1.8 V supply operation
Low power: 164 mW per channel at 125 MSPS
SNR = 76.5 dBFS at 70 MHz (2.0 V p-p input span)
SNR = 77.5 dBFS at 70 MHz (2.6 V p-p input span)
SFDR = 90 dBc (to Nyquist, 2.0 V p-p input span)
DNL = ±0.7 LSB; INL = ±3.5 LSB (2.0 V p-p input span)
Serial LVDS (ANSI-644, default) and low power, reduced
range option (similar to IEEE 1596.3)
650 MHz full power analog bandwidth
2 V p-p input voltage range (supports up to 2.6 V p-p)
Serial port control
Full chip and individual channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Multichip sync and clock divider
Programmable output clock and data alignment
Standby mode
APPLICATIONS
Medical ultrasound and MRI
High speed imaging
Quadrature radio receivers
Diversity radio receivers
Test equipment
GENERAL DESCRIPTION
The AD9653 is a quad, 16-bit, 125 MSPS analog-to-digital converter (ADC) with an on-chip sample-and-hold circuit
designed for low cost, low power, small size, and ease of use.
The product operates at a conversion rate of up to 125 MSPS
and is optimized for outstanding dynamic performance and low
power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/
CMOS-/LVDS-compatible sample rate clock for full performance
operation. No external reference or driver components are
required for many applications.
The ADC automatically multiplies the sample rate clock for the
appropriate LVDS serial data rate. A data clock output (DCO) for
capturing data on the output and a frame clock output (FCO)
for signaling a new output byte are provided. Individual-channel
power-down is supported and typically consumes less than 2 mW
when all channels are disabled. The ADC contains several features
designed to maximize flexibility and minimize system cost, such
FUNCTIONAL BLOCK DIAGRAM
VIN+A
VIN–A
VIN+B
VIN–B
RBIAS
VREF
AGND
VIN+C
VIN–C
VIN+D
VIN–D
VCM
PIPELINE
ADC
PIPELINE
ADC
REF
SELECT
PIPELINE
ADC
PIPELINE
ADC
SERIAL PORT
INTERFACE
CSB
SDIO/OLM
16
DIGITAL
SERIALIZER
16
DIGITAL
SERIALIZER
1V
AD9653
16
DIGITAL
SERIALIZER
16
DIGITAL
SERIALIZER
CLOCK
MANAGEMENT
CLK+
SYNC
SCLK/DTP
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
CLK–
Figure 1.
as programmable output clock and data alignment and digital
test pattern generation. The available digital test patterns
include built-in deterministic and pseudorandom patterns, along
with custom user-defined test patterns entered via the serial port
interface (SPI).
The AD9653 is available in a RoHS-compliant, 48-lead LFCSP.
It is specified over the industrial temperature range of −40°C to
+85°C. This product is protected by a U.S. patent.
D0+A
D0–A
D1+A
D1–A
D0+B
D0–B
D1+B
D1–B
FCO+
FCO–
D0+C
D0–C
D1+C
D1–C
D0+D
D0–D
D1+D
D1–D
DCO+
DCO–
10538-001
PRODUCT HIGHLIGHTS
1. Small Footprint.
Four ADCs are contained in a small, space-saving package.
2. Low power of 164 mW/channel at 125 MSPS with scalable
power options.
3. Pin compatible to the AD9253 14-bit quad and the AD9633
12-bit quad ADC.
4. Ease of Use.
A data clock output (DCO) operates at frequencies of up to
500 MHz and supports double data rate (DDR) operation.
5. User Flexibility.
The SPI control offers a wide range of flexible features to
meet specific system requirements.
responsi bility is as sumed by Anal og Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
AD9653 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
AVDD = 1.8 V, DRVDD = 1.8 V, 2.0 V p-p full-scale differential input at −1.0 dBFS; V
Table 1.
