Atec Agilent-346a User Manual
Probing Solutions for Logic Analyzers
Catalog
Create a Quality Connection to Your
Target System
To make sure you have the tools
for dependable state and timing
measurements, no matter what
mix of chip packages, test ports
and probes your application
requires, we’ve created the
largest line of probing solutions
in the industry.
Accurate measurements start
with reliable probing. Agilent
Technologies offers a wide variety
of probing accessories to support
your measurement needs, making
it easy to connect your Agilent
logic analyzer to your design.
Each is designed for a specific
measurement need because the
physical and electrical quality of
the connection can mean the difference between a good measurement and a bad one.
Table of Contents
Reliable Connections
Ensure Accuracy. . . . . . . . . . . . . . . . . . . . 2
Which Logic Analyzer? . . . . . . . . . . . . . 3
Quick Selection Guide . . . . . . . . . . . . . . 4
Selecting the Optimum
Probing Strategy. . . . . . . . . . . . . . . . . . . . 5
For All Agilent Logic Analyzers with
40-pin Pod Connectors . . . . . . . . . . . . . . . . . 5
For All Agilent Logic Analyzers with
90-pin Pod Connectors . . . . . . . . . . . . . . . . . 7
General-Purpose Probing . . . . . . . . . . . . 8
QFP Package Probing . . . . . . . . . . . . . . . 9
General-Purpose Probing. . . . . . . . . . . 12
For All Agilent Logic Analyzers with
40-pin Pod Connectors . . . . . . . . . . . . . . . . 12
Designing and Probing with
Target Connections . . . . . . . . . . . . . . . . 15
Normal-Density, Medium-Performance
Applications . . . . . . . . . . . . . . . . . . . . . . . . . 15
For All Agilent Logic Analyzers with
40-pin Pod Connectors . . . . . . . . . . . . . . . . 16
Probing Individual Pins of
High-Density Connectors. . . . . . . . . . . . . . 34
For All Agilent Logic Analyzers with
40-pin Pod Connectors . . . . . . . . . . . . . . . . 36
Agilent Logic Analyzers with
90-pin Pod Connectors . . . . . . . . . . . . . . . . 41
Agilent 16760A 1.5 Gbits/Sec
Logic Analyzer Module. . . . . . . . . . . . . . . . 58
Agilent Logic Analyzers with
90-pin Pod Connectors . . . . . . . . . . . . . . . . 59
General-Purpose Probing. . . . . . . . . . . 61
Agilent Logic Analyzers with
90-pin Pod Connectors . . . . . . . . . . . . . . . . 61
Agilent 16517A/16518A
1 GHz State / 4 GHz Timing . . . . . . . . . 66
Related Information . . . . . . . . . . . . . . . . 68
Support, Services, and Assistance. . . 69
About this Document
To assist you in choosing the best
state/timing probing solution for
your particular target, this document will consider the following:
• Chip packaging, test ports
• Special physical and electrical
considerations
• Other accessories and options
Other Reference Documents
Additional information on
probing solutions can be found
at www.agilent.com/find/
logic_analyzer_probes.
For information on probes and
accessories for the other related
Agilent Technologies logic
analysis system products listed
below, please refer to “Related
Information” in this document:
• Pattern generators
NOTE: Probes are ordered separately.
Please specify probes when ordering to
ensure the correct connection between
your logic analyzer and device under test.
2
• Impedance
High input impedance
ensures minimum intrusion on
your circuit. Although many
probes might be acceptable for
lower frequencies, capacitive
loading becomes significant
at higher frequencies. The
Agilent Technologies probing
products perform over a wide
frequency spectrum.
• Ruggedness
Probes with quality
mechanical design provide
solid electrical connections.
Intermittent open circuits
would only add one more
variable to your debugging
equation. Agilent probes
are mechanically designed
to relieve strain and ensure
rugged, reliable connection.
• Immunity to Noise
Electromagnetic noise can
corrupt data captured by
the logic analyzer. Agilent
probing solutions are
designed for a high immunity
to transient noise.
• Performance
Agilent logic analyzers have
front-end circuitry that
supports the state and
timing specifications of
the analyzer. This circuitry,
together with the Agilent
probing solutions described in
this document, will accurately
capture the target signals at
the specified clock rates.
Reliable Connections Ensure Accuracy
Signal Frequency Content Drives Probing Solutions
Faster clock rates demand tighter timing tolerances, such as setup
and hold specifications. Systems with faster clock rates usually
have shorter rise and fall times. Signals with shorter transition
times have more high frequency content and are more susceptible
to high frequency analog problems such as cross talk, reflections,
ground bounce, noise and emissions. Susceptibility of a system to
analog problems relates to the transition times of the signals, not
the clock rate. A system with slow transition times cannot have
high clock rates. However, it is possible for a system with slower
clock rates to have signals with very fast transition times.
