Atec ONT User Manual

ONT-503/506/-512

COMMUNICATIONS TEST & MEASUREMENT SOLUTIONS

Optical Network Tester 40/43 Gb/s Test Solution

Key Features

Optical transport networking

New 40/43 Gb/s networks will allow operators to further enhance transport capacity in the optical network, extend distances between systems, and improve its flexibility and responsiveness in setting up new high-bandwidth services as well as lowering operating costs for these services.

 40/43 Gb/s optical and electrical interfaces in a single

instrument

 SDH STM-256 and SONET OC-768 concatenated and

fully structured signals

 OTM0.3 with PRBS or SDH/SONET client

 Unframed 39.813 Gb/s and 43.018 Gb/s BER testing

 Alarm, error, overhead, and pointer generation and

analysis

 Jitter/ Wander generation and analysis for 40/43 Gb/s

March 2009

Market drivers

High-end core routers with 40 Gb/s short reach interfaces are becoming an important market driver, reducing the number of interconnecting fibers within the central office. Big benefits are the lower cost, space and power consumption. In long-haul networks, a key to 40 Gb/s migration is the ability to utilize the existing line system. In metro-regional networks, e.g. city-hoppers applications, 40 Gb/s can also be used very cost effectively.

Challenges

New, high bit rate networks create enormous challenges for equipment vendors not only because they push the boundaries of physics, but also because every network component must be perfectly designed, installed and tuned. The point at which networks are installed, turned up and commissioned will prove critical. A new generation of test equipment capable of meeting the demands of 40/43 Gb/s systems will be required at each stage of network design, system verification and validation, network installation, maintenance, and troubleshooting.

Optical transport test solution

The JDSU ONT-506/512 enables evaluation and characterization of 40/43 Gb/s electrical/ optical devices. The ONT supports unframed BER testing, and framed SDH/SONET/OTN functional testing including jitter/ wander generation and analysis. The modular concept starts with 3 slots for 40 Gb/s optical framed and unframed. Further modules can be added to enable electrical interfaces and jitter/ wander applications. In addition, the programmable hardware architecture allows to add a payload module for the combined OTN with SDH/ SONET client testing and to assure the future-proof for further applications.

WEBSITE: www.jdsu.com/test

ONT-5xx 40/43 Gb/s Test Solution

Design and conformance testing of NextGeneration transport networks

Multi-application and multi-port configuration

40/43G Solution

SDH/SONET, OTN (optional)• Unframed testing• OTN multiplexing option•

40/43G jitter/Wander Solution

SDH/SONET, OTN (optional)• Highly accurate jitter evaluation according to •

new O.172 Appendices VII + VIII Wander (optional)•

ONT-5xx 40/43 Gb/s Test Solution

Mainframes

ONT-503 mainframe, 3 slots, 15” TFT display BN 3075/01

ONT-506 mainframe, 6 slots, 15” TFT display BN 3062/01

ONT-512 mainframe, 12 slots, rack mount BN 3061/01

Modules and options Slots required

40/43G solution

40G SDH/SONET Jitter 5 BN 3061/91.61

43G Jitter – BN 3061/91.62

40/43G Wander – BN 3061/93.93

40G SDH/SONET 3 BN 3061/91.51

40G SDH/SONET (ONT-503) 2 BN 3075/91.51

40G SDH/SONET electrical 3 BN 3061/91.54

43G OTN + 1 BN 3061/91.52

43G OTN bulk client – BN 3061/91.53

43G OTN Multiplexing – BN 3061/93.14

43G OTN DPSK with bulk client 3 BN 3061/91.55

43G OTN with SDH/SONET Client + 1 BN 3061/91.56

ONT-5xx 40/43 Gb/s Test Solution

ONT-5xx Mainframes

Key features

Interchangeable plug-in modules for most ﬂexible use•

Linux operating system•

Easy test automation with full featured driver support•

ONT-503

3 slots to cover multiple ports/applications•

Portable•

Large 15” TFT touchscreen•

ONT-506

6 slots to cover multiple ports/applications•

Desktop•

Large 15” TFT touchscreen•

ONT-512

12 slots to cover multiple ports/applications•

Rack-mount chassis•

‘Plug-in’ modules allow for easy upgrade in the field and exchange of interfaces among ONT-503 mainframes as well as between ONT506 and ONT-512 mainframes.

All modules use the same software concept. Therefore, developed scripts can be used and training times for users are minimized.

General specifications

Power supply (nominal range of use)

AC line voltage 100 to 240 V AC line frequency 50/60 Hz, ± 5% Power consumption (fully equipped) ONT-503 ONT-506 ONT-512 Safety class to IEC 61010-1 Class I

Ambient temperature

Nominal range of use +5 to +40 oC/41 to 104 oF Storage −25 to +45 °C/−13 to +113 °F Transport −40 to +70 °C/−40 to 158

Weight and dimensions

Dimensions, including handle/bumpers (w × h × d )

ONT-503 360 × 392 × 185 mm, 14.1 × 15.4 × 7.3 in ONT-506 450 × 335 × 435 mm, 17.7 × 13.2 × 17.1 in ONT-512 464 × 327 × 523 mm, 18.2 × 12.9 × 20.6 in

7.5 rack unit height is required in a 19’’ rack

Weight, without modules

ONT-503 approx. 10 kg/ 21.5 lb ONT-506/512 approx. 17 kg/ 37.5 lb

max. 350 VA max. 650 VA

max. 1000 VA

for stacking

°F

Clock and synchronization

Internal master clock accuracy ± 2.0 ppm

(Exceeds T1.101 stratum 3/3E accuracy)

External synchronization

Connector, unbalanced 75 Ω, BNC jack Clock source DS1, E1, 1544 kHz, 2048 kHz,

8 kHz, 1 MHz, 5 MHz, 10 MHz Connector, balanced 110 Ω, Bantam jack Clock source DS1, E1, 1544 kHz, 2048 kHz

From RX

Each module may use its received signal clock information as reference for its transmitter.

