Wide V
Fourth Order Delta-Sigma A/D Converter
Easy to Use Three-wire Serial Interface Port
- Programmable/Auto Channel Sequencer with
Conversion Data FIFO
- Accessible Calibration Registers per Channel
- Compatible with SPI™
System and Self Calibration
Eight Selectable Word Rates
- Up to 617 Sps (XIN = 200 kHz)
- Single Conversion Settling
- 50/60 Hz ±3 Hz Simultaneous Rejection
Single +5 V Power Supply Operation
- Charge Pump Drive for Negative Supply
- +3 to +5 V Digital Supply Operation
Low Power Consumption: 6.0 mW
Input Range (+1 to +5 V)
REF
and Microwire™
General Description
The CS5521/22/23/24/28 are highly integrated ΔΣ analog-to-digital converters (ADCs) which use chargebalance techniques to achieve 16-bit (CS5521/23) and
24-bit (CS5522/24/28) performance. The ADCs
either two-channel (CS5521/22), four-channel
(CS5523/24), or eight-channel (CS5528) devices and
include a low-input-current, chopper-stabilized instrumentation amplifier. To permit selectable input spans of
25 mV, 55 mV, 100 mV, 1 V, 2.5 V, and 5 V, the ADCs
include a PGA (programmable gain amplifier). To accommodate ground-based thermocouple applications,
the devices include a charge pump drive which provides
a negative bias voltage to the on-chip amplifiers.
These devices also include a fourth-order ΔΣ modulator
followed by a digital filter
output word rates
. The digital filters are designed to settle
which provides eight selectable
to full accuracy within one conversion cycle and when
operated at word rates below 30 Sps, they reject both
50 Hz and 60 Hz interference.
These single-supply products are ideal solutions for
measuring isolated and non-isolated, low-level signals in
process control applications.
ORDERING INFORMATION
See page 53.
come as
http://www.cirrus.com
Copyright Cirrus Logic, Inc. 2009
(All Rights Reserved)
JUL ‘09
DS317F8
TABLE OF CONTENTS
ANALOG CHARACTERISTICS................................................................................................5
Range = 25 mV, 55 mV, or 100 mV
Range = 1 V, 2.5 V, or 5 V
Input Current Drift(Note 8)
Range = 25 mV, 55 mV, or 100 mV-1-pA/°C
Input Leakage for Multiplexer when Off-10-pA
Common Mode Rejectiondc
50, 60 Hz
Input Capacitance-10-pF
Voltage Reference Input
Range(VREF+) - (VREF-)12.5VA+V
VREF+
VREF-NBVCVF Current(Note 8)-5.0-nA
Common Mode Rejectiondc
50, 60 Hz
Input Capacitance-16-pF
System Calibration Specifications
Full Scale Calibration Range (VREF = 2.5V)Bipolar/Unipolar Mode
25 mV
55 mV
100 mV
1 V
2.5 V
5 V
Offset Calibration RangeBipolar/Unipolar Mode
25 mV
55 mV
100 mV(Note 9)
1 V
2.5 V
5 V
-0.150
NBV
1.85
0.0
-
-
-
-
(VREF-)+1
-
-
10
25
40
0.40
1.0
2.0
-
-
-
-
-
-
-
-
-
-
100
10
120
120
-VA+V
110
130
-
-
-
-
-
-
-
-
-
-
-
-
0.950
VA+
2.65
VA+
300
-
-
-
(VREF+)-1
-
-
32.5
71.5
105
1.30
3.25
VA+
±12.5
±27.5
±50
±0.5
±1.25
±2.50
pA
nA
dB
dB
dB
dB
mV
mV
mV
mV
mV
mV
V
V
V
V
V
V
V
V
V
V
V
Notes: 7. For the CS5528, the 25 mV, 55 mV and 100 mV ranges cannot be used unless NBV is powered at -1.8
to -2.5 V
8. See the section of the data sheet which discusses input models. Chop clock is 256 Hz (XIN/128) for
PGIA (programmable gain instrumentation amplifier). XIN = 32.768 kHz.
