Digital Phosphor Oscilloscopes / Digital Serial Analyzers
/ Mixed Signal
DPO70000B/DSA70000B/MSO70000Series
Features
On All FourChannels Simultaneously
20, 16, 12.5, 8,6, and 4GHz Bandwidth Models
Upto 50 GS/s Real-TimeSample Rate
Up to 250
Feature forQuick Navigation
FastestWaveform CaptureRate with>300,000 wfms/smaximum per
channel
Highest
high-speed serial standards
Superior Signal Integrityand Excellent Signal-to-Noise Ratio – Observe
the truest representation of your waveform
Pinpoint®Triggering– Minimize timespent trying to acquire problem
signalsfor efficient troubleshooting and sho rteneddebug time
& Benefits
Megasample Record Length with M ultiView Zoom™
Bandwidth – Up to 20 GHzenables measurement on the latest
Oscilloscopes
5 Gb/s Real-time Serial Trigger – Assures triggering on the first
instance of a specified NRZ or 8b/10b pattern to allow isolation of
pattern-dependent effects
16Logic Channels with 80ps TimingResolution forDebug ofDigital and
Analog Signals(MSO70000 only)
P7500 TriMode™ Probing System – Perfectly matched signal
connectivity f rom 4 GHz to20 GHz
Application Support for High-speed Serial Industry Standards, RF,
Power Su pplies and Memory – Enables standard-specificcertification,
measurement automation, and ease of use
P6780 and P6717 High Performance 17 Channel Logic Probes with
Bandwidths up t o 2.5 GHz for Connections to Today’sFast Digital
Signals (MSO70000 only)
Applications
DesignVerificationincluding SignalIntegrity,Jitter,andTiming Analysis
DesignCharacterization forHigh-speed, Sophisticated Designs
CertificationTestingofSerial Data Streams for Industry Standards
Memory Bus Analysis and Debug
Prototype Turn-on andPower Supply Verification
Research and Investigation ofTransient Phenomena
Production Testingof Complex Systems
Spectral Analysis of Transient orWide-bandwidth RF Signals
P6780DifferentialLogicProbesprovidehigh-bandwidthconnectionsfor up to 16 digital
signals.
Tools for Your Complete Design Cycles
Tektronix understands that engineers rely onan oscilloscope throughout
their design cycle, from prototype turn-on to production testing. The
DPO/DSA70000B and MSO70000 Series oscilloscopes’unique capabilities
combined with exceptional signal acquisition performance and analysis
erate your measurement tasks.
accel
Unmatched Acquisition and Signal-to-Noise
Performance
The superior signal integrity and excellent signal-to-noise ratio of the
DPO/DSA70000
measurement results.
Highbandwidth, up to 20 GHz, matched across4 channels
Bandwidth enhancement eliminates imperfections in frequency
response all the way to the probe tip. The user-selectable filter for each
channel provides magnitude and phase correctionfor more accurate
representation of extremely fast signals. In addition, only Tektronix
allowsthe user to disable thebandwidth enhancement forapplications
needing the highest measurement throughput
Simultaneous highsample rate on all channels captures more signal
details (transients, imperfections, fast edges)
12.5 GS/s on all logic channels in theMSO70000 Series
Lowestjitter noise floor and highestvertical accuracy provide additional
margin in your measurements
Long record length provides high resolution and extended -duration
waveform capture
Standard 10MS per channel on the DPO70000B and MSO70000
Series and 20 MSon the DSA7000 0B Series
Optional up to 125 M S on all four channels for the4, 6, and 8 GHz
models
Optional up to 250 MS on all fo ur channels for the 12.5, 16, and
20 GHz m odels
On the MSO70000 Series, the recordlength oflogic channels match
the analog record lengths for uncompromised analog and digital
acquisition
MultiView Zoom helps you manage long records, compare and
analyze multiplewaveform segments
With high signal-to-noise ratio and low internal noise floor, the
DPO/DSA70000B and MSO70000 Series enable you to perform precise
characterization measurements. When deb ugging a DUT, a low noise
floor and maximum signal fidelity of the measurement instrument
allows you to find the smallest anomalies thatmight affect theDUT’s
performance. For RF signals, a lower noise floor translates into a higher
dynamic range, op ening the DPO/DSA70000B and MSO70000 for a
wider range of applications
WidestRange of Probing Solutions – Whether you need tomeasure 8Gb/s
serial data, fast digital logic, or switching currents from your new power
supply design, Tektronixoffersa vast array of probingsolutions, including
active single ended, differential,logic, highvoltage, current, optical,and a
ange of probe andoscilloscope accessories.