Clock output

Connector, unbalanced 75 Ω, BNC jack Connector, balanced 110 Ω, Bantam jack (ONT-506/512)

Instrument operation

The ONT-5xx, which uses the Linux operating system, supports three types of operation:

Local GUI via built-in touchscreen (ONT-503, ONT-506)• Local by connecting screen/ mouse/ keyboard (ONT-512)• Customer script controlled for test automation• Remote control for test automation via LAN and GPIB• Remote operation via LAN •

Touchscreen display (ONT-503 and ONT-506)

Large color TFT 15” Resolution 1024 × 768 (XGA)

Interfaces, storage, data transfer

The ONT-5xx use a Pentium PC as internal controller allowing to run Linux applications as well.

Interfaces Ethernet (RJ45), 4 x USB, External keyboard, mouse, VGA, DVI CD R/W/DVD-ROM drive for data transfer and software update. PC Pentium M, 1.8 GHz, 1 GB RAM Hard drive for data/setup storage ≥ 40 GB

Remote control for test automation

The ONT-503 is controlled remotely via SCPI commands sent by the customer’s program using an Ethernet TCP/IP or a GPIB connection. The GPIB connection is possible via USB-GPIB cable, provided by National Instruments. Modules are addressed independently and in parallel and may be shared among multiple users. In case of GPIB only one module can be addressed. Universal driver libraries facilitate automation with specific support for individual applications. Scripting support via Tcl/Tk and C libraries and LabWindows drivers. The interactive GUI also works in parallel to remote control, so that it is very easy to develop automated scripts.

ONT-5xx 40/43 Gb/s Test Solution

40/43G Solutions

Physical layer

40G General

Interface

Line rate 39.813 Gb/s Line code Scrambled NRZ

Clock generator

Internal accuracy ± 2 ppm Offset range ± 50 ppm Offset step size 0.1 ppm Offset change mode Step, transition ramp Transition ramp 1 ppm step in 25 ms

Synchronization to external reference signals:

From received signal• From mainframe see clock and synchronization of the ONT-•

503/506/512 mainframe

40G standard optical

Optical interface

The interface is in accordance with ITU-T G.693, more specificly VSR2000-3R3 and VSR2000-3R5

Transmitter

Wavelength 1530 to 1565 nm Output level 0 dBm to +3 dBm

Receiver

Wavelength 1530 to 1565 nm Sensitivity −6 dBm to +3 dBm Offset pulling range ± 50 ppm

40G standard electrical

Electrical interface

Impedance AC coupled 50 Ω Connector type PC 2.92 mm (SMA compatible)

Transmitter

Line code Scrambled NRZ Output level >200 mVpp

Receiver

Line code Scrambled NRZ Input level 200 to 600 mVpp

40G Jitter

Optical interface

The interface is in accordance with ITU-T G.693

Transmitter

Wavelength 1530 to 1565 nm Output level 0 dBm to +3 dBm

Receiver

Wavelength 1530 - 1565 nm Sensitivity −5 dBm to +3 dBm Sensitivity for jitter measurement −2 dBm to +2 dBm Offset pulling range ± 50 ppm Offset permitted for jitter measurement ± 20 ppm

Eye clock interface

Clock 9.953 GHz Connector type SMA

Electrical interfaces

Impedance AC coupled 50 Ω Connector type PC 2.92 mm (SMA compatible)

Generator data signal

Line code Scrambled NRZ Output level >200 mVpp

Generator clock signal

Output level >200 mVpp

Receiver data signal for digital measurement

Line code Scrambled NRZ Input level 200 to 600 mVpp

43G General

Interface

Line Rate 43.018 Gb/s Line code Scrambled NRZ

Clock generator

Internal accuracy ± 2 ppm Offset range ± 50 ppm

ONT-5xx 40/43 Gb/s Test Solution

Offset step size 0.1 ppm Offset change mode Step, transition ramp Transition ramp 1 ppm step in 25 ms

Synchronization to external reference signals

From received signal• From mainframe, see clock and synchronization of the •

ONT-503/506/512 mainframe

43G Standard optical

Optical interface

The interface is in accordance with ITU-T G.693, more specificly VSR2000-3R3F and VSR2000-3R5F

Transmitter

Wavelength 1530 to 1565 nm Output level 0 dBm to +3 dBm

Reference clock output

Via 50 W SMA connector, with clocking at line rate/64

Receiver

Wavelength 1530 to 1565 nm Sensitivity −6 dBm to +3 dBm Offset pulling range ± 50 ppm

Recovered clock output

Via 50 W SMA connector, with clocking at line rate/64

43G Standard electrical

Electrical interfaces

Impedance AC coupled 50 Ω Connector type PC 2.92 mm (SMA compatible)

Transmitter

Line code Scrambled NRZ Output level >200 mVpp

Generator reference clock output

Via 50 W SMA connector, with clocking at line rate/64

Receiver

Line code Scrambled NRZ Input level 200 to 600 mVpp

Recovered clock output

Via 50 W SMA connector, with clocking at line rate/64

43G OTN DPSK (in preparation)

Interface

Line rate 43.016 Gb/s Line code NRZ-DPSK

Optical interface

Transmitter

Wavelength adjustable λ min. 1528.773 nm λ max. 1563.863nm Frequency grid 50 GHz conforming to ITU-T G.694.1 Output level adjustable -1 up to +3 dBm Step size 0.1 dBm

Reference clock

Via 50 W SMA connector, with clocking at line rate/64

Receiver

Wavelength wide range C-Band compatible Sensitivity +5 dBm to +10 dBm Offset pulling range ± 50 ppm Free spectral range switchable 50 GHz, 66 GHz

Recovered clock output

Via 50 W SMA connector, with clocking at line rate/64

Remark:

40G line rate is not available with this coding.