General-purpose probing solutions provide the analog bandwidth
required to run each logic analyzer module at its maximum clock
rate. The high input impedance of these probes, especially at high
frequencies, presents a minimal load to most systems. Systems
that are operating with little margin should be designed with
consideration for both the system components and the input
impedance of the probing solution being used during debug.
Input impedance specifications or equivalent load diagrams
can be found for each of the probing solutions described in
this document.
Other Considerations
Physical connection compatibility
between various Agilent probes
may allow you to mix and
match a variety of probes and
accessories. However, a probe
accessory designed for slower
clock speeds will not deliver
high-speed target performance
simply because it is used with a
higher speed analyzer module.
Also, the serial connection of
multiple probe leads and/or
accessories will degrade
signal integrity.
3
Agilent logic analyzers have
two methods of connection to
the probes. One uses a 3M-style
connector with 2 rows of 20
pins on 0.1-inch centers, as
illustrated in Figure 1.1. Probes
for these analyzers are identified
in this document as “for analyzers
with 40-pin pod connectors.”
The other style uses a 90-pin,
high-density connector, as
illustrated in Figure 1.2. Probes
for these analyzers are identified
in this document as “for analyzers
with 90-pin pod connectors.”
Currently available Agilent logic analyzers in these two groups are as follows:
Which Logic Analyzer?
Figure 1.1. 40-pin pod connector Figure 1.2. 90-pin pod connector
90-pin pod connector
16950A
16760A
40-pin pod connector
16911A
16910A
1680, 1690 series benchtop analyzers
4
Quick selection guide
For logic analyzer Connection to Single-ended* Number of Agilent model number
pod connection system under test or differential channels or part number Page
40-pin Flying leads Single-ended 17 E5383A 12
40-pin Pro Series soft touch Single-ended 34 E5404A 21
40-pin Half-size soft touch Single-ended 17 E5396A 23
40-pin Soft touch Single-ended 34 E5394A 20
connectorless
40-pin Samtec connector Single-ended 34 E5385A 28
40-pin Mictor connector Single-ended 34 E5346A 28
40-pin Mictor connector Single-ended, 34 E5339A 28
low voltage
40-pin Mictor connector Single-ended, 34 E5351A 32
no isolation networks
90-pin Flying leads Single-ended 17 E5382A 61
90-pin Flying leads Differential 17 E5381A 64
90-pin Pro Series soft touch Differential 17 E5405A 42
90-pin Pro Series soft touch Single-ended 34 E5406A 42
90-pin Half-size soft touch Single-ended 17 E5398A 52
90-pin Soft touch Single-ended 34 E5390A 43
connectorless
90-pin Soft touch Differential 17 E5387A 41
connectorless
90-pin Samtec connector Single-ended 34 E5378A 57
90-pin Samtec connector Differential 17 E5379A 57
90-pin Mictor connector Single-ended 34 E5380A 59
* Isolation networks are included unless designated otherwise.
5
Selecting the Optimum Probing Strategy
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Go to page 9 for a discussion of
Agilent’s QFP package probing
solutions for logic analyzers.
Connecting to all the Pins of a Specific Package
Advantages Limitations
Most flexible method. Can be time-consuming to connect a large
Convenient for picking up signals that number of channels.
may not be grouped conveniently on your Least space-efficient method.
board with buses routed to connectors Some accessories may compromise
(example: system clock, interrupts). probe performance.
Go to page 12 for a discussion of Agilent’s
flying-lead logic analysis probes and
accessories for logic analyzers.
Connecting to Individual IC Pins or Test Points
Advantages Limitations
Rapid access to all pins of fine-pitch Requires minimal keep-out area.
QFP package. Requires some time for installation of
Very reliable connections. retainer on IC package.
May compromise probe performance.
6
Selecting the Optimum Probing Strategy
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Go to page 16 for a discussion of
Agilent’s target connector solutions for
logic analyzers with 40-pin pod connectors.
Designing Connectors Directly into the Target System
Refer to Processor and Bus Support for
Agilent Technologies Logic Analyzers,
publication number 5966-4365E at:
http://www.agilent.com/find/pnbs
That document will tell you what additional
probing accessories you need to connect
logic analyzers with 40-pin pod connectors
to the analysis probes.
Using Processor/Bus Specific Probes
Advantages Limitations
Very reliable connections. Requires advanced planning in the
Saves time in making multiple connections. design stage.