9. The maximum full scale signal can be limited by saturation of circuitry within the internal signal path.
Notes: 13. For bipolar mode, the number of bits of Noise Free Resolution is LOG((2XInput Range)/(6.6xRMS
Noise))/LOG(2) rounded to the nearest bit. For unipolar mode, the number of bits of Noise Free
Resolution is LOG((Input Range)/(6.6xRMS Noise))/LOG(2) rounded to the nearest bit. Also, the
CS5521/23’s output conversions are 16 bits. Noise free Resolution numbers are based upon
VREF = 2.5 V and XIN = 32.768 kHz. The values will be affected directly by changes in VREF, but the
effects due to changes in the XIN frequency will be minor.
Notes: 17. For bipolar mode, the number of bits of Noise Free Resolution is LOG((2XInput Range)/(6.6xRMS
Noise))/LOG(2) rounded to the nearest bit. For unipolar mode, the number of bits of Noise Free
Resolution is LOG((Input Range)/(6.6xRMS Noise))/LOG(2) rounded to the nearest bit. Also, the
CS5522/24/28’s output conversions are 24 bits. Noise free Resolution numbers are based upon
VREF = 2.5 V and XIN = 32.768 kHz. The values will be affected directly by changes in VREF, but the
effects due to changes in the XIN frequency will be minor.
8DS317F8
CS5521/22/23/24/28
5 V DIGITAL CHARACTERISTICS (T
= 25° C; VA+, VD+ = 5 V ±5%; GND = 0;
A
See Notes 2 and 18.))
ParameterSymbol Min TypMaxUnit
High-level Input VoltageAll Pins Except XIN and SCLK
XIN
SCLK
Low-level Input VoltageAll Pins Except XIN and SCLK
XIN
SCLK
High-level Output Voltage
All Pins Except CPD and SDO (Note 19)
CPD, I
SDO, I
= -4.0 mA
out
= -5.0 mA
out
Low-level Output Voltage
All Pins Except CPD and SDO, I
CPD, I
SDO, I
= 1.6 mA
out
= 2 mA
out
= 5.0 mA
out
Input Leakage CurrentI
3-state Leakage CurrentI
Digital Output Pin CapacitanceC
Notes: 18. All measurements performed under static conditions.
19. I
= -100 µA unless stated otherwise. (VOH = 2.4 V @ I
out
V
IH
V
IL
V
OH
V
OL
in
OZ
out
(VD+) - 0.45
= -40 µA.)
out
0.6 VD+
(VD+)-0.5
-
-
-
(VA+) - 1.0
(VD+) - 1.0
(VD+) - 1.0
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.8
1.5
0.6
-
-
-
0.4
0.4
0.4
V
V
V
V
V
V
V
V
V
V
V
V
-±1±10µA
--±10µA
-9-pF
3 V DIGITAL CHARACTERISTICS (T
= 25° C; VA+ = 5 V ±5%; VD+ = 3.0 V ±10%; GND = 0;
A
See Notes 2 and 18.)
ParameterSymbol Min TypMaxUnit
High-level Input VoltageAll Pins Except XIN and SCLK
XIN
SCLK
Low-level Input VoltageAll Pins Except XIN and SCLK
XIN
SCLK
High-level Output Voltage
All Pins Except CPD and SDO, I
CPD, I
SDO, I
= -400 µA
out
= -4.0 mA
out
= -5.0 mA
out
Low-level Output Voltage
All Pins Except CPD and SDO, I
CPD, I
SDO, I
= 400 µA
out
= 2 mA
out
= 5.0 mA
out
Input Leakage CurrentI
3-state Leakage CurrentI
Digital Output Pin CapacitanceC
V
IH
V
IL
V
OH
V
OL
in
OZ
out
0.6 VD+
(VD+)-0.5
(VD+) - 0.45
-
-
-
(VA+) - 0.3
(VD+) - 1.0
(VD+) - 1.0
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
0.16 VD+
0.3
0.6
-
-
-
0.3
0.4
0.4
-±1±10µA
--±10µA
-9-pF
V
V
V
V
V
V
V
V
V
V
V
V
DS317F89
DYNAMIC CHARACTERISTICS
ParameterSymbolRatioUnit
Modulator Sampling Frequencyf
Filter Settling Time to 1/2 LSB (Full-scale Step)t
CS5521/22/23/24/28
s
s
XIN/4Hz
1/f
out
s
RECOMMENDED OPERATING CONDITIONS
(AGND, DGND = 0 V; See Note 20.)