Service disruption with LOS sensor is only supported with a lower performance, due to transponder restrictions.

43G Jitter

Optical interface

The interface is in accordance with ITU-T G.693

Transmitter

Wavelength 1530 to 1565 nm Output level 0 dBm to +3 dBm

Reference clock output

Via 50 W SMA connector, with clocking at line rate/64

Receiver

Wavelength 1530 to 1565 nm Sensitivity −5 dBm to +3 dBm Sensitivity for jitter measurement −2 dBm to +2 dBm Offset pulling range ± 50 ppm Offset permitted for jitter measurement ± 20 ppm

Recovered clock output

Via 50 W SMA connector, with clocking at line rate/64

Eye clock interface

Clock 10.75 GHz Connector type SMA

Electrical interfaces

Impedance AC coupled 50 Ω Connector type PC 2.92 mm (SMA compatible)

ONT-5xx 40/43 Gb/s Test Solution

Generator data signal

Line code Scrambled NRZ Output level >200 mVpp

Generator clock signal

Output level >200 mVpp

Receiver data signal for digital measurement

Line code Scrambled NRZ Input level 200 to 600 mVpp

40/43G Jitter

Standards

Jitter is generated and analyzed in accordance with the following standards:

ITU-T Recommendation O.172• Receiver veriﬁcation and characterization using ITU-T Rec. O.172 •

Appendices VII + VIII with Accuracy Map support ITU-T Recommendation O.173• ITU-T Recommendation G.825• ITU-T Recommendation G.8251•

Jitter analyzer

Measuring ranges/resolution

Peak-Peak I 0 to 2 UIpp/1 mUIpp Peak-Peak II 1 to 8 UIpp/1 mUIpp Peak-Peak III 4 to 40 UIpp/10 mUIpp Peak-Peak IV 20 to 800 UIpp/100 mUIpp Peak-Peak V 400 to 14000 UIpp/1 UIpp RMS I 0 to 1 UI/0.1 mUI RMS II 0.5 to 4 UI/0.1 mUI RMS III 2 to 20 UI/1 mUI RMS IV 10 to 400 UI/10 mUI RMS V 200 to 7000 UI/100 mUI

Measurement accuracy (fixed error in 2 UI range)

20/80 kHz to 320 MHz 150 mUIpp 16 MHz to 320 MHz 50 mUIpp

Built-in filters

High-pass filters 20 kHz, 80 kHz, 16 MHz Low-pass filter 320 MHz

Demodulator output

Connector type BNC, 50 Ω

Jitter application

Supports all manual and automatic measurements for jitter evaluations.

Jitter measuring modes

Current values (continuous measurement): Peak-Peak, positive peak, negative peak, RMS

Maximum values (gated measurement): Peak-Peak, positive peak, negative peak

Logged values (repetitive measurements): Peak-Peak, positive peak, negative peak

Jitter generator

Built-in modulation generator

Jitter modulation signal Sine wave, 10 Hz to 320 MHz Jitter amplitude up to 12800 UIpp Step width 0.001 UI

Generation accuracy (16 MHz to 320 MHz)

External modulation input

Connector type BNC, 50 Ω Modulation frequency 0.1 Hz to 320 MHz Input voltage range 0 to 632 mVpp (0 dBm)

40 mUIpp

Phase hits

The instrument detects when the programmable threshold for positive and negative jitter values is exceeded and the result indicates how often the threshold was exceeded.

Jitter versus time

This function is used to record variations of jitter with time and allows the positive and negative peak values, peak-to-peak values, and RMS values to be displayed versus time. Duration is up to 99 days.

Automatic jitter measurements

Maximum tolerable jitter (MTJ)

The jitter module automatically determines the maximum jitter amplitude tolerated by the DUT at selected jitter frequencies. The maximum permissible jitter amplitude can be precisely determined using a successive method. The module determines the exact limit value. Several error sources are selectable. Standard tolerance masks are available and can be edited.

ONT-5xx 40/43 Gb/s Test Solution

Fast maximum tolerable jitter (Fast-MTJ)

This extremely fast measurement tests the device under test for conformance to the standard tolerance mask limits for maximum tolerable jitter. The editable frequency/amplitude values are set sequentially and the test pattern is monitored for the permitted threshold by the receiver. The result of each measurement is shown in a table as a status message.

Selective jitter transfer function (JTF)

The JTF shows the ratio of the jitter amplitude at the output of the device under test (DUT) and at the input at various frequencies. Standard tolerance masks are available and can be edited.

40/43G Wander

Fully complies with or exceeds the requirements of ITU-T O.172.

This software option is only available in conjunction with 40G SDH/ SONET jitter and the 43G jitter option which enables wander generation and analysis at the different bit rates.

Unbalanced BNC 75 Ω Clock signal 1.544, 2.048, 5, 10 MHz Data signal 1.544, 2.048 Mb/s

Wander measuring modes

Time interval error (TIE) numerical and graphical, peak-peak wander numerical. TIE values are recorded and available for MTIE/TDEV evaluations and frequency offset and drift rate measurements with graphs and built-in masks that comply with Telcordia GR-253, GR-1244, ANSI T1.101, ETSI ETS 300 462, EN 302 084, ITU-T O.172, and G.810 to G.813 recommendations.

Automatic wander measurements

Maximum tolerable wander (MT W)

This application tests the DUT for conformance to the standard tolerance mask limits for wander tolerance and is available in connection with the wander generator.