wide r
B and MSO70000 Series ensures confidence in your
2 www.tektronix.com
Digital Phosphor Oscilloscopes / Digital Serial Analyzers / Mixed Signal Oscilloscopes
Quick Selection Guid e
ModelAnalog Bandwidth
DPO70404B4 GHz25 GS/s10 MS
DSA70404B4 GHz25 GS/s20 MS
MSO704044 GHz25 GS/s10 MS
DPO70604B6 GHz25 GS/s10 MS
DSA70604B6 GHz25 GS/s20 MS
MSO706046 GHz25 GS/s10 MS
DPO70804B8 GHz25 GS/s10 MS
DSA70804B8 GHz25 GS/s20 MS
MSO708048 GHz25 GS/s10 MS
DPO71254B12.5 GHz50 GS/s10 MS
DSA71254B12.5 GHz50 GS/s20 MS
MSO7125412.5 GHz50 GS/s10 MS
DPO71604B16 GHz50 GS/s10 MS
DSA71604B16 GHz50 GS/s20 MS
MSO7160416 GHz50 GS/s10 MS
DPO72004B20 GHz50 GS/s10 MS
DSA72004B20 GHz50 GS/s20 MS
MSO7200420 GHz50 GS/s10 MS
Analog Sample Rate
4Channels
Standard Memory –
Analog + Digital
Analog ChannelsLogic Channels
4
4
416
4
4
416
4
4
416
4
4
416
4
4
416
4
4
416
System Turn-on and Verification
Fromthetimeadesignisfirst powered upthrough the initial operational
checks,the DPO/DSA70000B andMSO70000 Series provide the features
you need.
Uncompromised Four Channel Acquisition
With the industry’s lowest noise andup to 50 GS/s samplerate on all four
channels the DPO70 000B Series ensures that signal integrity checks
ng analysis can be done without worrying about noise and jitter
and timi
in the scope distorting the measurements. Singleshot bandwidths up
to 20 GHz on allfour channels ensurethat you’ll captureyour signals of
interest without worrying about undersampling when usingmore than 1 or
2 channels.
16 Channel Digital Acquisition (MSO70000 only)
When you have many interfaces toverify, the MSO70000 Series with 4
analog and 16 logicchannels enables efficientchannel-to-channel timing
checks. With timing resolution of 80 ps, the MSO70000’s digital acquisition
system enables you to make precisetiming measurements on as many as
20 channe
ls simultaneously.
iCapture – One Connection for Analog and Digital
(MSO700
00 only)
The num ber of signalsthat must beverified can often make the checkout
gn long and involved. Byusing the iCapture digital-to -analog
of a desi
multiplexer feature, you caneasily verify the analog characteristics of any
of the16 signals connected tothe MSO70000 Series’ digitalchannels.
UsingiCapture, youcan quicklyview theanalog characteristicsof anyinput
channel. If the signal is working as expected, relegate itto a digital-only
view and continue testing other lines.
Verifyingyour system operation often requires the ability to see specific
system states on a key bus such as the DDR SDRAM interface. Th e
MSO70000 includes parallel and low-speed serial bus decoding that
providesdeeper insightinto thesystem’s behavior. Using the b us triggering
capabilityof theMSO70000 to isolate the exact state needed or findinvalid
tem States and Setting up Bus Triggers.
bus sequences is as easy as defining the bus andchoosing thebit pattern
or symbolic word that describes the desiredstate.