Parameter1 Temperature Min Typ Max Unit
RESOLUTION 16 Bits
ACCURACY
No Missing Codes Full Guaranteed
Offset Error Full −0.49 −0.3 0.17 % FSR
Offset Matching Full −0.14 +0.2 0.39 % FSR
Gain Error Full −12.3 −5 2.37 % FSR
Gain Matching Full 1.0 1.1 5.8 % FSR
Differential Nonlinearity (DNL) Full
25°C ±0.7 LSB
Integral Nonlinearity (INL) Full
25°C ±3.5
TEMPERATURE DRIFT
Offset Error Full 3.5 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1.0 V Mode) Full 0.98 1.0 1.01 V
Load Regulation at 1.0 mA (V
= 1.0 V) Full 2 mV
Input Resistance 25°C 7.5 kΩ
INPUT-REFERRED NOISE
V
= 1.0 V 25°C 2.7 LSB rms
ANALOG INPUTS
Differential Input Voltage (V
= 1.0 V) Full 2 V p-p
Common-Mode Voltage Full 0.9 V
Common-Mode Range 25°C 0.5 1.3 V
Differential Input Resistance 25°C 2.6 kΩ
Differential Input Capacitance 25°C 7 pF
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 V
DRVDD Full 1.7 1.8 1.9 V
2
I
Full 305 330 mA
I
(ANSI-644 Mode)2 Full 60 64 mA
I
(Reduced Range Mode)2 25°C 45
TOTAL POWER CONSUMPTION
DC Input Full 607 649 mW
Sine Wave Input (Four Channels Including Output Drivers, ANSI-644 Mode) Full 657 708 mW
Sine Wave Input (Four Channels Including Output Drivers, Reduced Range Mode) 25°C 630 mW
Power-Down 25°C 2 mW
Standby3 Full 356 392 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured with a low input frequency, full-scale sine wave on all four channels.
3
Can be controlled via the SPI.
= 1.0 V, DCS off, unless otherwise noted.
REF
0.77
0.95 LSB
7.26
8.18 LSB
LSB
mA
Rev. 0 | Page 3 of 40
AD9653 Data Sheet
INTERNAL VOLTAGE REFERENCE
REF
REF
REF
AVDD
25°C 1.8 V
DRVDD
25°C 1.8 V
AVDD
2
DRVDD
DRVDD
AVDD = 1.8 V, DRVDD = 1.8 V, 2.6 V p-p full-scale differential input at −1.0 dBFS; V
Table 2.
Parameter1 Temperature Min Ty p Max Unit
RESOLUTION 16 Bits
ACCURACY
No Missing Codes 25°C Guaranteed
Offset Error 25°C −0.3 % FSR
Offset Matching 25°C +0.2 % FSR
Gain Error 25°C −5 % FSR
Gain Matching 25°C 1.1 % FSR
Differential Nonlinearity (DNL) 25°C
Integral Nonlinearity (INL) 25°C
TEMPERATURE DRIFT
Offset Error 25°C 3.5 ppm/°C
Output Voltage (1.3 V Programmable Mode) 25°C 1.3 V
Load Regulation at 1.0 mA (V
= 1.3 V) 25°C 6.5 mV
Input Resistance 25°C 7.5 kΩ
INPUT-REFERRED NOISE
V
= 1.3 V 25°C 2.1 LSB rms
ANALOG INPUTS
Differential Input Voltage (V
= 1.3 V) 25°C 2.6 V p-p
Common-Mode Voltage 25°C 0.9 V
Common-Mode Range 25°C 0.6 1.3 V
Differential Input Resistance 25°C 2.6 kΩ
Differential Input Capacitance 25°C 7 pF
DC Input 25°C 614 mW
Sine Wave Input (Four Channels Including Output Drivers, ANSI-644 Mode) 25°C 673 mW
Sine Wave Input (Four Channels Including Output Drivers, Reduced Range Mode) 25°C 646 mW
Power-Down 25°C 2 mW
Standby3 25°C 371 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured with a low input frequency, full-scale sine wave on all four channels.
3
Can be controlled via the SPI.
Rev. 0 | Page 4 of 40
Data Sheet AD9653
fIN = 128 MHz
25°C 73.9 dBFS
fIN = 200 MHz
25°C 71.5 dBFS
fIN = 70 MHz
Full
12.1
12.4 Bits
fIN = 128 MHz
25°C 11.9 Bits
fIN = 70 MHz
Full
−78
−89 dBc
IN1
IN2
87
AVDD
25°C 31 dB
ANALOG INPUT BANDWIDTH, FULL POWER
25°C 650 MHz
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2.0 V p-p full-scale differential input at −1.0 dBFS; V
Table 3.
Parameter1 Temperature Min Typ Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 78 dBFS
fIN = 15 MHz 25°C 77.8 dBFS
fIN = 70 MHz Full 75.5 76.5 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 78 dBFS
fIN = 15 MHz 25°C 77.7 dBFS
fIN = 70 MHz Full 74.6 76.1 dBFS
fIN = 128 MHz 25°C 73.6 dBFS
fIN = 200 MHz 25°C 70.3 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 12.7 Bits
fIN = 15 MHz 25°C 12.6 Bits
= 1.0 V, DCS off, unless otherwise noted.
