Atec NSG3040 User Manual

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic
interference effects for immunity testing in conformity with international, national and manufacturers’
standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfi ll conducted
EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the
Featuring an innovative, modular design, th e NSG 3 040 i s a ve rsa tile s yst em tha t ca n be co nfi g ured
for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.
Using state-of-the-art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040 easy.
For fast and ef fi cient data entry, input devices include an integrated keyboard and a thumbwheel with
additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environ­ment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.
With expert mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values.
An easily accessible SD memory card allows fi rmware downloads to be performed quickly and tests to be saved. In the rare case that the storage space is not suffi cient, the card can be replaced by a commercially available SD memory card and existing test fi les can be easily copied onto the larger
SD card.
The NSG 3040 has an Ethernet port for external PC control. The Windows-based control software
simplifi es test programming and compilation of complex test sequences with various types of tests. Test
reports can be generated during the test operation, allowing the operator to enter obser vations as the
test progresses and increasing the effi ciency of long-term tests.
Modular, expandable system Surge voltage to 4.4 kV EFT/Burst to 4.8 kV/1 MHz PQT to 16 A/260 VAC & DC Easy to use 7“ color touch screen TA (Test Assistance) provides fast
standard test settings
Parameters can be changed while
test is running
Wide range of optional test
accessories
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
Combination wave pulse 1, 2/50 - 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
The NSG 3040 performs tests according to the following specifi cations:
Parameter Value
Pulse voltage (open circuit): ±200 V to 4.4 kV (in 1 V steps) Pulse current (short circuit): ±100 A to 2.2 kA
Impedance: 2/12 Ω
Polarity: positive / negative / alternate Pulse repetition: 10 s, up to 600 s (in 1 s steps) Test duration: 1 to 9999 pulses, continuous Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps) Coupling: external / internal
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter Value
Pulse amplitude: ±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)
Burst frequency: 100 Hz to 1000 kHz Polarity: positive / negative / alternate Repetition time: 1 ms to 4200 s (70 min) Burst time: 1 µs to 1999 s, single pulse, continuous Test duration: 1 s to 1000 h Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps) Coupling: external / internal
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
Dips & drops
conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter Value
Dips & drops: From EUT voltage input to 0 V, 0% Uvar with optional variac: depending on model (VAR 650x) Uvar with step transformer: 0, 40, 70, 80% (INA 650x) Peak inrush current capability: 500 A (at 230 V)
Switching times: 1 to 5 μs (100 Ω load)
Event time: 20 µs to 1999 s, 1 to 99’999 cycles Test duration: 1 s to 70’000 min, 1 to 99’999 events, continuous Repetition time: 40 µs to 35 min, 1 to 99’999 cycles Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
Variation test (with VAR 65xx only)
conforms to IEC/EN 61000-4-11
Parameter Value
Uvar with optional variac: 0 to 265 V (in 1 V steps), 0 to 115% (in 1% steps) Repetition time: 1 ms to 35 min, 1 to 99’999 cycles Test duration: 1 ms to 5 s, 1 to 250 cycles (50 Hz); 1 to 300 cycles (60 Hz), abrupt Repetition time: 10 ms to 10 s, 1 to 250 cycles (50 Hz), 1 to 300 cycles (60 Hz) Test duration: 1 s to 99’999 min, 1 to 99’999 events, continuous Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
Pulsed magnetic field in conjunction with INA 753 and INA 701 or 702
conforms to IEC/EN 61000-4-9
Parameter Value
Field: 1 to 1200 A/m (in 1 A/m steps) Polarity: positive / negative / alternate Repetition time: 5 s to 10 min (in 1 s steps)
Impedance: 2 Ω
Coil factor 0.01 to 50.00 Test duration: 1 to 9’999 pulses, continuous Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
Internal coupling network
Parameter Value
Decoupling attenuation: Remanent pulse 15% max. Mains side crosstalk 15% max. Mains decoupling: 1.5 mH 0% + 35% Connections: Back panel: EUT supply: Harting connector Additional ground connector Instrument supply 230/115 VAC Front panel: EUT connector IEC 320 HV coaxial Connector surge high & low EUT supply: 1-phase EUT VAC: 24 to 260 Vrms, 50/60 Hz (phase - neutral), 400 Hz max. EUT VDC: 0 to 260 VDC EUT current 1 x 16 Arms continuous (temperature controlled) 1 x 25 Arms for 15 min EFT (Burst) Standard coupling all lines to ref ground (GND) IEC/EN 61000-4-4 L, N, PE ref GND Any lines and combinations to ref GND: L ref GND N ref GND PE ref GND L, N ref GND L, PE ref GND N, PE ref GND PQT: Dips & drops to phase L
Field: 1 to max. 40 A/m (in 1 A /m steps) Frequency: 50/60 Hz Coil factor: 0.01 to 99.99 Test duration: 1 to 9’999 pulses, continuous
Power magnetic field in conjunction with MFO 6501 / MFO 6502 and INA 70x
conforms to IEC/EN 61000-4-8
Teseq AG Nordstrasse 11F 4542 Luterbach Switzerla nd T + 41 32 681 40 40 F + 41 32 681 40 48 sales@tese q.com ww w.teseq.com
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
691-05 3C Augu st 20 09
Dimensions NSG 3040: 449 (17.7”) x 226 (8.9”; 5 HU) x 565 mm (22.2”), W x H x D Weight NSG 3040: approx. 25 kg (55 lbs)
Dimensions/weight
Type Description
CDN 8014/8015 Capacitive coupling clamp for burst CDN 163 Burst coupling network 100 A per phase (coupling all to ref ground) CDN 117/118 Coupling networks for signal-/data lines (surge)
CAS 3025 Burst/EFT verifi cation set
MD 200 Voltage differential probe 7 kV MD 300 Current probe 5 kA INA 165 Conducted stand-off INA 166 Brackets 5 HU for rack mounting
Options
Type Description
INA 6501 Manual step transformer, 16 AAC, 0/40/70/80% INA 6502 Automatic step transformer, 16 AAC, 0/40/70/80% VAR 6501 Automatic variable transformer, 7.5 A VAR 6502 Automatic variable transformer, 2 x 16 A VAR 6503 Manual variable transformer, 7.5 A
Accessories for IEC/EN 61000-4-11
Type Description
MFO 6501 Manual magnetic fi eld option -4-8 MFO 6502 Automatic magnetic fi eld option -4-8 INA 701 Magnetic fi eld coil 1 x 1 m; with MFO max. 3.6 A/m -4-8;
Surge* max. 1200 A/m -4-9
INA 702 Magnetic fi eld coil 1 x 1 m, with MFO max. 40 A/m -4-8;
Surge* max. 1200 A/m -4-9 *) Pulse shape adapter INA 753 needed to surge generator INA 753 Pulse shape adapter
Accessories for IEC/EN 61000-4-8/-4-9
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