Least amount of board space required for Requires some dedicated board space.
large number of channels. Moderate incremental cost.
Advantages Limitations
Easiest and fastest connections to Moderate to significant incremental costs.
supported processors and buses. Only usable for the specific processor or bus.
7
Selecting the Optimum Probing Strategy
For all Agilent Logic Analyzers with 90-pin Pod Connectors
Go to page 61-65 for a discussion of
Agilent’s flying lead probe sets for logic
analyzers with 90-pin pod connectors.
Connecting to Individual IC Pins, Test Points, Browsing or Solder Attach to
Components, Traces or VIAs
Advantages Limitations
Most flexible method. Time-consuming to connect large number
Convenient for picking up signals that of channels.
may not be grouped conveniently on your Requires more board space, for large
board with buses routed to connectors number of channels.
(example: system clock, interrupts). Some accessories may degrade probe
performance at high speeds.
Go to page 54 for the target connection
probing solutions for logic analyzers with
90-pin pod connectors. Go to page 41 for
connectorless solutions for logic analyzers
with 90-pin pod connectors.
Designing Connections Directly into the Target System
Advantages Limitations
Very reliable connections. Requires advanced planning in the
Save time in making multiple connections. design stage.
Least amount of board space required for
large number of channels.
8
General-Purpose Probing
Wedge Adapters
The Agilent Technologies Wedge
technology provides very reliable
probing of a few channels on
0.5 mm and 0.65 mm pitch QFPs.
No clear area is required around
the device. Each Wedge of the
probe slides between the legs of
the QFP. The side of each Wedge
probe contacts the package legs.
An insulation core electrically
isolates the sides of each Wedge
(see Figures 2.1 and 2.2). Various
3-signal, 8-signal, and 16-signal
probes are available (see Table 1).
Figure 2.1. Three-signal Wedge
electrical connection
Figure 2.2. Eight-signal and 16-signal Wedge (16-signal Wedge has a common ground plane)
Top view of 16 signal pins
Bottom view of 16 ground pins (connected to common ground plane)
Ground connector pins
Wedge connector pins
Removable jumper
1
Gaps
16
Miscellaneous Probing Accessories
The ferrite core assembly can be
added to the probe cable to suppress EMI and RFI noise that can
corrupt the measurement.
Figure 2.3. Ferrite core assembly, 16555-60001
IC Leg Number Number Model
Spacing of Signals of Wedges Number
in Pack
0.5 mm 3 1 E2613A
0.5 mm 3 2 E2613B
0.5 mm 8 1 E2614A
0.5 mm 16 1 E2643A
0.65 mm 3 1 E2615A
0.65 mm 3 2 E2615B
0.65 mm 8 1 E2616A
0.65 mm 16 1 E2644A
Table 1. Wedge probe adapter
9
Figure 3.2. Elastomeric probing solution
1/4 flex adapter
(4 required to connect all pins)
Elastomeric
probe adapter
Retainer
TQFP IC
QFP Package Probing
Figure 3.1. Locator tool aligning
retainer on the device
Locator tool
Retainer
TQFP IC
connections to the pins on its
respective side of the QFP device.
Additional retainers and locator
tools are also available. A kit of
five retainers and adhesive is
available as option #201. The
locator tool is option #202. These
option numbers apply to any
of the listed elastomeric probe
adapter model numbers, for
example, Agilent E5374A #202.
Package Pin Pitch Elastomeric Probe Adapter 1/4 Flex Adapter
144-pin TQFP 0.5 mm E5336A E5340A
144-pin PQFP/CQFP 0.65 mm E5361A E5340A
160-pin PQFP/CQFP 0.65 mm E5373A E5349A
160-pin TQFP 0.5 mm E5377A E5349A
176-pin TQFP 0.5 mm E5348A E5349A
208-pin PQFP/CQFP 0.5 mm E5374A E5371A
240-pin PQFP/CQFP 0.5 mm E5363A E5371A
Table 2. Elastomeric probe adapters
If your target contains ASICs,
FPGAs, or other devices in an
industry-standard QFP configuration, Agilent Technologies has a
series of elastomeric probes from
which you can choose. Agilent’s
state-of-the-art elastomeric
probing technology offers an
inexpensive, convenient, and
reliable solution for 0.5 mm
and 0.65 mm high-density
TQFP/CQFP/PQFP packages.
The elastomer material on the
probe makes contact between the
probe and the pins of a device.
Embedded on the surface of the
elastomer are redundant connections for each pin, which ensure a
reliable and rugged connection.