ParameterSymbol Min TypMaxUnit
DC Power SuppliesPositive Digital
Positive Analog
Analog Reference Voltage(VREF+) - (VREF-)VRef
VD+
VA+
diff
2.7
4.75
5.0
5.0
5.25
5.25
1.02.5VA+V
V
V
Negative Bias VoltageNBV-1.8-2.1-2.5V
Notes: 20. All voltages with respect to ground.
ABSOLUTE MAXIMUM RATINGS (AGND, DGND = 0 V; See Note 20.)
ParameterSymbol Min TypMax Unit
DC Power Supplies(Note 21)
Positive Digital
Positive Analog
Negative Bias VoltageNegative PotentialNBV+0.3-2.1-3.0V
Input Current, Any Pin Except Supplies(Note 22 and 23)I
Output CurrentI
Power Dissipation(Note 24)PDN--500mW
Analog Input VoltageVREF pins
AIN Pins
Digital Input VoltageV
Ambient Operating TemperatureT
Storage TemperatureT
VD+
VA+
IN
OUT
V
INR
V
INA
IND
A
stg
-0.3
-0.3
-
-
+6.0
+6.0
V
V
--±10mA
--±25mA
NBV -0.3
NBV -0.3
--(VA+) + 0.3
(VA+) + 0.3VV
-0.3-(VD+) + 0.3V
-40-85°C
-65-150°C
Notes: 21. No pin should go more negative than NBV - 0.3 V.
22. Applies to all pins including continuous overvoltage conditions at the analog input (AIN) pins.
23. Transient current of up to 100 mA will not cause SCR latch-up. Maximum input current for a power
supply pin is ±50 mA.
24. Total power dissipation, including all input currents and output currents.
WARNING: Operation at or beyond these limits may result in permanent damage to the device.
Normal operation is not guaranteed at these extremes.
10DS317F8
CS5521/22/23/24/28
SWITCHING CHARACTERISTICS (T
Levels: Logic 0 = 0 V, Logic 1 = VD+; C
= 50 pF.))
L
= 25° C; VA+ = 5 V ±5%; VD+ = 3.0 V ±10% or 5 V ±5%;
A
ParameterSymbol Min TypMaxUnit
Master Clock Frequency(Note 25)
External Clock or Internal Oscillator (CS5522/24/28)
Serial Clock FrequencySCLK0-2MHz
SCLK Falling to CS
Falling for continuous running SCLK
t
0
100--ns
(Note 28)
Serial ClockPulse Width High
Pulse Width Low
t
1
t
2
250
250
-
-
-
-
ns
ns
SDI Write Timing
CS
Enable to Valid Latch Clockt
Data Set-up Time prior to SCLK risingt
Data Hold Time After SCLK Risingt
SCLK Falling Prior to CS
Disablet
3
4
5
6
50--ns
50--ns
100--ns
100--ns
SDO Read Timing
CS
to Data Validt
SCLK Falling to New Data Bitt
CS
Rising to SDO Hi-Zt
7
8
9
--150ns
--150ns
--150ns
Notes: 25. Device parameters are specified with a 32.768 kHz clock; however, clocks up to 200 kHz
(CS5522/24/28) or 130 kHz (CS5521/23) can be used for increased throughput.
26. Specified using 10% and 90% points on waveform of interest. Output loaded with 50 pF.
27. Oscillator start-up time varies with crystal parameters. This specification does not apply when using an
external clock source.
