1.1 GENERAL GUIDELINES
2.PREVENTION OF ELECTRO STATIC DISCHARGE(ESD)TO
ELECTROSTATICALLY SENSITIVE(ES)DEVICES
1. When servicing, observe the original lead dress. if a short circuit is found, replace all parts which have
been overheated or damaged by the short circuit.
2. After servicing, see to it that all the protective devices such as insulation barrier, insulation papers
shields are properly installed.
3. After servicing, make the following leakage current checks to prevent the customer from being exposed
to shock hazards.
Some semiconductor(solid state)devices can be damaged easily by static electricity. Such components
commonly are called Electrostatically Sensitive(ES)Devices. Examples of typical ES devices are integrated
circuits and some field-effect transistors and semiconductor chip components. The following techniques
should be used to help reduce the incidence of component damage caused by electro static discharge(ESD).
1. Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain
off any ESD on your body by touching a known earth ground. Alternatively, obtain and wear a commercially
availabel discharging ESD wrist strap, which should be removed for potential shock reasons prior to
applying power to the unit under test.
2. After removing an electrical assembly equipped with ES devices,place the assembly on a conductive
surface such as alminum foil, to prevent electrostatic charge buildup or exposure of the assembly.
3. Use only a grounded-tip soldering iron to solder or unsolder ES devices.
4. Use only an anti-static solder removal device. Some solder removal devices not classified as anti-static
(ESD protected)can generate electrical charge sufficient to damage ES devices.
5. Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES
devices.
6. Do not remove a replacement ES device from its protective package until immediately before you are
ready to install it. (Most replacement ES devices are packaged with leads electrically shorted together by
conductive foam, alminum foil or comparable conductive material).
7. Immediately before removing the protective material from the leads of a replacement ES device, touch
the protective material to the chassis or circuit assembly into which the device will be installed.
Caution
Be sure no power is applied to the chassis or circuit, and observe all other safety precautions.
8. Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise harmless motion
such as the brushing together of your clothes fabric or the lifting of your foot from a carpeted floor can
generate static electricity(ESD).
notice (1885x323x2 tiff)
The laser diode in the traverse unit (optical pickup)may brake down due to static electricity of clothes or human
body. Use due caution to electrostatic breakdown when servicing and handling the laser diode.
Some devices such as the DVD player use the optical pickup(laser diode)and the optical pickup will be damaged
by static electricity in the working environment.Proceed servicing works under the working environment where
1. Put a conductive material(sheet)or iron sheet on the area where the optical pickup is placed,and ground the
3. The flexible cable may be cut off if an excessive force is applied to it.Use caution when handling the cable.
4.PREVENTION OF STATIC ELECTRICITY DISCHARGE
4.1.Grounding for electrostatic breakdown prevention
grounding works is completed.
4.1.1. Worktable grounding
sheet.
4.1.2.Human body grounding
1 Use the anti-static wrist strap to discharge the static electricity from your body.
safety_3 (1577x409x2 tiff)
4.1.3.Handling of optical pickup
1. To keep the good quality of the optical pickup maintenance parts during transportation and before
installation, the both ends of the laser diode are short-circuited.After replacing the parts with new ones,
remove the short circuit according to the correct procedure. (See this Technical Guide).
2. Do not use a tester to check the laser diode for the optical pickup .Failure to do so willdamage the laser
diode due to the power supply in the tester.
4.2. Handling precautions for Traverse Unit (Optical Pickup)
1. Do not give a considerable shock to the traverse unit(optical pickup)as it has an extremely high-precise
structure.
2. When replacing the optical pickup, install the flexible cable and cut is short land with a nipper. See the
optical pickup replacement procedure in this Technical Guide. Before replacing the traverse unit, remove
the short pin for preventingstatic electricity and install a new unit.Connect the connector as short times as
possible.
4. The half-fixed resistor for laser power adjustment cannot be adjusted. Do not turn the resistor.
5.1 MISCELLANEOUS
5.1.1 Protection of the LD(Laser diode)
Short the parts of LD circuit pattern by soldering.
5.1.2 Cautions on assembly and adjustment
Make sure that the workbenches,jigs,tips,tips of soldering irons and measuring instruments are
grounded,and that personnel wear wrist straps for ground.
Open the LD short lands quickly with a soldering iron after a circuit is connected.
Keep the power source of the pick-up protected from internal and external sources of electrical
noise.
Refrain from operation and storage in atmospheres containing corrosive gases (such as H2S,SO2,
NO2 and Cl2)or toxic gases or in locations containing substances(especially from the organic silicon,cyan,
formalin and phenol groups)which emit toxic gases.It is particularly important to ensure that none of the
above substances are present inside the unit.Otherwise,the motor may no longer run.
6.1. Video Output (Luminance Signal) Confirmation
6.Electrical Confirmation
DO this confirmation after replacing a P.C.B.
