Atec NSG4070, NSG4075 User Manual

82-2532 90 E01 March 200 8

TEST SYSTEM FOR CONDUCTED AND RADIATED IMMUNITY

NSG 4070

The NSG 4070, successor of the NSG 2070, is a multifunctional EMC immunity test system. Its large fre-

quency range from 9 kHz to 1 GHz and its modular set-up using internal or external ampliﬁ ers enable a

large variety of applications including tests according to IEC 61000-4-6, various BCI applications as well as signal generator and power meter for test systems as per IEC 61000-4-3, IEC 61000-4-20, IEC 61000-4-21

and many other applications. The powerful and easy to use ﬁ rmware makes the NSG 4070 independent from an external PC and control software, however it can also be remote controlled for system operation. A state-of-the-art data transfer of test and measurement data for documentation is provided by USB stick to be plugged into the front panel.

External access to signal generator output and power amplifier input and output

User port for 4 TTL inputs and 4 TTL outputs and supply voltages for individual monitoring and control applications

3 power meter inputs

Analog, digital and optical monitoring inputs for extensive EUT monitoring options

5.7“ color display, easy to use firmware

10 MHz reference for synchronisation, Trigger input for external control of measurement routines

Hard keys for important functions

Remote control via RS232, LAN or USB

Integrated signal generator 9 kHz to

1 GHz

3 power meter inputs 9 kHz to

1 GHz

Integrated power amplifier module

for different applications

Multiple EUT monitoring options

5,7“ TF T color display

Internal, menu-based control soft-

ware

Basic remote control software and

report generator included

NSG 4070

NSG 4070 d atash eet

TEST SYSTEM FOR CONDUCTED AND RADIATED IMMUNITY

NSG 4070

Technical specifications

Generator

RF Frequency range: 9 kHz – 1 GHz Resolution: 1 Hz Reference frequency: 10 MHz Reference output

RF Level Level range: -60 dBm to +10 dBm Resolution: 0.1 dB Settling time: 10 ms

Amplitude modulation Modulation depth: 0 – 100% Modulation frequency range: 1 Hz – 50 kHz Frequency resolution: 1 Hz

Pulse modulation Rise / fall time (10% / 90%): < 1 µs Modulation frequency range: 1 Hz – 50 kHz Frequency resolution: 1 Hz Duty cycle: 10% to 90%

External modulation Delay time: < 1 µs / 180° Period: min. 20 µs Pulse width: min. 10 µs

Power meter

Frequency range: 9 kHz – 1 GHz Linear measurement range channel 1: -15 dBm to +27 dBm channel 2,3: -25 dBm to +20 dBm Max. input/no damage channel 1-3: +28 dBm

Noise level: >6 dB below the measurement range Input return loss: >20 dB (below 500 MHz), >17 dB (500 MHz to 1 GHz) Connector: BNC socket, 50 Ω

82-2532 90 E01 March 200 8

TEST SYSTEM FOR CONDUCTED AND RADIATED IMMUNITY

NSG 4070

Nominal output power: 20 W 30 W 75 W

Frequency range: 150 kHz – 230 MHz 150 kHz – 230 MHz 150 kHz – 230 MHz

Input impedance: 50 Ω 50 Ω 50 Ω

Output impedance: 50 Ω 50 Ω 50 Ω

Input return loss: min. 10 dB min. 10 dB min. 10 dB

Output return loss: nominal min. 9.5 dB,

0 dB without damage

nominal min. 9.5 dB, 0 dB without damage

Gain: min. 46 dB min. 46 dB min. 50 dB

Gain ﬂ atness: max. +/- 3 dB max. +/- 3 dB max. +/- 3 dB

Saturated output power: min. 43 dBm min. 45 dBm min. 48.75 dBm

Max. input power linear without damage:

< -3.5 dBm max. +10 dBm

< -1.5 dBm max. +10 dBm

< -3 dBm max. +10 dBm

2nd harmonic distortion at nominal output power:

typ. < -30 dBc typ. < -30 dBc typ. < -35 dBc

3rd harmonic distortion at nominal output power:

typ. < -20 dBc typ. < -20 dBc typ. < -18 dBc

Power amplifier

Power meter (continued)

Accuracy channel 1: typ. <0.4 dB channel 2,3

below 10 MHz: range -25 to 17 dBm typ. <0.3 dB

range 17 to 20 dBm typ. <1.5 dB

above 10 MHz: typ. <0.4 dB

NSG 4070 d atash eet

TEST SYSTEM FOR CONDUCTED AND RADIATED IMMUNITY

NSG 4070

Test and measurement routines Firmware: Generator mode

Firmware: Immunity mode

Sweep: frequency sweep, level sweep Modulation: AM, AM PC (peak conservation), pulse modulation and external Others: free parameter setting from 9 kHz to 1 GHz, high power mode

using power ampliﬁ er

Level: constant or slope test levels, max test levels depending on power

ampliﬁ er, test routine for IEC 61000-4-6 level 1 to 3 and X up to

30 V EMF, for BCI tests levels in mA or dBµA Test methods IEC 61000-4-6: CDN, EM clamp, current clamp and direct injection, clamp injection

with test level control using monitoring probe Test methods BCI: substitution method with optional use of the monitoring probe, closed loop method with power limitation (factor adjustable)

Sweep: frequency sweep, sweep function linear, steps per decade, percen- tal and as requested in ISO 11452 Modulation: AM, AM PC (peak conservation), pulse modulation, external or mixed (e.g. 1 kHz AM internal modulated with 1 Hz PM external)

EUT monitoring: Individual conﬁ guration of the ports, function to check or prepare the EUT monitoring, display of EUT monitoring results during the test, in the result ﬁ le and in the test report Calibration: Test set-up and monitoring probe calibration, display, store and recall function of calibration ﬁ les (limitation of ﬁ le numbers only by the disk space, typical >340 ﬁ les) EUT threshold search: test interrupt for manual or automatic change of frequency or stress

level

Store and recall: store and recall function of test conﬁ gurations, calibration results and test results (number of ﬁ les is only limited by the disk space, typical >340 ﬁ les), supports USB sticks Component check: quick check of system components, e.g. cable, attenuator max. 52 dB/ 54 dB/ 58 dB attenuation for 20 W/ 30 W/ 75 W ampliﬁ er,

max. +16 dB gain at 27 dBm output level Additional features: free parameter setting from 9 kHz to 1 GHz, supports external

power ampliﬁ er, directional coupler and attenuator

Firmware: Main generator menu

Firmware: Immunity test setup

Firmware: Calibration result

+ 8 hidden pages