28. Applicable when SCLK is continuously running.
Specifications are subject to change without notice.
DS317F811
CS5521/22/23/24/28
CS
SCLK
t
0
t
2
t
1
t
3
t
6
Figure 1. Continuous Running SCLK Timing (Not to Scale)
CS
SCLK
MSB
MSB-1LSBSDI
t
3
t
4
t
5
t
1
t
2
t
6
Figure 2. SDI Write Timing (Not to Scale)
CS
SCLK
MSB
MSB-1LSB
SDO
t
7
t
8
t
1
t
2
t
9
Figure 3. SDO Read Timing (Not to Scale)
12DS317F8
1. GENERAL DESCRIPTION
VREF+
Differential
4th
order
delta-
sigma
modulator
Digital
Filter
Programmable
Gain
VREF-
NBV
X20
M
U
X
AIN2+
AIN2-
AIN1+
AIN1-
CS5522
IN+
IN-
AIN4+
AIN4-
*
*
*
AIN1+
AIN1-
CS5524
AIN8+
AIN7+
*
*
*
AIN1+
CS5528
M
U
X
M
U
X
IN+
IN-
IN+
IN-
IN+
IN-
Figure 4. Multiplexer Configurations
NBV also supplies the negative
supply voltage for the coarse/fine
change buffers
CS5521/22/23/24/28
The CS5521/22/23/24/28 are highly integrated ΔΣ
Analog-to-Digital Converters (ADCs) which use
charge-balance techniques to achieve 16-bit
(CS5521/23) and 24-bit (CS5522/24/28) performance. The ADCs come as either two-channel
(CS5521/22), four-channel (CS5523/24), or eightchannel (CS5528) devices, and include a low input
current, chopper-stabilized instrumentation amplifier. To permit selectable input spans of 25 mV,
55 mV, 100 mV, 1 V, 2.5 V, and 5 V, the ADCs include a PGA (programmable gain amplifier). To
accommodate ground-based thermocouple applications, the devices include a CPD (Charge Pump
Drive) which provides a negative bias voltage to
the on-chip amplifiers.
These devices also include a fourth order DS modulator followed by a digital filter
eight selectable output word rates of
which provides
1.88 Sps,
3.76 Sps, 7.51 Sps, 15 Sps, 30 Sps, 61.6 Sps,
84.5 Sps, and 101.1 Sps
(XIN = 32.768 kHz).
The
devices are capable of producing output update
rates up to 617 Sps when a 200 kHz clock is used
(CS5522/24/28) or up to 401 Sps using a 130 kHz
clock (CS5521/23). Further note that the digital fil-
ters are designed to settle to full accuracy within
one conversion cycle and simultaneously reject
both 50 Hz and 60 Hz interference when operated
at word rates below 30 Sps (assuming a XIN clock
frequency of 32.768 kHz).
To ease communication between the ADCs and a
micro-controller, the converters include an easy to
use three-wire serial interface which is SPI™ and
Microwire™ compatible.
1.1 Analog Input
Figure 4 illustrates a block diagram of the analog input signal path inside the CS5521/22/23/24/28. The
front end consists of a multiplexer (break before
make configuration), a chopper-stabilized instrumentation amplifier with fixed gain of 20X,
coarse/fine charge buffers, and a programmable gain
section. For the 25 mV, 55 mV, and 100 mV input
ranges, the input signals are amplified by the 20X instrume ntati on amp lifi er. For the 1 V, 2.5 V, and 5 V
input ranges, the instrumentation amplifier is bypassed and the input signals are connected to the
Programmable Gain block via coarse/fine charge
buffers.
