ANALOG DEVICES ADATE304 Service Manual

200 MHz Dual Integrated DCL with Level

www.BDTIC.com/ADI

Setting DACs, Per Pin PMU, and Per Chip VHH

FEATURES

Driver

3-level driver with high-Z mode and built-in clamps Precision trimmed output resistance Low leakage mode (typically <10 nA) Voltage range: up to −2.0 V to +6.0 V

2.4 ns minimum pulse width, 2 V terminated

Comparator

Window and differential comparator 500 MHz input equivalent bandwidth

Load

±12 mA maximum current capability

Per pin PMU

Force voltage range: up to −2.0 V to +6.0 V 5 current ranges: 32 mA, 2 mA, 200 μA, 20 μA, 2 μA

Levels

14-bit DAC for DCL levels Typically < ±5 mV INL (calibrated) 16-bit DAC for PMU levels Typically < ±1.5 mV INL (calibrated) linearity in FV mode

HVOUT output buffer

0 V to 13.5 V output range 84-lead, 9 mm × 9 mm, CSP_BGA package 900 mW per channel with no load

APPLICATIONS

Automatic test equipment Semiconductor test systems Board test systems Instrumentation and characterization equipment

ADATE304

GENERAL DESCRIPTION

The ADATE304 is a complete, single-chip solution that performs the pin electronic functions of the driver, the comparator, and the active load (DCL), per pin PMU, and dc levels for ATE applications. The device also contains an HVOUT driver with a VHH buffer capable of generating up to 13.5 V.

The driver features three active states: data high mode, data low mode, and term mode, as well as an inhibit state. The inhibit state, in conjunction with the integrated dynamic clamp, facilitates the implementation of a high speed active termination. The ADATE304 supports two output voltage ranges: −2.0 V to +6.0 V and −1.25 V to +6.75 V by adjusting the positive and negative supply voltages.

Each channel of the ADATE304 features a high speed window comparator per pin for functional testing, as well as a per pin PMU with FV, or FI and MV, or MI functions. All necessary dc levels for DCL functions are generated by on-chip 14-bit DACs. The per pin PMU features an on-chip 16-bit DAC for high accuracy and contains integrated range resistors to minimize external component counts.

The ADATE304 uses a serial bus to program all functional blocks and has an on-board temperature sensor for monitoring the device temperature.

Rev. 0

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

ADATE304

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REVISION HISTORY

10/08—Revision 0: Initial Version

Rev. 0 | Page 2 of 52

ADATE304

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FUNCTIONAL BLOCK DIAGRAM

DAC16_MON

MEASOUT01

PMUS_CH0

DATA0P

DATA0N

RCV0P

RCV0N

COMP_VTT 0

COMP_QH0P

COMP_Q H0N

COMP_QL0P

COMP_QL0N

MUX

*

100

CH1

16-BIT DAC

*

MUX

50

CH1

VH VT VL

PMU_FLAG

DRV

*

VHH

*

G

PMU

VCLAMPH

MUX

VCLAMPL

VCLAMPH VCLAMPL

R

(TRIMMED)

WINDOW

DIFF.

C

OUT

C

SENSE

OVD

FORCE

OVD_CH0

DUT0

*

OTHER CHANNEL DUT1

HVOUT

VOH

VOL

SDIN

RST

SCLK

CS

SDOUT

*

SPI

*

ONE PER DEVICE.

IOL

VCOM

14-BIT DAC

IOH

ADATE304

TEMPERATURE

SENSOR

*

TEMPSENSE

07279-001

Figure 1. One of Two Channels

Rev. 0 | Page 3 of 52

ADATE304

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SPECIFICATIONS

Characterization and production tests performed using Power Supply Range 1 (see Table 37). VDD = +10.75 V, VCC = +3.3 V, VSS = −5.00 V,

= +16.75 V, V

V

PLUS

values are at T

= 55°C, where TJ corresponds to the internal temperature sensor and the temperature coefficients are measured at TJ =

J

55°C ± 20°C, unless otherwise noted. Typical values are based on design, simulation analyses, and/or limited bench evaluations. Typical values are not tested or guaranteed. Test levels are specified in the Explanation of Test Levels section.

TOTAL FUNCTION

Table 1.

Parameter Symbol Min Typ Max Unit

TOTAL FUNCTION

Output Leakage Current

PE Disable Range E −20.0 +5.3 +20.0 nA P −1.25 V < V

PE Disable Range A to Range D 5.3 nA CT −1.25 V < V

High-Z Mode −400 +5.4 +400 nA P −1.25 V < V

Output Capacitance 4 pF S VTERM mode operation DUT Pin Range −1.25 +6.0 V D

POWER SUPPLIES

Total Supply Range, V VPLUS Supply V Positive Supply VDD 10.25 10.75 11.25 V D Defines PSRR conditions Negative Supply VSS −5.25 −5.00 −4.75 V D Defines PSRR conditions Logic Supply VCC 3.1 3.3 3.5 V D Defines PSRR conditions Comparator Termination V V

Supply Current I

PLUS

4.0 12.7 16.0 mA P HVOUT enabled, RCV active, no load, VHH = 12 V Logic Supply Current ICC 1.0 2.7 4.0 mA P Quiescent (SPI is static) Comparator Termination Current I Positive Supply Current IDD 72 90.5 97 mA P Load power down (IOH = IOL = 0 mA) Negative Supply Current ISS 100 116 126 mA P Load power down (IOH = IOL = 0 mA) Total Power Dissipation 1.0 1.6 1.82 W P Load power down (IOH = IOL = 0 mA) Positive Supply Current IDD 102 120 152 mA P Load active off (IOH = IOL = 12 mA) Negative Supply Current ISS 130 146 181 mA P Load active off (IOH = IOL = 12 mA) Total Power Dissipation 1.8 2.2 2.5 W P Load active off (IOH = IOL = 12 mA)

TEMPERATURE MONITORS

Temperature Sensor Gain 10 mV/K CT Temperature Sensor Accuracy Without

Calibration over 25°C to 100°C

VREF INPUT

Reference Input Voltage Range for

DACs (VREF Pin)