REF
fIN = 200 MHz 25°C 11.4 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 96 dBc
fIN = 15 MHz 25°C 93 dBc
fIN = 70 MHz Full 78 89 dBc
fIN = 128 MHz 25°C 87 dBc
fIN = 200 MHz 25°C 77 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 9.7 MHz 25°C −98 dBc
fIN = 15 MHz 25°C −93 dBc
fIN = 128 MHz 25°C −87 dBc
fIN = 200 MHz 25°C −77 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 9.7 MHz 25°C −96 dBc
fIN = 15 MHz 25°C −98
fIN = 70 MHz Full −85 −94 dBc
fIN = 128 MHz 25°C −89 dBc
fIN = 200 MHz 25°C −83 dBc
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1 AND AIN2 = −7.0 dBFS
f
= 70.5 MHz, f
CROSSTALK2 25°C
CROSSTALK (OVERRANGE CONDITION)3 25°C
= 72.5 MHz 25°C −90 dBc
91
dB
dB
POWER SUPPLY REJECTION RATIO (PSRR)4
dBc
DRVDD 25°C 79 dB
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Crosstalk is measured at 70 MHz with −1.0 dBFS analog input on one channel and no input on the adjacent channel.
3
Overrange condition is defined as the input being 3 dB above full scale.
4
PSRR is measured by injecting a sinusoidal signal at 10 MHz to the power supply pin and measuring the output spur on the FFT. PSRR is calculated as the ratio of the
amplitudes of the spur voltage over the pin voltage, expressed in decibels.
Rev. 0 | Page 5 of 40
AD9653 Data Sheet
IN1
IN2
AVDD = 1.8 V, DRVDD = 1.8 V, 2.6 V p-p full-scale differential input at −1.0 dBFS; V
noted.
Table 4.
Parameter1 Temperature Min Ty p Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 80 dBFS
fIN = 15 MHz 25°C 79.4 dBFS
fIN = 70 MHz 25°C 77.5 dBFS
fIN = 128 MHz 25°C 74.4 dBFS
fIN = 200 MHz 25°C 71.7 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 79.8 dBFS
fIN = 15 MHz 25°C 79.2 dBFS
fIN = 70 MHz 25°C 76.1 dBFS
fIN = 128 MHz 25°C 74 dBFS
fIN = 200 MHz 25°C 69.9 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 13 Bits
fIN = 15 MHz 25°C 12.9 Bits
fIN = 70 MHz 25°C 12.3 Bits
fIN = 128 MHz 25°C 12 Bits
fIN = 200 MHz 25°C 11.3 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 94 dBc
fIN = 15 MHz 25°C 94 dBc
fIN = 70 MHz 25°C 82 dBc
fIN = 128 MHz 25°C 86 dBc
fIN = 200 MHz 25°C 75 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 9.7 MHz 25°C −94 dBc
fIN = 15 MHz 25°C −94 dBc
fIN = 70 MHz 25°C −82 dBc
fIN = 128 MHz 25°C −87 dBc
fIN = 200 MHz 25°C −75 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 9.7 MHz 25°C −100 dBc
fIN = 15 MHz 25°C −99 dBc
fIN = 70 MHz 25°C −96 dBc
fIN = 128 MHz 25°C −86 dBc
fIN = 200 MHz 25°C −84 dBc
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1 AND AIN2 = −7.0 dBFS
f
= 70.5 MHz, f
= 72.5 MHz 25°C −90 dBc
CROSSTALK2 25°C 91 dB
CROSSTALK (OVERRANGE CONDITION)3 25°C 87 dB
POWER SUPPLY REJECTION RATIO (PSRR)4
AVDD 25°C 31 dB
DRVDD 25°C 79 dB
ANALOG INPUT BANDWIDTH, FULL POWER 25°C 650 MHz
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Crosstalk is measured at 70 MHz with −1.0 dBFS analog input on one channel and no input on the adjacent channel.
3
Overrange condition is defined as the input being 3 dB above full scale.
4
PSRR is measured by injecting a sinusoidal signal at 10 MHz to the power supply pin and measuring the output spur on the FFT. PSRR is calculated as the ratio of the
amplitudes of the spur voltage over the pin voltage, expressed in decibels.