The device under test is subjected to wander at several amplitudes and frequencies and the output signal is monitored for different error sources. The measurement point is then marked as “Pass” (no alarms or errors detected) or “Fail” (alarms or errors detected).

Interface and Unframed Testing

Wander generator

Modulation signal Sine wave Amplitude range 0.1 to 1024000 UI Amplitude step width 0.1 UI Frequency range 10 µHz to 10 Hz Frequency step width 1 µHz

Wander analyzer

Four different sampling rates are available for detailed analysis versus time: Sampling rate – Low-pass filter

1/s – 0.1 Hz, 30/s – 10 Hz (O.172), 60/s – 20 Hz, 1000/s – 100 Hz (O.172)

Wander reference signal input

Balanced Bantam 110 Ω Clock signal 1.544, 2.048 MHz Data signal 1.544, 2.048 Mb/s

Unframed testing

With the possibility to generate and analyze unframed test signals the application space for testing with ONT family can be extended to earlier testing phases in the optical component area but also for verification of real transparent signals.

Transmitter

Generator reference clock output

Via 50 W SMA connector, with clocking at line rate/64

ONT-5xx 40/43 Gb/s Test Solution

Receiver

Recovered clock output

Via 50 W SMA connector, with clocking at line rate/64

Displays the current optical input level and the min/max values with timestamp. Displays the current signal frequency and offset and the min/max values with timestamp.

Generator

Test pattern PRBS: 2 2

-1 inv., 223-1 inv., 215-1 inv., 211-1 inv., 27-1 inv.

-1, 223-1, 215-1, 211-1, 27-1,

(Conforming to ITU-T O.150)

Error insertion

Type Bit errors Trigger Single, rates from 1 x 10

-3

to 1 x 10

-12

With mantissa equal 1

Alarm insertion

Type LOS Trigger Continuous

Trigger output

Type Off, Laser on Pulse output Event present, logical high Level TTL compatible, high >2.4 V, low <0.8 V Connector BNC, 75 Ω

Analyzer

Analysis of test pattern PRBS: 2 2

-1 inv., 223-1 inv., 215-1 inv., 211-1 inv., 27 -1 inv.

-1, 223-1, 215-1, 211-1, 27-1,

(Conforming to ITU-T O.150)

Error measurement

Type Bit errors

Alarm detection

Type LOS, Pattern Loss Resolution 100 ms

Result display of errors and alarms

Numerical display

Count, ratio and duration are displayed for each error Duration is displayed for each alarm

Tabular display

Display of all results with time stamps Criteria Start, stop, duration, count

Intermediate bit error

In addition to the long term bit error measurement, intermediate results are available. Interval 1 s up to 3600 s, Results Current/previous interval, Count and ratio

Trigger output

Type Off, LOS alarm Pulse output Event present, logical high Level TTL compatible, high >2.4 V, low <0.8 V Connector BNC, 75 Ω

40G SDH/SONET

SDH/SONET application

SDH/SONET testing

Generation/evaluation of STM-256 signal according to ITU-T G.707 Generation/evaluation of OC-768 signal according to ANSI T1.105

Mapping

SDH VC-4-256c, VC-4-64c, VC-4-16c, VC-4-4c, VC-4, AU-3/VC-3 SONET STS-768c SPE, STS-192c SPE, STS-48c SPE, STS-12c SPE, STS-3c SPE, STS-1 SPE

Generator

Generator modes

Free deﬁnable foreground• All channels identical • Background selectable mapping, depending on foreground chan-•

nel with deﬁnable path overhead and Null pattern as payload

Auto signal structure

Receiver analyses the signal structure (mapping, payload, traces) automatically for easy configuration of the test channel.

Test pattern PRBS: 2 2

-1 inv., 223-1 inv., 215-1 inv., 211-1 inv. (Conforming to ITU-T O.150) Programmable word Length 32 bits

-1, 223-1, 215-1, 211-1,

ONT-5xx 40/43 Gb/s Test Solution

Error insertion

Types

SDH Random, FAS, B1, B2, B3, MS-REI, HP-REI, bit errors SONET Random, FAS, B1, B2, B3, REI-L, REI-P, bit errors Trigger Single, rates

Error Min rate Max rate Stepping Mapping

Random 1 × 10

FAS 1 × 10

B1 1 × 10

B2 1 × 10

MS-REI, REI-L

B3 1 × 10

HP-REI, REI-P

Bit error 1 × 10

Burst error once and continuous M errored frames followed by N error-free frames. All errors except random and bit errors N, M = 1 to 8000000 or 125 µs to 1000 s

Alarm generation

Type:

SDH LOF, RS-TIM, MS-AIS, MS-RDI, AU-AIS, AU-LOP, HP-UNEQ, HP-TIM, HP-PLM, HP-RDI, HP-RDI-C, HP-RDI-S, HP-RDI-P SONET LOF, AIS-L, RDI-L, TIM-L, AIS-P, LOP-P, UNEQ-P, TIM-P, PLM-P, RDI-P, RDI-P-C, RDI-P-S, RDI-P-P, PDI-P Trigger LOS, TIMs on/off All others on/off or burst Burst once and continuous M frames with alarm ON, N frames with alarm OFF N, M = 1 to 800000 or 125 µs to 1000 s

Trigger output

Generates an external trigger signal at generation of the internal event.