Input Bias Current 0.1 100 μA P Tested with 5 V applied

= +3.3 V, V

COMP_VTT

to VSS 22.5 23.25 V D Defines PSRR conditions

PLUS

= +5.0 V, V

REF

16.25 16.75 17.25 V D Defines PSRR conditions

PLUS

3.3 5.0 V D

COMP_VTT

−1.0 +1.3 +3.0 mA P HVOUT disabled

PLUS

10.0 17 26.0 mA P

COMP_VTT

6 °C CT Temperature voltage available on Pin A1 at all

4.95 5 5.05 V D Referenced to V

= 0.0 V. All default test conditions are as defined in Table 38. All specified

REF_GND

Test Level Test Conditions/Comments

via SPI; PMU Range E, VCH = 7.0 V, VCL = −2.5 V

SPI; PMU Range A, PMU Range B, PMU Range C, and PMU Range D, VCH = +7.0 V, VCL = −2.5 V

enabled via SPI; RCV active, VCH = +7.0 V, VCL =

−2.5 V

times and on Pin K1 (MEASOUT01/TEMPSENSE) when selected (see

DUTx

< +6.0 V; PMU and PE disabled

< +6.0 V; PMU and PE disabled via

< +6.0 V; PMU disabled and PE

Tab le 24 and Tabl e 36 )

; not referenced to V

REF_GND

DUTGND

Rev. 0 | Page 4 of 52

ADATE304

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DRIVER

VH − VL ≥ 200 mV (to meet dc and ac specifications).

Table 2.

Parameter Min Typ Max Unit

DC SPECIFICATIONS

High Speed Differential Logic Input

Characteristics (DATAxx, RCVxx) Input Termination Resistance 92 100 108 Ω P

Input Voltage Differential 0.2 1.0 V PF Common-Mode Voltage 0.85 2.35 V PF

0.85 3.5 V D Input Bias Current −20.0 +2.2 +20.0 A P Each pin tested at 2.85 V and 0.35 V while the other high speed

Pin Output Characteristics

Output High Range, VH −1.15 +6.75 V D Output Low Range, VL −1.25 +6.65 V D Output Term Range, VT −1.25 +6.75 V D Functional Amplitude (VH − VL) 0.0 8.0 V D Amplitude can be programmed to VH = VL, accuracy specifica-

DC Output Current Limit Source 75 100 120 mA P Driver high, VH = 6.75 V, short DUTx pin to −1.25 V, measure

DC Output Current Limit Sink −120 −100 −75 mA P Driver low, VL = −1.25 V, short DUTx pin to +6.75 V, measure

Output Resistance, ±50 mA 45.0 47.0 49.0 Ω P Source: driver high, VH = +3.0 V, I

ABSOLUTE ACCURACY VH tests done with VL = −2.5 V and VT= −2.5 V;

VH, VL, VT Uncalibrated Accuracy −250 ±75 +250 mV P Error measured at calibration points of 0 V and 5 V

VH, VL, VT Offset Tempco ±450 V/°C CT Measured at calibration points

VH, VL, VT DNL ±1 mV CT After two-point gain/offset calibration

VH, VL, VT INL −10 ±2.5 +10 mV P After two-point gain/offset calibration; measured over driver

VH, VL, VT Resolution 0.6 +1 mV PF After two-point gain/offset calibration; range/number of DAC

DUTGND Voltage Accuracy −7 ±1.3 +7 mV P Over ±0.1 V range; measured at endpoints of VH, VL, and VT

VH, VL, VT Crosstalk ±2 mV CT

Overall Voltage Accuracy ±10 mV CT Sum of INL, crosstalk, DUTGND, and tempco over ±5°C, after

VH, VL, VT DC PSRR ±15 mV/V CT Measured at calibration points

AC SPECIFICATIONS

Rise/Fall Times Toggle DATAxx

0.2 V Programmed Swing 950 ps CB VH = 0.2 V, VL = 0.0 V, terminated; 20% to 80%

1.0 V Programmed Swing 850 ps CB VH = 1.0 V, VL = 0.0 V, terminated; 20% to 80%

2.0 V Programmed Swing 850 1150 1350 ps CB VH = 3.0 V, VL = 0.0 V, terminated; 20% to 80%

3.0 V Programmed Swing 1500 ps P/CB VH = 3.0 V, VL = 0.0 V, terminated; 20% to 80%

3.0 V Programmed Swing 2000 ps CB VH = 3.0 V, VL = 0.0 V, unterminated; 10% to 90%

5.0 V Programmed Swing 3100 ps CB VH = 5.0V, VL = 0.0 V, unterminated; 10% to 90% Rise-to-Fall Matching 40 ps CB VH = 3.0 V, VL = 0.0 V, terminated; rise-to-fall within one channel

Test Level

Test Conditions/Comments

Push 6 mA into xP pins voltage from xP to xN

pin remains open

tions apply when VH − VL ≥ 200 mV

current

sink: driver low, VL = 0.0 V, I

VL tests done with VH = +7.5 V and VT = +7.5 V; VT tests done with VL = −2.5 V and VH = +7.5 V; unless otherwise specified

output ranges

bits as measured at calibration points of 0 V and 5 V

functional range VL = −1.25 V: VH = −1.15 V

VH = +6.75 V: VL = −1.25 V VT = +1.25 V: VL = −1.25 V dc crosstalk on VL, VH, VT output level when other driver DACs

are varied

gain/offset calibration

1

, force 1.3 V on xN pins1; measure

1

, calculate resistance (∆V/∆I)

= +1 mA and +50 mA;

DUTx

= −1 mA and −50 mA; ∆V

DUTx

→ +6.75 V, VT = −1.25 V → +6.75 V; → +6.65 V, VT = −1.25 V → +6.75 V;

→ +6.65 V, VH = −1.15 V → +6.75 V;