DS317F813
CS5521/22/23/24/28
AIN
25 m V, 55 mV, and 100 mV Ranges
C=48pF
CFS1/CFS0 = 00, f = 256 Hz
CFS1/CFS0 = 01, f = 4096 Hz
CFS 1/CFS0 = 10, f = 16.384 kHz
CFS1/CFS0 = 11, f = 1024 Hz
V≤25 mV
i=fV C
os
osn
Figure 5. Input Models for AIN+ and AIN- pins, ≤100
mV Input Ranges
AIN
C=20pF
f=32.768kHz
φ
Coarse
1
φ
Fine
1
V≤25 mV
i=fV C
os
osn
1 V, 2.5 V and 5 V Ranges
Figure 6. Input Models for AIN+ and AIN- pins, >100
mV input ranges
,
1.1.1 Instrumentation Amplifier
The instrumentation amplifier is chopper stabilized
and is activated any time conversions are performed
with the low-level input ranges, ≤100 mV. The amplifier is powered from VA+ and from the NBV
(Negative Bias Voltage) pin allowing the
CS5521/22/23/24/28 to be operated in either of two
analog input configurations. The NBV pin can be biased to a negative voltage between -1.8 V and
-2.5 V, or tied to AGND (for the CS5528, NBV has
to be between -1.8 V and -2.5 V for the ranges below
100 mV when the amplifier is engaged). The common-mode-plus-signal range of the instrumentation
amplifier is 1.85 V to 2.65 V with NBV grounded.
The common-mode-plus-signal range of the instrumentation amplifier is -0.150 V to 0.950 V with
NBV between -1.8 V to -2.5 V. Whether NBV is
tied between -1.8 V and -2.5 V or tied to AGND,
the (Common Mode + Signal) input on AIN+ and
AIN- must stay between NBV and VA+.
Figure 5 illustrates an analog input model for the
ADCs when the instrumentation amplifier is engaged. The CVF (sampling) input current for each
of the analog input pins depends on the CFS1 and
CFS0 (Chop Frequency Select) bits in the configuration register (see Configuration Register for details). Note that the CVF current is lowest with the
CFS bits in their default states (cleared to logic 0s).
Further note that the CVF current into the instrumentation amplifier is less than 300 pA over -40°C
to +85°C. Note that Figure 5 is for input current
modeling only. For physical input capacitance see
‘Input Capacitance’ specification under ANALOGCHARACTERISTICS. Also refer to Applications
Note AN30 - “Switched-Capacitor A/D Converter
Input Structures” for more details on input models
and input sampling currents.
Note: Residual noise appears in the converter’s baseband for
output word rates greater than 61.6 Sps if the CFS bits
are logic 0 (chop clock = 256 Hz). For word rates of
30 Sps and lower, 256 Sps chopping is recommended,
and for 61.6 Sps, 84.5 Sps and 101.1 Sps word rate settings, 4096 Hz chopping is recommended.
1.1.2 Coarse/Fine Charge Buffers
The unity gain buffers are activated any time conversions are performed with the high-level inputs ranges, 1 V, 2.5 V, and 5 V. The u nity gai n bu ffer s ar e
designed to accommodate rail-to-rail input signals.
The common-mode-plus-signal range for the unity
gain buffer amplifier is NBV to VA+.
Typical CVF (sampling) current for the unity gain
buffer amplifiers is about 10 nA
(XIN = 32.768 kHz, see Figure 6).
14DS317F8
CS5521/22/23/24/28
Note:1. The converter's actual input range, the delta-sigma's nominal full-scale input, and the delta-sigm a's
maximum full-scale input all scale directly with the value of the voltage reference. The values in the
table assume a 2.5
V VREF voltage.
