Atec NSG-5071 User Manual

NSG 5071
INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT
The NSG 5071 is designed exactly in accordance with EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, A2-2, C1, C2 and RI 130 using an inductive/relay transient generator test circuit. The NSG 5071 also features
the CI 260 Waveform F in this test circuit which uses the same type of relay. This test circuit is defi ned in annex F for the A, C pulses and RI 130 and fi gure 19-10 for CI 260 Waveform F.
The basic philosophy of this test circuit is better reproducibility of actual switching transients. The repro­ducibility of this test circuit comes not from the output characteristics as in traditional conducted auto-
components are used as required in the standard.
Designed in accordance to Ford
standard EMC-CS-2009
Transients disturbances CI 220 A
and C pulses CI 260 waveform F User replaceable relays Timer to track relay usage Up to 30 A DUT current
The test circuit is based primarily around a Potter and Brumfi eld relay and two inductors from Osborne
Transformer. The relay is used in three ways: to switch the voltage off to inductors thus causing large inductive kickback transients, to self-chatter, and in the case of Waveform F, to act as a randomized dropout test.
The NSG 5071 is a convenient way of using the required com ponents in the different required confi gura-
tions in the standard to provide a single output to the EUT and maximize ease-of-use.
Technical specifications
Critical components used: Potter and Brumfi eld KUP-14A15-12
(as definied by the standard)
DC current (I
DC voltage (U
): 10 A with supplied relay
max
): 15 V
max
5 μH Osborn Transformer PN 8745 100 mH Osborn Transformer PN 32416
Up to 30 A with user-installed relay
NSG 5071
INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT
Example pulses:
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© February 2011 Teseq® Specifications subject to change without notice.
®
Tes eq
is an ISO-registered company. Its products
are designed and manufactured under the strict
quality and environmental requirements of the ISO
9001. This document has b een carefully checked.
However, Teseq
errors or inaccuracies.
691-271A February 2011
®
does not assum e any liability for
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