DUT

/∆I

DUT

Rev. 0 | Page 5 of 52

ADATE304

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Parameter Min Typ Max Unit

Minimum Pulse Width Toggle DATAxx

1.0 V Programmed Swing 1.7 ns CB VH = 1.0 V, VL = 0.0 V, terminated; timing error ± 75 ps

1.7 ns CB VH = 1.0 V, VL = 0.0 V, terminated; less than 10% amplitude

2.0 V Programmed Swing 2.0 ns CB VH = 2.0 V, VL = 0.0 V, terminated; timing error ± 75 ps

2.2 ns CB VH = 2.0 V, VL = 0.0 V, terminated; less than 10% amplitude

3.0 V Programmed Swing 2.7 ns CB VH = 3.0 V, VL = 0.0 V, terminated; timing error ± 75 ps

2.7 ns CB VH = 3.0 V, VL = 0.0 V, terminated; less than 10% amplitude

Maximum Toggle Rate

2.0 V Programmed Swing 200 MHz CB VH = 2.0 V, VH = 0.0 V, terminated, 10% amplitude degradation

Dynamic Performance, Drive

(VH to VL and VL to VH) Propagation Delay Time 3.0 ns CB VH = 2.0 V, VL = 0.0 V, terminated Propagation Delay Tempco 3.0 ps/°C CT VH = 2.0 V, VL = 0.0 V, terminated Delay Matching VH = 2.0 V, VL = 0.0 V, terminated

Edge to Edge 80 ps CB Rising vs. falling

Channel to Channel 30 ps CB Rising vs. rising, falling vs. falling Delay Change vs. Duty Cycle 30 ps CB VH = 3.0 V, VL = 0.0 V, terminated; 5% to 95% duty cycle; 1 MHz Overshoot and Undershoot 30 mV CB VH = 3.0 V, VL = 0.0 V, terminated Settling Time (VH to VL) Toggle DATAxx

To Within 3% of Final Value 4 ns CB VH = 3.0 V, VL = 0.0 V, terminated To Within 1% of Final Value 25 ns CB VH = 3.0 V, VL = 0.0 V, terminated

Dynamic Performance, VT

(VH or VL to VT and VT to VH or VL)

Propagation Delay Time 3.7 ns CB VH = 3.0 V, VT = 1.5 V, VL = 0.0 V, terminated Delay Matching, Edge to Edge 150 ps CB VH = 3.0 V, VT = 1.5 V, VL = 0.0 V, terminated; rising vs. falling Propagation Delay Tempco 4.0 ps/°C CT VH = 3.0 V, VT = 1.5 V, VL = 0.0 V, terminated

Transition Time, Active to VT

and VT to Active

Dynamic Performance, Inhibit

(VH or VL to/from Inhibit) Propagation Delay Time VH = +1.0 V, VL = −1.0 V, terminated

Active to Inhibit 4.5 ns CB

Inhibit to Active 7.9 ns CB Transition Time VH =+1.0 V, VL = −1.0 V, terminated; 20% to 80%

Active to Inhibit 2.9 ns CB

Inhibit to Active 0.65 ns CB I/O Spike 190 mV CB VH = 0.0 V, VL = 0.0 V, terminated

1

The xP pins include DATA0P, DATA1P, RCV0P, and RCV1P; the xN pins include DATA0N, DATA1N, RCV0N, and RCV1N. For example, push 6 mA into the DATA0P pin,

force 1.3 V into DATA0N, and measure the voltage from DATA0P to DATA0N.

Toggle DATAxx

Toggle RCVxx

1.0 ns CB VH = 3.0 V, VT = 1.5 V, VL = 0.0 V, terminated; 20% to 80%

Toggle RCVxx

Test Level Test Conditions/Comments

degradation

Rev. 0 | Page 6 of 52

ADATE304

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REFLECTION CLAMP

Clamp accuracy specifications apply when VCH > VCL.

Table 3.

Parameter Min Typ Max Unit

VCH

Range −1.0 +6.75 V D

Uncalibrated Accuracy −200 ±50 +200 mV P Driver high-Z, sinking 1 mA; VCH error measured at the

Resolution 0.6 0.75 mV PF Driver high-Z, sinking 1 mA; after two-point gain/offset

DNL ±1 mV CT Driver high-Z, sinking 1 mA; after two-point gain/offset

INL −40 ±2 +40 mV P Driver high-Z, sinking 1 mA; after two-point gain/offset

Tempco −0.3 mV/°C CT Measured at calibration points

VCL

Range −1.25 +5.75 V D

Uncalibrated Accuracy −200 ±50 +200 mV P Driver high-Z, sourcing 1 mA; VCL error measured at the

Resolution 0.6 0.75 mV PF Driver high-Z, sourcing 1 mA; after two-point gain/offset

DNL ±1 mV CT Driver high-Z, sourcing 1 mA; after two-point gain/offset

INL −40 ±2 +40 mV P Driver high-Z, sourcing 1 mA; after two-point gain/offset

Tempco 0.5 mV/°C CT Measured at calibration points

DC CLAMP CURRENT LIMIT

VCH −120 −85 −60 mA P Driver high-Z, VCH = 0 V, VCL = −1.0 V, V

VCL 60 85 120 mA P Driver high-Z, VCH = 6.75 V, VCL = 5.0 V, V

DUTGND VOLTAGE ACCURACY −7 ±1 +7 mV P Over ±0.1 V range; measured at the endpoints of VCH

Test Level

Test Conditions/Comments

calibration points of 0.0 V and 5.0 V

calibration; range/number of DAC bits as measured at the calibration points of 0.0 V and 5.0 V

calibration

calibration; measured over VCH range of −1.0 V to +6.75 V

calibration points of 0.0 V and 5.0 V

calibration; range/number of DAC bits as measured at the calibration points of 0.0 V and 5.0 V

calibration

calibration; measured over VCL range of −1.0 V to +5.75 V

= +5 V

DUTx

= 0.0 V

DUTx

and VCL functional range

NORMAL WINDOW COMPARATOR

VOH tests done with VOL = −1.25 V; VOL tests done with VOH = 6.0 V, unless other wise specified.

Table 4.