Deep Record Length Available on All Channels
Longer duration events such as power supply sequencing and system
status words can be analyzedwithout sacrificing timing resolution using
the long memor
y depths available on all four analog channels in the
DPO/DSA70000BSeries aswell asthe 16logic c h annels of the MSO70000
Series. Optional memory depths up to 125MS (Option 10XL) on the4, 6,
and8 GHzmodels and 250 MS (Option 20XL) on the 12.5, 16, and 20 GHz
models are available.
Power supplies can be a critical failure point in any system. Careful
testing ofthe power delivery system’s power on sequence can be time
consuming. The MSO70000provides independentlogic thresholdsfor each
logic chan ne
l enabling multiple logic volta ges to be set up and observed
simultaneously for quick verification of thesystem’s power rails.
Protocol and Serial Pattern Triggering
To verifyser
ial architectures, the serial pattern triggering for NRZ serial
data streams with built-in clock recovery in the DPO/DSA70000B and
MSO70000Series allowscorrelating eventsacross physicaland linklayers.
The instruments can recover the clock signal, identify transitions, and
allow you to setthe desired encoded words forthe serial pattern trigger to
capture. This feature co m es standard on the DSA70000B Series and is
available o
n DPO70000B and MSO70000 models as OptionPTH. Option
PTH and the DSA70000BSeries cover serial standards upto 3.125 Gb/s.
For higher bit rate standards like USB 3.0,Option PTUon theDPO70000B
Seriesand Option STU on theDSA70000B Seriesextend 8b10btriggering
and decode to 5 Gb/s.
Pattern Lock Triggering adds an extra dimension to NRZ serial pattern
triggering by enabling the o scilloscope to take synchronized acquisitions
of a long serial test pattern withoutstanding time base accuracy. Pattern
lock trigg
ering can be used to remove random jitter from long serial
data patterns. Effects of specific bit transitions canbe investigated, and
averagingcan be used with mask testing. Pattern Lock Triggering supports
upto 6.25 Gb/s NRZ serial data stream and is standard onthe DSA70000B
instruments, or is includedas part of Option PTHon the DPO70000B and
MSO70000 models.
4 www.tektronix.com
Digital Phosphor Oscilloscopes / Digital Serial Analyzers / Mixed Signal Oscilloscopes
DPOJET Jit
concerns,
highestse
ter And Eye Diagram Analysis – Simplify identifying signal integrity
jitter,and their relatedsources withDPOJETsoftware. DPOJETprovidesthe
nsitivityandaccuracyavailableforreal-timeoscilloscopes.
System Characterization and Margin Testing
Whena design is working correctly and the next taskis tofully characterize
its performance, the DSA70000B Series offers the industry’s most
comprehensive set of analysis and certification tools, such as math
expressions,waveform mask testing, pass/fail testing, event searching, and
event marking. Toolsfor automation reduce the tedium and speed upthe
processo
fmaking hundreds of characterization measurements.
violations. Select from 53 automatic measurements using a graphical
palette that logically organizes measurements into Amplitude, Time,
Histogram,and
Communications categories. Gather further insight into your
measurement results withstatistical datasuch asmean, min,max, standard
deviation, and population.
Defineand apply math expressions towaveform data for on-screen results
in termsthat you can use. Access common waveform math f unctions
with the touch ofa button. Or,for advanced applications, create algebraic
expressions consisting oflive waveforms, reference waveforms, math
functions,measurement values, scalars, anduser-adjustable variables with
an easy-to-use calculator-style editor.
With deep acquisition memory, margin testing can be done over many
cycles and long duration trends in the datacan be observed. Plus, data
fromthe oscilloscopecan becaptured into Microsoft Excel usingthe unique
Excel toolbar, and formatted into custom reports using the Wordtoolbar
providedwith the DPO/DSA70000B and MSO70000 products.
Automated Tools to Increase Measurement Throughput
Easeof use and measurement throu ghput are keywhen alarge numberof
measurements must be completed with a performanceoscilloscope. The
DSA70000B comes standard with the DPOJET Advanced Jitter and Eye
Diagram measurement application, providingthe toolsyou need to quickly
perform a high volumeof measurements and collect statistics. DPOJET is
available on the DPO70000Band MSO70000 as Option DJA.Application
specific measurement packages are also availablethat extend DPOJET
andperform theextensive setof testsrequired by industry standard groups.
