Analog Devices ADXRS150 B Datasheet

±150°/s Single Chip Yaw Rate

FEATURES

Complete rate gyroscope on a single chip
Z-axis (yaw rate) response
High vibration rejection over wide frequency

0.05°/s/√Hz noise
2000 g powered shock survivability
Self-test on digital command
Temperature sensor output
Precision voltage reference output
Absolute rate output for precision applications
5 V single-supply operation
Ultrasmall and light (< 0.15 cc, < 0.5 gram)

APPLICATIONS

GPS navigation systems
Vehicle stability control
Inertial measurement units
Guidance and control
Platform stabilization

Gyro with Signal Conditioning

ADXRS150

GENERAL DESCRIPTION

The ADXRS150 is a complete angular rate sensor (gyroscope)
that uses Analog Devices’ surface-micromachining process to
make a functionally complete and low cost angular rate sensor
integrated with all of the required electronics on one chip.

The manufacturing technique for this device is the same high
volume BIMOS process used for high reliability automotive
airbag accelerometers.

The output signal, RATEOUT (1B, 2A), is a voltage proportional
to the angular rate about the axis normal to the top surface of
the package (see Figure 2). A single external resistor can be used
to lower the scale factor. An external capacitor is used to set the
bandwidth. Other external capacitors are required for operation
(see Figure 22).

A precision reference and a temperature output are also pro­vided for compensation techniques. Two digital self-test inputs
electromechanically excite the sensor to test the operation of
both sensors and the signal conditioning circuits. The ADXRS150
is available in a 7 mm × 7 mm × 3 mm BGA surface-mount
package.

FUNCTIONAL BLOCK DIAGRAM

–

+

5V

ST1

5G

4G

ST2

ADXRS150

SELF
TEST

AVCC

3A

4A 5A 7E 6G

CP2

22nF

100nF

RATE

SENSOR

CHARGE PUMP/REG.

PDD

CP1

AGND

2G 1F

CORIOLIS SIGNAL CHANNEL

RESONATOR LOOP

100nF

100nF

π DEMOD

12V

7F 6A 7D7C7B

PGND CP4

CMID

R

≈

9k

Ω

1D

SEN1

±

35%

2.5V REF

CP3 CP5

22nF

R

SEN2

≈

9k

Ω

±

PTAT

Figure 1.

35%

1C

47nF

SUMJ

180k

C

OUT

R

OUT

Ω

1%

1B

RATEOUT

2A

1E

2.5V

3G

TEMP

Rev. B

Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] © 2004 Analog Devices, Inc. All rights reserved.

ADXRS150

TABLE OF CONTENTS

Specifications..................................................................................... 3

Increasing Measurement Range ............................................... 10

Absolute Maximum Ratings............................................................ 4

Rate Sensitive Axis........................................................................ 4

ESD Caution.................................................................................. 4

Pin Configurations and Function Descriptions ........................... 5

Typical Performance Characteristics .............................................6

Theory of Operation ........................................................................ 9

Supply and Common Considerations ....................................... 9

Setting Bandwidth ........................................................................ 9

REVISION HISTORY

3/04—Data Sheet Changed from Rev. A to Rev. B

Updated Format..................................................................Universal

Changes to Table 1 Conditions....................................................... 3

Added Evaluation Board to Ordering Guide.............................. 12

Temperature Output and Calibration...................................... 10

Using the ADXRS150 with a Supply-Ratiometric ADC ...... 10

Null Adjustment ......................................................................... 10

Self-Test Function ...................................................................... 10

Continuous Self-Test.................................................................. 10

Acceleration Sensitivity............................................................. 11

Outline Dimensions....................................................................... 12

Ordering Guide .......................................................................... 12

1/03—Data Sheet Changed from Rev. 0 to Rev. A

Edit to Figure 5.................................................................................. 5

Rev. B | Page 2 of 12

ADXRS150

SPECIFICATIONS

@TA = 25°C, VS = 5 V, bandwidth = 80 Hz (C

Table 1.

