ANALOG DEVICES ADATE209 Service Manual

www.BDTIC.com/ADI

4.0 Gbps Dual Driver

FEATURES

>4.0 Gbps (2 V swings) 120 ps rise time/fall time (2 V swings) <1.0 W for dual driver (<500 mW/channel)

−1 V to +3.5 V range Fast termination mode (VTx) Cable loss compensation

APPLICATIONS

Automatic test equipment Semiconductor test systems Board test systems Instrumentation and characterization equipment High speed memory testing (DDR2/DDR3/DDR4) HDMI testing

GENERAL DESCRIPTION

The ADATE209 is a dual pin driver designed for testing DDR2, DDR3, and DDR4. It can also be used for high speed SoC applications, such as testing PCI Express 1.0 and HDMI™. The device is a three-level driver capable of high fidelity swings from 200 mV to 4 V over a −1 V to +3.5 V range. It has rise/fall times (20% to 80%) under 120 ps for a 2 V programmed swing and 150 ps for

ADATE209

FUNCTIONAL BLOCK DIAGRAM

VL1

VT1

DA1

DB1

TERM1

DA2

DB2

TERM2

Figure 1.

a 3 V programmed swing, and is capable of supporting data rates of 4.4 Gbps and 3.2 Gbps, respectively.

The device is capable of high speed transitions into and out of termination mode. It also contains peaking/pre-emphasis circuitry.

The ADATE209 is available in an 8 mm × 8 mm, 49-ball CSP_BGA.

CLC1EN

VH2

VL2

CLC2EN

VT2

DROUT1

DROUT2

07277-001

Rev. 0

Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

ADATE209

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Features .............................................................................................. 1

Applications ....................................................................................... 1

Functional Block Diagram .............................................................. 1

General Description ......................................................................... 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 3

Electrical Characteristics ............................................................. 3

Absolute Maximum Ratings ............................................................ 6

Thermal Resistance ...................................................................... 6

Explanation of Test Levels ........................................................... 6

REVISION HISTORY

5/08—Revision 0: Initial Version

ESD Caution...................................................................................6

Pin Configuration and Function Descriptions ..............................7

Typical Performance Characteristics ..............................................9

Applications Information .............................................................. 14

Data Inputs .................................................................................. 14

Thermal Diode String ................................................................ 14

Cable Loss Compensation/Peaking Circuitry ........................ 14

Default Test Conditions ............................................................. 14

Outline Dimensions ....................................................................... 15

Ordering Guide .......................................................................... 15

Rev. 0 | Page 2 of 16

ADATE209

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SPECIFICATIONS

ELECTRICAL CHARACTERISTICS

VCC = 7.0 V, VEE = −4.5 V, GND = 0.0 V; all test conditions are as defined in Table 7, unless otherwise specified. All specified values are at

= 70°C, where TJ corresponds to the internal temperature sensor, unless otherwise noted. Temperature coefficients are measured at TJ =

70°C ± 20°C, unless otherwise noted. Typical values are based on design, simulation analyses, and/or limited bench evaluations. Typical values are not tested or guaranteed.

Table 1.

Te st

Parameter Min Typ Max Unit

TOTAL FUNCTION

DROUTx Pin Range −1.0 +3.5 V I

POWER SUPPLIES

Positive Supply, VCC 6.65 7.0 7.35 V I Defines PSRR conditions Negative Supply, VEE −4.73 −4.5 −4.28 V I Defines PSRR conditions Data and Termination, V Data and Termination, I

Positive Supply Current, ICC 50 76 100 mA II Negative Supply Current, IEE 60 80 110 mA II Total Power Dissipation 0.5 0.87 1.3 W II

0.97 W III

TEMPERATURE MONITORS

Temperature Sensor Gain −4.7 Temperature Sensor Offset 3.1 V III Voltage reading at 30°C

DRIVER DC SPECIFICATIONS

High Speed Differential Logic Input

Characteristics (DAx, DBx, TERMx) Input Termination Resistance 45 48 55 Ω II

Input Voltage Differential 0.25 0.8 V IV Common-Mode Voltage −1.0 +3.3 V IV Input Bias Current −10 +1.2 +10 μA II