Parameter Min Typ Max Unit

DC SPECIFICATIONS

Input Voltage Range −1.25 +6.75 V D

Differential Voltage Range ±0.1 ±8.0 V D

Comparator Input Offset Voltage

Accuracy, Uncalibrated

Comparator Threshold Resolution 0.6 1 mV PF After two-point gain/offset calibration;

Comparator Threshold DNL ±1 mV CT After two-point gain/offset calibration

Comparator Threshold INL −7 ±1.3 +7 mV P After two-point gain/offset calibration;

Comparator Input Offset Voltage

Tempco

DUTGND Voltage Accuracy −7 ±0.5 +7 mV P Over ±0.1 V range; measured at endpoints

−150 ±30 +150 mV P Offset measured at the calibration points

±100 µV/°C CT Measured at calibration points

Rev. 0 | Page 7 of 52

Test Level Test Conditions/Comments

of 0.0 V and 5.0 V

range/number of DAC bits as measured at the calibration points of 0 V and 5 V

measured over VOH, VOL range of −1.25 V to +6.75 V

of VOH and VOL functional range

ADATE304

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Parameter Min Typ Max Unit

Comparator Uncertainty Range 6.0 mV CB V

DC Hysteresis 0.5 mV CB V DC PSRR ±5 mV/V CT Measured at calibration points Digital Output Characteristics

Internal Pull-Up Resistance to

40 50 60 Ω P Pull 1 mA and 10 mA from Logic 1 leg and

Comparator, COMP_VTT Pin

V

Range 3.3 5.0 V D

COMP_VTT

Common-Mode Voltage V V

− 2.075 V

COMP_VTT

− 1.88 V CT Measured with 100 Ω differential termination

COMP_VTT

− 1.675 V P Measured with no external termination

COMP_VTT

Differential Voltage 250 mV CT Measured with 100 Ω differential termination 400 500 600 mV P Measured with no external termination Rise/Fall Time, 20% to 80% 450 ps CB Measured with each comparator leg

AC SPECIFICATIONS Input transition time = 800 ps, 10% to 90%;

Propagation Delay, Input to

1.75 ns CB V

Output

Propagation Delay Tempco 5 ps/°C CT V

Propagation Delay Matching V

High Transition to Low

200 ps CB

Transition High to Low Comparator 50 ps CB

Propagation Delay Change (with

Respect To)

Slew Rate, 800 ps, 1 ns, 1.2 ns,

50 ps CB V

and 2.2 ns (10% to 90%)

Overdrive, 250 mV and 1.0 V 75 ps CB For 250 mV: V

Pulse Width, Sweep 1.6 ns to

75 ps CB V

10 ns

Duty Cycle, 5% to 95% 50 ps CB V

Minimum Pulse Width 2.0 ns CB V

Input Equivalent Bandwidth,

500 MHz CB V

Terminated

ERT High-Z Mode, 3 V, 20%

2.5 ns CB V

to 80%

Test Level Test Conditions/Comments

= 0 V, sweep comparator threshold to

DUTx

determine uncertainty region

= 0 V

DUTx

measure ∆V to calculate resistance; measured ∆V/9 mA; done for both comparator logic states

terminated 50 Ω to GND

measured with each comparator leg terminated 50 Ω to GND, unless otherwise specified

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; high-side measurement: VOH = +0.50 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.50 V

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; high-side measurement: VOH = +0.50 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.50 V

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; high-side measurement: VOH = +0.50 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.50 V

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; high-side measurement: VOH = +0.50 V, VOL = −1.25 V; low-side measurement: VOH = +6.75V, VOL = +0.50 V

= 0 V to 0.5 V swing; for

1.0 V: V

DUTx

= 0 V to 1.25 V swing; Driver

DUTx

VTERM mode, VT = 0.0 V; high-side measurement: VOH = +0.25 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.25 V

= 0 V to 1.0 V swing @ 32.0 MHz,

DUTx

Driver VTERM mode, VT = 0.0 V; high-side measurement: VOH = +0.5 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.5 V

= 0 V to 1.0 V swing @ 1.0 MHz, Driver

DUTx

VTERM mode, VT =0.0 V; high-side measurement: VOH = +0.50 V, VOL = −1.25 V; low-side measurement: VOH = +6.75 V, VOL = +0.50 V

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; less than 12% amplitude degradation measured by shmoo

= 0 V to 1.0 V swing, Driver VTERM

DUTx

mode, VT = 0.0 V; as measured by shmoo

= 0 V to 3.0 V swing, driver high-Z; as

DUTx

measured by shmoo; input transition time of ~2000 ps, 10% to 90%

Rev. 0 | Page 8 of 52

ADATE304

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DIFFERENTIAL COMPARATOR

VOH tests done with VOL = −1.1 V, VOL tests done with VOH = +1.1 V, unless otherwise specified.

Table 5.

Parameter Min Typ Max Unit

DC SPECIFICATIONS

Input Voltage Range −1.25 +4.5 V D

Operational Differential Voltage

±0.05 ±1.1 V D

Range Maximum Differential Voltage Range ±8 V D Comparator Input Offset Voltage

−150 ±35 +150 mV P/CT Offset measured at differential calibration points +1.0 V

Accuracy, Uncalibrated VOH, VOL Resolution 0.6 1 mV PF After two-point gain/offset calibration; range/number of

VOH, VOL DNL ±1 mV CT After two-point gain/offset calibration; common

VOH, VOL INL −15 ±2.0 +15 mV P After two-point gain/offset calibration; measured over VOH,

VOH, VOL Offset Voltage Tempco ±200 µV/°C CT Measured at calibration points Comparator Uncertainty Range 18 mV CB V

DC Hysteresis 0.5 mV CB V CMRR 0.15 1 mV/V P Offset measured at common-mode voltage points of

DC PSRR ±1.5 mV/V CT Measured at calibration points

AC SPECIFICATIONS Input transition time = 800 ps, 10% to 90%, measured

Propagation Delay, Input to Output 1.7 ns CB V

Propagation Delay Tempco 5 ps/°C CT V

Propagation Delay Matching V

High Transition to Low Transition 100 ps CB

High-to-Low Comparator 50 ps CB Propagation Delay Change (with

V

Respect To)

Slew Rate, 800 ps, 1 ns, 1.2 ns, and

60 ps CB V

2.2 ns (10% to 90%)