A locator tool, included with the
probe adapter, correctly aligns
the retainer to the device. A small
amount of adhesive on the bottom
of the retainer holds the retainer
firmly to the device. After the
adhesive is set, the locator tool
can be removed. The elastomeric
probe adapter then attaches to
the device, held in place by the
retainer and its knurled nut. Five
retainers, a locator tool, and
adhesive are included with each
elastomeric probe adapter.
Additional Accessories
Quarter flex adapters, shown in
Figure 3.2, are available to bring
the signals from the elastomeric
probe adapter to general-purpose
headers for easy connection to
logic analyzers, oscilloscopes,
or other test equipment. Four
1/4 flex adapters are required
to view all signals on a device.
Each 1/4 flex adapter provides
10
QFP Package Probing
Electrical characteristics for this
probing technology are listed in
Table 3.
Note: The Agilent logic analyzer
probes are connected to the
adapters shown in this section.
The target system impedance load
is increased slightly (see Table 3).
Fast transition times (< 2 - 3 ns)
may suffer some loss of signal
fidelity.
The probe adapters require a
minimal “keep out” area around
the device, as shown in the
dimension tables of Figures 3.3
and 3.4.
Electrical Characteristics Elastomeric Probe Adapter 1/4 Flex Adapter
Operating voltage <40 V (DC + peak AC) <40 V (DC + peak AC)
Operating current 0.5A (max) 0.5A (max)
Insulation resistance >100 MΩ >100 MΩ
Model Parameters
Pin-to-ground plane
capacitance (typical)
E5340A
3.0 pF first row
4.0 pF second row
6.0 pF third row
E5349A
2.5 pF first row
3.5 pF second row
5.0 pF third row
E5371A
2.5 pF first row
3.5 pF second row
5.0 pF third row
Pin-to-pin capacitance 0.5 pF 2 pF
Self inductance (typical)
E5340A
15 nH first row
25 nH second row
35 nH third row
E5349A
20 nH first row
30 nH second row
40 nH third row
E5371A
20 nH first row
30 nH second row
40 nH third row
Environmental Characteristics
Operating temperature 0°C to 50°C 0°C to 50°C
Maximum operating humidity 75% relative humidity 75% relative humidity
Table 3. Probe and flexible adapter electrical and environmental characteristics
11
QFP Package Probing
Adapter A B C D E F G H J K L M
144-Pin TQFP
(inches) 0.674 1.240 1.130 0.055 0.138 0.827 (min) 0.795 (max) 0.866±0.008 0.057 to 0.063 0.053 to 0.057 0.0197±0.0012 0.009±0.002
(millimeters) 17.13 31.50 28.70 1.40 3.50 21.00 (min) 20.20 (max) 22.00±0.20 1.450 to 1.60 1.350 to 1.45 0.500±0.03 0.220±0.05
160-Pin TQFP
(inches) 0.76 1.343 1.343 0 0.11 0.988 (min) 0.953 (max) 1.024±0.008 0.061 to 0.063 0.051 to 0.059 0.01965±0.001 0.0087 to 0.015
(millimeters) 19.2 34.11 34.11 0 2.79 25.09 (min) 24.20 (max) 26.00±0.20 1.550 to 1.61 1.3 to 1.5 0.50±0.03 0.220 to 0.38
176-Pin TQFP
(inches) 0.674 1.398 1.287 0.055 0.138 0.984 (min) 0.953 (max) 1.024±0.008 0.057 to 0.063 0.053 to 0.057 0.0197±0.0012 0.009±0.002
(millimeters) 17.13 35.50 32.70 1.40 3.50 25.00 (min) 24.20 (max) 26.00±0.20 1.450 to 1.60 1.350 to 1.45 0.50±0.03 0.220±0.05
Figure 3.3. Elastomeric probe and package dimensions for TQFP
A
E
Maximum height of components in this area
B
C
F
G
H
K
J
L
M
Adapter A B C E F G H J K L M
144-Pin PQFP/CQFP
(inches) 0.73 1.583 0.16 0.01 1.135 (min) 1.106 (max) 1.236 (max) 0.094 to 0.098 0.108 (max) .0256±0.0012 0.009±0.002
(millimeters) 18.5 40.21 4 0.3 28.85 (min) 28.10 (max) 31.40 (max) 2.40 to 2.50 2.75 (max) 0.65±.03 0.22±0.05
160-Pin PQFP/CQFP
(inches) 0.76 1.583 0.16 0.03 1.154 (min) 1.106 (max) 1.266 (max) 0.126 to 0.146 0.136 to 0.161 .0256±0.0012 0.009±0.002
(millimeters) 19.2 40.21 4 0.8 29.32 (min) 28.10 (max) 32.15 (max) 3.20 to 3.70 3.45 to 4.10 0.65±.03 0.22±0.05
208-Pin PQFP/CQFP
(inches) 0.76 1.583 0.16 0.03 1.136 (min) 1.110 (max) 1.197 to 1.213 0.126 to 0.142 0.136 to 0.161 0.0197±0.0012 0.009±0.002