Measurement point
Video output terminal
Measuring equipment,tools
200mV/dir,10 sec/dir
Purpose:To maintain video signal output compatibility.
1.Connect the oscilloscope to the video output terminal and terminate at 75 ohms.
2.Confirm that luminance signal(Y+S)level is 1000mVp-p±30mV
PLAY(Title 46):DVDT-S15
PLAY(Title 12):DVDT-S01
Mode Disc
Color bar 75%
Confirmation value
1000mVp-p±30mV
DVDT-S15
or
DVDT-S01
Do the confirmation after replacing P.C.B.
6.2 Video Output(Chrominance Signal) Confirmation
Measurement point
Video output terminal
Measuring equipment,tools Confirmation value
200mV/dir,10 sec/dir
Purpose:To maintain video signal output compatibility.
1.Connect the oscilloscope to the video output terminal and terminate at 75 ohme.
2.Confirm that the chrominance signal(C)level is 621 mVp-p±30mV
PLAY(Title 46):DVDT-S15
PLAY(Title 12):DVDT-S01
Mode Disc
Color bar 75%
621mVp-p±30mV
DVDT-S15
or
DVDT-S01
16 Megabit (2 M x 8-Bit/1 M x 16-Bit)
CMOS 3.0 Volt-only Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
■ Single power supply operation
— Full voltage range: 2.7 to 3.6 volt read and write
operations for battery-powered applications
— Regulated voltage range: 3. 0 to 3.6 volt read and
write operations and for compatibility with high
performance 3.3 volt microprocessors
■ Embedded Algorithms
— Embedded Erase algorithm automatically
preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
■ Manufactured on 0.23 µm process technology
— Fully compatible with 0.32 µm Am29LV160B device
■ High performance
— Access times as fast as 70 ns
■ Ultra low power consumption (typical values at
5MHz)
— 200 nA Automatic Sleep mode current
— 200 nA standby mode current
— 9 mA read current
— 20 mA program/erase current
■ Flexible sector arc hitecture
— O ne 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
thirty-one 64 Kbyte sectors (byte mode)
— One 8 Kword, two 4 Kword, one 16 Kword, and
thirty-one 32 Kword sectors (word mode)
— Supports full chip erase
— Sector Protection features:
A hardware method of locking a sector to prevent
any program or erase operations within that sector
Sectors can be locked in-system or via
programming equipment
Temporary Sector Unprotect f eature allows code
changes in previously locked sectors
■ Unlock Bypass Program Command
— Reduces overall pr ogramming time when issuing
multiple program command sequences
■ Top or bottom boot block configurations
available
■ Minimum 1,000,000 write cycle guarantee
per sector
■ 20-year data retention at 125°C
— Reliable operation for the life of the system
■ Package option
— 48-ball FBGA
— 48-pin TSOP
— 44-pin SO
■ CFI (Common Flash Interface) compliant
— Provides device-specific information to the
system, allowing host software to easily
reconfigure for different Flash devices
■ Compatibility with JEDEC standards
— Pinout and software compatible with single-
power supply Flash
— Superior inadvertent write protection
■ Data# Polling and toggle bits
— Provides a software method of detec ting program
or erase operation completion
■ Ready/Busy# pin (RY/ BY#)
— Provides a hardware method of detecting
program or erase cycle completi on (not av ailable
on 44-pin SO)
■ Erase Suspend/Erase Resume
— Suspends an erase operation t o read data from,
or program data to, a sector that is not being
erased, then resumes the erase operation
■ Hardware reset pin (RESET#)
— Hardware method to reset the devic e to reading
array data
This Data Sheet states AMD’s current technical specifications regarding the Product described herein. This Data
Sheet may be revised by subsequent versions or modificat ions due to changes in technical specif ic ations.
Publication# 22358 Rev: B Amendment/+3
Issue Date: November 10, 2000
PRODUCT SELECTOR GUIDE
Family Part Number Am29LV160D
Speed Option Voltage Range: V
Max access time, ns (t
Max CE# access time, ns (t
Max OE# access time, ns (t
)7090120
ACC
)7090120
CE
) 303550
OE
= 2.7–3.6 V -70 -90 -120
CC
Note: See “AC Characteristics” for full specifications.
BLOCK DIAGRAM
RY/BY#
V
CC
V
SS
RESET#
WE#
BYTE#
CE#
OE#
State
Control
Command
Register
PGM Voltage
Generator
Sector Switches
Erase Voltage
Generator
Chip Enable
Output Enable
Logic
STB
DQ0
–
DQ15 (A-1)
Input/Output
Buffers
Latch
Data
A0–A19
VCC Detector
Timer
STB
Address Latch
Y-Decoder
X-Decoder
Y-Gating
Cell Matrix
Am29LV160D