Atec NSG-3040-SOW User Manual

NSG 3040-SOW
THE SMART 4 KV SOLUTION FOR SLOW DAMPED OSCILLATORY WAVE TESTING
Teseq’s new NSG 3040-SOW is an easy-to-use stand alone generator for Slow Damped Oscillatory Wave testing (100 kHz and 1 MHz) in compliance with IEC/EN 61000-4-18 and ANSI C37.90.1, for single phase equipment up to 270 V/16 A. Unique NSG 3040-SOW capabilities enable users not only to perform tests according to exact standard requirements, but also to test at higher levels when over-testing is required, and to test under conditions that are closer to reality, ensuring their product will perform as intended in the real world.
IEC/EN 61000-4-18 &
ANSI C37.90.1 compliant
100 kHz and 1 MHz oscillation
frequency from 0.2 to 4.4 kV
Selectable source impedance
of 200 Ω and 150 Ω
Pulse repetition rate exceeds
standards requirement
Quickly launch tests from
extensive Standards Library or User Test folders
Easy-to-operate 7“ touchscreen
color display
and over-testing purposes. Common mode, differential mode, and single/multiple line to ground coupling.
Unique NSG 3040-SOW source impedance values that refl ect actual reality conditions. The NSG 3040-SOW features a selectable source impedance of 200 Ω and 150 Ω. According to standard, 200 Ω is the fi xed output impedance, while the 150 Ω value represents the actual impedance of cables (twisted pairs).
A 7” touch panel display with superb contrast and colour makes controlling the NSG 3040-SOW
easy. For fast and effi cient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environ­ment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings.
With expert mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values.
The NSG 3040-SOW has an Ethernet port for external PC control. The Windows-based control software simplifi es test programming and compilation of complex test sequences with various types of tests. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the effi ciency of long-term tests.
NSG 3040-SOW
THE SMART 4 KV SOLUTION FOR SLOW DAMPED OSCILLATORY WAVE TESTING
The NSG 3040-SOW performs tests according to the following specifi cations:
Slow Damped Oscillatory Wave pulses 100 kHz and 1 MHz
Pulse conforms to IEC/EN 61000-4-18, ANSI C37.90.1, and IEC/EN 62052-11
Parameter Value
Voltage Range 0.2 to 4.4 kV Oscillation frequency 100 kHz and 1 MHz Pulse repetition 1 MHz pulse: From 1/s to 600/s 100 kHz pulse: From 1/s to 120/s
Source impedance 150 Ω and 200 Ω
Burst duration From 1 s to 100 s or 1 pulse to 9999 pulses or continuous – default setting is 2 s
Rise time 75 ns EUT AC 1 Ph 16 A, 24 to 270 Vrms, 50/60 Hz (phase - neutral), 400 Hz max. EUT DC 16 A, 0 to 270 VDC Coupling cap 0.5 µF Decoupling choke 2 x ≤1.5 mH
Output Floating
1)
, default is 400/s
1)
, default is 40/s
Teseq AG
Nordstrasse 11F 45 42 Luter bach Switzerland T + 41 32 681 40 4 0 F + 41 32 681 4 0 48
sales@teseq.com www.teseq.com
© June 2013 Teseq®
Specifications subject to change without notice.
®
Tes eq
is an ISO -regis tered co mpany. Its p roducts are designed and manufactured under the strict qualit y and env ironmen tal requirements of the IS O
9001. This documen t h as been carefully checked. However, Teseq
errors or inaccuracies.
691-309A June 2013
®
does not assume any liability for
1)
Pulse repetition rate is derated for voltage levels above 3 kV. Please refer to user manual.
Dimensions / weight
Dimensions 449 (17.7”) x 226 (8.9”; 5 HU) x 565 mm (22.2”) (W x H x D) Weight approx. 25 kg (55 lbs)
Options
Type Description
WIN 3000 Control and reporting software MD 200 Voltage calibration probe MD 300-SOW Current calibration probe
CDN 3425 Capacitive coupling clamp
INA XXX Adapter for capacitive coupling clamp INA 166 Rack mounting brackets (4HU)
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