Types

SDH Off, frame trigger, MS-AIS, AU-AIS, B1, B2, B3, Bit errors SONET Off, frame t rigger, AIS-L, AIS-P, B1, B2, B3, Bit errors Pulse output Event present, logical high Level TTL compatible, high >2.4 V, low <0.8 V Connector BNC, 75 Ω

1 × 10

-10

1 × 10-3Exponential –

-12

-3

1 × 10

1.61 × 10

-6

-3

1 × 10

-3

1 × 10

-6

-3

1 × 10

-6

-3

1 × 10

1 × 10-3Exponential –

0.1 –

0.1 STM-VC-4-256c, STS-1-768cSPE

0.1 STM-VC-3, STS-1-SPE

0.1 STM-VC-4-256c, STS-1-768cSPE

0.1 STM-AU-3/VC-3, STS-1-SPE

Overhead generator

The stimulus of different overhead byte pattern is an important part of verification and interoperability testing. Network elements (NE) should respond in the defined manner and any responses then conveyed by a different overhead byte.

Statically programmable bytes

A1-A2 unscrambled• RSOH/SOH all bytes except B1• MSOH/LOH all bytes except B2, H1...H3• POH all bytes except B3•

Display of overhead on the GUI.

Trace identifier

J0, J1 programmable 1 byte, 16 bytes with CRC or 64 byte sequence

Generation of pointer actions

Generation of pointer actions at the AU/STS level

New pointer value setting with or without NDF• Oﬀset simulation in ppms• Single, periodical and alternating pointer increment/decrement • Pointer sequences with diﬀerent types• SS-bits deﬁnable•

Analyzer

Test pattern PRBS: 231-1, 223-1, 215-1, 211-1, 2 (conforming to ITU-T O.150) Programmable word Length 32 bits “Live traffic” mode ignores pattern loss and bit error that allows analysis of live traffic without trouble indication

Error measurements

SDH FAS, B1, B2, B3, MS-REI, HP-REI, Bit errors SONET FAS, B1, B2, B3, REI-L, REI-P, Bit errors

-1 inv., 223-1 inv. , 215-1 inv., 211-1 inv.

ONT-5xx 40/43 Gb/s Test Solution

Alarm detections

SDH OOF, LOF, MS-AIS, MS-RDI, RS-TIM, AU-AIS, AU-LOP, HP-TIM, HP-UNEQ, HP-PLM, HP-RDI, Pattern Loss SONET OOF, LOF, AIS-L, RDI-L, TIM-L, AIS-P, LOP-P, TIM-P, UNEQ-P, PLM-P, RDI-P, PDI-P, PLM-P, ERDI-P-Payload, ERDI-P-Server, ERDI-P-Connect, Pattern Loss Resolution 100 ms

Result display of errors and alarms

Numerical display

Count, ratio and duration are displayed for each error Duration is displayed for each alarm

Tabular display

Display of all results with time stamps Criteria Start, stop, duration, count

Graphical display

Display of all events as bar graphs versus time. Cursors allow easy identification and zooming (in and out) on results. Filters enable event selection. Time axis Second, minute, hour

Intermediate bit error

In addition to the long term bit error measurement, intermediate results are available. Interval 1 s up to 3600 s, Results Current/previous interval, Count and ratio

Trigger output

Generates an external trigger signal at the detection of the received event.

Types

SDH Off, frame trigger, LOF alarm, OOF alarm, MS-AIS alarm, AU-AIS alarm, B1, B2, B3, Bit errors SONET Off, frame trigger, LOF alarm, SEF alarm, AIS-L alarm, AIS-P alarm, B1, B2, B3, Bit errors Pulse output Event present, logical high Level TTL compatible, high >2.4 V, low <0.8 V Connector BNC, 75 Ω

Overhead analyzer

Display of Overhead on the GUI.

Service disruption test

To analyze service disruption times, the ONT-5xx generates a highspeed event list as a result of all detected events.

Sensor to trigger service disruption test, selectable

Errors

SDH FAS, B1, B2, MS-REI, B3, HP-REI, bit errors/pattern loss SONET FAS, B1, B2, REI-L, B3, REI-P, bit errors/patt. loss

Alarms

SDH LOS, LOF, OOF, MS-AIS, MS-RDI, AU-AIS, AU-LOP , HP-UNEQ, HP-PLM, HP-RDI, SONET LOS, LOF, SEF, AIS-L, RDI-L, AIS-P, LOP-P, UNEQ-P, PLM-P, PDI-P, RDI-P Event sample resolution 100 µs Separation time 0.1 ms to 100000 ms Separation time starts at the end of the last event. Separation time is used to determine if the following event is a continuation of the same disruption (event occurs within separation time) or the start of the next disruption (event occurs after separation time has elapsed).

Result display of disruptions

Numerical display

Total Number of disruptions, begin timestamp of first Disruption, end timestamp of last disruption, Shortest disruption time (with timestamp) Longest disruption time (with timestamp)

Average disruption time

The threshold to identify a violation of allowed service Disruption time can be set in the range of 0 ms to 100000 ms

Tabular display

Service disruption events with start/stop times and duration. Three logging modes available (no logging; disruption events only; disruption and causing sensor events)

Transfer delay analysis

Message evaluation (TIM/PLM)

J0, J1 1 byte, 16 bytes with CRC or 64 byte sequence• J0, J1 clear text display• TIM evaluation: exception value editable as criterion for TIM• C2 signal label clear text selection• PLM Evaluation: exception value editable as criterion for PLM•

ONT-5xx 40/43 Gb/s Test Solution

Transfer delay measurements by special payload pattern in the Range of 0 to 40 s. Transfer delay can be measured even between different ports within the same mainframe.

Numerical display

Current transfer delay with accuracy of 1 µs and Resolution 100 ns Minimum transfer delay (with timestamp) Maximum transfer delay (with timestamp)

Pointer analysis

AU/STS Pointer

Numerical display

Value, count of increments, decrements, NDF.

Tabular display

Display of all events with time stamps Criteria Start, stop, duration, count

Performance monitoring

For SDH

Performance monitoring G.826

EB, BBE, ES, EFS, SES, and UAS are evaluated. Pass/fail assessments based on line length allocation of 0.1 to 100%. The SES and UAS thresholds are user-programmable. In-service measurement (ISM) of the near end and the far end of a selected path, as well as out-of-service (OOS) measurements, are supported.