Pin Output Characteristics

Output High Range, VHx −0.9 +3.5 V I Output Low Range, VLx −1.0 +3.4 V I Output Termination Range, VTx −1.0 +3.5 V I Output High Range, VHx −0.9 +4.0 V I VCC = 7.5 V, this range is not production tested Output Low Range, VLx −1.0 +3.9 V I VCC = 7.5 V, this range is not production tested Output Termination Range, VTx −1.0 +4.0 V I VCC = 7.5 V, this range is not production tested Functional Amplitude (VHx − VLx) 0.2 4.5 V I

DC Output Current-Limit Source 50 60 70 mA II

DAx

, V

DBx

, I

DBx

−1 +1.3 +3.3 V I

TERMx

, I

40 mA I

TERMx

mV/°C

Rev. 0 | Page 3 of 16

Level1 Test Conditions/Comments

Exceeding 40 mA through any input termination resistor may cause damage to the device or cause long-term reliability concerns

Quiescent; excludes current draw through data input termination resistors

VLx = 0.0 V, VHx = 2.0 V; driver toggling into open circuit; excludes current draw through data input termination resistors

III

9 mA pushed into DAxB/DBxB/TERMxB signal,

0.6 V forced on DAx/DBx/TERMx signal; DAxT, DBxT, TERMxT open; measure voltage from DAx/DBx/ TERMx signal to DAxB/DBxB/TERMxB signal, calculate resistance (ΔV/ΔI)

Each pin tested at −1.0 V and +3.3 V, while other high speed pins (DAxB, DBx, DBxB, TERMx, TERMxB) are left open, termination pins (DAxT, DBxT, TERMxT ) open

Amplitude can be programmed to VHx = VLx, accuracy specifications apply when VHx − VLx ≥ 200 mV

Driver high, VHx = 3.5 V, short DROUTx pin to

−1.0 V, then measure current

ADATE209

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Te st

Parameter Min Typ Max Unit

DC Output Current-Limit Sink −70 −60 −50 mA II

Output Resistance, ±30 mA 46.5 48.5 50.5 Ω II

Absolute Accuracy

VHx, VLx, VTx Offset −150 +20 +150 mV II Measured at 0.0 V, target: improve offset VHx, VLx, VTx Offset Temperature

Coefficient VHx, VLx, VTx Gain 0.97 1.02 1.03 %FSR II Relative to straight line from 0.0 V to 2.0 V VHx, VLx, VTx Linearity −15 ±2.4 +15 mV II

VLx, VHx, VTx Interaction 0.3 mV III

VHx, VLx, VTx DC PSRR −36 +24 +36 mV/V II

VHx, VLx, VTx Input Bias Current −10 +1 +10 μA II

DRIVER AC SPECIFICATIONS

Rise/Fall Times Toggle DAx inputs

0.2 V Programmed Swing 115 ps V VHx = 0.2 V, VLx = 0.0 V, terminated, 20% to 80%

0.5 V Programmed Swing 90 ps V VHx = 0.5 V, VLx = 0.0 V, terminated, 20% to 80%

1.0 V Programmed Swing 90 ps V VHx = 1.0 V, VLx = 0.0 V, terminated, 20% to 80%

2.0 V Programmed Swing 90 110 130 ps II/V VHx = 2.0 V, VLx = 0.0 V, terminated, 20% to 80%

3.0 V Programmed Swing 150 ps V VHx = 3.0 V, VLx = 0.0 V, terminated, 20% to 80%

4.0 V Programmed Swing 190 ps V VHx = 3.5 V, VLx = −0.5 V, terminated, 20% to 80% Rise-to-Fall Matching 10 ps V

Minimum Pulse Width Toggle both DAx and DBx inputs

0.2 V Programmed Swing 200 ps V

0.5 V Programmed Swing 180 ps V

1.0 V Programmed Swing 180 ps V

2.0 V Programmed Swing 200 ps V

3.0 V Programmed Swing 300 ps V

Maximum Toggle Rate 2.5 GHz V

2.2 GHz V

1.8 GHz V

270 μV/°C III Measured at calibration points, 0.0 V and 2.0 V

Level1 Test Conditions/Comments

Driver high, VHx = −1.0 V, short DROUTx pin to

3.5 V, then measure current Source: driver high, VHx = 3.0 V, I

9 mA; sink: driver low, VLx = 0.0 V, I

/ΔI

and −9 mA; ΔV VHx tests conducted with VLx = −1.0 V and

VTx = −1.0 V; VLx tests conducted with VHx =

3.5 V and VTx = 3.5 V; VTx tests conducted with VLx = −1.0 V and VHx = 3.5 V

After two-point gain/offset calibration, relative to straight line from 0.0 V to 2.0 V

