AMERICANORTH AMERICADWG NUMBER
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
LOGIC SYMBOL
35678 10 11 12
1A0 1A1 1A2 1A3 1A4 1A5 1A6 1A7
55
28
56
29OEB
LEA
LEB
SEL
1
ODD/EVEN
OEA
2
1B0 1B1 1B2 1B3 1B4 1B5 1B6 1B7
54 52 51 50 49 47 46 45
PARITY AND ERROR FUNCTION TABLE
INPUTSOUTPUTS
SELODD/EVEN
xPAR
(A or B)
HHH
HHL
HLH
HLL
LHH
LHL
LLH
LLL
H = High voltage level
L = Low voltage level
t = Transmit–if the data path is from A→B then ERRt
r = Receive–if the data path is from A→B then ERRr is ERRB
* Blocked if latch is not transparent
Σ of High
Inputs
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
Even
Odd
13
1APAR
1ERRA
1ERRB
1BPAR
44
xPAR
(B or A)
H
H
L
L
H
H
L
L
H
L
H
L
L
H
L
H
is ERRA
14
43
ERRtERRr*
74ABT16899
74ABTH16899
27 25 24 23 22 20 19 18
2A0 2A1 2A2 2A3 2A4 2A5 2A6 2A7
55
28
56
29
LEA
LEB
SEL
1
ODD/EVEN
OEA
2
OEB
2B0 2B1 2B2 2B3 2B4 2B5 2B6 2B7
30 32 33 34 35 37 38 39
PARITY MODES
H
L
L
H
L
H
H
L
H
L
L
H
L
H
H
L
H
LOdd
L
Mode
H
L
HEven
H
Mode
L
H
HOdd
H
Mode
H
H
HEven
H
Mode
H
17
2APAR
2ERRA
2ERRB
2BPAR
40
16
41
SH00083
Feed-through/check parity
Generate parity
1998 Feb 25
4
Page 5
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
BLOCK DIAGRAM
9–bit
Transparent
Latch
LEA
A0
A1
A2
A3
A4
A5
A6
A7
APAR
LE
Parity
Generator
9–bit
Output
Buffer
1
mux
0
9–bit
Output
Buffer
9–bit
Transparent
Latch
OE
74ABT16899
74ABTH16899
OEB
B0
B1
B2
B3
B4
B5
B6
B7
BPAR
OEA
SEL
ODD/
EVEN
OE
mux
1
0
Parity
Generator
LE
(1 of 2 parity blocks)
FUNCTION TABLE
INPUTSOPERATING MODE
OEB OEASELLEALEB
HHXXX3-State A bus and B bus (input A & B simultaneously)
HLLLHB → A, transparent B latch, generate parity from B0 - B7, check B bus parity
HLLHHB → A, transparent A & B latch, generate parity from B0 - B7, check A & B bus parity
HLLXLB → A, B bus latched, generate parity from latched B0 - B7 data, check B bus parity
HLHXHB → A, transparent B latch, parity feed-through, check B bus parity
HLHHHB → A, transparent A & B latch, parity feed-through, check A & B bus parity
LHLHXA → B, transparent A latch, generate parity from A0 - A7, check A bus parity
LHLHHA → B, transparent A & B latch, generate parity from A0 - A7, check A & B bus parity
LHLLXA → B, A bus latched, generate parity from latched A0 - A7 data, check A bus parity
LHHHLA → B, transparent A latch, parity feed-through, check A bus parity
LHHHHA → B, transparent A & B latch, parity feed-through, check A & B bus parity
LLXXXOutput to A bus and B bus (NOT ALLOWED)
H = High voltage level
L = Low voltage level
X = Don’t care
LEB
ERRA
ERRB
SH00084
1998 Feb 25
5
Page 6
Philips Semiconductors Product specification
I
DC output current
mA
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
ABSOLUTE MAXIMUM RATINGS
SYMBOL
V
CC
I
IK
V
I
OK
V
OUT
OUT
T
stg
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability .
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create ju nction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 1505C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
DC supply voltage–0.5 to +7.0V
DC input diode currentVI < 0–18mA
DC input voltage
I
DC output diode currentVO < 0–50mA
DC output voltage
High-level output voltageVCC = 5.0V; IOH = –3mA; VI = VIL or V
OH
VCC = 4.5V; IOH = –32mA; VI = VIL or V
Low-level output voltageVCC = 4.5V; IOL = 64mA; VI = VIL or V
OL
Power-up output low
3
voltage
I
Input leakageControl pins VCC = 5.5V; VI = GND or 5.5V±0.2±1.0±1.0µA
I
VCC = 5.5V; IO = 1mA; VI = GND or V
IH
IH
IH
IH
CC
currentData pinsVCC = 5.5V; VI = GND or 5.5V±1.0±100±100µA
VCC = 4.5V; VI = 0.8V7575
I
HOLD
I
OFF
IPU/I
IIH + I
IIL + I
I
CEX
I
CCH
I
CCL
I
CCZ
∆I
5
inputs
7
Power-off leakage currentVCC = 0.0V; VO or V
Power-up/down 3-State
PD
output current
3-State output High currentVCC = 5.5V; VO = 2.7V; VI = VIL or V
OZH
3-State output Low currentVCC = 5.5V; VO = 0.5V; VI = VIL or V
OZL
4
Output High leakage currentVCC = 5.5V; VO = 5.5V; VI = GND or V
I
O
Output current
1
Quiescent supply currentVCC = 5.5V; Outputs Low, VI = GND or V
Additional supply current per
CC
input pin
2
VCC = 4.5V; VI = 2.0V–75–75
VCC = 5.5V; VI = 0 to 5.5V±500
≤
4.5V±2.0±100±100µA
I
VCC = 2.1V; VO = 0.5V; VI= GND or V
CC
IH
IH
CC
VCC = 5.5V; VO = 2.5V–50–100–180–50–180mA
VCC = 5.5V; Outputs High, VI = GND or V
CC
CC
VCC = 5.5V; Outputs 3-State;
VI = GND or V
CC
VCC = 5.5V; one input at 3.4V,
other inputs at VCC or GND
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
4. This parameter is valid for any V
transition time of up to 100µsec is permitted.
between 0V and 2.1V , with a transition time of up to 10msec. From VCC = 2.1V to VCC = 5V ± 10%, a
CC
5. This is the bus hold overdrive current required to force the input to the opposite logic state.
= +25°C
amb
2.53.12.5V
3.03.63.0V
2.02.72.0V
0.360.550.55V
0.130.550.55V
±5.0±50±50µA
2.05050µA
–2.0–50–50µA
2.05050µA
0.511mA
10.51919mA
0.511mA
0.21.51.5mA
74ABT16899
74ABTH16899
T
= –40°C
amb
to +85°C
UNIT
µA
1998 Feb 25
7
Page 8
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
AC CHARACTERISTICS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500Ω
SYMBOLPARAMETERWAVEFORM
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PLH
PHL
PZH
PZL
PHZ
PLZ
Propagation delay
An to Bn or Bn to An
Propagation delay
An to BPAR or Bn to APAR
Propagation delay
An to ERRA or Bn to ERRB
Propagation delay
APAR to BPAR or BPAR to APAR
Propagation delay
APAR to ERRA or BPAR to ERRB
Propagation delay
ODD/EVEN to APAR or BPAR
Propagation delay
ODD/EVEN to ERRA or ERRB
Propagation delay
SEL
to APAR or BPAR
Propagation delay
SEL to ERRA or ERRB
Propagation delay
LEA to Bn or LEB to An
Propagation delay
LEA to BPAR or LEB to APAR
Propagation delay
LEA to ERRA or LEB to ERRB
Output enable time
OEA to An, APAR or OEB to Bn, BPAR
Output disable time
OEA to An, APAR or OEB to Bn, BPAR
1
2
3
1
6
5
4
8
8
9
9
7
11, 12
11, 12
74ABT16899
74ABTH16899
LIMITS
T
= +25oC
amb
VCC = +5.0V
CL = 50pF
RL = 500Ω
MinTypMaxMinMax
1.0
1.0
2.5
2.5
2.8