Performance monitoring G.828 and G.829

The G.828 defines error performance parameters for international synchronous paths. EB, BBE, ES, EFS, SES, and UAS are evaluated. Pass/fail assessments are based on a line length allocation of 0.1 to 100%.The SES and UAS thresholds are user-programmable. The SEP can be switched off for assessment. G.829 defines error performance events and block structures for SDH multiplex and regenerator sections.

Storage depth of one byte or K1/K2 combination Post trigger up to 256 value changes Pre trigger up to 256 value changes Trigger conditions Pre, post, center Trigger events User defined byte value, (compare, not compare, don’t care)

bit mask

43G OTN

OTN application

OTN testing

The OTN application runs on the Interface module and the payload board and allows generation and analysis of an OTM0.3 signal.

Detailed parameters can be manipulated and evaluated in different OTN levels. Its payload supports both framed SDH/SONET and unframed clients.

The test set provides signal analysis and manipulation (alarm, error, overhead), Forward Error Correction (FEC) generation and analysis as well as FEC error testing. In addition to this, the full analysis capabilities of SDH and SONET are available for OTN client analysis.

For SONET

Evaluation of ES, EFS, SES, UAS and SEFS (GR 253, T1.231) ESA, ESB

Byte capture SOH/TOH

To analyze the SOH/TOH functions, it is necessary to capture individual bytes vs. time, allowing detection of errors or short term changes with frame level resolution. The capture function is started by a selectable trigger. Values for one/two selected bytes are stored and can be accessed subsequently in a table of values. Particularly in capturing the APS sequences, bytes K1 and K2 are displayed in clear text.

Selectable bytes for SOH/TOH All bytes Captured parameters Byte value, number of frames and Correspondent time

Generator

OPU3 mapping of client signals:

CBR40G with SDH/SONET client (optional, BN 3061/91.52 or • BN 3061/91.56) – STM-256/STS-768 signal internally generated. – Generation see “40G SDH/SONET application” page 9.

PRBS test signal • – PRBS 2 27-1 inv. (conforming to ITU-T O.150) – Digital word 32 bit free programmable

Null client• OTN multiplexing (optional, see page 16)• All clients can be mapped bit-synchronous or asynchronous. •

-1, 223-1, 215-1, 27-1, 231-1 inv., 223-1 inv., 215-1 inv.,

ONT-5xx 40/43 Gb/s Test Solution

Client offset – stuffing

The asynchronous SONET and SDH client offset can be adjusted within the ± 65 ppm range and the stuffing rate of the client can thus be manipulated.

Overhead

Overhead bytes (frame alignment/OTU/ODU/OPU)

All bytes statically programmable except MFAS, SM BIP, PM BIP, • TCM1...6 BIP

Additional possibilities for SM TTI, PM TTI, TCM1...6 TTI (Trail Trace • Identiﬁer): Sequence consisting of the SAPI (16 bytes) and DAPI (16 bytes) and the operator speciﬁed (32 bytes).

User designed payload structure identiﬁer (PSI), payload type • identiﬁer clear text and support of MSI

One OH byte can be selected for a freely deﬁned sequence of • 16/32/64/128/256 bytes

FTFL free deﬁnable forward/backward (FW/BW) fault indication • and operator identiﬁer

Error insertion

Type Random, FAS, MFAS SM BIP-8, SM BEI, PM BIP-8, PM BEI TCMi BIP-8, TCMi BEI (i = 1 to 6) Bit errors (only available with PRBS test signal) Trigger Single , rate, burst , burst continuous Burst error M frames errors, N frames error free, M and N = 0 to 2 Rate

Error name Min rate Max rate Stepping

Random 1 × 10

Bit 1 × 10

FAS 4.9 × 10

MFAS 3.0 × 10

SM BIP 1 × 10

SM BEI 1 × 10

PM BIP 1 × 10

PM BEI 1 × 10

TCMi BIP 1 × 10

TCMi BEI 1 × 10

-10

-12

-11

-12

1 × 10

6.6 × 10

-3

-5

Exponential

0.1

BIP masks

The position and number of bit errors in the bytes can be selected. Valid for SM BIP, PM BIP, TCMi BIP (i = 1 to 6)

BEI value

To stress the BEI evaluation of the DUT receiver the BEIs can be set to values 0 to 15 Valid for SM BEI, PM BEI, TCMi BEI (i = 1 to 6)

Alarm generation

Type LOF, OOF, LOM, OOM OTU-AIS, ODU-AIS, ODU-OCI, ODU-LCK, SM BDI, SM IAE, SM BIAE, PM-BDI, PM-TM FW-SD, FW-SF, BW-SD, BW-SF TCMi-LTC, TCMi-BDI, TCMi-BIAE, TCMi-TIM (i = 1 to 6)

Trigger

Continuously All alarms Burst once/ Burst continuous all errors except LOF, OOF, OOM, SD, SF, TIMs Burst alarms M frames with alarm, N frames no alarm, M = 1 to 2 N = 0 to 2

OTU FEC

The FEC generation can be switched on and off. Using the OTU FEC field, FEC according to the Reed-Solomon (255,239) algorithm is performed on the generated frame. With data blocks consisting of 239 data bytes and 16 FEC field bytes, up to 16 byte errors can be detected or 8 byte errors be corrected.

FEC error inser tion modes

FECcorrectable, FECuncorrectable• FECstress: This extremely helpful function allows maximum stress •

tests within a short time frame. The maximum possible number of errors that the device under test (DUT) should still be able to correct is inserted into the OTU

frame.