VLx = −1.0 V, VHx swept from −0.9 V to +3.5 V, VTx swept from −1.0 V to 3.5 V, VHx = 3.5 V, VLx swept from −1.0 V to +3.4 V, VTx swept from −0.8 V to +3.5 V, VTx = 1.5 V, VLx swept from −1.0 V to +3.5 V, VHx swept from −1.0 V to +3.5 V

Change in output voltage as power supplies are moved by ±5%; measured at calibration points,

0.0 V and 2.0 V

VHx = 1.0 V, VLx = 0.0 V, terminated; rise to fall within one channel

VHx = 0.2 V, VLx = 0.0 V, terminated, timing error less than ±25 ps

VHx = 0.5 V, VLx = 0.0 V, terminated, timing error less than ±25 ps

VHx = 1.0 V, VLx = 0.0 V, terminated, timing error less than ±25 ps

VHx = 2.0 V, VLx = 0.0 V, terminated, timing error less than ±25 ps

VHx = 3.0 V, VLx = 0.0 V, terminated, timing error less than ±25 ps

VHx = 1.0 V, VLx = 0.0 V, terminated, 10% amplitude degradation

VHx = 2.0 V, VLx = 0.0 V, terminated, 10% amplitude degradation

VHx = 3.0 V, VLx = 0.0 V, terminated, 10% amplitude degradation

DROUTx

= 1 mA and

DUT

= −1 mA

DUT

Rev. 0 | Page 4 of 16

ADATE209

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Te st

Parameter Min Typ Max Unit

Dynamic Performance, Drive (VHx to VLx) Toggle DAx inputs

Propagation Delay Time 300 660 1400 ps II/V VHx = 2.0 V, VLx = 0.0 V, terminated Propagation Delay Temperature

Coefficient Delay Matching, Edge to Edge ±15 ps V VHx = 2.0 V, VLx = 0.0 V, terminated, rising vs. falling Delay Change vs. Duty Cycle ±10 ps V

Preshoot and Undershoot 10 mV V VHx = 2.0 V, VLx = 0.0 V, terminated

Settling Time (VHx to VLx) Toggle DAx Inputs

To Within 3% of Final Value 0.4 ns V VHx = 2.0 V, VLx = 0.0 V, terminated To Within 1% of Final Value 2 ns V VHx = 2.0 V, VLx = 0.0 V, terminated

Rise/Fall Times (VTx to/from VHx/VLx) Toggle DAx inputs

1.0 V Programmed Swing 110 ps V

2.0 V Programmed Swing 170 ps V

Dynamic Performance, V (VHx or VLx to/from VTx)

Propagation Delay Time 720 ns V VHx = 3.0 V, VTx = 1.5 V, VLx = 0.0 V, terminated

Cable Loss Compensation

Logic Control Inputs, CLCxEN 0 3.3 V I

Logic High

Logic Low

CLCxEN

Compensation Constants

Boost Time Constant

Boost Peaking Amplifier 18 % V

See the Explanation of Test Levels section.

TERM

0.7 ps/ºC III VHx = 2.0 V, VLx = 0.0 V, terminated

Toggle TERMx inputs

0.9 3.3 V IV 0 0.7 V IV

−10 ±1.2 +10 μA II VIN = 0.0 V and 3.3 V

275 ps V

Level1 Test Conditions/Comments

VHx = 2.0 V, VLx = 0.0 V, terminated, 5% to 95% duty cycle

VHx = 1.0 V, VTx = 0.5V, VLx = 0.0 V, terminated, 20% to 80%

VHx = 2.0 V, VTx = 1.0 V, VLx = 0.0 V, terminated, 20% to 80%

CLCxEN = 3.3 V, VHx = 1.0 V, VLx = 0.0 V, terminated

Rev. 0 | Page 5 of 16

+ 11 hidden pages

ANALOG DEVICES ADATE209 Service Manual

FEATURES

APPLICATIONS

GENERAL DESCRIPTION

FUNCTIONAL BLOCK DIAGRAM

TABLE OF CONTENTS

REVISION HISTORY

SPECIFICATIONS

ELECTRICAL CHARACTERISTICS