2. The 2.8 V limit at the output of the 20X amplifier is the differential output voltage.
Input Range
(1)
Max. Differential Output
20X Amplifier
VREFGain Factor
Δ-Σ Nominal
(1)
Differential Input
Δ-Σ
(1)
Max. Input
± 25 mV
2.8 V
(2)
2.5V5± 0.5 V± 0.75 V
± 55 mV
2.8 V
(2)
2.5V2.272727...± 1.1 V± 1.65 V
± 100 mV
2.8 V
(2)
2.5V1.25± 2.0 V± 3.0 V
± 1.0 V-2.5V2.5± 1.0 V± 1.5 V
± 2.5 V-2.5V1.0± 2.5 V± 5.0 V
± 5.0 V-2.5V0.5± 5.0 V0V, VA+
Table 1. Relationship between Full Scale Input, Gain Factors, and Internal Analog
Signal Limitations
1.1.3 Analog Input Span Considerations
The CS5521/22/23/24/28 is designed to measure
full-scale ranges of 25 mV, 55 mV, 100 mV, 1 V,
2.5 V, and 5 V. Other full scale values can be accommodated by performing a system calibration
within the limits specified. See the Calibration section for more details. Another way to change the
full scale range is to increase or to decrease the
voltage reference to a voltage other than 2.5 . See
the Voltage Reference section for more details.
Three factors set the operating limits for the input
span. They include: instrumentation amplifier saturation, modulator 1’s density, and a lower reference
voltage. When the 25 mV, 55 mV, or 100 mV
range is selected, the input signal (including the
common-mode voltage and the amplifier offset
voltage) must not cause the 20X amplifier to saturate in either its input stage or output stage. To prevent saturation, the absolute voltages on AIN+ and
AIN- must stay within the limits specified (refer to
the Analog Input section). Additionally, the differential output voltage of the amplifier must not exceed 2.8 V. The equation
is the differential input voltage and VOS is the absolute maximum offset voltage for the instrumentation amplifier (VOS will not exceed 40 mV). If the
differential output voltage from the amplifier exceeds 2.8 V, the amplifier may saturate, which will
cause a measurement error.
The input voltage into the modulator must not
cause the modulator to exceed a low of 20 percent
or a high of 80 percent 1's density. The nominal
full-scale input span of the modulator (from 30 percent to 70 percent 1’s density) is determined by the
VREF voltage divided by the Gain Factor. See
Table 1 to determine if the CS5521/22/23/24/28 is
being used properly. For example, in the 55 mV
range, to determine the nominal input voltage to the
modulator, divide VREF (2.5 V) by the Gain Factor (2.2727).
When a smaller voltage reference is used, the resulting code widths are smaller causing the converter output codes to exhibit more changing codes
for a fixed amount of noise. Table 1 is based upon
a VREF = 2.5 V. For other values of VREF, the
values in Table 1 must be scaled accordingly.
ABS(VIN + VOS) x 20 = 2.8 V
defines the differential output limit, where
VIN = (AIN+) - (AIN-)
1.1.4 Measuring Voltages Higher than 5 V
Some systems require the measurement of voltages
greater than 5 V. The input current of the instru-
DS317F815
CS5521/22/23/24/28
Voltage
Divider
PGIA set for
+
100 mV
±10V
Charge Pump
Regulator
ΔΣ
ADC
PGIA
+5 V
2.5 V
VA+
VREF+
VREF-
VD+
+
-
NBV
V
≈
-2.1 V
+
10
μ
F
0.033
μ
F
CPD
0.1 μF
10
Ω
0.1 μF
1N4148
1N4148BAT85
Charge Pump
Circuitry
DGND
chop clock = 256 Hz
10 K
Ω
1 M
Ω
Figure 7. Input Ranges Greater than 5 V
VREF
C = 10pF
f = 32.768 kHz
2
φ
Fin e
1
V ≤ 25mV
i = fV C
os
osn
φ
Coarse
Figure 8. Input Model for VREF+ and VREF- Pins
mentation amplifier with a gain range setting of
100 mV or less, is typically 100 pA. This is low
enough to permit large external resistors to divide
down a large external signal without significant
loading. Figure 7 illustrates an example circuit. Refer to Application Note 158 for more details on
high-voltage (>5 V) measurement.
1.1.5 Voltage Reference
The CS5521/22/23/24/28 devices are specified for
operation with a 2.5 V reference voltage between
the VREF+ and VREF- pins of the device. For a
single-ended reference voltage, such as the
LT1019-2.5, the reference voltage is input into the
VREF+ pin of the converter and the VREF- pin is
grounded.