Overdrive, 250 mV and 750 mV 100 ps CB V

Pulse Width, Sweep from 1.6 ns to

75 ps CB V

10 ns

Duty Cycle, 5% to 95% 60 ps CB V

Rev. 0 | Page 9 of 52

Test Level

Test Conditions/Comments

and −1.0 V, with common mode = 0.0 V

DAC bits as measured at differential calibration points +1.0 V and −1.0 V, with common mode = 0.0 V

mode = 0.0 V

VOL range of −1.1 V to +1.1 V, common mode = 0.0 V

= 0 V, sweep comparator threshold to determine

DUTx

uncertainty region

= 0 V

DUTx

−1.5 V and +4.5 V, with differential voltage = 0.0 V

with each comparator leg terminated 50 Ω to GND

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

= 0 V, for 250 mV: V

DUT0

750 mV: V

= 0 V to 1.0 V swing, Driver VTERM mode,

DUT1

= 0 V to 0.5 V swing; for

DUT1

VT = 0.0 V; VOH = −0.25 V; repeat for other DUT channel with comparator threshold = +0.25 V

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing @ 32 MHz, Driver

DUT1

VTERM mode, VT = 0.0 V; high-side measurement: VOH =

0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing @ 1 MHz, Driver

DUT1

VTERM mode, VT = 0.0 V; high-side measurement: VOH =

0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; repeat for other DUT channel

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Parameter Min Typ Max Unit

Minimum Pulse Width 2.5 ns CB V

Input Equivalent Bandwidth,

400 MHz CB V

Terminated

ACTIVE LOAD

See the Tr u t h Tables section and Tab l e 2 9 for load control information.

Table 6.

Parameter Min Typ Max Unit

DC SPECIFICATIONS Load active on, RCV active, unless otherwise noted

Input Characteristics

VCOM Voltage Range −1.00 +6.50 V D V

Range −1.25 +6.75 V D

DUT

VCOM Accuracy, Uncalibrated −200 ±30 +200 mV P IOH = IOL = 6 mA, VCOM error measured at the calibration points

VCOM Resolution 0.6 1 mV PF IOH = IOL = 6 mA, after two-point gain/offset calibration;

VCOM DNL ±1 mV CT IOH = IOL = 6 mA, after two-point gain/offset calibration VCOM INL −7 ±2 +7 mV P IOH = IOL = 6 mA, after two-point gain/offset calibration;

DUTGND Voltage Accuracy −7 ±1 +7 mV P Over ±0.1 V range; measured at end points of VCOM functional

Output Characteristics

IOL Maximum Source Current 12 mA D

Uncalibrated Offset −600 ±100 +600 µA P IOH = 0 mA, VCOM = 1.5 V, V

Uncalibrated Gain −12 ±4 +12 % P IOH = 0 mA, VCOM = 1.5 V, V

Resolution 1.5 2 µA PF IOH = 0 mA, VCOM = 1.5 V, V

DNL ±3.0 µA CT IOH = 0 mA, VCOM = 1.5 V, V

INL −80 ±20 +80 µA P IOH = 0 mA, VCOM = 1.5 V, V

90% Commutation Voltage 0.25 V P IOH = IOL = 12 mA, VCOM = 2.0 V, measure IOL reference at

IOH

Maximum Sink Current 12 mA D

Uncalibrated Offset −600 ±100 +600 µA P IOL = 0 mA, VCOM = 1.5 V, V

Uncalibrated Gain −12 ±4 +12 % P IOL = 0 mA, VCOM = 1.5 V, V

Resolution 1.5 2 µA PF IOL = 0 mA, VCOM = 1.5 V, V

DNL ±3.0 µA CT IOL = 0 mA, VCOM = 1.5 V, V

Rev. 0 | Page 10 of 52

Test Level Test Conditions/Comments

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; less than 10% amplitude degradation measured by shmoo; repeat for other DUT channel

DUT0

= 0 V, V

= −0.5 V to +0.5 V swing, Driver VTERM

DUT1

mode, VT = 0.0 V; high-side measurement: VOH = 0.0 V, VOL = −1.1 V; low-side measurement: VOH = +1.1 V, VOL = 0.0 V; less than 22% amplitude degradation measured by shmoo; repeat for other DUT channel

Test Level Test Conditions/Comments

of 0.0 V and 5.0 V

range/number of DAC bits as measured at the calibration points of 0.0 V and 5.0 V

measured over VCOM range of −1.00 V to +6.50 V

range

the calibration points of 1 mA and 11 mA

DUTx

the calibration points of 1 mA and 11 mA

DUTx

offset calibration; range/number of DAC bits as measured at the

DUTx

calibration points of 1 mA and 11 mA

gain/offset calibration

DUTx

offset calibration; measured over IOL range of 0 mA to 12 mA

DUTx

= −1.0 V, measure IOL current at V

V

DUTx

of reference current

the calibration points of 1 mA and 11 mA

DUTx

the calibration points of 1 mA and 11 mA

DUTx

gain/offset calibration; range/number of DAC bits as measured at

DUTx

the calibration points of 1 mA and 11 mA

gain/offset calibration

DUTx

= 0.0 V, IOL offset calculated from

= 0.0 V, IOL gain calculated from

= 0.0 V, after two-point gain/

= 0.0 V, after two-point

= 0.0 V, after two-point gain/

= +1.75 V, ensure > 90%

DUTx

= 3.0 V, IOH offset calculated from

= 3.0 V, IOH gain calculated from

= 3.0 V, after two-point

ADATE304

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Parameter Min Typ Max Unit

INL −80 ±20 +80 µA P IOL = 0 mA, VCOM = 1.5 V, V

90% Commutation Voltage 0.25 V P IOH = IOL =12 mA, VCOM = 2.0 V, measure IOH reference at V

Output Current Tempco ±1.5 µA/°C CT Measured at calibration points

AC SPECIFICATIONS Load active on, unless otherwise noted

Dynamic Performance Propagation Delay, Load Active

On to Load Active Off;

50%,90%

Propagation Delay, Load Active

Off to Load Active On;

50%, 90%

Propagation Delay Matching 3.0 ns CB Toggle RCV, DUTx terminated 50 Ω to GND, IOH = IOL = 12 mA,

Load Spike 190 mV CB Toggle RCV, DUTx terminated 50 Ω to GND, IOH = IOL = 0 mA, VH

Settling Time to 90% 1.9 ns CB Toggle RCV, DUTx terminated 50 Ω to GND, IOH = IOL = 12 mA,

