Atec NSG3040 User Manual
Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic
interference effects for immunity testing in conformity with international, national and manufacturers’
standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfi ll conducted
EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical
Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the
system to be confi gured for a much broader range of applications.
Featuring an innovative, modular design, th e NSG 3 040 i s a ve rsa tile s yst em tha t ca n be co nfi g ured
for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well
proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with
calibration data and correction factors stored on the slave controller. New modules can be easily installed
with no need to return the entire system for calibration.
Using state-of-the-art components, the self-contained modules set new standards with respect to
switching and phase accuracy and exceed the existing standards’ requirements.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040 easy.
For fast and ef fi cient data entry, input devices include an integrated keyboard and a thumbwheel with
additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance
(TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to
quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed
quickly and easily. Multi-step test procedures can be created and their sequence or parameter values
can be changed easily.
With expert mode users can make manual parameter changes using the thumbwheel while a
test is under way, providing an effective and fast method for identifying critical threshold values.
An easily accessible SD memory card allows fi rmware downloads to be performed quickly and
tests to be saved. In the rare case that the storage space is not suffi cient, the card can be replaced by
a commercially available SD memory card and existing test fi les can be easily copied onto the larger
SD card.
The NSG 3040 has an Ethernet port for external PC control. The Windows-based control software
simplifi es test programming and compilation of complex test sequences with various types of tests. Test
reports can be generated during the test operation, allowing the operator to enter obser vations as the
test progresses and increasing the effi ciency of long-term tests.
Modular, expandable system
Surge voltage to 4.4 kV
EFT/Burst to 4.8 kV/1 MHz
PQT to 16 A/260 VAC & DC
Easy to use 7“ color touch screen
TA (Test Assistance) provides fast
standard test settings
Parameters can be changed while
test is running
Wide range of optional test
accessories
THE SMART 4 KV SOLUTION FOR
CE APPLICATIONS
NSG 3040
Combination wave pulse 1, 2/50 - 8/20 µs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
THE SMART 4 KV SOLUTION FOR CE APPLICATIONS
NSG 3040
The NSG 3040 performs tests according to the following specifi cations:
Parameter Value
Pulse voltage (open circuit): ±200 V to 4.4 kV (in 1 V steps)
Pulse current (short circuit): ±100 A to 2.2 kA
Impedance: 2/12 Ω
Polarity: positive / negative / alternate
Pulse repetition: 10 s, up to 600 s (in 1 s steps)
Test duration: 1 to 9999 pulses, continuous
Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling: external / internal
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter Value
Pulse amplitude: ±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)
Burst frequency: 100 Hz to 1000 kHz
Polarity: positive / negative / alternate
Repetition time: 1 ms to 4200 s (70 min)
Burst time: 1 µs to 1999 s, single pulse, continuous
Test duration: 1 s to 1000 h
Phase synchronization: asynchronous, synchronous 0 to 359º (in 1º steps)
Coupling: external / internal
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