ATMEL AT93C46A User Manual
1
2
3
4
8
7
6
5
CS
SK
DI
DO
VCC
DC
NC
GND
1
2
3
4
8
7
6
5
CS
SK
DI
DO
VCC
DC
NC
GND
8-lead SOIC
8-lead TSSOP
BDTIC www.bdtic.com/ATMEL
Features
• Low-voltage and Standard-voltage Operation
– 2.7 (VCC = 2.7V to 5.5V)
• Three-wire Serial Interface
• 2 MHz Clock Rate Compatibility
• Self-timed Write Cycle (10 ms max)
• High Reliability
– Endurance: 1 Million Write Cycles
– Data Retention: 100 Years
• Lead-free/Halogen-free Devices Available
• 8-lead JEDEC SOIC and 8-lead TSSOP Packages
Three-wire
Description
The AT93C46A provides 1024 bits of serial electrically-erasable programmable readonly memory (EEPROM) organized as 64 words of 16 bits each. The device is optimized for use in many automotive applications where low-power and low-voltage
operation
SOIC and 8-lead TSSOP packages.
The AT93C46A is enabled through the Chip Select pin (CS) and accessed via a threewire s
(SK). Upon receiving a Read instruction at DI, the address is decoded and the data is
clocked out serially on the data output pin DO. The write cycle is completely self-timed
and no separate erase cycle is required before write. The write cycle is only enabled
when the part is in the erase/write enable state. When CS is brought high following the
initiation of a write cycle, the DO pin outputs the ready/busy status of the part.
The AT93C46A is available in 2.7V to 5.5V versions.
Table 1. Pin Configuration
Pin Name Function
CS Chip Select
SK Serial Data Clock
DI Serial Data Input
DO Serial Data Output
GND Ground
VCC Power Supply
NC No Connect
are essential. The AT93C46A is available in space-saving 8-lead JEDEC
erial interface consisting of Data Input (DI), Data Output (DO), and Shift Clock
Automotive
Temperature
Serial EEPROM
1K (64 x 16)
AT93C46A
DC Don’t Connect
5089B–SEEPR–2/07
Absolute Maximum Ratings*
MEMORY ARRAY
64 x 16
ADDRESS
DECODER
OUTPUT
BUFFER
DATA
REGISTER
MODE
DECODE
LOGIC
CLOCK
GENERATOR
Operating Temperature......................................−55°C to +125°C
Storage Temperature .
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
........................................−65°C to +150°C
Figure 1. Block Diagram
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
nctional operation of the device at these or any
fu
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
2
AT93C46A
5089B–SEEPR–2/07
AT93C46A
Table 2. Pin Capacitance
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted)
Symbol Test Conditions Max Units Conditions
C
OUT
C
IN
Output Capacitance (DO) 5 pF V
Input Capacitance (CS, SK, DI) 5 pF VIN = 0V
Note: This parameter is characterized and is not 100% tested.
Table 3. DC Characteristics
OUT
= 0V
Applicable over recommended operating range from: T
= −40°C to +125°C, VCC = +2.7V to +5.5V,
A
(unless otherwise noted).
Symbol Parameter Test Condition Min Typ Max Unit
V
CC1
I
CC
I
SB1
I
SB2
I
IL
I
OL
(1)
V
IL1
(1)
V
IH1
V
OL1
V
OH1
Note: 1. VIL min and VIH max are reference only and are not tested.
Supply Voltage 2.7 5.5 V
Read at 1.0 MHz 0.5 2.0 mA
Supply Current VCC = 5.0V
Write at 1.0 MHz 0.5 2.0 mA
Standby Current VCC = 2.7V CS = 0V 6.0 10.0 µA
Standby Current VCC = 5.0V CS = 0V 10.0 15.0 µA
Input Leakage VIN = 0V to VCC 0.1 3.0 µA
Output Leakage VIN = 0V to VCC 0.1 3.0 µA
Input Low Voltage 2.7V ≤ VCC ≤ 5.5V −0.6 0.8 V
Input High Voltage 2.7V ≤ VCC ≤ 5.5V 2.0 VCC + 1 V
Output Low Voltage 2.7V ≤ VCC ≤ 5.5V IOL = 2.1 mA 0.4 V
Output High Voltage 2.7V ≤ VCC ≤ 5.5V IOH = −0.4 mA 2.4
5089B–SEEPR–2/07
3
Table 4. AC Characteristics
Applicable over recommended operating range from T
= −40°C to + 125°C, VCC = As Specified, CL = 1 TTL Gate and
A
100 pF (unless otherwise noted)
Symbol Parameter Test Condition Min Typ Max Units
f
SK
t
SKH
t
SKL
t
CS
t
CSS
t
DIS
t
CSH
t
DIH
t
PD1
t
PD0
SK Clock Frequency
SK High Time
SK Low Time
Minimum CS Low Time
4.5V ≤ V
2.7V ≤ V
4.5V ≤ V
2.7V ≤ VCC ≤ 5.5V
4.5V ≤ V
2.7V ≤ VCC ≤ 5.5V
4.5V ≤ V
2.7V ≤ V
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
CS Setup Time Relative to SK
DI Setup Time Relative to SK
4.5V ≤ V
≤ 5.5V
CC
2.7V ≤ VCC ≤ 5.5V
4.5V ≤ V
≤ 5.5V
CC
2.7V ≤ VCC ≤ 5.5V
0
0
250
250
250
250
250
25
50
50
100
100
0
CS Hold Time Relative to SK 0 ns
DI Hold Time Relative to SK
Output Delay to “1” AC Test
Output Delay to “0” AC Test
4.5V ≤ V
2.7V ≤ VCC ≤ 5.5V
4.5V ≤ V
2.7V ≤ V
4.5V ≤ V
2.7V ≤ VCC ≤ 5.5V
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
100
100
2
1
250
500
250
500
MHz
ns
ns
ns
ns
ns
ns
ns
ns
t
SV
t
DF
t
WP
Endurance
CS to Status Valid AC Test
CS to DO in High
Impedance
AC Test
CS = V
IL
Write Cycle Time 2.7V ≤ VCC ≤ 5.5V 0.1 3 10 ms
(1)
5.0V, 25°C 1M Write Cycles
4.5V ≤ V
2.7V ≤ VCC ≤ 5.5V
4.5V ≤ VCC ≤ 5.5V
2.7V ≤ V
Note: 1. This parameter is characterized and is not 100% tested.
≤ 5.5V
CC
≤ 5.5V
CC
250
250
100
150
ns
ns
4
AT93C46A
5089B–SEEPR–2/07
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