Atec CE-Tester User Manual

CE - TESTER

Compact EMC-tester
acc. to the standards:

BURST 5kV:

IEC 61000-4-4 : 2012

SURGE 5kV, 2.5kA:

IEC 61000-4-5 : 2007

Magnetic field 50/60 Hz:

IEC 61000-4-8 : 2010

Magnetic field 8/20 µs:

IEC 61000-4-9 : 2001

Voltage dips/variation:

IEC 61000-4-11 : 2004

The CE-TESTER is a compact EMC test unit designed for testing electromagnetic immunity
against pulsed and conducted interference. Demonstrating such immunity is generally a
requirement for compliance with the European EMC directive, a necessary step leading to the
CE mark.

In its basic configuration, the CE-TESTER includes an Electrical Fast Transient Generator
(EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN)
for single-phase power supply lines.

The Electrical Fast Transient Generator fully compliant to IEC 61000-4-4, delivers fast
transient pulses with waveform 5/50 ns and a maximum burst frequency of 1 MHz. It is used
for immunity testing of electronic systems and devices. The four standard IEC 61000-4-4 test
levels may be easily selected by push button or all parameters may be adjusted individually.

The Combination Wave Generator fully compliant to IEC 61000-4-5 and IEEE 587 delivers a
standard impulse voltage with waveform 1.2/50 µs and a standard impulse current with
waveform 8/20 µs. It is a combined impulse-current-/impulse-voltage generator for high­impedance loads RL > 100Ω and may be used for surge testing of components and devices,
as well as for galvanic coupling of surges to cable shields, shielded enclosures and cabinets.

The built-in capacitive Coupling-/Decoupling Network allows superimposition of the
combination wave generator output to the mains voltage of the device under test.

The simulation of voltage dips and voltage variations acc. to IEC 61000-4-11 can be included
as a option. Additional accessories allow the testing of immunity against both pulsed and
power frequency magnetic fields according to IEC 61000-4-8 and IEC 61000-4-9.

Technical specifications subject to change, CE_TESTE_3G.DOC, 10/12

HILO-TEST GmbH, Am Hasenbiel 42, D-76297 Stutensee-Karlsruhe, Tel. [phone], www.hilo-test.de

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Optionally the CE-TESTER can include a trigger able power supply switch which allows the
simulation of the voltage dips as specified in the standard IEC 61000-4-11. The variation of
power supply voltage is controlled by use of an external motor driven variac. The control of
the external power source is included in the mainframe.

An Induction Coil in conjunction with the Combination Wave Generator output, is used to
simulate pulsed magnetic fields according to IEC 61000-4-9. Combined with the external
power source, the Induction Coil can be used to simulate power frequency magnetic fields
according to IEC 61000-4-8.

Additional Coupling-/Decoupling Networks covering three-phase power supply lines, DC
supply lines and signal lines are also available, as well as a Capacitive Coupling Clamp for
coupling to shielded interconnection lines.

The CE-TESTER excels by its compact design, simple handling and precise reproducibility of
test impulses. It features a microprocessor controlled user interface and a 5” touch screen
unit for ease of use. The microprocessor allows the user to execute either standard test
routines or a “user defined ” test sequence. A standard USB port provides the ability to print a
summary of the test parameters to a USB stick.

The software program CE-REMOTE allows full remote control of the test generator via
Ethernet light guide as well as documentation and evaluation of test results, accordingly to
the IEC 17025. To record definite impulses, it is equipped with an Impulse Recording
Function (IRF)

Moreover all generator functions including the built-in Coupling-/Decoupling Network, may be
computer controlled via the isolated optical interface.

Technical specifications subject to change, CE_TESTE_3G.DOC, 10/12

HILO-TEST GmbH, Am Hasenbiel 42, D-76297 Stutensee-Karlsruhe, Tel. [phone], www.hilo-test.de

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