Advance
d Waveform Analysis
Full analysis of the power, voltage, and temperature corners of your
system u
nder te st can be very time consuming. The DPO/DSA70000B
and MSO70000 Series offera wide range of built-in advancedwaveform
analysis tools.
Waveform cursors make it easy to measure trace-to-trace timing
characteristics, while cursors thatlink between YT and XYdisplay modes
make it easy toinvestigate phase relationshipsand Safe OperatingArea
RF and Vector Signal Analysis
When vector signal analysis o f RF or baseband signals are needed
the optional SignalVuapplication enables measurements in multiple
domains (frequency,time, phase,modulation) simultaneously. SignalVu
measure
mentsare fullycorrelated with the scope’stime domainacquisition
and triggering. Time domain events, such as commands to a RF
subsystem, can beused as trigger events, while the subsystem’s RFsignal
can be seen in thefrequency domain.
www.tektronix.com 5
Data Sheet
TekExpres
USB 3.0 pro
hostsand d
Bus Electr
appropria
basedond
leverage
solution
TekExpress SATA Automated Compliance Test Software – Complete support for
SATA Gen1 and SATA Gen2 defined testsuites. Reduce yourcompliancetest time
by approximately 70% with simple, efficientautomationof all required test suiteswith
TekExpress software. Also included is auto-recognitionof allrequiredtest equipment,
preciseDUT/Host control, and one-button testing.
s USB 3.0 Automated Test Software (Option USB-TX) – TekExpress
videsan automated, simple, and efficient way to test USB 3.0 Transmitter
evicesconsistentwiththe requirements of the SuperSpeed Universal Serial
ical Compliance TestSpecification. The application automates selection of
teCTLE and reference channel emulation filters and measurementselections
evicetype, test type, test points,andselectedprobes. In addition, USB-TX
s DPOJET allowingfor debug and advanced characterization of USB 3.0
s.
TekExpress™ Software Automation Framework
TekExpress software automation framework has been developed for
The
automated one-button testing of high-speed se rial data standards. Built
on top of National Instruments TestStandproduct, TekExpress efficiently
executes the required tests for many serialstandards like SATARev 3.0,
SDLA - Serial Data Link Analysis (options SLE and SLA) – Offers the capability
to emulate the serialdata channel, de-embed afixture or other network,and add or
removetransmitter equalization. Option SLA adds processingofwaveforms with FFE
and DFE equalizations and automatic equalizer training. DPOJETprovidesadvanced
measurementand jitter analysis of the resulting waveforms.
USB 3.0, DisplayPort and 10GBase-T Ethernet. Run on an external
Windows PC, the TekExpress SATAsoftware orchestrates the instrument
setup and control sequencesto providecomplete test r esults for complete
design validation.
Beyond using the TekExpress framework, customapplications that you
develop yourself using application development environments such as
MATLAB
®
can furtherextend the tool set of the DPO/DSA70000B and
MSO70000 Series.
Characterization measurements depend uponaccuracy and repe atability.
The wide bandwidth and unmatched signalfidelity ofthe DPO/DSA70000B
and MSO70000 analog front end ensures that your signal quality
measurements such asrise timesare faithfulwith captureof thesignal’s 5th
harmonic andflatness of ±0.5 dB.
tom Filter and De-Embed Capability
Cus
Create your own filters or use the filters provided as standard with the
/DSA70000B and MSO70000 Series to enha nce your abilityto isolate
DPO
or remove a component of your signal (noise or specific harmonics of
the signal). These customizable FIR filters can be used to implement
signal-processing techniques, such as removingsignal pre-emphasis or
minimizingthe effectsof fixtures and cables connected to thedevice under
test. Using the optional Serial Data Link Analysis (SDLA) application,
u can gain further insight into serial data links with the capability to
yo
emulate the serial data channel from its S-parameters, de-embed the
fixture or other network, and add or remove transmitter equalization
(de-emphasis/pre-emphasis).