(millimeters) 19.2 40.21 4 0.8 28.85 (min) 28.20 (max) 30.40 to 30.80 3.20 to 3.60 3.45 to 3.60 0.50±0.03 0.22±0.05
240-Pin PQFP/CQFP
(inches) 0.76 1.937 0.16 0.03 1.293 (min) 1.268 (max) 1.354 to 1.370 0.126 to 0.142 0.136 to 0.161 0.0197±0.0012 0.009±0.002
(millimeters) 19.2 49.20 4 0.8 32.85 (min) 32.20 (max) 34.40 to 34.80 3.20 to 3.60 3.45 to 3.60 0.50±0.03 0.22±0.05
Figure 3.4. Elastomeric probe and package dimensions for PQFP/CQFP
Maximum height of components in this area
A
B
C
D
E
F
G
H
K
J
L (non-accumulative)
M
12
General-Purpose Probing
For All Agilent Logic Analyzers with 40-pin Pod Connectors
E5383A 17-Channel Single-Ended
Flying Lead Probe
Ideal when only a few lines may
need to be probed or probe points
are distributed across a target.
The E5383A includes a set of 20
IC test clips and five ground leads.
Logic Analysis
General-Purpose Probes
General-purpose probing requires
connecting probe leads to
individual signal lines. This
method is most convenient for
a small to moderate number of
signals, very flexible, and can be
used in conjunction with other
probing methods.
Note: Any probed signal line
must be able to supply a minimum
of 600 mV to the probe with the
specified loading.
The Standard Probing System
The standard probing system
consists of IC clips, probe leads,
probe housing and probe cable.
Because it is passive, the standard probing system is smaller,
lighter, and much easier to use
than active probing systems. This
passive probing system is similar
to a probing system used on a
high frequency oscilloscope. It
consists of an isolation network
(as shown in Figure 4.1) at the
probe tip and a shielded resistive
transmission line. The advantages
of this system are:
• High input impedance. See
Figure 4.1.
• Signal ground at the probe tip
for high-speed signals.
• Inexpensive, removable probe
tip assemblies.
Probe Leads and Lead Sets
Probe leads are configured into
lead sets, which can probe 16
data channels with ground, one
clock channel, and a common
ground. A 17-channel probe
lead set (E5383A) is shown in
Figure 4.2, along with the replacement part numbers for individual
components in Figure 4.3.
Each probe lead is a 12-inch,
twisted-pair cable connected to
the probe cable at the probe housing (see Figure 4.3). The probe tip
includes a signal lead, a connector for a ground lead, and the
isolation network.
The signal and ground leads
can be connected directly to the
target system. This requires
installing 0.63 mm (0.025 in)
square pins, or round pins with
a diameter of between 0.66 mm
(0.026 in) and 0.84 mm (0.033 in)
directly on the board. An IC test
clip can also be used. The same
specifications apply for the pin
dimensions of the test clip.
(See Figure 4.6 for IC test clips
available from Agilent.)
Figure 4.1. Probe tip Isolation network and equivalent load
Equivalent Load
Tip Isolation Network
Figure 4.3. E5383A 17-channel probe lead set replacement parts
Common ground
lead (long)
(Agilent part number
5959-9335 contains
5 pod grounds)
Probe housing
Probe lead
(Agilent part number 5959-9333
contains 5 probe leads)
Each probe lead set contains:
1 clock probe lead
16 data line leads
RC network housing
Connector for
ground lead
Signal leads
Ground leads
(Agilent part number
5959-9334 contains
5 short ground leads)
Figure 4.2. E5383A 17-channel probe
lead set
SMD IC clip
(Agilent part number
5090-4833 contains 20 clips)
13
General-Purpose Probing
For All Agilent Logic Analyzers with 40-pin Pod Connectors
IC Clips
The surface-mount device IC clip
with twin hooks (part number
5090-4833, containing 20 IC clips)
is designed for fine surfacemounted component leads. The
twin hook 0.5 mm IC clip (part
number 10467-68701, containing
four 0.5 mm IC clips), is very useful for 0.5 mm pitch components.
See Figure 4.5.
The E2421A kit contains one
each: 8-pin, 14-pin, 16-pin, 20-pin,
24-pin, and 28-pin SOIC test clips.
See Figure 4.6.