7.3 ns C

10.3 ns C

Test Level Test Conditions/Comments

= 3.0 V, after two-point gain/

offset calibration; measured over IOH range of 0 mA to 12 mA

= 5.0 V, measure IOH current at V reference current

Toggle RCV, DUTx terminated 50 Ω to GND, IOH = IOL = 12 mA,

B

VH = VL = 0 V, VCOM = +1.25 V for IOL and VCOM = −1.25 V for IOH; measured from 50% point of RCVxP − RCVxN to 90% point of final output, repeat for drive low and high

Toggle RCV, DUTx terminated 50 Ω to GND, IOH = IOL = 12 mA,

B

VH = VL = 0 V, VCOM = +1.25 V for IOL and VCOM = −1.25 V for IOH; measured from 50% point of RCVxP − RCVxN to 90% point of final output, repeat for drive low and high

VH = VL = 0 V, VCOM = +1.25 V for IOL and VCOM = −1.25 V for IOH; active on vs. active off, repeat for drive low and high

= VL = 0 V, VCOM = +1.25 V for IOL and VCOM = −1.25 V for IOH; repeat for drive low and high

VH = VL = 0 V, VCOM = +1.25 V for IOL and VCOM = −1.25 V for IOH; measured at 90% of final value

DUTx

= 2.25 V, ensure > 90% of

DUTx

PMU

FV is the force voltage, MV is the measure voltage, FI is the force current, MI is the measure current, FN is force nothing.

Table 7.

Parameter Min Typ Max Unit

FORCE VOLTAGE (FV)

Current Range A ±32 mA D Current Range B ±2 mA D Current Range C ±200 µA D Current Range D ±20 µA D Current Range E ±2 µA D Force Input Voltage Range at

Output for All Ranges Force Voltage Uncalibrated

Accuracy for Range C Force Voltage Uncalibrated

Accuracy for All Ranges Force Voltage Offset Tempco

for All Ranges Force Voltage Gain Tempco

for All Ranges Forced Voltage INL −7 ±2 +7 mV P PMU enabled, FV, Range C, PE disabled, after two-point gain/offset

Force Voltage Compliance vs.

Current Load

Range A ±4 mV CT

Range B to Range E ±1 mV CT

−1.25 +6.75 V D

−100 ±25 +100 mV P PMU enabled, FV, Range C, PE disabled, error measured at

±25 mV CT PMU enabled, FV, PE disabled, error measured at calibration

±25 µV/°C CT Measured at calibration points for each PMU current range

±10 ppm/°C CT Measured at calibration points for each PMU current range

PMU enabled, FV, PE disabled, force −1.25 V, measure voltage

Test Level Test Conditions/Comments

calibration points of 0.0 V and 5.0 V

points of 0.0 V and 5.0 V; repeat for each PMU current range

calibration; measured over output range of −1.25 V to +6.75 V

while PMU sinking zero and full-scale current; measure V; force 6.75 V, measure voltage while PMU sourcing zero and full-scale current; measure V; repeat for each PMU current range

Rev. 0 | Page 11 of 52

ADATE304

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Parameter Min Typ Max Unit

Current Limit, Source, and Sink

Range A 108 140 180 %FS P PMU enabled, FV, PE disabled; sink: force 2.5 V, short DUTx

Range B to Range E 120 145 180 %FS P PMU enabled, FV, PE disabled; sink: force 2.5 V, short DUTx to

DUTGND Voltage Accuracy −7 ±1 +7 mV P Over ±0.1 V range; measured at endpoints of FV functional

MEASURE CURRENT (MI) V

Measure Current, Pin DUTx

−1.5 +6.0 V D

Voltage Range for All Ranges

Measure Current Uncalibrated

Accuracy Range A ±500 µA CT PMU enabled, FIMI, Range A, PE disabled, error at calibration

Range B −400 ±3.0 +400 µA P PMU enabled, FIMI, Range B, PE disabled, error at calibration

Range C ± 2.00 µA CT PMU enabled, FIMI, PE disabled, error at calibration points of

Range D ±0.30 µA CT PMU enabled, FIMI, PE disabled, error at calibration points of

Range E ±0.08 µA CT PMU enabled, FIMI, PE disabled, error at calibration points of

Measure Current Offset Tempco

Range A ±2 µA/°C CT Measured at calibration points Range B ±25 nA/°C CT Measured at calibration points Range C ±5 nA/°C CT Measured at calibration points Range D and Range E ±1 nA/°C CT Measured at calibration points

Measure Current Gain Error,

Nominal Gain = 1 Range A ±2.5 % CT PMU enabled, FIMI, PE disabled, gain error from calibration

Range B −20 ±2 +20 % P PMU enabled, FIMI, Range B, PE disabled, gain error from

Range C to Range E ±4 % CT PMU enabled, FIMI, PE disabled, gain error from calibration

Measure Current Gain Tempco Measured at calibration points

Range A ±300 ppm/°C CT Range B to Range E ±50 ppm/°C CT

Measure Current INL

Range A ±0.05 %FSR CT PMU enabled, FIMI, Range A, PE disabled, after two-point

Range B −0.02 +0.02 %FSR P PMU enabled, FIM,I Range B, PE disabled, after two-point gain/

Range B to Range E ±0.01 %FSR CT PMU enabled, FIMI, PE disabled, after two-point gain/offset

FVMI DUT Pin Voltage Rejection −0.01 +0.01 %FSR/V P PMU enabled, FVMI, Range B, PE disabled, force −1 V and +5 V

DUTGND Voltage Accuracy ±2.5 mV CT Over ±0.1 V range; measured at endpoints of MI functional range

Test Level Test Conditions/Comments

to 6.0 V; source: force 2.5 V, short DUTx to −1.0 V; Range A FS = 32 mA, 108% FS = 35 mA, 180% FS = 58 mA

6.0 V; source: force 2.5 V, short DUTx to −1.0 V; repeat for each PMU current range; example: Range B FS = 2 mA, 120 % FS =