6 www.tektronix.com
Digital Phosphor Oscilloscopes / Digital Serial Analyzers / Mixed Signal Oscilloscopes
Certification
Beforeaproductcangotomarket,youoftenneedtocompleteaseriesof
certification tests on theindustry-standard high-speed serialbuses in your
design. These tests caninvolve manyhours of wrestling with testfixtures,
readingcertifi
your system passes the required tests.
Application Specific Solutions – Enable Standard
SpecificCertification, Measurement Automation, and
Extended Signal Analysis
Accurate,Simple,and CustomizablePhysical Layer CertificationTesting–
For designers with indu stry-standard certification needs, standard-specific
compliance a
mask and measurement limit testing are available as options to the
DPO/DSA70000B and MSO70000. Modulesare available for PCI
Express, DDR Memory,Serial ATAand SAS, InfiniBand, HDMI, Ethernet,
DisplayPort,DVI, UWB, MIPI
See the following list for highlights of the available application-specific
solutions.
cationdocuments andcollecting sufficientdata tovalidate that
nd analysis modules that configure the pass/fail waveform
®
D-PHY, Power Supplies, andUSB.
USB 3.0 Transmitter Test Solution (Option USB3) – Perform verification,
characterization,and debug of USB3.0 devices. Measurements are implementedin
DPOJETandarecomplianttotheUSB3.0specification. For compliance and automation,
USB-TX is available, which also includes OptionUSB3.
DDR Memory Bus Analysis (Option DDRA) –AutomaticallyidentifyDDR1,LPDDR1,
LPDDR2,DDR2,DDR3, and GDDR3 Reads and Writes and makes JEDEC conformance
measurementswithpass/failresultson all edges in every ReadandWriteburst. DDRA
also provides capabilities for measurements of clock,address,and control signals. In
additiontoenablingconformancetestingDDRAwithDPOJET is the fastest way to debug
complex memory signaling issues.
PCI Express Analysis Test Solution (Option PCE) – Analyze the performance of your
PCI-ExpressRev 1.0, 2.0, or 3.0(draft spec) design with comprehensive testsupport.
UsingDPOJET, Option PCE enables tests that conform to PCI-SIG standards.
www.tektronix.com 7
Data Sheet
®
MIPI
D-PHY Transmitter Characterization and Compliance Test Solution –Verifyto
theD-PHY specification, rapidly characterize and discoversourcesof jitter and signal
integrityconcerns. Perform high-speed data-clock timing measurements, along with other
electricalcharacteristicsin high-speedorlow-powermodes.
XGbT 10GBase-T Automated Compliance Software –Quickly perform 10GBase-T
measurementsper the IEEE 802.3an-2006 standard including Power SpectralDensity
(PSD), Power Level, and Linearity,with asimplified instrument configuration. XGbT
providesflexiblecontrolovertestconfigurationsandanalysisparameters,enablingmore
in-depthdevice characterization.
Ethernet C
for Ethern
comprehen
software,
DVI Compliance Test Solution (Option DVI) – Obtainquick and dependable results
with the DVI compliance test software. Automatedtestingbasedon pass/fail detection
dramaticallyenhances productivity.
ompliance Test Solution (Option ET3) – Receive full PHYlayer support
et variants 10Base-T, 100Base-TX, and 1000Base-T with Tektronix’
Digital Phosphor Oscilloscopes / Digital Serial Analyzers / Mixed Signal Oscilloscopes
DisplayPort Compliance Test Solution (Option DSPT) – Support DisplayPort
ComplianceTestStandard(CTS) source test with four-line simultaneoustestingusingthe
TektronixP7300SMA Series probes and DisplayPort software. Detailed test reports with
waveformplots,pass/failresults,andmargin analysis are included.
HDMI Compliance Test Solution (Option HT3) – Fast, efficientsolutionfor HDMI
compliancemeasurementchallenges,no matter if you are workingon aSource, Cable,
or Sink solution. This application providesall the HDMI compliance test solutions you
need to ensure quality andinteroperability.
Measurement and Analysis Software (Option PWR) –Improvetheefficiency of
Power
hingpower supplies with increased power densities. Measure andanalyzepower
switc
ipationinpower supply switching devices and magnetic components, andgenerate