The differential voltage between the VREF+ and
VREF- can be any voltage from 1.0 V up to VA+,
however, the VREF+ cannot go above VA+ and the
VREF- pin can not go below NBV.
Figure 8 illustrates the input models for the VREF
pins. The dynamic input current for each of the pins
can be determined from the models shown.
1.2 Overview of ADC Register Structure
and Operating Modes
The CS5521/22/23/24/28 ADCs have an on-chip
controller, which includes a number of user-accessible registers. The registers are used to hold offset
and gain calibration results, configure the chip's
operating modes, hold conversion instructions, and
to store conversion data words. Figure 9 depicts a
block diagram of the on-chip controller’s internal
registers for the CS5523/24.
Each of the converters has 24-bit registers to function as offset and gain calibration registers for each
channel. The converters with two channels have
two offset and two gain calibration registers, the
converters with four channels have four offset and
four gain calibration registers, and the eight channel converter has eight offset and eight gain calibration registers. These registers hold calibration
results. The contents of these registers can be read
or written by the user. This allows calibration data
to be off-loaded into an external EEPROM. The
user can also manipulate the contents of these registers to modify the offset or the gain slope of the
converter.
16DS317F8
The converters include a 24-bit configuration register of which 17 of the bits are used for setting options such as the conversion mode, operating power
options, setting the chop clock rate of the instru-
CS5521/22/23/24/28
AIN1
AIN2
AIN3
AIN4
4 (24) 4 (24) 4 (12 x 2) 8 x 24
Off 1
Off 2
Off 3
Off 4
Gain 1
Gain 2
Gain 3
Gain 4
Setup 1
Setup 3
Setup 5
Setup 7
Setup 2
Setup 4
Setup 6
Setup 8
DATA
FIFO
SDO
1 x 24
Configuration
Chop Frequency
Multiple Conversions
Depth Pointer
Loop
Read Convert
Powerdown Modes
Flags
Etc.
Latch Outputs
Channel Select
Output Word Rate
PGA Selection
Unipolar/Bipolar
Figure 9. CS5523/24 Register Diagram
mentation amplifier, and providing a number of
flags which indicate converter operation.
A group of registers, called Channel Set-up Registers, are also included in the converters. These registers are used to hold pre-loaded conversion
instructions. Each channel set-up register is 24 bits
wide and holds two 12-bit conversion instructions
(Setups). Upon power-up, these registers can be
initialized by the user’s microcontroller with conversion instructions. The user can then use bits in
the configuration register to choose a conversion
mode.
Several conversion modes are possible. Using the
single conversion mode, an 8-bit command word
can be written into the serial port. The command includes pointer bits which ‘point’ to a 12-bit command in one of the Channel Setup Registers which
is to be executed. The 12-bit commands can be setup to perform a conversion on any of the input
channels of the converter. More than one of the 12bit Setups can be used for the same analog input
channel. This allows the user to convert on the
same signal with either a different conversion
speed, a different gain range, or any of the other options available in the Setup Register. The user can
set up the registers to perform conversions using
different conversion options on each of the input
channels.
The ADCs also include multiple-channel conversion capability. User bits in the configuration register of the ADCs can be configured to sequence
through the 12-bit command Setups, performing a
conversion according to the content of each 12-bit
Setup. This channel scanning capability can be
configured to run continuously, or to scan through
a specified number of Setup Registers and stop until commanded to continue. In the multiple-channel
scanning modes, the conversion data words are
loaded into an on-chip data FIFO. The converter issues a flag on the SDO pin when a scan cycle is
completed so the user can read the FIFO. More details are given in the following pages.
Instructions are provided on how to initialize the
converter, perform offset and gain calibrations, and
to configure the converter for the various conversion modes. Each of the bits of the configuration
register and of the Channel Setup Registers is described. A list of examples follows the description
section. Table 2 can be used to decode all valid
commands (the first 8 bits into the serial port).
DS317F817
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