Logic Compliance CMOS/LVDS/LVPECL
Differential Input Voltage2 Full 0.2 3.6 V p-p
Input Voltage Range Full AGND − 0.2 AVDD + 0.2 V
Input Common-Mode Voltage Full 0.9 V
Input Resistance (Differential) 25°C 15 kΩ
Input Capacitance 25°C 4 pF
LOGIC INPUTS (PDWN, SYNC, SCLK)
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 30 kΩ
Input Capacitance 25°C 2 pF
LOGIC INPUT (CSB)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 26 kΩ
Input Capacitance 25°C 2 pF
Logic 1 Voltage (IOH = 800 μA) Full 1.79 V
Logic 0 Voltage (IOL = 50 μA) Full 0.05 V
DIGITAL OUTPUTS (D0±x, D1±x), ANSI-644
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 290 345 400 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
DIGITAL OUTPUTS (D0±x, D1±x), LOW POWER,
REDUCED SIGNAL OPTION
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 160 200 230 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
This is specified for LVDS and LVPECL only.
3
This is specified for 13 SDIO/OLM pins sharing the same connection.
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured on standard FR-4 material.
3
Can be adjusted via the SPI. The conversion rate is the clock rate after the divider.
4
t
/16 is based on the number of bits in two LVDS data lanes. t
SAMPLE
5
Wake-up time is defined as the time required to return to normal operation from power-down mode.
SAMPLE
= 1/fS.
Clock cycles
Clock cycles
Rev. 0 | Page 8 of 40
Data Sheet AD9653
SSYNC
HSYNC
CLK
HIGH
LOW
D0–A
D0+A
D1–A
D1+A
FCO–
BYTEWISE
MODE
FCO+
D0–A
D0+A
D1–A
D1+A
FCO–
DCO
DCO+
CLK+
VIN±x
CLK–
DCO–
FCO+
BITWISE
MODE
SDR
DDR
10538-002
MSB
N – 17
D14
N – 17
D13
N – 17
D12
N – 17
D11
N – 17
D10
N – 17
D09
N – 17
D08
N – 17
MSB
N – 16
D14
N – 16
D13
N – 16
D12
N – 16
D11
N – 16
D10
N – 16
D09
N – 16
D08
N – 16
D07
N – 17
D06
N – 17
D05
N – 17
D04
N – 17
D03
N – 17
D02
N – 17
D01
N – 17
LSB
N – 17
D07
N – 16
D06
N – 16
D05
N – 16
D04
N – 16
D03
N – 16
D02
N – 16
D01
N – 16
LSB
N – 16
MSB
N – 17
D13
N – 17
D11
N – 17
D09
N – 17
D07
N – 17
D05
N – 17
D03
N – 17
D01
N – 17
MSB
N – 16
D13
N – 16
D11
N – 16
D09
N – 16
D07
N – 16
D05
N – 16
D03
N – 16
D01
N – 16
D14
N – 17
D12
N – 17
D10
N – 17
D08
N – 17
D06
N – 17
D04
N – 17
D02
N – 17
LSB
N – 17
D14
N – 16
D12
N – 16
D10
N – 16
D08
N – 16
D06
N – 16
D04
N – 16
D02
N – 16
LSB
N – 16
t
A
t
DATA
t
LD
t
EH
t
FCO
t
FRAME
t
PD
t
CPD
t
EL
N – 1
N
N + 1
TIMING SPECIFICATIONS
Table 7.
Parameter Description Limit
SYNC TIMING REQUIREMENTS
t
SYNC to rising edge of CLK+ setup time 0.24 ns typ
t
SYNC to rising edge of CLK+ hold time 0.40 ns typ
SPI TIMING REQUIREMENTS See Figure 75
tDS Setup time between the data and the rising edge of SCLK 2 ns min
tDH Hold time between the data and the rising edge of SCLK 2 ns min
t
Period of the SCLK 40 ns min
tS Setup time between CSB and SCLK 2 ns min
tH Hold time between CSB and SCLK 2 ns min
t
SCLK pulse width high 10 ns min
t
SCLK pulse width low 10 ns min
t
Time required for the SDIO pin to switch from an input to an output relative to the
EN_SDIO
10 ns min
SCLK falling edge (not shown in Figure 75)
t
Time required for the SDIO pin to switch from an output to an input relative to the
DIS_SDIO
10 ns min
SCLK rising edge (not shown in Figure 75)
Timing Diagrams
Refer to the Memory Map Register Descriptions section and Table 23 for SPI register settings.