The E2422A kit contains one
each: 20-pin, 28-pin, 44-pin,
52-pin, 66-pin, and 84-pin QUAD
IC test adapters. See Figure 4.6.
Grounding
There are three methods of
grounding the probe system.
First, the entire probe lead set
can be grounded through the
common ground. This requires
only one connection, but is not
recommended because it will
cause poor signal fidelity in
systems with fast transition
times. The recommended method
is to individually ground each
probe lead. This yields optimal
signal fidelity and is required for
signals with faster transition
times (< 4 - 5 ns).
For moderate rise times (greater
than 2 ns), it may be acceptable
to ground every other (or every
fourth) ground connection to
the target.
Figure 4.4. Connecting IC clips and ground leads to probes
Figure 4.5. SMD IC clip and 0.5 mm IC clip
Signal leads
SMT IC clip
RC network housing
Figure 4.6. Typical IC test clips available in E2421A SOIC kit (left) and
E2422A QUAD kit (right)
5090-4833
10467-68701
Probe ground leads
14
General-Purpose Probing
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Signal Line Loading
Any probed signal line must be
able to supply a minimum of
600 mV (unless noted otherwise —
see probe of interest) to the probe
tip while the probe is connected
to the system. The maximum
input voltage of each probe is
±40 volts peak (unless noted otherwise — see probe of interest).
Probe Cables
The probe cable (see Figure 4.7
and Table 4) contains 16 signal
lines and two clk lines, two +5 volt
power lines, and ground lines
for each of the signal/clock and
power lines. All of these lines are
contained in a 4.5-foot cable. The
probe cable is included with the
logic analyzer. The cable grounds
are chassis (earth) grounds, not
“floating” grounds. The two
+5 volt power lines can be used
to power active probing systems.
Consult the specifications for the
individual logic analyzers or logic
analyzer cards for the maximum
allowable current through each
+5 volt power supply.
Caution: These +5 volt power
lines MUST NOT be connected to
the target’s power supply.
Caution: Be careful when using
straight wire probe leads, one
common ground, or RC networks
located far from the target.
These circumstances increase
the impact of analog effects
such as crosstalk and EMT
susceptibility, which contribute
to measurement errors.
Logic Analyzer 01660-61605 16555-61606 16710-61603 16715-61601
Stand Alone or Module
16550A x
16554A x
16555A/D x
16556A/D x
16557D x
16710A x
16711A x
16712A x
16715A x
16716A x
16717A x
16718A x
16719A x
16740 Series x
16750A/B x
16751A/B x
16752A/B x
16910A x
16911A x
1670 Series x
1680 Series x
1690 Series x
Table 4. Probe cables supplied with Agilent logic analyzers
Figure 4.7. Logic analyzer probe cable
15
Designing and Probing with Target Connections
Normal-Density, Medium-Performance Applications
In some cases, you may not have
a standard QFP package on the
target available for probing
access, or your device may be
available only in BGA packaging.
Agilent recommends that targets
with probing constraints have
connectors designed into the
prototype versions of the product
for effective hardware and software debug. The following should
be considered when designing
with connectors:
• Select the appropriate connector technology for your target
speed and target density.
• Carefully select all lines for
routing to the connectors that
may be needed for debug.
• Group the lines at each
connector for your probing
convenience. For example,
Agilent may have written an
inverse assembler for your
device that has a preconfigured signal order. Before
designing, refer to the documentation for this inverse
assembler for essential signal
lines and order.
• Keep the routing to connectors
as short as possible to minimize target impact and provide
accurate data.
• Examine the impact of probing
isolation networks designed
into the target vs. the isolation
network products offered by
Agilent Technologies.
An isolation network must be
located between the target and
the logic analyzer. It can be
located on the target board in
through-hole or SMT parts; or
it can be attached to the logic
analyzer cable with the probe
leads (the isolation network is
molded into the end of the probe);
or the Agilent 01650-63203 isolation adapter with self contained
isolation networks can be used.
Probe leads can be used with
connectors but are not the most
convenient method. Direct connection of the connectors with
the analyzer cable (isolation network parts on the target) or with
a probe or isolation adapter is the
faster, more convenient method.
16
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
High-Density, High-Performance
Probes
Agilent Pro Series Soft Touch
Connectorless Logic Analyzer Probes
Agilent Technologies has developed connectorless logic analyzer
probes based on soft touch
probing technology. Connectorless
logic analyzer probing removes
the connector that is traditionally
attached to the target board and
replaces it with an array of probe
pads. This reduces the probe load
on the target by eliminating the
loading associated with the
physical body of the connector.