2.4 mA, 180% FS = 3.6 mA

range

externally forced to 0.0V, unless otherwise specified; ideal

DUTx

MEASOUT transfer functions: V

2.5 + V

DUTGND

I(V

MEASOUT01

) [A] = (V

points −25 mA and +25 mA, error = (I(V

points −1.6 mA and +1.6 mA, error = (I(V

±80% FS, error = (I(V

MEASOUT01)1

MEASOUT01

− I

) − I

points ±80% FS

calibration points ±1.6 mA

points ±80% FS

gain/offset calibration, measured over FSR output of −32 mA to +32 mA

offset calibration measured over FSR output of −2 mA to +2 mA

calibration; measured over FSR output

into load of 1 mA; measure I reported at MEASOUT01

MEASOUT01

)

DUTx

)

DUTx

)

DUTx

[V] = (I

− V

DUTGND

MEASOUT01

× 5/FSR) +

MEASOUT01

− 2.5) × FSR/5

) − I

)

DUTx

) − I

DUTx

)

Rev. 0 | Page 12 of 52

ADATE304

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Parameter Min Typ Max Unit

FORCE CURRENT (FI) V

Force Current, DUTx Pin Voltage

Range for All Ranges Force Current Uncalibrated

Accuracy

Range A −5.0 ±0.5 +5.0 mA P PMU enabled, FIMI, Range A, PE disabled, error at calibration

Range B −400 ±40 +400 µA P PMU enabled, FIMI, Range B, PE disabled, error at calibration

Range C −40 ±4 +40 µA P PMU enabled, FIMI, Range C, PE disabled, error at calibration

Range D −4 ±0.4 +4 µA P PMU enabled, FIMI, Range D, PE disabled, error at calibration

Range E −400 ±75 +400 nA P PMU enabled, FIMI, Range E, PE disabled, error at calibration

Force Current Offset Tempco

Range A ±1 µA/°C CT Measured at calibration points

Range B ±80 nA/°C CT Measured at calibration points

Range C to Range E ±4 nA/°C CT Measured at calibration points Forced Current Gain Error,

Nominal Gain = 1 Forced Current Gain Tempco Measured at calibration points

Range A −500 ppm/°C CT

Range B to Range E ±75 ppm/°C CT Force Current INL

Range A −0.3 ±0.05 +0.3 %FSR P PMU enabled, FIMI, Range A, PE disabled, after two-point

Range B to Range E −0.2 ±0.015 +0.2 %FSR P PMU enabled, FIMI, PE disabled, after two-point gain/offset

Force Current Compliance vs.

Voltage Load

Range A to Range D −0.6 ±0.06 +0.6 %FSR P

Range E −1.0 ±0.1 +1.0 %FSR P

MEASURE VOLTAGE

Measure Voltage Range −1.5 +6.0 V D Measure Voltage Uncalibrated

Accuracy Measure Voltage Offset Tempco ±10 µV/°C CT Measured at calibration points Measure Voltage Gain Error −0.2 ±0.01 +0.2 % P PMU enabled, FVMV, Range B, PE disabled, gain error from

Measure Voltage Gain Tempco 25 ppm/°C CT Measured at calibration points Measure Voltage INL −7 ±1 +7 mV P PMU enabled, FVMV, Range B, PE disabled, after two-point

Rejection of Measure V vs. I

−1.25 +6.75 V D

−20 ±4 +20 % P PMU enabled, FIMI, PE disabled, gain error from calibration

PMU enabled, FIMV, PE disabled; force positive full-scale

−25 ±2.0 +25 mV P PMU enabled, FVMV, Range B, PE disabled, error at calibration

−1.5 ±0.1 +1.5 mV P PMU enabled, FVMV, Range D, PE disabled, force 0 V into load

DUTx

Test Level Test Conditions/Comments

externally forced to 0.0V, unless otherwise specified, ideal

DUTx

force current transfer function: I

points of −25 mA and +25 mA

points of −1.6 mA and 1.6 mA

points of ±80% FS

gain/offset calibration; measured over FSR output of −32 mA to +32 mA

calibration; measured over FSR output

current driving −1.5 V and +6.0 V, measure I @ DUTx pin; force negative full-scale current driving −1.25 V and +6.75 V, measure I @ DUTx pin

points of 0 V and 5 V, error = (V

calibration points of 0 V and 5 V

gain/offset calibration; measured over output range of −1.25 V to +6.75 V

of −10 µA and +10 µA; measure V reported at MEASOUT01

= (PMUDAC − 2.5) × (FSR/5)

FORCE

− V

MEASOUT01

DUTx

)

Rev. 0 | Page 13 of 52

ADATE304

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Parameter Min Typ Max Unit

MEASOUT01 DC CHARACTERISTICS

MEASOUT01 Voltage Range −1.5 +6.0 V D DC Output Current 4 mA D MEASOUT01 Pin Output

Impedance

Output Leakage Current when

Tristated

Output Short-Circuit Current −25 +25 mA P PMU enabled, FVMV, PE disabled; source: PMU force +6.75 V,

VOLTAGE CLAMPS

Low Clamp Range (VCL) −1.25 +4.75 V D High Clamp Range (VCH) 0.75 6.75 V D Positive Clamp Voltage Droop −300 +10 +300 mV P PMU enabled, FIMI, Range A, PE disabled, PMU clamps

Negative Clamp Voltage Droop −300 −10 +300 mV P PMU enabled, FIMI, Range A, PE disabled, PMU clamps

Uncalibrated Accuracy −250 ±100 +250 mV P PMU enabled, FIMI, Range B, PE disabled, PMU clamps enabled,

INL −70 ±5 +70 mV P PMU enabled, FIMI, Range B, PE disabled, PMU clamps enabled,

DUTGND Voltage Accuracy ±1 mV CT Over ±0.1 V range; measured at endpoints of PMU clamp

SETTLING/SWITCHING TIMES SCAP = 330 pF, FFCAP = 220 pF

Voltage Force Settling Time to

0.1% of Final Value

Range A, 200 pF and

2000 pF Load

Range B, 200 pF and

2000 pF Load

Range C, 200 pF and

2000 pF Load

Range D, 200 pF and

2000 pF Load

Range E, 200 pF and

2000 pF Load

Voltage Force Settling Time to

1.0% of Final Value Range A, 200 pF and

2000 pF Load

Range B, 200 pF and

2000 pF Load

Range C, 200 pF and

2000 pF Load

Range D, 200 pF Load 45 µs CB Range D, 2000 pF Load 45 µs CB Range E, 200 pF Load 45 µs CB Range E, 2000 pF Load 225 µs CB