2.8
1.5
1.5
1.0
1.0
2.5
2.5
2.5
2.5
1.5
1.5
2.5
2.5
1.0
1.0
2.8
2.8
1.1
1.2
1.0
1.0
2.5
1.5
2.7
2.2
4.9
5.0
5.0
4.9
3.1
2.5
2.5
2.5
4.1
3.9
4.1
4.0
3.1
2.6
5.0
4.4
3.1
2.8
5.5
5.1
5.4
5.8
2.6
2.3
3.9
2.8
4.5
3.5
7.2
7.4
9.3
8.0
3.9
3.1
3.3
3.3
5.1
5.0
6.1
5.5
4.0
3.4
7.5
5.9
4.2
4.3
8.0
7.7
8.0
8.0
3.6
3.2
5.6
4.1
T
= –40 to +85oC
amb
VCC = +5.0V ±10%
CL = 50pF
RL = 500Ω
1.0
1.0
2.5
2.5
2.8
2.8
1.5
1.5
1.0
1.0
2.5
2.5
2.5
2.5
1.5
1.5
2.5
2.5
1.0
1.0
2.8
2.8
1.1
1.2
1.0
1.0
2.5
1.5
5.5
6.9
8.8
8.7
11.0
10.2
4.8
3.9
4.3
3.9
6.1
5.7
7.1
6.6
5.0
4.2
8.3
7.1
5.2
4.7
9.7
9.1
9.2
9.6
5.1
4.5
6.0
4.4
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC SETUP REQUIREMENTS
GND = 0V; tR = tF = 2.5ns; CL = 50pF, RL = 500Ω
SYMBOLPARAMETERWAVEFORM
ts(H)
ts(L)
th(H)
th(L)
tw(H)
1998 Feb 25
Setup time, High or Low
An, APAR to LEA or Bn, BPAR to LEB
Hold time, High or Low
An, APAR to LEA or Bn, BPAR to LEB
Pulse width, High
LEA or LEB
10
10
103.01.03.0ns
LIMITS
T
= +25oC
amb
VCC = +5.0V
CL = 50pF
R
= 500Ω
L
T
= –40 to +85oC
amb
VCC = +5.0V ±10%
CL = 50pF
R
= 500Ω
L
UNIT
MinTypMin
1.5
1.0
1.5
1.0
0.3
–0.1
0.1
–0.2
1.5
1.0
1.5
1.0
ns
ns
8
Page 9
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
AC WAVEFORMS
VM = 1.5V, VIN = GND to 3.0V
1
SEL
An, APAR
(Bn, BPAR)
Bn, BPAR
(An, APAR)
Waveform 1. Propagation Delay, An to Bn, Bn to An, APAR to BPAR, BPAR to APAR
SEL
ODD/EVEN
V
M
t
PLH
0
0
V
M
V
M
t
PHL
74ABT16899
74ABTH16899
INPUT
V
M
OUTPUT
SA00293
1
LEA
(LEB)
An
(Bn)
BPAR
(APAR)
ODD PARITY
V
M
t
PHL
EVEN PARITYODD PARITY
V
M
V
M
t
PLH
V
M
NOTE: Only even parity mode is shown, odd parity mode would be with ODD/EVEN = 1
Waveform 2. Propagation Delay, An to BPAR or Bn to APAR
ODD/EVEN
0
APAR
(BPAR)
SEL
LEA
(LEB)
(Bn)
An
0
1
ODD PARITY
V
M
EVEN PARITYODD PARITY
V
M
INPUT
OUTPUT
SA00294
INPUT
1998 Feb 25
ERRA
(ERRB)
t
PLH
V
M
t
PHL
V
M
NOTE: Only even parity mode is shown, odd parity mode would be with ODD/EVEN = 1
Waveform 3. Propagation Delay, An to ERRA or Bn to ERRB
9
OUTPUT
SA00295
Page 10
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
1
APAR
(BPAR)
An
(Bn)
ODD/EVEN
ERRA
(ERRB)
NOTE: Only even parity mode is shown, odd parity mode would cause inverted output
Waveform 4. Propagation Delay, ODD/EVEN to ERRA or ODD/EVEN to ERRB
V
M
t
PLH
V
M
V
M
EVEN PARITY
t
PHL
V
M
74ABT16899
74ABTH16899
INPUT
INPUT
OUTPUT
SA00296
SEL
0
APAR
(BPAR)
ODD/EVEN
(APAR)
(Bn)
BPAR
0
An
t
PLH
V
M
V
M
V
M
EVEN PARITY
t
PHL
V
M
NOTE: Only even parity mode is shown, odd parity mode would cause inverted output
Waveform 5. Propagation Delay, ODD/EVEN to APAR or ODD/EVEN to BPAR
INPUT
INPUT
OUTPUT
SA00297
1998 Feb 25
10
Page 11
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
ODD/EVEN
0
An
(Bn)
APAR
(BPAR)
ERRA
(ERRB)
V
M
NOTE: Only even parity mode is shown with even parity. Odd parity mode would cause inverted output
and odd parity mode would be with ODD/EVEN = 1
Waveform 6. Propagation Delay, APAR to ERRA or BPAR to ERRB
1
ODD/EVEN
t
PLH
V
M
V
74ABT16899
74ABTH16899
EVEN PARITY
t
PHL
V
M
M
INPUT
INPUT
OUTPUT
SA00298
APAR
(BPAR)
(ERRB)
(Bn)
LEA
(LEB)
ERRA
An
0
EVEN PARITY
ODD PARITYEVEN PARITY