Additionally, this streamlines the
design flow by eliminating the
need to assign a logic analyzer
connector to the bill of material
of your board, procuring those
connectors and then having them
loaded onto your board.
Agilent’s soft touch connectorless
probes use micro spring-pin technology to provide reliable contact
which is not dependent on the
planarity of the PC board or the
plating processes used to fabricate the board. No special cleaning processes are required when
using Agilent’s soft touch probes.
The new Agilent Technologies Pro
Series soft touch connectorless
probes offer a 30% smaller footprint than the original soft touch
probes and are the basis for the
industry standard connectorless
probing footprint.
The probes use a retention module
that ensures soft touch pin-to-PC
board pad alignment and holds
the probe in place while in use.
The Pro Series soft touch uses a
“top-side” mountable retention
module. The retention module is
mounted on the same side of the
board as the probing footprint so
there is no need to access the
back-side of the board. Because
there is no requirement for the
retention module pins to extend
beyond the back-side of the
board, the retention module is
compatible with virtually any
board thickness.
E5404A Pro Series Soft Touch
Connectorless Probe
The E5404A is a 34-channel
single-ended Pro Series soft touch
connectorless probe compatible
with all Agilent logic analyzers
that have a 40-pin pod connector.
It is capable of acquiring data at
the maximum rates of the logic
analyzer it is connected to.
Features
• No connector on the
target board
• Top-side mount retention
module
• Industry-standard
connectorless footprint
• 34 channels, single-ended
clock and data
• Extremely low, <0.7 pF,
equivalent load capacitance
• Capable of data rates >2.5 Gb/s
(maximum rate dependent on
analyzer used)
• 500 mV p-p minimum
signal amplitude
• Robust and reliable soft
touch technology
Unused clock inputs can be used
as data inputs.
The E5404A (used with logic analyzers with a 40-pin cable connector) uses the same footprint,
pinout, and retention module as
the E5406A Pro Series soft touch
connectorless probe (used with
logic analyzers with a 90-pin
cable connector).
A kit of five retention modules is
shipped with each Pro Series soft
touch probe. Additional kits can
be ordered using Agilent part
number E5403A.
Figure 5.1. “Top-side” mountable retention module.
Insert
Solder pins from
top of board
17
Figure 5.2. Agilent E5394A soft touch probe connection
Pads and mounting
holes on target system
Retention module
E5394A
single-ended
soft touch probe
Logic analyzer probe cables
(40-pin pod connector)
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
E5394A Soft Touch
Connectorless Probe
The E5394A is a 34-channel
single-ended soft touch connectorless probe compatible with all
Agilent logic analyzers that have
a 40-pin pod connector. It is
capable of acquiring data at the
maximum rates of the logic
analyzer it is connected to. The
probe has the following inputs:
• 32 single-ended data inputs
• two single-ended clock inputs
• < 0.7 pf input capacitance
• 500 mV p-p minimum signal
amplitude
Unused clock inputs can be used
as data inputs.
The E5394A (used with logic
analyzers with a 40-pin pod connector) uses the same footprint,
pinout and retention module as
the E5390A single-ended soft
touch connectorless probe (used
with logic analyzers with a 90-pin
pod connector).
A kit of five retention modules
is shipped with each soft touch
probe. Additional kits can be
ordered using Agilent part
number E5387-68701.
E5396A Half-Size Soft Touch
Connectorless Probe
The E5396A is a small space
saving probe compatible with all
Agilent logic analyzers that have
a 40-pin cable connector. It is a
17-channel, single-ended probe
capable of capturing data at
the maximum rates of the logic
analyzer it is connected to. The
probe has the following inputs:
• 16 single-ended data inputs
• one single-ended clock input
• <0.7 pf equivalent load
capacitance
• 500 mV p-p minimum signal
amplitude
The unused clock input can be
used as a data input.
The E5396A (used with logic
analyzers with a 40-pin cable connector) uses the same footprint,
pinout, and retention module as
the E5398A single-ended soft
touch connectorless probe (used
with logic analyzers with a 90-pin
cable connector).
More information about soft
touch connectorless probes
is available on the web at
www.agilent.com/find/softtouch.
18
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Probe Dimensions
The following figures show
dimensions, footprint, and pinout
information you will need to
design your target system board
for use with the Agilent Pro
Series soft touch probes.
Figure 5.3. E5404A probe dimensions
Figure 5.4. Pro Series soft touch retention module dimensions
Figure 5.5. Pro Series soft touch side-by-side dimensions
Probe and Retention Module
Dimensions
The following dimensions show
the Pro Series soft touch probe
attached to the retention module.
The retention module is mounted
on the PC board.