Parameter Conditions

SENSITIVITY Clockwise rotation is positive output

Dynamic Range2 Full-scale range over specifications range ±150 °/s
Initial @25°C 11.25 12.5 13.75 mV/°/s
Over Temperature3 V
Nonlinearity Best fit straight line 0.1 % of FS
Voltage Sensitivity VCC = 4.75 V to 5.25 V 0.7 %/V

NULL

Initial Null 2.50 V
Null Drift over Temperature3 Delta from 25°C ±300 mV
Turn-On Time Power on to ±½°/s of final 35 ms
Linear Acceleration Effect Any axis 0.2 °/s/g
Voltage Sensitivity VCC = 4.75 V to 5.25 V 1 °/s/V

NOISE PERFORMANCE

Rate Noise Density @25°C 0.05 °/s/√Hz

FREQUENCY RESPONSE

3 db Bandwidth4 (User Selectable) 22 nF as comp cap (see the Applications section) 40 Hz
Sensor Resonant Frequency 14 kHz

SELF TEST

ST1 RATEOUT Response5 ST1 pin from Logic 0 to 1, –40°C to +85°C –400 –660 –1000 mV
ST2 RATEOUT Response5 ST2 pin from Logic 0 to 1, –40°C to +85°C +400 +660 +1000 mV
Logic 1 Input Voltage Standard high logic level definition 3.3 V
Logic 0 Input Voltage Standard low logic level definition 1.7 V
Input Impedance To common 50 kΩ

TEMPERATURE SENSOR

V

at 298°K 2.50 V

OUT

Max Current Load on Pin Source to common 50 µA
Scale Factor Proportional to absolute temperature 8.4 mV/°K

OUTPUT DRIVE CAPABILITY

Output Voltage Swing I
Capacitive Load Drive 1000 pF

2.5 V REFERENCE
Voltage Value 2.45 2.5 2.55 V
Load Drive to Ground Source 200 µA
Load Regulation 0 < I
Power Supply Rejection 4.75 VS to 5.25 VS 1.0 mV/V
Temperature Drift3 Delta from 25°C 5.0 mV

POWER SUPPLY

Operating Voltage Range 4.75 5.00 5.25 V
Quiescent Supply Current 6.0 8.0 mA

TEMPERATURE RANGE

Specified Performance Grade A –40 +85 °C

= 0.01 µF), angular rate = 0°/s, ±1g, unless otherwise noted.

OUT

ADXRS150ABG

1

Min

Typ Max1

= 4.75 V to 5.25 V 11.25 13.75 mV/°/s

CC

= ±100 µA 0.25 VS – 0.25 V

OUT

< 200 µA 5.0 mV/mA

OUT

Unit

1

All min and max specifications are guaranteed. Typical specifications are not tested or guaranteed.

2

Dynamic range is the maximum full-scale measurement range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at

5 V supplies.

3

Specification refers to the maximum extent of this parameter as a worst-case value at T

4

Frequency at which response is 3 dB down from dc response with specified compensation capacitor value. Internal pole forming resistor is 180 kΩ. See the Setting

Bandwidth section.

5

Self-test response varies with temperature. See the Self-Test Function section for details.

Rev. B | Page 3 of 12

or T

MAX

.

MIN

ADXRS150

ABSOLUTE MAXIMUM RATINGS

Table 2.

Parameter Rating

Acceleration (Any Axis, Unpowered, 0.5 ms) 2000 g
Acceleration (Any Axis, Powered, 0.5 ms) 2000 g
+VS –0.3 V to +6.0 V
Output Short-Circuit Duration

(Any Pin to Common)

Indefininte

Operating Temperature Range –55°C to +125°C
Storage Temperature –65°C to +150°C

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress rat­ing only and functional operation of the device at these or any
other conditions above those indicated in the operational sec­tion of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

Applications requiring more than 200 cycles to MIL-STD-883
Method 1010 Condition B (–55°C to +125°C) require underfill
or other means to achieve this requirement.

RATE SENSITIVE AXIS

This is a Z-axis rate-sensing device that is also called a yaw rate
sensing device. It produces a positive going output voltage for
clockwise rotation about the axis normal to the package top, i.e.,
clockwise when looking down at the package lid.

LONGITUDINAL

AXIS

ABCDEFG

A1

LATERAL AXIS

Figure 2. RATEOUT Signal Increases with Clockwise Rotation

RATE

AXIS

1

VCC= 5V

7

GND

RATEOUT

4.75V

2.5V
RATE IN

0.25V

Drops onto hard surfaces can cause shocks of greater than
2000 g and exceed the absolute maximum rating of the device.
Care should be exercised in handling to avoid damage.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.

Rev. B | Page 4 of 12