FECadvanced

FECadvanced allows the user to define a detailed position for error insertion in the OTU frame. Correction capability testing below and above the correction limit can be performed.

Selectable parameters: row, subrow, errored bytes per subrow, Start position in subrow, byte error mask

Analyzer

OPU-3 mapping of client signals:

CBR40G with SDH/SONET client (optional, BN 3061/91.52) • – STM-256/STS-768 signal. – Analysis see 4”0G SDH/SONET applications” page 9.

PRBS test signal • – PRBS 2 2

-1, 223-1, 215-1, 27-1, 231-1 inv., 223-1 inv. 215-1 inv.,

-1 inv., (conforming to ITU-T O.150)

– Digital word 32 bit free programmable Null client• OTN multiplexing (optional, see page 16)•

All clients can be de-mapped bit-synchronous and asynchronous

Stuffing of the client

Display of client offset in ppm

ONT-5xx 40/43 Gb/s Test Solution

Stuffing counts

Positive, negative, sum count, duration of affected seconds

Overhead

Overhead evaluation (frame alignment/OTU/ODU/OPU)

Display of the complete overhead• SM TTI, PM TTI, TCM1…6 TTI display of the 64 byte ASCII sequence •

of SAPI, DAPI and Operator ﬁeld One sequence of up to 256 bytes can be captured and displayed •

for a selectable OH byte Display payload structure identiﬁer (PSI) bytes, payload type iden-•

tiﬁer (PT) clear text and support of MSI Editable PT expectation value as mismatch criterion• FTFL forward/backward (FW/BW) fault indication and operator •

identiﬁer ﬁelds

Trace references

Set of SAPI and DAPI expectation values in traces SM TTI, PM TTI, • TCM1…6 TTI

Select evaluation type of the received signal: SAPI or DAPI or SAPI/• DAPI

General Communication Channel Capture (GCC, in preparation)

The management information between network element and termination equipment is transported in the GCCs in the OTN overhead. With this feature, the transmitted information can be captured in real-time.

Captured fields GCC0, GCC1, GCC2, GCC1+2 Captured format Raw Capture size up to 500 MB Trigger Manual

Error measurement

Validation of data for error measurement occurs after frame alignment, descrambling, and FEC computation and correction (if enabled).

Alarm detection

Types LOF, OOF, LOM, OOM OTU-AIS, ODU-AIS, ODU-OCI, ODU-LCK, SM BDI, SM IAE, SM BIAE, SM TIM, PM-BDI, PM TIM FW-SD, FW-SF, BW-SD, BW-SF TCMi-LTC, TCMi-BDI, TCMi-IAE, TCMi-BIAE, TCMi-TIM (i = 1 to 6) CL-LOSS (Client signal loss of synchronization) PT-MISM

Error detection

Types FAS, MFAS, SM BIP, SM BEI, PM BIP, PM BEI TCMi BIP, TCMi BEI (i = 1 to 6) Bit error (only available for PRBS/digital word testing signal) Resolution 100 ms

Result display of errors and alarms

Numerical display

Count, ratio and duration are displayed for each error

Duration is displayed for each alarm

Tabular display

Display of all results with time stamps Criteria Start, stop, duration, count

Graphical display

Display of all events as bar graphs versus time. Cursors allow easy identification and zooming (in and out) on results. Filters enable event selection.

Time axis Second, minute, hour

Intermediate bit error

In addition to the long term bit error measurement, intermediate results are available. Interval 1 s up to 3600 s, Results Current/previous interval, Count and ratio

OTU FEC

The FEC analysis and correction can be switched on and off. Using the OTU FEC field, FEC according to the Reed-Solomon (255,239) algorithm is performed on the received frame. With data blocks consisting of 239 data bytes and 16 FEC field bytes, up to 16 byte errors can be detected or 8 byte errors be corrected.

Error detection

Type FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word

Result display of errors

Numerical display

Count, ratio and duration are displayed for each error

Tabular display

Display of all results with time stamps Criteria Start, stop, duration, count

ONT-5xx 40/43 Gb/s Test Solution

Graphical display

Display of all events as bar graphs versus time. Cursors allow easy identification and zooming (in and out) on results. Filters enable event selection. Time axis Second, minute, hour

Service disruption test

To analyze service disruption times, the ONT-5xx generates a highspeed event list as a result of all detected events.

Sensor to trigger service disruption test, selectable:

Errors

Types MFAS, SM-BEI, PM-BIP, PM-BEI, payload errors Event sample resolution 100 µs

Alarms

Types LOS, LOM, OOM, SM-IAE, SM-BDI, SM-BIAE, ODU-AIS, ODU-OCI, ODU-LCK, PM-BDI Separation time 0.1 ms to 100000 ms Separation time starts at the end of the last event. Separation time is used to determine if the following event is a continuation of the same disruption (event occurs within separation time) or the start of the next disruption (event occurs after separation time has elapsed).

Tabular display:

Service disruption events with start/stop times and duration.

Three logging modes available (no logging; disruption events only; disruption and causing sensor events)

Transfer delay analysis

Transfer delay measurements by special payload pattern in the range of 0 to 40 s.

Transfer delay can be measured even between different ports within the same mainframe.

Numerical display

Current transfer delay with accuracy of 1 µs and resolution 100 ns

Minimum transfer delay (with timestamp) Maximum transfer delay (with timestamp)

Result display of disruptions

Numerical display

Total Number of disruptions, begin timestamp of first disruption, end timestamp of last disruption,

Shortest disruption time (with timestamp) Longest disruption time (with timestamp)

Average disruption time

The threshold to identify a violation of allowed service disruption time can be set in the range of 0 ms to 100000 ms

ONT-5xx 40/43 Gb/s Test Solution

OTN Multiplexing

As OTN moving forward from a point to point technology to a network technology additional features getting implemented. In special OTN-Multiplexing is to mention as such a feature. The ONT-503/-506/-512 will support ODU2/1 multiplexing in ODU3.

