Analog Devices ADXRS401 Datasheet

±75°/s Single Chip Yaw Rate

FEATURES

Complete rate gyroscope on a single chip Z-axis (yaw-rate) response High vibration rejection over wide frequency 2000 g powered shock survivability Self-test on digital command Temperature sensor output Precision voltage reference output Absolute rate output for precision applications 5 V single-supply operation Ultra small and light (< 0.15 cc, < 0.5 gram)

APPLICATIONS

GPS navigation systems Image stabilization Inertial measurement units Platform stabilization
FUNCTIONAL BLOCK DIAGRAM
+
5V
100nF 100nF
AVCC
ST1
ST2
5G
4G
SELF TEST
3A
RATE
SENSOR
2G 1F

GENERAL DESCRIPTION

The ADXRS401 is a functionally complete and low cost angular rate sensor (gyroscope), integrated with all of the required electronics on one chip. It is manufactured using Analog Devices’ surface-micromachining technique, the same high volume BIMOS process used for high reliability automotive airbag accelerometers. It is available in a 7 mm × 7 mm × 3 mm BGA surface-mount package.
The output signal, RATEOUT (1B, 2A), is a voltage proportional to angular rate about the axis normal to the top surface of the package (see Figure 2). A single external resistor can be used to lower the scale factor. An external capacitor is used to set the bandwidth. Other external capacitors are required for operation (see Figure 1).
A precision reference and a temperature output are also provided for compensation techniques. Two digital self-test inputs electromechanically excite the sensor to test proper operation of both sensors and the signal conditioning circuits.
AGND
CORIOLIS SIGNAL CHANNEL
π
DEMOD
RESONATOR LOOP
Gyro with Signal Conditioning
ADXRS401
C
OUT
SEN
SUMJ
1C
R
OUT
2
180k 1%
1B
RATEOUT
2A
CMID
1D
R
SEN
9k±35%≈9k±35%
S
1
CHARGE PUMP/REG.
CP1
PDD
PGND
100nF
4A 5A 7E 6G
CP2
22nF
ADXRS401
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
7F 6A 7D7C7B
Figure 1.
2.5V REF
PTAT
12V
CP4
CP3 CP5
1µF
22nF
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 Fax: 781.326.8703 © 2004 Analog Devices, Inc. All rights reserved.
www.analog.com
1E
3G
2.5V
TEMP
04992-001
ADXRS401
TABLE OF CONTENTS
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 4
Rate-Sensitive Axis ....................................................................... 4
Pin Configuration and Function Descriptions............................. 5
Typical Performance Characteristics............................................. 6
Theory of Operation ........................................................................ 8
Supply and Common Considerations ....................................... 8
Setting Bandwidth ........................................................................ 9
Increasing Measurement Range ................................................. 9
Temperature Output and Calibration........................................ 9
Use with a Supply-Ratiometric ADC....................................... 10
Null Adjust................................................................................... 10
Self-Test Function....................................................................... 10
Acceleration Sensitivity ............................................................. 10
Outline Dimensions ....................................................................... 12
Ordering Guide........................................................................... 12
REVISION HISTORY
7/04—Revision 0: Initial Version
Rev. 0 | Page 2 of 12
ADXRS401

SPECIFICATIONS

@TA = 25°C, Vs = 5 V, bandwidth = 80 Hz (C
Table 1.
Parameter Conditions Min Typ Max Unit
SENSITIVITY Top view clockwise rotation is positive output
Dynamic Range
1
Scale Factor
Nonlinearity Best fit straight line 0.1 % of FS
NULL
Initial Null 2.50 V Turn-On Time Power on to ± ½°/s of final 35 ms Linear Acceleration Effect Any axis 0.2 °/s/g
NOISE PERFORMANCE
Rate Noise @ 10 Hz bandwidth 3 mV (rms)
FREQUENCY RESPONSE
3 dB Bandwidth2 (User Selectable) 22 nF as C Sensor Resonant Frequency 14 kHz
SELF TEST
ST1 RATEOUT Response
3
ST2 RATEOUT Response3 ST2 pin from Logic 0 to 1 +800 mV Logic 1 Input Voltage Standard high logic level definition 3.3 V Logic 0 Input Voltage Standard low logic level definition 1.7 V Input Impedance To common 50
TEMPERATURE SENSOR
V
at 298K 2.50 V
OUT
Max Current Load on Pin Source to common 50 µA Scale Factor Proportional to absolute temperature 8.4 mV/K
OUTPUT DRIVE CAPABILITY
Output Voltage Swing I Capacitive Load Drive 1000 pF
2.5 V REFERENCE Voltage Value 2.5 V Load Drive to Ground Source 200 µA Load Regulation 0 < I
POWER SUPPLY
Operating Voltage Range 4.75 5.00 5.25 V Quiescent Supply Current 6.0 8.0 mA
TEMPERATURE RANGE
Operating Temperature Range
= 0.01 µF), angular rate = 0°/s, ± 1 g, unless otherwise noted.
OUT
Full-scale range, 40°C to +85°C
40°C to +85°C
(see Setting Bandwidth section) 40 Hz
OUT
ST1 pin from Logic 0 to 1
= ±100 µA 0.25 VS – 0.25 V
OUT
< 200 µA 5.0 mV/mA
OUT
±75 °/s
12.75 15 17.25 mV/°/s
mV
40
800
+85 °C
k
1
Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V
supplies.
2
Frequency at which response is 3 dB down from dc response with specified compensation capacitor value. Internal pole forming resistor is 180 k. See the S
Bandwidth
3
Self-test response varies with temperature. See the section for details. Self-Test Function
section.
etting
Rev. 0 | Page 3 of 12
ADXRS401
A

ABSOLUTE MAXIMUM RATINGS

Table 2.
Parameter Rating
Acceleration (Any Axis, Unpowered, 0.5 ms) 2000 g Acceleration (Any Axis, Powered, 0.5 ms) 2000 g +V
S
Output Short-Circuit Duration (Any Pin to Common)
Operating Temperature Range
Storage Temperature
0.3 V to +6.0 V
Indefinite
55°C to +125°C
65°C to +150°C

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
Stresses above those listed under the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Applications requiring more than 200 cycles to MIL-STD-883 Method 1010 Condition B (–55°C to +125°C) require underfill or other means to achieve this requirement.
Drops onto hard surfaces can cause shocks of greater than 2000 g and exceed the absolute maximum rating of the device. Care should be exercised in handling to avoid damage.

RATE-SENSITIVE AXIS

This Z-axis rate-sensing device is also called a yaw-rate sensing device. It produces a positive-going output voltage for clockwise rotation about the axis normal to the package top (clockwise when looking down at the package lid).
RATE
AXIS
LONGITUDINAL
AXIS
ABCDEFG
1
LATERAL AXIS
Figure 2. RATEOUT Signal Increases with Clockwise Rotation
VCC= 5V
7
1
GND
RATEOUT
2.5V
4.75V
RATE IN
0.25V
04992-002
Rev. 0 | Page 4 of 12
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