Top view E5404A
Side view E5404A
19
_
_
Top view E5394A
Side view E5394A
Top view E5396A
Side view E5396A
Figure 5.6. E5394A and E5396A soft touch probe dimensions
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
45.72 mm
_______
1.80 in.
60.96 mm
_______
2.40 in.
E5394A
E5394A
11.176 mm
________
0.440 in.
160.79 mm
_________
6.330 in.
8.76 mm
_______
0.345 in.
21.08 mm
________
0.830 in.
34.61 mm
________
1.363 in.
27.93 mm
________
1.100 in.
7.54 mm
_______
0.297 in.
5.31 mm
_______
0.209 in.
15.26
45.720 mm
45.87 mm
________
1.806 in.
64.48 mm
________
2.538 in.
6.63 mm
________
0.261 in.
_________
18.000 in.
8.76 mm
_______
0.345 in.
21.11 mm
________
0.831 in.
22.05 mm
________
0.868 in.
15.93 mm
________
0.627 in.
7.54 mm
_______
0.297 in.
5.31 mm
_______
0.209 in.
21.61 mm
_______
0.851 in.
20
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Retention Module Dimensions
The soft touch probes are
attached to the PC board using a
retention module which ensures
pin-to-pad alignment and holds
the probe in place. A board
thickness of up to 2.54 mm
(0.100 in.) is recommended.
Insert the retention module into
the board, noting the keying pin,
and solder the four alignment
pins to the backside of the board.
Probe and Retention Module
Dimensions
The following dimensions show
the soft touch probe attached
to the retention module. The
retention module is mounted on
the PC board.
_
Figure 5.7. Retention module dimensions
Figure 5.8. Side-by-side dimensions
17-channel retention module dimensions
34-channel retention module dimensions
17-channel probe and retention module dimensions
34-channel probe and retention module dimensions
4.83 mm
_______
0.190 in.
6.99 mm
_______
0.275 in.
4.83 mm
_______
0.190 in.
6.99 mm
_______
0.275 in.
0.64 mm
_______
0.025 in.
4.98 mm
_______
0.196 in.
17.98 mm
_______
0.708 in.
22.05 mm
_______
0.868 in.
4.98 mm
_______
0.196 in.
34.04 mm
________
1.340 in.
29.97 mm
________
1.180 in.
0.64 mm
________
0.025 in.
3.58 mm
_______
0.141 in.
_______
2.72 mm
_______
0.107 in.
2.72 mm
_______
0.107 in.
3.58 mm
0.141 in.
25.35 mm
________
0.998 in.
8.13 mm
_______
0.320 in.
Minimum
recommended
29.61 mm
________
1.166 in.
8.13 mm
_______
0.320 in.
Minimum
recommended
35.05 mm
________
1.380 in.
Minimum
recommended
2.54 mm
_______
0.100 in.
23.06 mm
________
0.908 in.
Minimum
recommended
2.54 mm
______
0.100 in.
21
Designing and Probing with Target Connections
For All Agilent Logic Analyzers with 40-pin Pod Connectors
Figure 5.9. Pro Series soft touch footprint dimensions (see drawing notes).
Drawing notes:
Maintain a solder mask web between pads when
traces are routed between the pads on the same
layer. The solder mask may not encroach onto the
pads within the pad dimension shown.
VIAs not allowed on these pads.
VIA edges may be tangent to pad
edges as long as a solder mask
web between VIAs and pads is
maintained.
Surface finishes on pads should be HASL
immersion silver, or gold over nickel.
This footprint is compatible with retention module
Agilent part number E5405-68702.
This through hole is not used with the Agilent
retention module.
Plated through hole should not be tied to ground
plane for thermal relief.
Figure 5.10. Pad numbers for E5404/06A 34-channel
single-ended probes.
1
VIA
Pad
2
3
4
5
6
B1
B2
B3
B4
B5
B6
B7
B8
B9
B10
B11
B12
B13
B14
B15
B16
B17
B18
B19
B20
B21
B22
B23
B24
B25
B26
B27
GND
D2
D3
GND
D6
D7
GND
D8
D9
GND
D12
D13
GND
D0
D1
GND
D4
D5
GND
GND/NC
CK 2+
GND
D10
D11
GND
D14
D15
Logic
analyzer
odd pod
Logic
analyzer
even pod
D0
D1
GND
D4
D5
GND
CK 1+
GND/NC
GND
D10
D11
GND
D14
D15
GND
D2
D3
GND
D6
D7
GND
D8
D9
GND
D12
D13
GND
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
A13
A14
A15
A16
A17
A18
A19
A20
A21
A22
A23
A24
A25
A26
A27
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