V
M
t
PLH
V
M
V
M
t
PHL
V
M
NOTE: Only odd parity mode is shown. Even parity mode would be with ODD/EVEN = o
Waveform 7. Propagation Delay, LEA to ERRA or LEB to ERRB
INPUT
INPUT
OUTPUT
SA00299
1998 Feb 25
11
Page 12
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
1
ODD/EVEN
APAR
(BPAR)
(APAR)
NOTE: Only even parity mode is shown with even parity. Odd parity mode would cause inverted output
and odd parity mode would be with ODD/EVEN = 1
0
An
(Bn)
SEL
BPAR
V
M
t
PLH
V
M
V
Waveform 8. Propagation Delay, SEL to BPAR or SEL to APAR
74ABT16899
74ABTH16899
EVEN PARITY
t
PHL
V
M
M
INPUT
INPUT
OUTPUT
SA00300
1
SEL
APAR, An]
(BPAR, Bn)
LEA
(LEB)
Bn, BPAR
(An, APAR)
V
M
t
PLH
V
M
V
M
t
PHL
V
M
SA00301
Waveform 9. Propagation Delay, LEA to BPAR or LEB to APAR, LEA to Bn or LEB to An
APAR, BPAR,
An, Bn
LEA, LEB
The shaded areas indicate when the input is permitted to change for predictable output performance.
ts(H)
V
M
V
M
t
(H)
h
V
M
V
M
V
M
(L)
t
s
tw(H)
V
M
t
(L)
h
V
M
SA00302
Waveform 10. Data Setup and Hold Times, Pulse W idth High
INPUT
INPUT
OUTPUT
1998 Feb 25
12
Page 13
Philips Semiconductors Product specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
OEA,
OEB
An, APAR,
Bn, BPAR
Waveform 11. 3-State Output Enable Time to High Level and Output Disable Time from High Level
OEA,
OEB
An, APAR,
Bn, BPAR
Waveform 12. 3-State Output Enable Time to Low Level and Output Disable Time from Low Level
V
M
t
PZH
V
M
t
PZL
74ABT16899
74ABTH16899
V
M
t
PHZ
V
–0.3V
V
M
V
M
t
PLZ
V
M
VOL +0.3V
OH
0V
SA00303
SA00304
TEST CIRCUIT AND WAVEFORM
V
CC
R
PULSE
GENERATOR
V
IN
R
T
D.U.T.
V
OUT
Test Circuit for Open Collector Outputs
SWITCH POSITION
TEST SWITCH
t
PLZ
t
PZL
closed
closed
LOAD VALUES
OUTPUT RX V
ERROR 100 V
All other 500 7.0V
All otheropen
DEFINITIONS:
RL= Load resistor; see AC CHARACTERISTICS for value.
CL= Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
R
= Termination resistance should be equal to Z
T
pulse generators.
X
C
R
L
L
Ω
Ω
OUT
of
V
X
X
CC
NEGATIVE
PULSE
POSITIVE
PULSE
FAMILY
74ABT/H16
90%
10%
t
W
V
M
10%
)
t
THL (tf
)
t
TLH (tr
90%
V
M
t
TLH (tr
t
THL (tf
t
W
Input Pulse Definition
INPUT PULSE REQUIREMENTS
Amplitude
3.0V
Rep. Rate
1MHz500ns
10%
)
)
90%
V
M
V
M
t
w
AMP (V)
90%
0V
AMP (V)
10%
0V
t
R
t
F
2.5ns2.5ns
SH00009
1998 Feb 25
13
Page 14
Philips SemiconductorsProduct specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
SSOP56: plastic shrink small outline package; 56 leads; body width 7.5 mmSOT371-1
74ABT16899
74ABTH16899
1998 Feb 25
14
Page 15
Philips SemiconductorsProduct specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
TSSOP56: plastic thin shrink small outline package; 56 leads; body width 6.1mmSOT364-1
74ABT16899
74ABTH16899
1998 Feb 25
15
Page 16
Philips SemiconductorsProduct specification
18-bit latched transceiver with 16-bit
parity generator/checker (3-State)
Data sheet status
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
74ABT16899
74ABTH16899
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 05-96
Document order number:9397-750-03507
yyyy mmm dd
16
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