−0.3 V to +2.0 V
(D0±x, D1±x, DCO+, DCO−, FCO+,
FCO−) to AGND
VIN+x, VIN−x to AGND −0.3 V to +2.0 V
SCLK/DTP, SDIO/OLM, CSB to AGND −0.3 V to +2.0 V
SYNC, PDWN to AGND −0.3 V to +2.0 V
RBIAS to AGND −0.3 V to +2.0 V
VREF, SENSE to AGND −0.3 V to +2.0 V
Environmental
Operating Temperature
Range (Ambient, V
Operating Temperature
Range (Ambient, V
Maximum Junction
= 1.0 V)
= 1.3 V)
−40°C to +85°C
0°C to 85°C
150°C
Temperature
Lead Temperature
300°C
(Soldering, 10 sec)
Storage Temperature
−65°C to +150°C
Range (Ambient)
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Table 9. Thermal Resistance
Air Flow
Package Type
Velocity
(m/sec)
θ
1
θ
Unit
48-Lead LFCSP 0.0 23.7 7.8 7.1 °C/W
7 mm × 7 mm 1.0 20.0 N/A N/A °C/W
(CP-48-13) 2.5 18.7 N/A N/A °C/W
1
θJA for a 4-layer PCB with solid ground plane (simulated). Exposed pad
soldered to PCB.
ESD CAUTION
Rev. 0 | Page 11 of 40
AD9653 Data Sheet
21, 22
D1−B, D1+B
Channel B Digital Outputs.
35
VIN−A
ADC A Analog Input Complement.
36 VIN+A
ADC A Analog Input True.
SENSE
D
NOTES
1. THE EXPOSED THERMAL PAD ON THE BOTTOM OF THE
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
VIN+C
48
1
VIN+D
2
VIN–D
3
AVDD
4
AVDD
5
CLK–
6
CLK+
7
AVDD
8
RVDD
9
D1–D
10
D1+D
11
D0–D
12
D0+D
13
D1–C
PACKAGE PROV IDES THE ANALOG GROUND FOR THE PART.
THIS EXP OSED PAD MUST BE CONNECTED TO GROUND FOR
PROPER OP E RATION.
VIN–C
AVDD
AVDD
SYNC
47
46
45
44
AD9653
TOP VIEW
(Not to S cale)
17
16
14
15
D0–C
D0+C
D1+C
DCO–
VCM
43
18
DCO+
Figure 6. 48-Lead LFCSP Pin Configuration, Top View
Table 10. Pin Function Descriptions
Pin No. Mnemonic Description
0 AGND,
Exposed Pad
1
2
VIN+D ADC D Analog Input True.
VIN−D ADC D Analog Input Complement.
Analog Ground, Exposed Pad. The exposed thermal pad on the bottom of the package provides the
analog ground for the part. This exposed pad must be connected to ground for proper operation.
3, 4, 7, 34, 39, 45, 46 AVDD 1.8 V Analog Supply Pins.
5, 6
8, 29
9, 10
CLK−, CLK+ Differential Encode Clock. PECL, LVDS, or 1.8 V CMOS inputs.
DRVDD Digital Output Driver Supply.
D1−D, D1+D Channel D Digital Outputs.
11, 12 D0−D, D0+D Channel D Digital Outputs.
13, 14
15, 16
17, 18
19, 20
D1−C, D1+C Channel C Digital Outputs.
D0−C, D0+C Channel C Digital Outputs.
DCO−, DCO+ Data Clock Outputs.
FCO−, FCO+ Frame Clock Outputs.
VREF
42
19
FCO–
41
20
FCO+
AVDD
RBIAS
39
40
22
21
D1–B
D1+B
VIN+B
VIN–B
37
38
24
23
D0–B
D0+B
36
VIN+A
VIN–A
35
AVDD
34
PDWN
33
32
CSB
SDIO/OLM
31
SCLK/DTP
30
DRVDD
29
28
D0+A
D0–A
27
D1+A
26
25
D1–A
10538-006
23, 24
D0−B, D0+B Channel B Digital Outputs.
25, 26 D1−A, D1+A Channel A Digital Outputs.
27, 28 D0−A, D0+A Channel A Digital Outputs.
30
31
32
33
37
38 VIN−B ADC B Analog Input Complement.
40
41
42
43
SCLK/DTP SPI Clock Input/Digital Test Pattern.
SDIO/OLM SPI Data Input and Output Bidirectional SPI Data/Output Lane Mode.
CSB SPI Chip Select Bar. Active low enable; 30 kΩ internal pull-up.
PDWN Digital Input, 30 kΩ Internal Pull-Down.
VIN+B ADC B Analog Input True.
RBIAS Sets Analog Current Bias. Connect to 10 kΩ (1% tolerance) resistor to ground.
SENSE Reference Mode Selection.
VREF Voltage Reference Input and Output.
VCM Analog Input Common-Mode Voltage.
PDWN high = power-down device.
PDWN low = run device, normal operation.
Rev. 0 | Page 12 of 40
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