Features
Industry Standard Architecture
•
Low Cost Easy-to-Use Software Tools
High Speed Electrically Erasable Programmable Logic Devices
•
5 ns Maximum Pin-to-Pin Delay
CMOS and TTL Compatible Inputs and Outputs
•
Latch Feature Holds Inputs to Previous Logic States
Advanced Flash Tech no lo gy
•
Reprogrammable
100% Tested
High Reliability CMOS Process
•
20 Year Data Retention
100 Erase/Write Cyc le s
2,000V ESD Protection
200 mA Latchup Immunity
Dual-in-Line and Surface Mount Packages in Standard Pinouts
•
High
Performance
2
E
PLD
Logic Diagram
Pin Configurations
Pin Name Function
CLK Clock
IN Logic Inputs
I/O Bidirectional Buffers
* No Internal Connection
VCC +5V Supply
PD Power Down
TSSOP Top View
1
CLK/IN
2
IN
3
IN
4
IN/PD
5
IN
6
IN
7
IN
8
IN
9
IN
10
IN
11
IN
12
GND
DIP/SOIC
24
VCC
23
I/O
22
I/O
21
I/O
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
13
IN
PLCC
ATF22V10C
ATF22V10C
Top view
Note: For PLCC, pins 1, 8, 15 and 22 can be left uncon-
nected. For superior performance, connect V
to pin 1 and ground to 8, 15, 22.
CC
Rev. 0735C/22V10C-D–04/98
Description
The ATF22V10C is a high performance CMOS (Electrically Erasable) Programmable Logic Device (PLD)
which utilizes Atmel’s proven electrically erasable
Flash memory technology. Speeds down to 5 ns and
power dissipation as low as 100 µA are offered. All
speed ran ges are specified ov er the full 5V ± 10%
range for industrial temperature ranges, and 5V ± 5%
for commercial temperature ranges.
Absolute Maximum Ratings*
Several low power options allow selection of the best solution for various types of power-limited applications. Each
of these options significantly reduces total system power
and enhances system reliability.
Temperature Under Bias...................-40°C to +85°C
Storage Temperature......................-65°C to +150°C
Voltage on Any Pin with
Respect to Ground........................-2.0V to +7.0V
(1)
*NOTICE: Stresses beyond those listed under “A bsolute Maxi-
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or an y ot he r con ditions beyond those indicated in the oper ational secti ons of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
Voltage on Input Pins
with Respect to Ground
During Programming................... -2.0V to +14.0V
Programming Voltage with
Respect to Ground...................... -2.0V to +14.0V
(1)
(1)
Note:
1. Minimum voltage is -0.6V dc, which may undershoot to -2.0V
for pulses of le ss than 20 ns. Maximum output pin volt age is
+ 0.75V dc, which may overshoot to 7. 0V for pulses of
V
CC
less than 20 ns.
DC and AC Operating Conditions
Commercial Industrial
Operating Temperature (Case) 0°C - 70°C -40°C - 85°C
V
Power Supply 5V ± 5% 5V ± 10%
CC
2
ATF22V10C
ATF22V10C
DC Characteristics
Symbol Parameter Condition Min Typ Max Units
I
IL
I
IH
I
CC
I
CC2
I
CC3
I
PD
I
OS
V
IL
V
IH
V
OL
V
OH
Notes: 1. Not more than one output at a time should be shorted.
Input or I/O Low
Leakage Current
Input or I/O High
Leakage Current
Power Supply Current,
Standby
Clocked Power Supply
Current
Clocked Power Supply
Current
Power Supply Current,
PD Mode
Output Short Circuit
(1)
Current
Input Low Voltage -0.5 0.8 V
Input High Voltage 2.0 VCC+0.75 V
Output Low Voltage
Output High Voltage
Duration of short circuit test should not exceed 30 sec.
2. Low frequency only. See Supply Current versus Input Frequency curves.
0 ≤ VIN ≤
V
(MAX)
IL
3.5 ≤ V
V
CC
V
IN
≤ V
IN
= MAX,
= MAX,
Outputs Open
VCC = MAX,
Outputs Open
V
= MAX,
CC
CC
C-5, 7, 10 Com. 85 130 mA
C-10 Ind. 90 140 mA
C-5, 7, 10 Com. 1 mA/MHz
C-10 Ind. 1 mA/MHz
C-5, 7, 10 Com. 150 mA
-35 -10 µA
10 µA
Outputs Open,
f = 15 MHz
V
= MAX Com. 10 100 µA
CC
V
= 0, MAX Ind. 10 100 µA
IN
V
= 0.5V -130 mA
OUT
= VIH or VIL,
V
IN
V
= MIN
CC
= VIH or VIL,
V
IN
V
= MIN
CC
C-10 Ind. 160 mA
= 16 mA Com., Ind. 0.5 V
I
OL
I
= 12 mA Mil. 0.5 V
OL
= -4.0 mA 2.4 V
I
OH
(2)
(2)
3