Software option 43G OTN Mulitplexing BN 3061/93.14

OTU3

Generator

Signal structure

Foreground Full structured ODU1/ODU2 With one of the following clients Bulk client, SDH/SONET (optional) Bulk client PRBS: 2 2

-1 inv., 223-1 inv., 215-1 inv., 211-1 inv., 27-1 inv. User Background Structured ODU1/ODU2 With user defined PM-TTI and a NULL client payload Generation enable/disable Background The remaining time slots are filled ODU1/ODU2 With a user defined PM-TTI, identical all channels and a NULL client payload User background and background can be overwritten by ODU-OCI, ODU-AIS, and ODU-LCK Only one multiplex type is supported at a time ODU1 or ODU2. TX and RX not coupled.

Time slot allocation Foreground and user background can be Free allocated, background channels Are automatically allocated.

Client offset stuffing

Following modes a supported Negative, positive, Double positive Foreground Default 0 ppm to client bit rate Offset range ± 65 ppm User Background Enabled, default 0 ppm to client bit rate Offset range ± 65 ppm Background No stuffing support Other generator capabilities are identical to OTU3 for the Foreground with following restrictions:

No SM support, because only on OTU available. No FEC support, because only on OTU available.

-1, 223-1, 215-1, 211-1, 27,

Analyzer

Signal structure

Foreground Full structured ODU1/ODU2 With one of the following clients Bulk client, SDH/SONET client (optional) Bulk client PRBS: 2 2

-1 inv., 223-1 inv., 215-1 inv., 211-1 inv., 27-1 inv.

-1, 223-1, 215-1, 211-1, 27,

Time slot allocation Foreground can be free allocated

Client offset stuffing

Following modes a supported Negative, positive, Double positive Displays of client offset in ppm

Stuffing counts

Positive, double positive, negative, sum count, duration of affected seconds

Other analyzer capabilities are identical to OTU3 for the foreground with following restrictions:

No SM support, because only at OTU layer available No FEC support, because only at OTU layer available No GCC capture See “OTN application” page 12

Ordering information

ONT-5xx 40/43 Gb/s Test Solution

Module 40/43G solution

SDH/SONET Application

For ONT-506/512

BN 3061/91.51 40G SDH/SONET

STM-256, OC-768, unframed 40G 3 slots

BN 3061/91.54 40G SDH/SONET electrical

STM-256, OC-768, unframed 40G 3 slots

For ONT-503

BN 3075/91.51 40G SDH/SONET

STM-256, OC-768, unframed 40G 2 slots

OTN Application

BN 3061/91.52 43G OTN

OTM.03, unframed 43G, SDH/SONET and bulk-client 1 slot in addition Requires one of the following: 40G SDH/SONET BN 3061/91.51 or BN 3075/91.51 or 43G Jitter BN 3061/91.62

BN 3061/91.53 43G OTN bulk with bulk client

OTM.03 unframed 43G, Bulk-client Software option Requires one of the following: 40G SDH/SONET BN 3061/91.51 or BN 3075/91.51 or 43G Jitter BN 3061/91.62

BN 3061/91.55 43G OTN DPSK

OTM.03, framed 43G Bulk client 3 slots

BN 3061/91.56 43G OTN with SDH/SONET client

Adds to 43G OTN a full SDH/SONET client Requires BN 3061/91.55 or BN 3061/91.53 1 slot

BN 3061/93.14 43G OTN Multiplexing

ODU2 and ODU1 in ODU3 with SDH/SONET or bulk client Requires BN 3061/91.52 or /91.56

OTN Application with DPSK

BN 3061/91.55 43G OTN DPSK with bulk client

OTM.03 with NRZ-DPSK Unframed 43G OTU3 with bulk client 3 slots

BN 3061/91.56 43G OTN with SDH/SONET client

Adds to OTU3 the capability to have a SDH/SONET client 1 slot

Jitter/Wander Application

BN 3061/91.61 40G SDH/SONET Jitter

STM-256, OC-768, unframed 40G 5 slots

BN 3061/91.62 43G Jitter

Unframed jitter at 43G No additional slot required Requires the following: 40G SDH/SONET Jitter BN 3061/91.61 OTN framed signals require: 43G OTN BN 3061/91.52

BN 3061/93.93 Wander 40/43G

Software option Requires the following: 40G SDH/SONET Jitter BN 3061/91.61 and optional 43G Jitter BN 3061/91.62

ONT-5xx 40/43 Gb/s Test Solution

Ordering information

Optical Connectors

For built-in optics, the following adapter types are available. One adapter per interface is included in the initial order and is user selectable.

Measuring adapter

BN 2060/00.51 FC, FC-PC, FC-APC

BN 2060/00.58 SC, SC-PC, SC-APC

BN 2060/00.32 ST type (AT&T)

BN 2060/00.51 DIN 47256

BN 2060/00.53 E 2000 (Diamond)

BN 2060/00.59 LC, F-3000 (PC-APC)

Optical attenuators

BN 2239/90.30 FC-PC, 10 dB, 1310/1550 nm

BN 2239/90.38 SC, 10 dB, 1310/1550 nm

JDSU offers a wide range of optical power meters, sources and attenuators. Contact your local sales representative for details.

Ordering information

NOTES:

ONT-5xx 40/43 Gb/s Test Solution

ONT

DUT

22

VOA

1N

TBF

22

VOA

OPM

OPMOA

22

Fiber spool

Scope

MAP

Atec ONT User Manual

Specifications and Main Features

Frequently Asked Questions

User Manual