4.5 ns Propagation Delay
200 ps Maximum Propagation Delay Dispersion
Single +5 V or 65 V Supply Operation
Complementary Matched TTL Outputs
APPLICATIONS
High Speed Line Receivers
Peak Detectors
Window Comparators
High Speed Triggers
Ultrafast Pulse Width Discriminators
GENERAL DESCRIPTION
The AD9696 and AD9698 are ultrafast TTL-compatible voltage comparators able to achieve propagation delays previously
possible only in high performance ECL devices. The AD9696 is
a single comparator providing 4.5 ns propagation delay, 200 ps
maximum delay dispersion and 1.7 ns setup time. The AD9698
is a dual comparator with equally high performance; both devices are ideal for critical timing circuits in such applications as
ATE, communications receivers and test instruments.
TTL Comparators
AD9696/AD9698
Both devices allow the use of either a single +5 V supply or
±5 V supplies. The choice of supplies determines the common
mode input voltage range available: –2.2 V to +3.7 V for ±5 V
operation, +1.4 V to +3.7 V for single +5 V supply operation.
The differential input stage features high precision, with offset
voltages that are less than 2 mV and offset currents less than
1 µA. A latch enable input is provided to allow operation in ei-
ther sample-and-hold or track-and-hold applications.
The AD9696 and AD9698 are both available as commercial
temperature range devices operating from ambient temperatures
of 0°C to +70°C, and as extended temperature range devices for
ambient temperatures from –55°C to +125°C. Both versions are
available qualified to MIL-STD-883 class B.
Package options for the AD9696 include a 10-pin TO-100 metal
can, an 8-pin ceramic DIP, an 8-pin plastic DIP, and an 8-lead
small outline plastic package. The AD9698 is available in a
16-pin ceramic DIP, a 16-lead ceramic gullwing, a 16-pin plastic
DIP and a 16-lead small outline plastic package. Military qualified versions of the AD9696 come in the TO-100 can and
ceramic DIP; the dual AD9698 comes in ceramic DIP.
FUNCTIONAL BLOCK DIAGRAM
AD9696/AD9698 Architecture
LATCH
GAIN
LEVEL
SHIFT
OUTPUTINPUT
AD9698
NONINVERTING
INPUT
INVERTING
INPUT
#1
LATCH
ENABLE
Q OUTPUT
Q OUTPUT
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
Logic “1” Voltage ThresholdFullVI2.02.0V
Logic “0” Voltage ThresholdFullVI0.80.8V
Logic “1” CurrentFullVI1010µA
Logic “0” CurrentFullVI11µA
DIGITAL OUTPUTS
Logic “1” Voltage (Source 4 mA)FullVI2.73.52.73.5V
Logic “0” Voltage (Sink 10 mA)FullVI0.40.50.40.5V
SWITCHING PERFORMANCE
Propagation Delay (t
PD
5
)
Input to Output HIGHFullIV4.57.04.57.0ns
Input to Output LOWFullIV4.57.04.57.0ns
Latch Enable to Output HIGH+25°CIV6.58.56.58.5ns
Latch Enable to Output LOW+25°CIV6.58.56.58.5ns
Delta Delay Between Outputs+25°CIV0.51.50.51.5ns
Propagation Delay Dispersion
20 mV to 100 mV Overdrive+25°CV100100ps
100 mV to 1.0 V Overdrive+25°CIV100200100200ps
Rise Time
Fall Time
10
10
+25°CV1.851.85ns
+25°CV1.351.35ns
Latch Enable
Pulse Width [t
Setup Time (t
]+25°CIV3.52.53.52.5ns
PW(E)
)+25°CIV31.731.7ns
S
Hold Time (tH)+25°CIV31.931.9ns
–2–
REV. B
AD9696/AD9698
08C to +708C –558C to +1258C
AD9696/AD9698 AD9696/AD9698
Absolute maximum ratings are limiting values, to be applied individually,
and beyond which the serviceability of the circuit may be impaired. Functional
operability is not necessarily implied. Exposure to absolute maximum rating
conditions for an extended period of time may affect device reliability.
Load circuit has 420 Ω from +VS to output; 460 Ω from output to ground.
4
RS ≤100 Ω.
5
Propagation delays measured with 100 mV pulse; 10 mV overdrive.
6
Supply voltages should remain stable within ±5% for normal operation.
7
Specification applies to both +5 V and ±5 V supply operation.
8
Specification applies to only ±5 V supply operation.
9
Measured with nominal values ±5% of +VS and –VS.
10
Although fall time is faster than rise time, the complementary outputs cross at
midpoint of logic swing because of delay on start of falling edge.
Specifications subject to change without notice.
EXPLANATION OF TEST LEVELS
Test Level
I– 100% production tested.
II– 100% production tested at +25°C, and sample tested at
specified temperatures.
III– Sample tested only.
IV– Parameter is guaranteed by design and characterization
testing.
V– Parameter is a typical value only.
VI– All devices are 100% production tested at +25°C.
100% production tested at temperature extremes for
extended temperature devices; sample tested at temp-
erature extremes for commercial/industrial devices.
ORDERING GUIDE
Package
ModelPackageTemperatureOption
1
AD9696KNPlastic DIP0°C to +70°CN-8
AD9696KRSOIC0°C to +70°CR-8
AD9696KQCerdip0°C to +70°CQ-8
AD9696TQCerdip–55°C to +125°C Q-8
AD9696TZ/883B
2
Gullwing–55°C to +125°C Z-8A
AD9698KNPlastic DIP0°C to +70°CN-16
AD9698KRSOIC0°C to +70°CR-16A
AD9698KQCerdip0°C to +70°CQ-16
AD9698TQCerdip–55°C to +125°C Q-16
AD9698TZ/883B3Gullwing–55°C to +125°C Z-16
NOTES
1
N = Plastic DIP, Q = Cerdip, R = Small Outline (SOIC), Z = Ceramic Leaded
Chip Carrier.
2
Refer to AD9696TZ/883B military data sheet.
3
Refer to AD9698TZ/883B military data sheet.
REV. B
–3–
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