25 200 Ω P PMU enabled, FVMV, PE disabled; source resistance: PMU force

−1 +1 µA P Tested at −1.25 V and +6.75 V

PMU enabled, FV, PE disabled, program PMUDAC steps of

15 µs S

20 µs S

124 µs S

1015 µs S

3455 µs S

PMU enabled, FV, PE disabled, start with PMUDAC

14 µs CB

Test Level Test Conditions/Comments

+6.75 V and load with 0 mA and +4 mA; sink resistance: PMU force −1.25 V and load with 0 mA and −4 mA; resistance = V/I at MEASOUT01 pin

short MEASOUT01 to −1.25 V; sink: PMU force −1.25 V, short MEASOUT01 to +6.75 V

enabled, VCH = +5.0 V, VCL = −1.0 V, PMU force 2.0 mA and 32 mA into open; V seen at DUTx pin

enabled, VCH = +5.0 V, VCL = −1.0 V, PMU force −2.0 mA and

−32 mA into open; V seen at DUTx pin

PMU force ±1 mA into open; VCH errors at calibration points

1.0 V and 5.0 V; VCL errors at the calibration points 0.0 V and

4.0 V

PMU force ±1 mA into open; after two-point gain/offset calibration; measured over PMU clamp range

functional range

500 mV and 5.0 V; simulation of worst case, 2000 pF load, PMUDAC step of 5.0 V

programmed to 0.0 V, program PMUDAC to 500 mV

Rev. 0 | Page 14 of 52

ADATE304

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Parameter Min Typ Max Unit

Voltage Force Settling Time to

1.0% of Final Value

Range A, 200 pF and

2000 pF Load Range B, 200 pF Load 4.2 µs CB Range B, 2000 pF Load 4.2 µs CB Range C, 200 pF Load 5.8 µs CB Range C, 2000 pF Load 19 µs CB Range D, 200 pF Load 50 µs CB Range D, 2000 pF Load 210 µs CB Range E, 200 pF Load 360 µs CB Range E, 2000 pF Load 610 µs CB

Current Force Settling Time to

0.1% of Final Value Range A, 200 pF in Parallel

with 120 Ω Range B, 200 pF in Parallel

with 1.5 kΩ Range C, 200 pF in Parallel

with 15.0 kΩ Range D, 200 pF in Parallel

with 150 kΩ Range E, 200 pF in Parallel

with 1.5 MΩ

Current Force Settling Time to

1.0% of Final Value Range A, 200 pF in Parallel

with 120 Ω Range B, 200 pF in Parallel

with 1.5 kΩ Range C, 200 pF in Parallel

with 15.0 kΩ Range D, 200 pF in Parallel

with 150 kΩ Range E, 200 pF in Parallel

with 1.5 MΩ

INTERACTION AND CROSSTALK

Measure Voltage Channel-to-

Channel Crosstalk

Measure Current Channel-to-

Channel Crosstalk

PMU enabled, FV, PE disabled, start with PMUDAC

4.0 µs CB

PMU enabled, FI, PE disabled, start with PMUDAC

8.2 µs S

9.4 µs S

30 µs S

281 µs S

2668 µs S

PMU enabled, FI, PE disabled, start with PMUDAC

4.2 µs CB

4.3 µs CB

8.1 µs CB

205 µs CB

505 µs CB

±0.125 %FSR CT PMU enabled, FIMV, PE disabled, Range B, forcing 0 mA into

±0.01 %FSR CT PMU enabled, FVMI, PE disabled, Range E, forcing 0 V into

Test Level Test Conditions/Comments

programmed to 0.0 V, program PMUDAC to 5.0 V

programmed to 0 current, program PMUDAC to FS current

0 V load; other channel: Range A, forcing a step of 0 mA to 25 mA into 0 V load; report V of MEASOUT01 pin under test;

0.125% × 8.0 V = 10 mV

0 mA current load; other channel: Range E, forcing a step of 0 V to 5 V into 0 mA current load; report V of MEASOUT01 pin under test; 0.01% × 5.0 V = 0.5 mV

Rev. 0 | Page 15 of 52

ADATE304

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EXTERNAL SENSE (PMUS_CHx)

Table 8.

Parameter Min Typ Max Unit

EXTERNAL SENSE (PMUS_CHX)

Voltage Range −1.25 +6.75 V D Input Leakage Current −20 +20 nA P Tested at −1.25 V and +6.75 V

DUTGND INPUT

Table 9.

Parameter Min Typ Max Unit

DUTGND INPUT

Input Voltage Range, Referenced to GND −0.1 +0.1 V D Input Bias Current 1 100 A P Tested at −100 mV and +100 mV

SERIAL PERIPHERAL INTERFACE

Table 10.

Parameter Min Typ Max Unit

SERIAL PERIPHERAL INTERFACE

Serial Input Logic High 1.8 VCC V PF Serial Input Logic Low 0 0.7 V PF Input Bias Current −10 1 +10 A P Tested at 0.0 V and 3.3 V SCLK Clock Rate 50 MHz PF SCLK Pulse Width 9 ns CT SCLK Crosstalk on DUTx Pin 8 mV CB PE disabled, PMU FV enabled and forcing 0 V Serial Output Logic High VCC − 0.4 VCC V PF Sourcing 2 mA

Test Level

Test Level Test Conditions/Comments

Test Conditions/Comments

Test Level

Test Conditions/Comments

Serial Output Logic Low 0 0.8 V PF Sinking 2 mA Update Time 10 s D Maximum delay time required for the part to

Rev. 0 | Page 16 of 52

enter a stable state after a serial bus

ANALOG DEVICES ADATE304 Service Manual

FEATURES

APPLICATIONS

GENERAL DESCRIPTION

TABLE OF CONTENTS

REVISION HISTORY

FUNCTIONAL BLOCK DIAGRAM

SPECIFICATIONS

TOTAL FUNCTION

DRIVER

REFLECTION CLAMP

NORMAL WINDOW COMPARATOR

DIFFERENTIAL COMPARATOR

ACTIVE LOAD

EXTERNAL SENSE (PMUS_CHx)

DUTGND INPUT

SERIAL PERIPHERAL INTERFACE